CN203479845U - Microwave amplifier test socket - Google Patents

Microwave amplifier test socket Download PDF

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Publication number
CN203479845U
CN203479845U CN201320612581.5U CN201320612581U CN203479845U CN 203479845 U CN203479845 U CN 203479845U CN 201320612581 U CN201320612581 U CN 201320612581U CN 203479845 U CN203479845 U CN 203479845U
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CN
China
Prior art keywords
test
microwave amplifier
circuit board
testing circuit
bracket
Prior art date
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Active
Application number
CN201320612581.5U
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Chinese (zh)
Inventor
袁文
邱云峰
张文辉
雷芸
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Guizhou Aerospace Institute of Measuring and Testing Technology
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Guizhou Aerospace Institute of Measuring and Testing Technology
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Application filed by Guizhou Aerospace Institute of Measuring and Testing Technology filed Critical Guizhou Aerospace Institute of Measuring and Testing Technology
Priority to CN201320612581.5U priority Critical patent/CN203479845U/en
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Publication of CN203479845U publication Critical patent/CN203479845U/en
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Abstract

The utility model discloses a microwave amplifier test socket which comprises a test circuit board (6) that is provided at the upper surface of a test bracket (1). The test circuit board (6) is provided with test needle holes (5) which are connected with a microstrip line (7). The test bracket (1) is provided with joints (2) and metal electrodes (4). The inner cores of the joints (2) are connected with the metal electrodes (4) and the microstrip line (7) at the lower surface of the test circuit board (6). The microwave amplifier test socket settles the following problems in testing a large-power active microwave amplifier according to the prior art: low test efficiency because of direct welding of a test line onto a device pin; low suitability for large-batch test operation; mechanical damage of a tested workpiece; inferior contact, no enough grounding area, low fixing firmness and easy larger test data error in the test process; etc.

Description

A kind of microwave amplifier test bench
Technical field
The utility model relates to microwave amplifier measuring technology, relates in particular to a kind of microwave amplifier test bench.
Background technology
For High Power Active microwave amplifier, its frequency of operation is more than 10GHz, gain is more than 35dBm, during work, need provide direct supply, because this active microwave amplifier frequency of operation is very high, it is special to encapsulate, also there is no at present special-purpose proving installation, while conventionally dispatching from the factory test, be that p-wire is directly welded on the device pin of tested High Power Active microwave amplifier, this mode has had a strong impact on the weldability of tested amplifier, to subsequent installation, uses and has brought trouble; And this test mode efficiency is not high, expend a large amount of manpower and materials, be not suitable for large batch of test job, the mechanical damage that makes microwave amplifier when test adopt conventional contact or welding manner to bring, loose contact, contact area not, fixing not firm, easily cause the larger problems such as test data error.
Summary of the invention
The technical problems to be solved in the utility model: a kind of microwave amplifier test bench is provided, to solve when prior art is tested High Power Active microwave amplifier, need the testing efficiency that directly welding p-wire exists on device pin low, be not suitable for test job in enormous quantities, and can bring mechanical damage to measured device, loose contact in test process, contact area not, fixing not firm, reliability is not high, easily cause the larger problems such as test data error.
Technical solutions of the utility model:
A kind of microwave amplifier test bench, it comprises testing circuit board, testing circuit board is positioned at the upper surface of test bracket, on testing circuit board, there is test vent needle, test vent needle is connected with microstrip line, on test bracket, have joint and metal electrode, the inner core of joint is connected with the microstrip line of testing circuit board lower surface with metal electrode.
Testing circuit board upper surface is for entirely covering copper ground wire, and lower surface is test circuit.
Testing circuit board is fixed by four mounting holes and test bracket upper surface.
Test vent needle is arranged in the manhole of four diamond arraies in the middle of testing circuit board.
Joint is positioned at the left and right sides of test bracket, and joint is symmetrical to be installed, the inner core of joint and microstrip line welding.
Metal electrode is positioned at the upper and lower sides of test bracket.
Test pin hole installing space size and measured device lead pin pitch are measure-alike, and caliber size is identical with measured device leg diameter.
On microstrip line, be connected with capacitance.
Between power supply positive electrode and ground wire, be connected with filter capacitor.
The beneficial effects of the utility model:
Measured device is directly inserted in the utility model microwave amplifier test bench, after join dependency Microwave Test Equipment, can realizes the test to the active microwave amplifier of metal straight cutting packaged high-power, and need on measured device pin, not weld p-wire; Because the disclosed microwave amplifier test bench of the utility model adopts, there is the circle test vent needle that tightens function, guaranteed the electrical connection completely of microwave amplifier and test bench, reduced power attenuation; Used the large area to cover the microwave circuit boards of copper simultaneously, guaranteed enough large contact area, improved the antijamming capability of test, made test data more reliable and more stable.Therefore compared to existing technology, the utlity model has simple in structure, highly versatile, the feature such as easy for installation, microwave amplifier testing reliability and efficiency have been improved, having solved when prior art is tested High Power Active microwave amplifier needs the testing efficiency that directly welding p-wire exists on device pin low, be not suitable for test job in enormous quantities, and can bring mechanical damage to measured device, loose contact in test process, contact area not, fixing not firm, reliability is low, easily cause the larger problems such as test data error.
accompanying drawing explanation:
Fig. 1 is the utility model schematic top plan view;
Fig. 2 is the utility model elevational schematic view.
embodiment:
A kind of microwave amplifier test bench, it comprises testing circuit board 6, testing circuit board 6 is positioned at the upper surface of test bracket 1, on testing circuit board 6, there is test vent needle 5, test vent needle 5 is connected with microstrip line 7, on test bracket 1, have joint 2 and metal electrode 4, the inner core of joint 2 is connected with the microstrip line 7 of testing circuit board 6 lower surfaces with metal electrode 4; Test bracket 1 adopts metal support, upper and lower surface opening, and upper surface open is less than lower surface, and lower surface opening size is identical with testing circuit board 6.
Testing circuit board 6 upper surfaces are for entirely covering copper ground wire, and lower surface is test circuit.
Testing circuit board 6 is fixed by four mounting holes 3 and test bracket 1 upper surface.
Test vent needle 5 is arranged in the manhole of four diamond arraies in the middle of testing circuit board 6; Test pin hole 5 installing space sizes and measured device lead pin pitch are measure-alike, and caliber size is identical with measured device leg diameter.
Joint 2 is positioned at the left and right sides of test bracket 1, and joint 2 is symmetrical to be installed, the inner core of joint 2 and microstrip line 7 welding, and joint 2 adopts SAM joint.
Metal electrode 4 is positioned at the upper and lower sides of test bracket 1.
On microstrip line 7, be connected with capacitance 8, capacitance 8 adopts welding, and its capacitance is determined according to the frequency of operation of measured device.
Between power supply positive electrode and ground wire 10, be connected with filter capacitor 9, capacitance is less than 0.47mF.
While using the utility model to test microwave amplifier, tested amplifier is inserted in test vent needle, guarantee that device metal shell covers copper ground wire with the upper surface of testing circuit board and contacts completely; On the electrode before and after metal support, connect direct supply, magnitude of voltage is determined according to measured device operating voltage, the input of the output of microwave signal source and spectrum analyzer is connected respectively on 2 the SAM joints in left and right, starts testing apparatus and can complete the test to microwave amplifier.

Claims (9)

1. a microwave amplifier test bench, it comprises testing circuit board (6), it is characterized in that: testing circuit board (6) is positioned at the upper surface of test bracket (1), on testing circuit board (6), there is test vent needle (5), test vent needle (5) is connected with microstrip line (7), on test bracket (1), have joint (2) and metal electrode (4), the inner core of joint (2) is connected with the microstrip line (7) of testing circuit board (6) lower surface with metal electrode (4).
2. a kind of microwave amplifier test bench according to claim 1, is characterized in that: testing circuit board (6) upper surface is for entirely covering copper ground wire, and lower surface is test circuit.
3. a kind of microwave amplifier test bench according to claim 1 and 2, is characterized in that: testing circuit board (6) is fixed by four mounting holes (3) and test bracket (1) upper surface.
4. a kind of microwave amplifier test bench according to claim 1, is characterized in that: test vent needle (5) is arranged in the manhole of four diamond arraies in the middle of testing circuit board (6).
5. a kind of microwave amplifier test bench according to claim 1, is characterized in that: joint (2) is positioned at the left and right sides of test bracket (1), and joint (2) is symmetrical to be installed, the inner core of joint (2) and microstrip line (7) welding.
6. a kind of microwave amplifier test bench according to claim 1, is characterized in that: metal electrode (4) is positioned at the upper and lower sides of test bracket (1).
7. a kind of microwave amplifier test bench according to claim 1, is characterized in that: test pin hole (5) installing space size and measured device lead pin pitch are measure-alike, and caliber size is identical with measured device leg diameter.
8. a kind of microwave amplifier test bench according to claim 1, is characterized in that: on microstrip line (7), be connected with capacitance (8).
9. a kind of microwave amplifier test bench according to claim 1, is characterized in that: between power supply positive electrode and ground wire (10), be connected with filter capacitor (9).
CN201320612581.5U 2013-09-30 2013-09-30 Microwave amplifier test socket Active CN203479845U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201320612581.5U CN203479845U (en) 2013-09-30 2013-09-30 Microwave amplifier test socket

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201320612581.5U CN203479845U (en) 2013-09-30 2013-09-30 Microwave amplifier test socket

Publications (1)

Publication Number Publication Date
CN203479845U true CN203479845U (en) 2014-03-12

Family

ID=50228154

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201320612581.5U Active CN203479845U (en) 2013-09-30 2013-09-30 Microwave amplifier test socket

Country Status (1)

Country Link
CN (1) CN203479845U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104678230A (en) * 2015-03-25 2015-06-03 中国电子科技集团公司第二十九研究所 Three-dimensional microwave assembly testing device
CN106053895A (en) * 2016-07-22 2016-10-26 苏州韬盛电子科技有限公司 Detection device for 50GHz high frequency and detection method thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104678230A (en) * 2015-03-25 2015-06-03 中国电子科技集团公司第二十九研究所 Three-dimensional microwave assembly testing device
CN106053895A (en) * 2016-07-22 2016-10-26 苏州韬盛电子科技有限公司 Detection device for 50GHz high frequency and detection method thereof

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