CN212497317U - Clamp for radio frequency circuit test - Google Patents
Clamp for radio frequency circuit test Download PDFInfo
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- CN212497317U CN212497317U CN202020168102.5U CN202020168102U CN212497317U CN 212497317 U CN212497317 U CN 212497317U CN 202020168102 U CN202020168102 U CN 202020168102U CN 212497317 U CN212497317 U CN 212497317U
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- 238000012360 testing method Methods 0.000 title claims abstract description 37
- 238000006243 chemical reaction Methods 0.000 claims abstract description 21
- 239000002184 metal Substances 0.000 claims abstract description 6
- 229910052751 metal Inorganic materials 0.000 claims abstract description 6
- 239000003990 capacitor Substances 0.000 claims description 24
- 238000009413 insulation Methods 0.000 claims description 7
- 238000000034 method Methods 0.000 description 9
- 238000010586 diagram Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 238000004891 communication Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 229910001369 Brass Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000010951 brass Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- 230000003252 repetitive effect Effects 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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Abstract
The application discloses anchor clamps for radio frequency circuit test belongs to radio frequency circuit test field. A clamp for radio frequency circuit testing comprises a metal shielding box and a pair of signal conversion ports; the metal shielding box comprises a first cover plate, a second cover plate and a side wall, wherein the side wall is connected between the first cover plate and the second cover plate; the pair of signal conversion ports are arranged on the group of side walls and comprise channels and interfaces arranged at the end parts of the channels. The radio frequency circuit test is carried out through the clamp, and the microstrip-to-waveguide interface is adopted to replace a coaxial connecting line for signal output, so that the problem of signal connection can be solved, shielding protection can be provided, and the stability of the radio frequency circuit test is ensured.
Description
Technical Field
The application relates to the field of radio frequency circuit testing, in particular to a clamp for radio frequency circuit testing.
Background
As the human society enters the information age, the wireless communication technology has been rapidly developed. Mobile phones, wireless local area networks, bluetooth, etc. have become an indispensable part of social life and development. Advances in wireless communication technology are not independent of the development of rf chips and microwave technology.
The radio frequency chip needs to be debugged in the research and development process. At present, the main method for debugging a radio frequency chip is to weld the chip on a test board, and then connect the test board with a power supply through a coaxial connecting wire to form a radio frequency circuit. And performing system performance test on the radio frequency circuit to obtain relevant performance parameters of the chip.
The above method has problems in that: on one hand, the SMA joint of the coaxial connecting line is a loss component and needs to be replaced periodically to ensure the accuracy of the test; on the other hand, the power lines are connected by flat cables, and frequent test plugging can cause poor line contact and affect the test stability; in addition, the test board is exposed, and static electricity carried by an operator in the operation process can damage the radio frequency circuit and the chip.
SUMMERY OF THE UTILITY MODEL
The application aims to provide a clamp for testing a radio frequency circuit. The radio frequency circuit is placed in the clamp, and the microstrip-to-waveguide interface is adopted to replace a coaxial connecting line for signal output. The problem of signal connection can be solved, shielding protection can be provided, and therefore stability of radio frequency circuit testing is guaranteed.
According to a first aspect of the present application, there is provided a fixture for radio frequency circuit testing, characterized by comprising a metallic shield box and a pair of signal conversion ports. The metal shielding box comprises a first cover plate, a second cover plate and a side wall, wherein the side wall is connected between the first cover plate and the second cover plate. The pair of signal conversion ports is arranged on the side wall and comprises a channel and an interface arranged at the end part of the channel.
Through setting up anchor clamps, place radio frequency circuit and test in the anchor clamps, carry out signal output through signal conversion port, can solve the problem of signal connection to shield external signal interference.
According to some embodiments of the present application, the metal shielding box includes a first portion and a second portion. The first portion includes a first cover plate and a first set of sidewalls disposed about the first cover plate. The second part is arranged on the first part and comprises a second cover plate and a second group of side walls, the second group of side walls are arranged around the second cover plate, and the first group of side walls and the second group of side walls are attached up and down to form the side walls.
According to some embodiments of the application, the first set of side walls includes a set of locating rods, the second set of side walls includes a set of locating holes, and the set of locating rods is inserted into the set of locating holes.
Through set up locating hole and locating lever on first portion, second portion, the equipment and the location of two parts about being convenient for.
According to some embodiments of the present application, the second portion further comprises a set of securing members disposed on the second cover plate.
Further, the set of fixing parts includes a set of fixing bars.
By arranging the fixing part on the second cover plate, after the upper part and the lower part are closed, the fixing rod is contacted with the circuit board to be tested, so that the circuit board to be tested is fixed, and the stability of electric connection in the testing process is ensured.
According to some embodiments of the application, the clamp further comprises a pair of electrical connectors, one end of each electrical connector is arranged in the first cover plate through an insulation protection device, and the other end of each electrical connector protrudes out of the first cover plate.
Further, the first cover plate comprises a pair of mounting holes, the insulation protection device is arranged in the pair of mounting holes, and the pair of electric connectors are arranged in the insulation protection device.
According to some embodiments of the application, the pair of electrical connections comprises a pair of pogo pins.
The circuit board to be tested is placed on the first cover plate, and the connection between the circuit board to be tested and the power supply is realized through the contact between the pair of spring pins and the power supply electrode of the circuit board to be tested.
According to some embodiments of the present application, the clamp further includes a pair of capacitors coupled to the pair of electrical connections.
Furthermore, the pair of capacitors comprises a pair of feedthrough capacitors, outer electrodes of the feedthrough capacitors are connected to the first group of side walls through threads, and feedthrough inner electrodes of the feedthrough capacitors penetrate into the first cover plate to be connected with the pair of electric connectors.
The external power supply system supplies power to the circuit board to be tested through the feedthrough capacitor, and can filter power supply signals and further ensure the stability of the power supply.
According to some embodiments of the present application, the first portion includes a first groove and a second groove respectively disposed on the first set of oppositely disposed sidewalls.
Further, the second portion includes a third groove and a fourth groove, which are respectively disposed on the second group of side walls disposed oppositely, and the first groove and the second groove are respectively attached to the third groove and the fourth groove from top to bottom to form the channel of the pair of signal conversion ports.
According to some embodiments of the application, the first groove, the second groove, the third groove, the fourth groove comprise a zigzag groove.
According to some embodiments of the present application, the outer side ends of the first, second, third, and fourth grooves respectively include first, second, third, and fourth bosses.
Furthermore, the first boss and the second boss are respectively attached to the third boss and the fourth boss to form the interfaces of the pair of signal conversion ports.
The microstrip signal of the tested radio frequency circuit board can be converted into a waveguide signal through a pair of signal conversion ports and output.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the application.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is apparent that the drawings in the following description are only some embodiments of the present application.
Fig. 1 shows a schematic view of the external structure of a clamp according to an exemplary embodiment of the present application.
Fig. 2 shows a first partial structural schematic according to an exemplary embodiment of the present application.
Fig. 3 shows a partial schematic view of a first partial structure according to an exemplary embodiment of the present application.
Fig. 4 shows a partial schematic view of a feedthrough capacitor and electrical connector according to an example embodiment of the present application.
Fig. 5 shows a second partial structural schematic according to an exemplary embodiment of the present application.
FIG. 6 shows a schematic diagram of a tested RF circuit board according to an example embodiment of the present application.
Fig. 7 shows a schematic diagram of a tested rf circuit board mounting according to an example embodiment of the present application.
FIG. 8 shows a flow chart of a testing method according to an example embodiment of the present application.
Detailed Description
Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. These embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of example embodiments to those skilled in the art. The same reference numerals denote the same or similar parts in the drawings, and thus, a repetitive description thereof will be omitted.
Furthermore, the described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided to give a thorough understanding of embodiments of the application. One skilled in the relevant art will recognize, however, that the subject matter of the present application can be practiced without one or more of the specific details, or with other methods, components, devices, steps, and so forth. In other instances, well-known methods, devices, implementations, or operations have not been shown or described in detail to avoid obscuring aspects of the application.
Those skilled in the art will appreciate that the drawings are merely schematic representations of exemplary embodiments, which may not be to scale. The blocks or flows in the drawings are not necessarily required to practice the present application and therefore should not be used to limit the scope of the present application.
The invention provides a clamp, aiming at the problems that in the prior art, a connector needs to be replaced periodically in a radio frequency circuit test structure, a power supply is easy to contact badly, static interference is caused and the like. When the radio frequency circuit is tested, the circuit board to be tested is placed in the clamp, the power is supplied to the circuit board to be tested in a mode of combining the feedthrough capacitor and the spring pin, and the waveguide-to-microstrip interface is adopted to replace a coaxial connecting line for signal output. The problem of signal connection can be solved, the problem of poor contact of a power supply line can be solved, and meanwhile, electrostatic protection can be provided, so that the stability of the radio frequency circuit test is ensured.
The technical solution of the present application will be described in detail below with reference to the accompanying drawings.
Fig. 1 shows a schematic view of the external structure of a clamp according to an exemplary embodiment of the present application.
As shown in fig. 1, according to a first aspect of the present application, there is provided a fixture 1000 for radio frequency circuit testing, comprising a first portion 100 and a second portion 200. The material of the first and second portions 100 and 200 is a metallic material, such as brass, aluminum, or the like. The circuit board to be tested is placed in the clamp 1000 made of metal, so that the circuit board to be tested can be shielded and protected.
The first portion 100 includes a first cover plate 110 and a first set of sidewalls 120. The first set of sidewalls 120 is disposed around the first cover plate 110.
A second portion 200 disposed on the first portion 100. The second portion 200 includes a second cover plate 210 and a second set of sidewalls 220. The second set of sidewalls 220 is disposed around the second cover plate 210.
The first set of sidewalls 120 and the second set of sidewalls 220 are attached to each other to form a closed space. The clamp 1000 further includes a first signal conversion port 310 and a second signal conversion port 320, which are disposed outside the enclosed space.
The first and second portions 100 and 200 may be two portions that are completely separate and independent, or may be hinged together at a side wall.
Referring to fig. 1, a first boss 125 and a third boss 126 are respectively disposed on a first sidewall 121 and a second sidewall 122, which are oppositely disposed, of the first set of sidewalls 120. A second boss 225 and a fourth boss 226 are respectively disposed on a third sidewall 221 and a fourth sidewall 222 oppositely disposed in the second set of sidewalls 220.
According to some embodiments of the present application, the first boss 125, the second boss 126, the third boss 225, and the fourth boss 226 may be semi-circular, semi-elliptical, square, or rectangular in shape. Accordingly, the first and second signal conversion ports 310 and 320 may be formed in a circular, oval, rectangular, or square shape. However, the present application is not limited thereto, and the specific shape may be matched to the shape of the external interface.
Fig. 2 shows a first partial structural schematic according to an exemplary embodiment of the present application.
Fig. 3 shows a first partial structural schematic according to an exemplary embodiment of the present application.
As shown in fig. 2, the fixture 1000 further includes a pair of electrical connectors 400, one end of each electrical connector is disposed in the first cover plate 110, and the other end of each electrical connector protrudes from the first cover plate 110. The first cover plate 110 is provided with a pair of mounting holes 111.
As shown in fig. 3, a pair of insulation guards 112 are disposed in the pair of mounting holes 111, and the pair of electrical connectors 400 are disposed in the insulation guards 112. According to some embodiments of the present application, the pair of electrical connectors 400 may be a pair of pogo pins.
Referring to fig. 2, a first groove 127 and a second groove 128 are respectively included on a first sidewall 121 and a second sidewall 122 of the first set of sidewalls 120 that are oppositely disposed. The first groove 127 and the second groove 128 are zigzag-shaped.
The inner ends of the first groove 127 and the second groove 128 are connected with the microstrip waveguide structure of the circuit board to be tested, and the outer ends are respectively a first boss 125 and a third boss 126.
According to an exemplary embodiment of the present application, a set of positioning rods 129 is disposed on the first set of sidewalls 120, as shown in fig. 2. When the first part 100 is assembled with the second part 200, positioning may be performed by the set of positioning rods 129. As shown in fig. 2, a set of 4 positioning rods 129 is diagonally disposed along the first set of sidewalls 120, but is not limited thereto. The number and position of the positioning rods 129 can meet the assembling requirement of the first part 100 and the second part 200.
As shown in fig. 2, the fixture 1000 further includes a pair of feedthrough capacitors 500 according to an example embodiment of the present application. The pair of feedthrough capacitors 500 is disposed on the first set of sidewalls 120 of the first portion 100, penetrating the first cover plate 110 and connected to the pair of electrical connectors 400. For example, the pair of feedthrough capacitors 500 may be disposed on the third sidewall 123 or the fourth sidewall 124.
Fig. 4 shows a partial schematic view of a feedthrough capacitor and electrical connector according to an example embodiment of the present application.
As shown in fig. 4, the pair of feedthrough capacitors 500 includes a feedthrough inner electrode 510 and an outer electrode 520. One end of the through inner electrode 510 penetrates into the first cover plate 110 and is connected with a pair of electrical connectors 400 respectively. The outer electrode 520 is threaded and may be rotatably secured to the sidewall. During the test, a pair of feedthrough capacitors 500 is connected to an external power source, and a pair of electrical connections 400 are connected to the power supply electrodes of the circuit board under test to form a power supply loop.
Fig. 5 shows a second partial structural schematic according to an exemplary embodiment of the present application.
As shown in fig. 5, the first sidewall 221 and the second sidewall 222 of the second set of sidewalls 220, which are oppositely disposed, respectively include a third groove 227 and a fourth groove 228. The third groove 227 and the fourth groove 228 are zigzag-shaped.
The outer ends of the third groove 227 and the fourth groove 228 are respectively a third boss 225 and a fourth boss 226.
After the first part 100 and the second part 200 are assembled, the first boss 125 and the third boss 126 are respectively attached to the third boss 225 and the fourth boss 226, and the first groove 127 and the second groove 128 are respectively attached to the third groove 227 and the fourth groove 228, so as to form a first signal conversion port 310 and a second signal conversion port 320. When the radio frequency circuit test is performed, the microstrip electric signal generated by the circuit board is converted into waveguide energy through the first signal conversion port 310 and the second signal conversion port 320 for transmission.
According to an exemplary embodiment of the present application, as shown in fig. 5, a set of positioning holes 229 is disposed on the second set of sidewalls 220. When the first part 100 is assembled with the second part 200, the positioning holes 229 can be matched with the positioning rods 129 on the first part 100 for positioning. The number of the positioning holes 229 in one set is the same as that of the positioning rods 129 in one set.
Referring to fig. 5, the second portion 200 further includes a set of fixing rods 230 disposed on the second cover plate 210. After the first part 100 and the second part 200 are assembled, a set of fixing bars 230 is in contact with the circuit board to be tested, so as to fix the circuit board to be tested, thereby ensuring the stability of electrical connection during the testing process. According to the exemplary embodiment of the present application, the number of the fixing bars 230 in a group is 4, but the present application is not limited thereto, and the number thereof may be sufficient to satisfy the fixing requirement of the circuit board to be tested.
FIG. 6 shows a schematic diagram of a tested RF circuit board according to an example embodiment of the present application.
As shown in fig. 6, the rf circuit board 700 to be tested includes an rf chip 710, a pair of microstrip-to-waveguide connectors 720, and a pair of power supply electrodes 730. The radio frequency chip 710 and the microstrip-to-waveguide joint 720 are electrically connected with the power supply electrode 730.
FIG. 7 shows a schematic diagram of a tested RF circuit board test installation according to an example embodiment of the present application.
As shown in fig. 7, when the fixture is used to test the rf circuit board 700 to be tested, the rf circuit board 700 to be tested is placed in the first cavity 130 of the first portion 100 and on the first cover plate 110. A pair of microstrip-to-waveguide connectors 720 are disposed at one end of the inner sides of the first signal path 127 and the second signal path 128, respectively. A pair of power supply electrodes 730 are connected to the pair of electrical connections 400, respectively.
FIG. 8 shows a flow chart of a testing method according to an example embodiment of the present application.
As shown in fig. 8, the process of testing the rf circuit using the above-mentioned jig includes:
at step S1, the circuit board under test is positioned within the first portion. The supply electrodes of the circuit board under test are in contact with the pair of electrical connections of the first portion. The signal output connector of the circuit board is placed in the groove of the first part.
In step S2, the second part is assembled with the first part to secure the circuit board. The first part and the second part are assembled through the positioning holes and the positioning columns, the set of fixing columns fix the circuit board to be tested, and the circuit board to be tested is stably connected with the electric connecting piece. The first part and the second part are jointed up and down to form a pair of signal conversion ports.
In step S3, an external signal port is connected through a pair of signal conversion ports. The pair of signal conversion ports converts the microstrip signal output by the circuit board to a waveguide signal and outputs the waveguide signal through the external signal port.
At step S4: and connecting an external power supply to supply power to the through-core capacitor and starting testing. The external power supply supplies power to the circuit board to be tested through the feedthrough capacitor. The power supply signal is more stable after being filtered by the feedthrough capacitor.
It should be noted that each of the embodiments described above with reference to the drawings is only for illustrating the present application and not for limiting the scope of the present application, and those skilled in the art should understand that modifications or equivalent substitutions made on the present application without departing from the spirit and scope of the present application should be covered by the present application. Furthermore, unless the context indicates otherwise, words that appear in the singular include the plural and vice versa. Additionally, all or a portion of any embodiment may be utilized with all or a portion of any other embodiment, unless stated otherwise.
Claims (15)
1. A fixture for radio frequency circuit testing, comprising:
the metal shielding box comprises a first cover plate, a second cover plate and a side wall, wherein the side wall is connected between the first cover plate and the second cover plate;
and the signal conversion ports are arranged on the side wall and comprise channels and interfaces arranged at the end parts of the channels.
2. The clamp of claim 1, wherein the metallic shield can comprises:
a first portion comprising a first cover plate and a first set of sidewalls disposed about the first cover plate;
the second part is arranged on the first part and comprises a second cover plate and a second group of side walls, the second group of side walls are arranged around the second cover plate, and the first group of side walls and the second group of side walls are attached up and down to form the side walls.
3. The clamp of claim 2, wherein the first set of side walls includes a set of locating rods and the second set of side walls includes a set of locating holes into which the set of locating rods are inserted.
4. The clamp of claim 2, wherein the second portion further comprises a set of securing features disposed on the second cover plate.
5. The clamp of claim 4, wherein the set of securing members comprises a set of securing rods.
6. The clamp of claim 2, further comprising a pair of electrical connectors, one end disposed within the first cover plate through an insulating guard, the other end protruding out of the first cover plate.
7. The clamp of claim 6, wherein the first cover plate includes a pair of mounting holes, the insulation shield is disposed within the pair of mounting holes, and the pair of electrical connectors is disposed within the insulation shield.
8. The clamp of claim 6, wherein the pair of electrical connections comprise a pair of pogo pins.
9. The fixture of claim 6, further comprising a pair of capacitors coupled to the pair of electrical connectors.
10. The clamp of claim 9, wherein the pair of capacitors comprises a pair of feedthrough capacitors, outer electrodes of the feedthrough capacitors are threaded onto the first set of sidewalls, and inner feedthrough electrodes of the feedthrough capacitors penetrate the first cover plate to connect with the pair of electrical connectors.
11. The clip of claim 2, wherein the first portion includes a first groove and a second groove, each disposed on a first set of oppositely disposed sidewalls.
12. The fixture of claim 11, wherein the second portion includes a third groove and a fourth groove respectively disposed on the second set of sidewalls, and the first groove and the second groove respectively fit the third groove and the fourth groove to form the channels of the pair of signal conversion ports.
13. The clamp of claim 12, wherein the first groove, the second groove, the third groove, and the fourth groove comprise a zigzag groove.
14. The clamp of claim 12, wherein the outboard ends of the first, second, third, and fourth grooves comprise first, second, third, and fourth bosses, respectively.
15. The clamp of claim 14, wherein the first and second bosses respectively engage with the third and fourth bosses to form the interfaces of the pair of signal conversion ports.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020168102.5U CN212497317U (en) | 2020-02-13 | 2020-02-13 | Clamp for radio frequency circuit test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020168102.5U CN212497317U (en) | 2020-02-13 | 2020-02-13 | Clamp for radio frequency circuit test |
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| Publication Number | Publication Date |
|---|---|
| CN212497317U true CN212497317U (en) | 2021-02-09 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202020168102.5U Active CN212497317U (en) | 2020-02-13 | 2020-02-13 | Clamp for radio frequency circuit test |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111230767A (en) * | 2020-02-13 | 2020-06-05 | 深圳飞骧科技有限公司 | Clamp for radio frequency circuit test |
| WO2023020101A1 (en) * | 2021-08-19 | 2023-02-23 | 深圳飞骧科技股份有限公司 | Chip test fixture and chip test fixture combination |
| EP4191258A1 (en) * | 2021-12-06 | 2023-06-07 | Aptiv Technologies Limited | Test fixture for printed circuit board components |
-
2020
- 2020-02-13 CN CN202020168102.5U patent/CN212497317U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111230767A (en) * | 2020-02-13 | 2020-06-05 | 深圳飞骧科技有限公司 | Clamp for radio frequency circuit test |
| WO2023020101A1 (en) * | 2021-08-19 | 2023-02-23 | 深圳飞骧科技股份有限公司 | Chip test fixture and chip test fixture combination |
| EP4191258A1 (en) * | 2021-12-06 | 2023-06-07 | Aptiv Technologies Limited | Test fixture for printed circuit board components |
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Address after: 518057 1601, building 1, shuimuyifang building, No. 286, Nanguang Road, dawangshan community, Nantou street, Nanshan District, Shenzhen, Guangdong Patentee after: Shenzhen Feiyu Technology Co.,Ltd. Address before: 518057 318, 3F, building B, Guoren building, kejizhong Third Road, Science Park, Yuehai street, Nanshan District, Shenzhen City, Guangdong Province Patentee before: LANSUS TECHNOLOGIES Inc. |