CN212459799U

CN212459799U - Electronic industry equipment probe tool

Info

Publication number: CN212459799U
Application number: CN202021595653.6U
Authority: CN
Inventors: 桂恒
Original assignee: Huizhou Chenye Technology Co ltd
Current assignee: Huizhou Chenye Technology Co ltd
Priority date: 2020-08-04
Filing date: 2020-08-04
Publication date: 2021-02-02
Anticipated expiration: 2030-08-04

Abstract

The utility model discloses an electronic industry equipment probe tool, include: the device comprises a base, wherein fixed blocks are welded at the upper end, the lower end, the left end and the right end of the outer wall of the base, and screws are arranged on the outer wall of each fixed block; the sliding structure comprises a sleeve, the bottom of the sleeve is welded with the top of the base, a loop bar is connected to the inner cavity of the sleeve in a sliding mode, limiting blocks are welded to the lower portions of the left side wall and the right side wall of the loop bar, idler wheels are welded to the bottom of the loop bar, and a probe body is inserted into the inner cavity of the clamping seat; the clamping mechanism comprises a first clamping arm, a sliding groove is formed in the left side of the top of the base, and a second clamping arm is welded to the top of the fourth sliding block. This device can make the probe body test the circuit board through the removal of sloping block, and a plurality of probe bodies that the bottom of plectane set up simultaneously can carry out the multiple spot test to the circuit board better, through dismantling the screw down, can change the probe body, and it is convenient to use.

Description

Electronic industry equipment probe tool

Technical Field

The utility model relates to an electronic equipment production and manufacturing technical field specifically are an electronic industry equipment probe tool.

Background

The English name Test probe of the precision Test probe is an essential part in the precision electrical Test process. In the process of research and development and production of electronic circuits, the on-off and quality of signals are often required to be tested and analyzed, and in this time, a precise test probe is required to be used for taking out the signals without damage and providing the signals to a corresponding ICT or test system for integrated analysis. The quality of the test probe greatly influences the accuracy and repeatability of the test. The test probes are classified into conventional ICT probes, semiconductor test probes, RF high-frequency test probes, large-current probes, and battery contact probes according to their application fields. The probe can be divided into a conventional single-head spring needle, a double-head BGA test needle, a needle sleeve switching double-head needle and the like according to the structure of the probe. In the early stage of probe typing, several parameters which need to be considered in an important way are respectively: testing the distance between the probes, selecting the appropriate head type of the object to be tested, testing the borne current, testing the stroke of the motion, selecting the elastic force required to be selected and the like.

The jig is a tool for carpenters, ironmen, pincers, machines, electrical controls and other handicrafts, and is mainly used as a tool for assisting in controlling position or action (or both). The jig can be divided into a process assembly type jig, a project test type jig and a circuit board test type jig.

The existing probe jig for the electronic industrial equipment is difficult to carry out multi-point test on a circuit board through a plurality of probes, more probes are used for carrying out single-point test, and the test efficiency is not high. Therefore, a probe jig for electronic industrial equipment is provided.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide an electronic industry equipment probe tool to solve the problem that proposes among the above-mentioned background art.

In order to achieve the above object, the utility model provides a following technical scheme: an electronic industry equipment probe tool, includes:

the device comprises a base, wherein fixed blocks are welded at the upper end, the lower end, the left end and the right end of the outer wall of the base respectively, screws are arranged on the outer wall of each fixed block, a bottom plate is welded at the bottom of the inner cavity of the base, a sliding rail is arranged at the top of the bottom plate, first sliding blocks are connected to two sides of the inner cavity of the sliding rail in a sliding mode, an inclined block is connected to the top of the sliding rail in a sliding mode, a limiting plate is welded on the left side of the top of the inner cavity of the base, and two first;

the sliding structure comprises a sleeve, the bottom of the sleeve is welded with the top of the base, an inner cavity of the sleeve is connected with a loop bar in a sliding mode, the bottom of the loop bar penetrates through the outer wall of the base and extends to the inner cavity of the base, limiting blocks are welded to the lower portions of the left side wall and the right side wall of the loop bar, the top of the loop bar penetrates through the top of the outer wall of the sleeve, rollers are welded to the bottom of the loop bar, a connecting rod is welded to the top of the loop bar, a circular plate is welded to one end of the connecting rod, clamping seats are circumferentially and equidistantly distributed on the bottom of the circular plate, and probe bodies are inserted into inner;

the clamping mechanism comprises a first clamping arm, the bottom of the first clamping arm is welded with the top of the base, a first push rod is arranged at the top of the first clamping arm, a second sliding block is connected to the inner cavity of the first clamping arm in a sliding manner, a second tension spring is fixed to the inner cavity of the first clamping arm, a first clamping block is welded to the top of the left side wall of the first clamping arm, a second clamping block is connected to the lower portion of the first clamping block in a sliding manner, a sliding groove is formed in the left side of the top of the base, a lead screw is transversely arranged in the inner cavity of the sliding groove, a fourth sliding block is arranged on the left side of the sliding groove, one end of the sliding groove penetrates through the outer wall of the fourth sliding block, a second clamping arm is welded to the top of the fourth sliding block, a third clamping block is welded to the top of the right side wall of the second clamping arm, a fourth clamping block is connected to the lower portion of the third clamping block, the inner cavity of the second clamping arm is connected with a third sliding block in a sliding mode, and a third tension spring is fixed to the inner cavity of the second clamping arm.

By adopting the technical scheme, the device can be fixed on an operating console through screws, a user respectively presses a first push rod and a second push rod downwards to install and fix the circuit board between a first clamping block, a second clamping block, a third clamping block and a fourth clamping block, a second tension spring and a third tension spring respectively pull a second sliding block and a third sliding block upwards, so that the second clamping block and the fourth clamping block can slide upwards and clamp the circuit board, the user pulls a pull handle to enable a cross rod to pull an inclined block outwards, the inclined block can slide in the top of a bottom plate through the first sliding block, the first tension spring gives a pulling force to the inclined block in opposite directions, the inclined plane at the top of the inclined block is in rolling connection with a roller, the spring gives a downward tension to the fixed block, when the inclined block is pulled outwards through the pull handle, due to the inclined plane effect of the inclined block, a probe body connected with the bottom of the circular plate is gradually far away from the circuit board, after the user loosens one's hand, under the reverse pulling force of first extension spring, the sloping block returns gradually, and the limiting plate is used for injecing the return position of sloping block, and at this moment, the loop bar is displacement downwards under the tension effect of spring, and the fixed block is used for injecing the extreme low position of loop bar, and after the loop bar fell back to the extreme low position, the probe body that the bottom of plectane was connected just contacted with the circuit board, and the design of a plurality of probe bodies is convenient for carry out the multiple spot test to the circuit board.

Preferably, the right side wall welding of sloping block has the horizontal pole, the one end of horizontal pole runs through in the right side outer wall of base and welds and have the handle of drawing, the one end of first extension spring welds with the left side wall of sloping block mutually, the bottom both sides of sloping block weld with the top of first slider mutually respectively.

Through adopting above-mentioned technical scheme, the user draws the handle through the pulling, can be through the horizontal pole, with the sloping block to one side pulling.

Preferably, the idler wheel is in rolling connection with the top inclined plane of the inclined block, springs are welded to the tops of the limiting blocks, and the tops of the springs are welded to the two sides of the top of the inner cavity of the sleeve respectively.

Through adopting above-mentioned technical scheme, the gyro wheel rolls with the top inclined plane of sloping block in-process, and the loop bar can realize rising or whereabouts according to the height on inclined plane, and the spring is used for giving the downward tension of fixed block at telescopic inner chamber.

Preferably, the probe body is detachably connected with the clamping seat through a screw.

Through adopting above-mentioned technical scheme, the user can accomplish the change to the probe body through dismantling down the screw.

Preferably, the right side wall of the inner cavity of the sliding chute is welded with a rotating cylinder, one end of the screw rod is rotatably connected with the inner cavity of the rotating cylinder, and the other end of the sliding chute penetrates through the outer wall of the sliding chute and is welded with a handle.

Through adopting above-mentioned technical scheme, through rotating the drum, the lead screw can realize rotating, through the handle, makes things convenient for operating personnel to rotate the lead screw to better carry out position control according to the size of circuit board.

Preferably, the inner cavity of the fourth slider is in threaded connection with the outer wall thread portion of the sliding groove, a circuit board is arranged between the first clamping arm and the second clamping arm, and the third clamping block, the fourth clamping block, the first clamping block and the second clamping block are respectively connected with two ends of the circuit board in a clamping mode.

Through adopting above-mentioned technical scheme, through rotating the lead screw, can make the fourth slider realize the displacement, through pressing first push rod and second push rod respectively downwards, can take out the circuit board.

Compared with the prior art, the beneficial effects of the utility model are that:

this device can make the probe body test the circuit board through the removal of sloping block, and a plurality of probe bodies that the bottom of plectane set up simultaneously can carry out the multiple spot test to the circuit board better, have improved efficiency of software testing, through dismantling down the screw, can change the probe body, it is convenient to use.

Drawings

Fig. 1 is a schematic structural view of the present invention;

fig. 2 is a schematic view of the structure of the present invention;

FIG. 3 is a schematic structural view of the clamping mechanism of the present invention;

fig. 4 is a schematic structural view of the sliding structure of the present invention;

fig. 5 is a schematic top view of the circular plate of the present invention;

fig. 6 is a front view of the circular plate according to the present invention.

In the figure: 1. a base; 11. a fixed block; 12. a screw; 13. a base plate; 14. a sloping block; 15. a first slider; 16. a cross bar; 17. pulling a handle; 18. a first tension spring; 19. a limiting plate; 110. a slide rail; 2. a sleeve; 21. a loop bar; 22. a spring; 23. a limiting block; 24. a roller; 25. a connecting rod; 26. a circular plate; 27. a card holder; 28. a probe body; 3. a first clamp arm; 31. a first push rod; 32. a second slider; 33. a second tension spring; 34. a first clamping block; 35. a second clamp block; 36. a second clamp arm; 37. a second push rod; 38. a third slider; 39. a third tension spring; 310. a third clamping block; 311. a fourth clamping block; 312. a circuit board; 313. a chute; 314. rotating the cylinder; 315. a screw rod; 316. a fourth slider; 317. a handle.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1-6, the present invention provides a technical solution:

as shown in fig. 1 and 6, a probe jig for electronic industrial equipment includes:

the device comprises a base 1, wherein fixed blocks 11 are welded at the upper end, the lower end, the left end and the right end of the outer wall of the base 1, screws 12 are arranged on the outer wall of each fixed block 11, as shown in figure 1, the device can be fixed on an operation table through the screws 12, a bottom plate 13 is welded at the bottom of an inner cavity of the base 1, a slide rail 110 is arranged at the top of the bottom plate 13, first sliding blocks 15 are connected to two sides of the inner cavity of the slide rail 110 in a sliding mode, an inclined block 14 is connected to the top of the slide rail 110 in a sliding mode, a limiting plate 19 is welded at the left side of the top of the inner cavity of the base 1, two first tension springs 18 are welded on the left side wall of the inner cavity of the base 1, a cross rod 16 is welded on the right side wall of the inclined block 14, one end of the cross rod 16 penetrates through the outer wall of the right side of the base 1 and is welded with, the inclined block 14 can be pulled to one side through the cross rod 16, a user can pull the pull handle 17 to enable the cross rod 16 to pull the inclined block 14 outwards, the inclined block 14 can slide in the top of the bottom plate 13 through the first sliding block 15, the first tension spring 18 gives a tension to the inclined block 14 in the opposite direction, the top inclined surface of the inclined block 14 is in rolling connection with the roller 24, the spring 22 gives a downward tension to the limiting block 23, when the user pulls the inclined block 14 outwards through the pull handle 17, due to the inclined surface effect of the inclined block 14, the probe body 28 connected to the bottom of the circular plate 26 is gradually far away from the circuit board 312, after the user loosens the hand, under the reverse tension of the first tension spring 18, the inclined block 14 is gradually returned, the limiting plate 19 is used for limiting the return position of the inclined block 14, at the moment, the loop bar 21 is displaced downwards under the tension of the spring 22, the limiting block 23 is used for limiting the lowest position of the loop bar 21, and after, the probe bodies 28 connected to the bottom of the circular plate 26 are just in contact with the circuit board 312, and the design of the plurality of probe bodies 28 facilitates the multi-point test of the circuit board 312;

the sliding structure comprises a sleeve 2, the bottom of the sleeve 2 is welded with the top of a base 1, an inner cavity of the sleeve 2 is connected with a loop bar 21 in a sliding manner, the bottom of the loop bar 21 penetrates through the outer wall of the base 1 and extends to the inner cavity of the base 1, limiting blocks 23 are welded on the lower portions of the left side wall and the right side wall of the loop bar 21, the top of the loop bar 21 penetrates through the top of the outer wall of the sleeve 2, rollers 24 are welded on the bottom of the loop bar 21, connecting rods 25 are welded on the top of the loop bar 21, circular plates 26 are welded on one ends of the connecting rods 25, clamping seats 27 are distributed on the bottom of the circular plates 26 in an equidistant manner, probe bodies 28 are inserted into the inner cavities of the clamping seats 27, the rollers 24 are in rolling connection with top slopes of inclined blocks 14, springs 22 are welded on the tops of the limiting blocks 23, the tops of the springs 22 are respectively welded with two sides of the top of the inner cavity of, the spring 22 is used for providing downward tension for the limiting block 23 in the inner cavity of the sleeve 2;

the clamping mechanism comprises a first clamping arm 3, the bottom of the first clamping arm 3 is welded with the top of the base 1, a first push rod 31 is arranged at the top of the first clamping arm 3, a second slide block 32 is slidably connected with the inner cavity of the first clamping arm 3, a second tension spring 33 is fixed in the inner cavity of the first clamping arm 3, a first clamping block 34 is welded at the top of the left side wall of the first clamping arm 3, a second clamping block 35 is slidably connected below the first clamping block 34, a sliding groove 313 is formed in the left side of the top of the base 1, a lead screw 315 is transversely arranged in the inner cavity of the sliding groove 313, a fourth slide block 316 is arranged on the left side of the sliding groove 313, one end of the sliding groove 313 penetrates through the outer wall of the fourth slide block 316, a second clamping arm 36 is welded at the top of the fourth slide block 316, a third clamping block 310 is welded at the top of the right side wall of the second clamping arm 36, a fourth clamping block 311 is slidably connected below the third clamping block 310, the inner cavity of the second clamping arm 36 is slidably connected with a third slide block 38, a third tension spring 39 is fixed in the inner cavity of the second clamping arm 36, the probe body 28 is detachably connected with the clamping seat 27 through screws, a user can replace the probe body 28 by detaching the screws, a rotating cylinder 314 is welded on the right side wall of the inner cavity of the sliding groove 313, one end of a screw rod 315 is rotatably connected with the inner cavity of the rotating cylinder 314, the other end of the sliding groove 313 penetrates through the outer wall of the sliding groove 313 and is welded with a handle 317, the screw rod 315 can rotate through rotating the rotating cylinder 314, an operator can conveniently rotate the screw rod 315 through the handle 317 to better adjust the position according to the size of the circuit board 312, the inner cavity of the fourth slide block 316 is in threaded connection with the threaded part of the outer wall of the sliding groove 313, the circuit board 312 is arranged between the first clamping arm 3 and the second clamping arm 36, and the third clamping block 310, the second clamping blocks 35 are respectively clamped and connected to two ends of the circuit board 312, the fourth slider 316 can be displaced by rotating the screw 315, and the circuit board 312 can be taken out by pressing the first push rod 31 and the second push rod 37 downward respectively.

The structure principle is as follows: as shown in fig. 1, the device can be fixed on the operation desk by the screw 12, the user presses the first push rod 31 and the second push rod 37 downwards respectively to fix the circuit board 312 between the first clamping block 34, the second clamping block 35, the third clamping block 310 and the fourth clamping block 311, the second tension spring 33 and the third tension spring 39 respectively pull the second slider 32 and the third slider 38 upwards to enable the second clamping block 35 and the fourth clamping block 311 to slide upwards and clamp the circuit board 312, the user pulls the pull handle 17 to enable the cross rod 16 to pull the inclined block 14 outwards, the inclined block 14 can slide in the top of the bottom plate 13 by the first slider 15, the first tension spring 18 applies a tension to the inclined block 14 in the opposite direction, the top inclined surface of the inclined block 14 is in rolling connection with the roller 24, the spring 22 applies a downward tension to the stopper 23, when the user pulls the inclined block 14 outwards by the pull handle 17, due to the inclined plane function of the inclined block 14, the probe body 28 connected to the bottom of the circular plate 26 is gradually far away from the circuit board 312, after a user looses his hand, the inclined block 14 gradually returns under the reverse tension of the first tension spring 18, the limiting plate 19 is used for limiting the return position of the inclined block 14, at this time, the loop bar 21 moves downwards under the tension of the spring 22, the limiting block 23 is used for limiting the lowest position of the loop bar 21, after the loop bar 21 falls back to the lowest position, the probe body 28 connected to the bottom of the circular plate 26 is just in contact with the circuit board 312, and the design of the plurality of probe bodies 28 is convenient for performing multi-point testing on the circuit board 312.

In summary, in the device, the user pulls the pull handle 17 to move the inclined block 14, and in the moving process of the inclined block 14, the lifting of the sleeve rod 21 drives the probe body 28 to separate the probe body 28 from the circuit board 312 or perform multi-point testing.

The part not involved in the utility model is the same as the prior art or can be realized by adopting the prior art. Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. The utility model provides an electronic industry equipment probe tool which characterized in that includes:

the base comprises a base (1), fixed blocks (11) are welded at the upper end, the lower end, the left end and the right end of the outer wall of the base (1), screws (12) are arranged on the outer wall of each fixed block (11), a bottom plate (13) is welded at the bottom of the inner cavity of the base (1), a sliding rail (110) is arranged at the top of the bottom plate (13), first sliding blocks (15) are connected to two sides of the inner cavity of the sliding rail (110) in a sliding mode, an inclined block (14) is connected to the top of the sliding rail (110) in a sliding mode, a limiting plate (19) is welded at the left side of the top of the inner cavity of the base (1), and two first tension springs (18);

the sliding structure comprises a sleeve (2), the bottom of the sleeve (2) is welded with the top of a base (1), an inner cavity of the sleeve (2) is connected with a loop bar (21) in a sliding mode, the bottom of the loop bar (21) penetrates through the outer wall of the base (1) and extends to the inner cavity of the base (1), limiting blocks (23) are welded on the lower portions of the left side wall and the right side wall of the loop bar (21), the top of the loop bar (21) penetrates through the top of the outer wall of the sleeve (2), idler wheels (24) are welded on the bottom of the loop bar (21), a connecting rod (25) is welded on the top of the loop bar (21), a circular plate (26) is welded on one end of the connecting rod (25), clamping seats (27) are distributed on the bottom of the circular plate (26) in a circumferential mode at equal intervals, and probe bodies (28) are inserted;

the clamping mechanism comprises a first clamping arm (3), the bottom of the first clamping arm (3) is welded with the top of the base (1), a first push rod (31) is arranged at the top of the first clamping arm (3), a second sliding block (32) is connected to the inner cavity of the first clamping arm (3) in a sliding manner, a second tension spring (33) is fixed to the inner cavity of the first clamping arm (3), a first clamping block (34) is welded to the top of the left side wall of the first clamping arm (3), a second clamping block (35) is connected to the lower portion of the first clamping block (34) in a sliding manner, a sliding groove (313) is formed in the left side of the top of the base (1), a lead screw (315) is transversely arranged in the inner cavity of the sliding groove (313), a fourth sliding block (316) is arranged on the left side of the sliding groove (313), one end of the sliding groove (313) penetrates through the outer wall of the fourth sliding block (316), and a second clamping arm (36) is welded to the top of, the welding of the right side wall top of second arm lock (36) has third clamp splice (310), the below sliding connection of third clamp splice (310) has fourth clamp splice (311), the top of second arm lock (36) is equipped with second push rod (37), the inner chamber sliding connection of second arm lock (36) has third slider (38), the inner chamber of second arm lock (36) is fixed with third extension spring (39).

2. The electronic industrial equipment probe tool of claim 1, wherein: the right side wall welding of sloping block (14) has horizontal pole (16), the one end of horizontal pole (16) runs through in the right side outer wall of base (1) and the welding has and draws handle (17), the one end of first extension spring (18) welds with the left side wall of sloping block (14), the bottom both sides of sloping block (14) weld with the top of first slider (15) mutually respectively.

3. The electronic industrial equipment probe tool of claim 1, wherein: the roller (24) is in rolling connection with the top inclined plane of the inclined block (14), springs (22) are welded to the tops of the limiting blocks (23), and the tops of the springs (22) are welded to the two sides of the top of the inner cavity of the sleeve (2) respectively.

4. The electronic industrial equipment probe tool of claim 1, wherein: the probe body (28) is detachably connected with the clamping seat (27) through screws.

5. The electronic industrial equipment probe tool of claim 1, wherein: the inner cavity right side wall of spout (313) has welded and has rotated drum (314), the one end of lead screw (315) rotates with the inner cavity that rotates drum (314) to be connected, the other end of spout (313) runs through in the outer wall of spout (313) and welds handle (317).

6. The electronic industrial equipment probe tool of claim 1, wherein: the inner cavity of the fourth sliding block (316) is in threaded connection with the outer wall thread portion of the sliding groove (313), a circuit board (312) is arranged between the first clamping arm (3) and the second clamping arm (36), and the third clamping block (310), the fourth clamping block (311), the first clamping block (34) and the second clamping block (35) are respectively connected with two ends of the circuit board (312) in a clamping mode.