CN212459796U - Replaceable modular electrical detection head and test needle thereof - Google Patents

Abstract

The utility model provides an interchangeable modularization electrical detection head and test needle thereof, this interchangeable modularization electrical detection head is cavity cap type thin shell form conducting structure, and have a cavity cap type sheath portion, breach is replied to an annular cap portion and a deformation, cavity cap type sheath portion is tubular structure, annular cap portion is sheet structure and is formed and the surface is equipped with plural convex structure by the outside extension of cavity cap type sheath portion one end, the breach is replied in deformation is buckled through this annular cap portion and is extended to this annular cap portion edge by this cavity cap type sheath portion one end, make deformation reply the breach lean on merge in cavity cap type sheath portion arrange the perforation back of test needle body in according to this application of force, can let cavity cap type sheath portion prop in fenestrate internal surface when the breach is replied in deformation. So can reach quick and simple and easy replacement efficiency, and compare in traditional test needle structure, the utility model discloses except make and simply also have cheaper manufacturing cost.

Description

Replaceable modular electrical detection head and test needle thereof

Technical Field

The utility model belongs to the technical field of the electrical property detection product and specifically relates to a carry out modularized design with electrical property detection head, and can reach the damaged subassembly of quick replacement and reduce the test needle cost by a wide margin and the test needle of the replaceable modularization electrical property detection head of utensil.

Background

In the production process of the electronic device, an important link is the operation of detecting the electric conduction and signal transmission states of the electronic device after the electronic device is assembled. This procedure is to ensure that the assembled components of the electronic device meet the product specification requirements, and to avoid the influence of various possible factors on the state of the end product.

In the electrical testing operation, the electrical testing device is different according to different testing objects, and the electrical testing pin is used as a main component for testing, so as to obtain the electrical property or signal conduction state of the object to be tested by contacting the electrical testing pin with the object to be tested. Generally, the electrical testing pins are mounted on the base corresponding to the distribution of the electrical contacts of the object, and each electrical testing pin has a contact for contacting and electrically connecting with the object. During detection, the base moves towards the object to be detected so that the joint of the electrical test needle contacts the electrical contact of the object to be detected and is conducted with the electrical contact to detect whether the object to be detected conforms to the required electrical state.

The conventional electrical testing probe head is turned to a required structure according to different types of objects to be tested, thereby having a relatively high manufacturing cost and consuming a relatively long processing time. On the other hand, the connector of the electrical testing probe is easily damaged by testing application of contacting the object to be tested for a long time or many times, and needs to be replaced at this moment.

In view of the above, the present invention contemplates and provides an interchangeable modular electrical detector head and a test pin having the interchangeable modular electrical detector head to effectively reduce product cost and improve convenience in replacement.

SUMMERY OF THE UTILITY MODEL

An object of the present invention is to provide an interchangeable modular electrical inspection head and a test pin having the same, which is an inventive concept of producing a modular component that can be assembled and disassembled quickly, thereby greatly reducing inconvenience in replacing the connector, and simultaneously, the test pin can be manufactured in a stamping manner to reduce the production cost and the required time, thereby effectively improving various defects of the existing test pin.

To achieve the above objects, the present invention provides in one embodiment an interchangeable modular electrical inspection head, comprising: the replaceable modularized electrical detection head is a hollow cap-shaped thin-shell conductive structure and is provided with a hollow cap-shaped sheath part, an annular brim part and a deformation recovery gap, the hollow cap-shaped sheath part is of a tubular structure, the annular brim part is a part for electrical contact and is of a sheet structure, the annular brim part is formed by extending one end of the hollow cap-shaped sheath part outwards, the surface of the annular brim part is provided with a plurality of convex structures, and one end of the hollow cap-shaped sheath part bends to pass through the annular brim part and extend to the edge of the annular brim part; the deformation recovery notch can be used for replacing and installing the replaceable modularized electrical detection head through the change of force leaning and returning and non-force returning. The modular structure of the test pin connector is beneficial to replacement and assembly, and the cap-shaped thin-shell structure and the deformation restoring notch on the cap-shaped thin-shell structure can enable the modular electrical detection head to be rapidly and stably assembled on the test pin for detecting electrical property without being fixed by other components, so that the modular electrical detection head also has excellent convenience in replacement.

In another embodiment, the present invention provides a testing probe with a replaceable modular electrical testing head, comprising: the testing probe body is hollow to accommodate the probe, one end of the testing probe body is provided with a testing part, and the testing part is provided with a through hole; the replaceable modular electrical detection head is assembled in the through hole, is of a hollow cap type thin-shell conductive structure and is provided with a hollow cap type sheath part, an annular brim part and a deformation return gap, the hollow cap type sheath part is of a tubular structure, the annular brim part is a part for electrical contact and is of a sheet structure, the annular brim part is formed by extending one end of the hollow cap type sheath part outwards, the surface of the annular brim part is provided with a plurality of convex structures, and one end of the hollow cap type sheath part bends to pass through the annular brim part and extend to the edge of the annular brim part; wherein the deformation recovery notch is forced to close so that the hollow cap-shaped sheath part is arranged in the through hole of the test needle body, and when the deformation recovery notch is not stressed and recovers, the hollow cap-shaped sheath part is supported against the inner surface of the through hole to form a fixed state, and the annular brim part is abutted against the test part; and the insulating part is of a tubular structure, is arranged in the through hole and is positioned in the hollow area of the replaceable modular electrical detection head, and one end of the probe penetrates through the insulating part. Therefore, when the plurality of protruding structures are damaged after the test needle contacts the object to be tested for many times, the modular electrical test head can be quickly taken down and replaced, and compared with the conventional product, the modular electrical test head has better replacement convenience, and meanwhile, the manufacturing process cost of the replaceable modular electrical test head is relatively low, so that the assembly cost required by part replacement can be greatly reduced.

Based on the above two embodiments, preferably, the replaceable modular electrical detection head is manufactured by stamping, and at least one side of the plurality of protruding structures is connected to the annular brim portion, the annular brim portion has an opening corresponding to each protruding structure position, and a deformation air gap space is formed between the opening and the protruding structure, so that the protruding structure has a stress deformation margin, and accordingly, when the plurality of protruding structures contact the surface of the object to be detected, the oxide layer attached to the surface of the object to be detected can be pierced or scraped more easily, and the plurality of protruding structures can be protected more. In addition, the assembly cost and the manufacturing time can be greatly reduced by a stamping mode, and the utility model discloses can really reduce the application cost of detection device by a wide margin in view of the existing and unavoidable loss in the application of test needle.

Furthermore, a preferred implementation state is that two of the side edges of each of the protruding structures are connected with the annular brim part, and each protruding structure has a triangular structure with a sharp ridge, and the opening is located at the bottom side of the protruding structure, so that the deformed air gap space is in a gradually widened triangular shape, and the conduction efficiency of the plurality of protruding structures can be improved.

Alternatively, in an embodiment, the replaceable modular electrical inspection head is manufactured by stamping, the plurality of protruding structures are symmetrically arranged in pairs, one side of each protruding structure is connected to the annular brim part, an opening is formed at a position between any two symmetrically arranged protruding structures of the annular brim part, so that a deformed air gap space is formed between the opening and the protruding structures, and the deformed air gap space is in a gradually-widened triangular shape, so that the protruding structures have stress deformation margins, thereby improving the sliding scraping efficiency relative to the surface of the object to be inspected and preventing the plurality of protruding structures from being damaged by stress. Furthermore, the plurality of protruding structures which are symmetrically arranged are respectively inclined towards each other to be close to each other, so that each protruding structure is an inclined structure with an arc surface or a plane, and the plurality of protruding structures can have better conduction efficiency when contacting the plane of the object to be measured.

In addition, in order to increase the contact area of the plurality of protruding structures with respect to the object to be tested and the scraping efficiency of the oxide layer, preferably, the plurality of protruding structures are arranged in a single-row or multi-row ring.

To sum up, the utility model provides an interchangeable modularization electrical property detects head and possesses interchangeable modularization electrical property and detect the test needle of head carries out the modularized design to the joint portion of electrical property test needle, makes the test needle connect to have better convenience on changing. The replaceable modularized electrical detection head is manufactured by stamping, so that the replaceable modularized electrical detection head has lower manufacturing cost of components and required processing time, has special structural design, utilizes the hollow cap-shaped thin shell structure and the deformation recovery notch on the hollow cap-shaped thin shell structure, only needs to squeeze during assembly to enable the deformation recovery notch to be temporarily closed to place the hollow cap-shaped sheath in the through hole, and can enable the deformation recovery notch to recover in response to elasticity by continuous release, so that the hollow cap-shaped sheath is stably abutted against the inner surface of the through hole, and the replaceable modularized electrical detection head has better assembly stability.

Drawings

Fig. 1 is a perspective view of a modular electrical inspection head according to a preferred embodiment of the present invention.

Fig. 2 is a perspective view of another view of the modular electrical inspection head according to a preferred embodiment of the present invention.

Fig. 3 is a schematic view of a protruding structure of the modular electrical detection head according to a preferred embodiment of the present invention.

Fig. 4 is a perspective view of another embodiment of the modular electrical inspection head according to the preferred embodiment of the present invention.

Fig. 5 is a schematic view of a protruding structure of another embodiment of the modular electrical detection head according to the preferred embodiment of the present invention.

Fig. 6 is an exploded view of the inspection probe according to the preferred embodiment of the present invention.

Fig. 7 is a schematic sectional view of the inspection probe according to the preferred embodiment of the present invention.

Description of reference numerals: 1-replaceable modular electrical test heads; 10-a hollow cap-shaped sheath portion; 11-an annular brim portion; 111-a protruding structure; 1111-side edge; 112-opening a hole; 12-deformation recovery gap; 2-a test needle; 20-testing the needle body; 201-a test section; 202-punching; 2021-a stop; 21-an insulator; 3-a probe; a-deformation air gap space.

Detailed Description

For the people with ordinary skill in the art to clearly understand the contents of the present invention, please refer to the following description and accompanying drawings.

Please refer to fig. 1, fig. 2, fig. 3 and fig. 6, which are a perspective view, a perspective view with another view angle, a protruded structure and an exploded view of a modular electrical inspection head according to a preferred embodiment of the present invention. The present invention discloses a modular electrical detection head 1, which is provided to be installed on a testing needle 2, and the testing needle 2 is provided for electrical or signal detection of various electronic devices such as battery, semiconductor device, etc. The replaceable modular electrical detection head 1 is characterized in that it is a hollow cap-shaped thin-shell conductive structure, and has a hollow cap-shaped sheath portion 10, an annular brim portion 11 and a deformation recovery notch 12, the hollow cap-shaped sheath portion 10 is a tubular structure, the annular brim portion 11 is a portion for electrical contact and is a sheet-shaped structure, and the annular brim portion is formed by extending outward from one end of the hollow cap-shaped sheath portion 10 and has a plurality of protruding structures 111 on the surface. The deformation recovery notch 12 is bent from one end of the hollow cap-shaped sheath portion 10 to pass through the annular brim portion 11 and extend to the edge of the annular brim portion 11, that is, the deformation recovery notch 12 extends from the end of the hollow cap-shaped sheath portion 10 not connected with the annular brim portion 11 to the edge of the annular brim portion 11, so that the deformation recovery notch 12 penetrates through the hollow cap-shaped sheath portion 10 and the annular brim portion 11, and thus the replaceable modular electrical detection head 1 can achieve the efficacy of quick replacement and stable installation through the change of forced leaning and unstressed recovery of the deformation recovery notch 12. In other words, the replaceable modular electrical testing head 1 can automatically form an installation clamp by the deformation recovery notch 12 according to the structural elasticity, when the replaceable modular electrical testing head 1 is to be installed, the replaceable modular electrical testing head 1 can be slightly pressed by applying force, so that the deformation recovery notch 12 is closed to slightly reduce the hollow cap-shaped sheath portion 10, at this time, the hollow cap-shaped sheath portion 10 can be placed at a through hole 202 of the testing pin 2, and after the replaceable modular electrical testing head 1 is released, the deformation recovery notch 12 automatically returns according to the elasticity, at this time, an outward supporting force is formed relative to the through hole 202, so that the replaceable modular electrical testing head 1 naturally forms a stable supporting installation state relative to the testing pin 2.

Therefore, to the user and the provider of the electrical property detection device, the replaceable modularized electrical property detection head 1 can greatly improve the convenience of replacement and assembly, and simultaneously reduce the production cost and working hours of components, and face the problem of joint damage caused by necessity, compared with the traditional joint which needs to be turned, the utility model discloses the cost of manufacture can be greatly reduced and better molding qualification rate is also provided, and the whole test needle does not need to be replaced by complicated disassembly and assembly procedures, and in addition, the material cost of the components is effectively reduced through the thin-shell product structure. In addition, the replaceable modular electrical inspection head 1 has a special structural design, which is a thin-shell structure, such as a cap-shaped structure formed by bending or bending a sheet body to have a hollow region and two ends of the sheet body are not connected to each other, and the annular brim portion 11 has the plurality of protruding structures 111 capable of improving the conduction efficiency, which is a new structural technical feature in the field. When the replaceable modular electrical detection head 1 is mounted to the through hole 202 of the test pin 2 through the reserved deformation recovery notch 12, the replaceable modular electrical detection head is outwardly abutted against the inner surface of the through hole 202 due to the reverse elasticity, so that the assembly stability of the replaceable modular electrical detection head is improved, the replaceable modular electrical detection head 1 can be stably fixed in the through hole without any additional fixing element, and the effect of quick and simple assembly is achieved. The plurality of protruding structures 111 on the annular brim 11 can achieve the effect of scraping or piercing the oxide layer on the surface of the object to be tested when contacting the object to be tested, so as to enhance the conduction strength.

In order to enhance the conductive contact effect of the annular brim part 11 with respect to the object to be tested, the plurality of protruding structures 111 may be arranged in a single-row or multi-row ring shape, so that when the annular brim part 11 contacts the object to be tested, the plurality of protruding structures 111 can scrape off the oxide layer on the surface of the object to be tested as much as possible, and since the replaceable modular electrical detection head 1 is a thin-shell structure, the plurality of protruding structures 111 are arranged in a ring shape, and the structural rigidity of the annular brim part 11 can be considered.

Preferably, this interchangeable modularization electrical property detection head 1 is made through the punching press, and it is very much mentioned, the utility model discloses a starting point lies in improving the inconvenience and the disappearance of current electrical joint, based on how to reduce manufacturing procedure and material cost's development direction effectively, originally proposes to produce the product that can assemble fast alone and change with the punching press mode, compares in view of the above in the technical structure of current relevant field, has reduced material and manufacturing cost by a wide margin, puts on the reality to jump off the general processing procedure scheme and the selection among this technical field. Meanwhile, the plurality of protruding structures 111 are formed by stamping, and compared with the existing micro protruding structure which is formed by turning on the connector, the utility model discloses it is more favorable to greatly reduce man-hour and reduce manufacturing cost, and can not be like turning easily influenced by waste material to reduce the structure qualification rate, the plurality of protruding structures 111 can be in response to the type and the test requirement of the object to be tested.

The design is based on the basis of reliable electrical conduction with the object to be tested, and in the present embodiment, it is preferable to take the case that the plurality of protruding structures 111 are symmetrically arranged two by two, and one side 1111 of each protruding structure 111 is connected to the annular brim portion 11, so that the annular brim portion 11 forms an opening 112 at a position between the plurality of protruding structures 111 arranged symmetrically at any place, and a deformation air gap space a is formed between the opening 112 and the protruding structure 111, and the deformation air gap space a is in a gradually widening triangle shape, so that the protruding structure 111 has a tolerance of deformation under stress. When detecting, the annular brim part 11 contacts with the object to be detected, the plural protruding structures 111 arranged symmetrically can be more beneficial to piercing the oxide layer, so as to effectively reduce the influence of the oxide layer on the electric conduction, and meanwhile, the plural protruding structures 111 can have the space of deformation and displacement when receiving the plane reaction force of the object to be detected through the plural openings 112 and the deformed air gap space A, so that the plural protruding structures 111 can also have the efficacy of sliding and scraping. That is, the deformation air gap space a can provide a deformation allowance space for the plurality of protruding structures 111, so as to prevent the plurality of protruding structures 111 from interfering and impacting the annular brim part 11 to cause damage when being pressed by a force, thereby increasing the deformable space of the plurality of protruding structures 111. For example, referring to fig. 3, (a) shows a state when the plurality of protruding structures 111 are not stressed, and (b) shows a state when the plurality of protruding structures 111 are stressed, when a certain group of the plurality of protruding structures 111 are pressed and deformed, it can be seen that each protruding structure 111 is displaced towards the opening 112, and the distance between the plurality of protruding structures 111 at the bottom side is increased, the deformation air gap space a is reduced according to the displacement of the plurality of protruding structures 111, and the plurality of protruding structures 111 can receive the applied force in the above deformation manner through the deformation air gap space a, so as to prevent the plurality of protruding structures 111 from shifting or pressure loss. Preferably, the plurality of protruding structures 111 can be sheet-like structures, and further, the plurality of protruding structures 111 disposed symmetrically are inclined toward each other, so that each protruding structure 111 is an inclined structure with an arc surface or a plane, which is more conducive to piercing and scraping an oxide layer on the object to be tested. When each of the protruding structures 111 is an inclined structure, the plurality of protruding structures 111 may have an inclined plane or an inclined arc surface so that each of the protruding structures 111 is an arc-shaped inclined structure, and as shown in fig. 1, each of the protruding structures 111 has an inclined arc surface, so that the structure has a better force-sliding effect when an oxide layer is scraped. Furthermore, the plurality of protruding structures 111 can be of equal size, so that the deformation air gap space a is formed as an isosceles gradually-widening triangle space, thereby achieving the effect of evenly supporting the pressing force, and making the plurality of protruding structures 111 not easy to be damaged by the force, thereby causing the ultimate damage. In addition, when the plurality of protruding structures 111 are disposed in a symmetrical manner, the protruding structures 111 are disposed in a single row or multiple rows in a ring shape, which means that each pair of protruding structures 111 disposed symmetrically is disposed one by one to form a ring shape, as shown in the figure.

In addition to the above-mentioned configuration of the plurality of protruding structures 111, the plurality of protruding structures 111 may not be arranged in a group in a two-by-two symmetrical manner, but at least one side 1111 of the plurality of protruding structures is connected to the annular brim part 11, and the annular brim part 11 has an opening 112 corresponding to each protruding structure 111, and a deformation air gap space is formed between the opening 112 and the protruding structures 111, so that the protruding structures 111 have a tolerance of deformation under stress, and the replaceable modular electrical detection head 1 is also manufactured by stamping. Thus, the plurality of protruding structures 111 are convex relative to the annular brim 11, such as a sheet lifted relative to the annular brim 11, which is beneficial to improving the conduction efficiency, and the opening 112 is arranged at the position of the annular brim 11 corresponding to the protruding structures 111, and the deformed air gap space formed by the clamping of the opening 112 and the protruding structures 111 can reserve the space for the plurality of protruding structures 111 to slide or displace under stress, so as to reduce the loss probability. Further, please refer to fig. 4 and 5, which are a perspective view and a protruded structure of another embodiment of the modular electrical detection head according to the preferred embodiment of the present invention. The plurality of protruding structures 111 can also be shown in fig. 4, such that two sides 1111 of each protruding structure 111 are connected to the annular brim 11 and have a pointed-ridge triangular structure, and the opening 112 is located at the bottom side of the protruding structure 111, such that the deformed air gap space a has a gradually-widened triangular shape. Accordingly, when the plurality of protruding structures 111 contact the surface of the object to be tested, the oxide layer on the surface of the object to be tested can be pierced to achieve conduction with the object to be tested. Similarly, the deformation air gap space a on the bottom side of the protruding structure 111 can also reserve a space for the protruding structure 111 to move under stress, i.e. can provide a deformation margin allowance space for the plurality of protruding structures 111, so as to prevent the plurality of protruding structures 111 from interfering and impacting the annular brim portion 11 to cause damage when the plurality of protruding structures 111 are pressed under stress. Referring to fig. 5, (a) shows a state where the protruding structure 111 is not stressed, and (b) shows a state where the protruding structure 111 is stressed, during detection, when the protruding structure 111 is pressed, it can move toward the opening 112, and the deformation air gap space a can make the protruding structure 111 have a deformation margin, so as to prevent the protruding structure 111 from being damaged after being stressed. Similarly, the protruding structure 111 can be an isosceles triangle structure, so that the stress distribution is more uniform, and the damage probability is reduced.

Please refer to fig. 6 and 7, which are an exploded view and a partially assembled cross-sectional view of a testing probe according to a preferred embodiment of the present invention, and refer to fig. 1 to 5. The utility model discloses also disclose a test needle 2 of the removable modularization electrical property detection head of utensil, contain a test needle body 20, a removable modularization electrical property detection head 1 and an insulating part 21. The testing needle 2 is a component for electrical or signal detection of electronic devices such as batteries, semiconductor devices, etc. as mentioned above, and the testing needle 2 can be assembled on the base of the testing device according to the distribution pattern of the electrical contacts of the object to be tested, so a large number of testing needles are generally disposed on one base. The testing needle body 20 is hollow to accommodate the probe 3, one end of the testing needle body 20 has a testing portion 201, and the testing portion 201 is provided with a through hole 202. The replaceable modular electrical detection head 1 is provided to be inserted into the through hole 202, and as mentioned above, the replaceable modular electrical detection head 1 is a hollow cap-shaped thin-shell conductive structure, and has a hollow cap-shaped sheath portion 10, an annular brim portion 11 and a deformation recovery gap 12, the hollow cap-shaped sheath portion 10 is a tubular structure, the annular brim portion 11 is a portion provided for electrical contact and is a sheet-shaped structure, the annular brim portion 11 is formed by extending from one end of the hollow cap-shaped sheath portion 10 to the outside and has a plurality of protruding structures 111 on the surface for contacting with an object to be detected, the deformation recovery gap 12 is bent from one end of the hollow cap-shaped sheath portion 10 through the annular brim portion 11 and extends to the edge of the annular brim portion 11; when the deformation recovery notch 12 is pressed against the hollow cap sheath 10, the hollow cap sheath 10 can be disposed in the through hole 202, and after the deformation recovery notch 12 is not pressed against the hollow cap sheath 10, the hollow cap sheath is outwardly supported against the inner surface of the through hole 102 to be fixed, and the annular brim 11 is pressed against the testing part 101. The insulator 21 is a tubular structure, and is disposed in the through hole 202 and located in the hollow region of the replaceable modular electrical detection head 1, and one end of the probe 3 passes through the insulator 21 and preferably protrudes out of the insulator 21, so that the probe 3 and the replaceable modular electrical detection head 1 can be prevented from contacting each other by the insulator 21 and being short-circuited. Preferably, a stop portion 2021 is disposed in the through hole 202, so that the insulation member 21 can achieve the positioning effect when disposed in the through hole 202 according to the stop portion 2021, and the hollow cap sheath portion 10 of the replaceable modular electrical detection head 1 is disposed between the inner surface of the through hole 202 and the insulation member 21, thereby effectively achieving the insulation and short circuit prevention effect.

Through this interchangeable modularization electrical detection head 1, this test needle 2's overall cost can effectively descend, and in the consumptive material aspect, this interchangeable modularization electrical detection head 1's low in manufacturing cost is honest and clean, and manufacturing man-hour is short, and material cost is also lower, so in the face of needing the problem of replacing because of the joint damage that the contact determinand caused, use this interchangeable modularization electrical detection head 1's test needle 2 can reduce its cost because of the consumptive material produces by a wide margin. In addition, in the assembly aspect, since the replaceable modular electrical detection head 1 is a thin-shell structure and has the deformation recovery notch 12, when assembling, only the replaceable modular electrical detection head 1 needs to be squeezed to close the deformation recovery notch 12, so that the hollow cap-shaped sheath portion 10 is disposed in the through hole 202, and then the replaceable modular electrical detection head 1 is released to allow the deformation recovery notch 12 to recover elastically from the material, at this time, the hollow cap-shaped sheath portion 10 is firmly supported against the inner surface of the through hole 202, so that the replaceable modular electrical detection head 1 is stably mounted on the test needle body 20. Otherwise, the replaceable modular electrical inspection head 1 can be quickly removed from the through hole 202 by, for example, a jig. Therefore, the replacement operation can bring about faster, simpler and more convenient efficiency, and time and labor are saved.

A preferred assembly process may be to first place the insulating member 21 in the through hole 202 and make it positioned by the stopper 2021, at this time, a gap is formed between the insulating member 21 and the inner surface of the through hole 202, and then the replaceable modular electrical inspection head 1 is installed in the through hole 202 in the manner described above, that is, at the gap described above, at this time, the insulating member 21 is located in the hollow region of the replaceable modular electrical inspection head 1, and the probe 3 can be inserted from the end of the testing needle body 20 opposite to the testing part 201 until it passes through the hollow region of the insulating member 21. During the detection, the annular brim 11 abutting against the testing part 201 is in contact with the object to be tested, and the oxide layer attached to the surface of the object to be tested can be effectively pierced or scraped by the plurality of protruding structures 111, so as to realize the electrical conduction.

Similarly, the plurality of protruding structures 111 may be arranged in a single row or multiple rows, such that when the annular brim portion 11 contacts the object to be tested, the plurality of protruding structures 111 can scrape the oxide layer on the surface of the object to be tested as much as possible. The plurality of protruding structures 111 can be designed based on the electrical connection with the object to be tested, preferably, the replaceable modular electrical testing head 1 is formed by stamping, the plurality of protruding structures 111 are symmetrically arranged in pairs, one side 1111 of each protruding structure 111 is connected to the annular brim part 11, so that the annular brim part 11 forms an opening 112 at any position between the plurality of protruding structures 111, and a deformation air gap space a is formed between the opening 112 and the protruding structure 111, and the deformation air gap space a is gradually widened and triangular, so that the protruding structure 111 has a tolerance for deformation under stress. And further making any two pairs of the symmetrically disposed plural protruding structures 111 tilt toward each other to approach each other, so that each protruding structure 111 is a tilted structure with a cambered surface or a plane, which is more conducive to puncturing an oxide layer on an object to be tested, as shown in fig. 1 to 3, and when the plural protruding structures 111 are disposed in pairs symmetrically, the plural protruding structures 111 are disposed in a single-row or multi-row ring-shaped arrangement, which means that each pair of the symmetrically disposed protruding structures 111 is disposed one by one to form a ring shape.

Or, the plurality of protruding structures 111 may also be at least one side 1111 connected to the annular brim 11, and the annular brim 11 has a structure with an opening 112 corresponding to each protruding structure 111, and a deformation air gap space a is formed between the opening 112 and the protruding structure 111, so that the protruding structure 111 has a stress deformation margin, so that the plurality of protruding structures 111 are outward convex relative to the annular brim 11, which is beneficial to improving the conduction efficiency, and the opening 112 is provided at the position of the annular brim 11 corresponding to the protruding structure 111, which can reserve a space for the plurality of protruding structures 111 to slide or displace under stress. Further, referring to fig. 4 and 5, the two side edges 1111 of each protruding structure 111 are connected to the annular brim 11 and have a pointed-ridge triangular structure, and the opening 112 is located at the bottom side of the protruding structure 111, so that the deformed air gap space a is gradually widened and triangular. The other relevant detailed technical features and functions should be repeated together with the corresponding contents, which is not repeated herein.

To sum up, the utility model provides an interchangeable modularization electrical property detects first 1 and possesses the test needle 2 of interchangeable modularization electrical property detection head carries out the modularized design to the joint portion of electrical property test needle, makes the test needle connect in possessing splendid replaceability and the convenience of operation. The stamping method is selected to manufacture the replaceable modular electrical inspection head 1, which has lower manufacturing cost of components and required manufacturing time, and reduces the material cost of the inspection device. The replaceable modular electrical inspection head 1 has a special structural design, and the deformation recovery notch 12 is utilized to temporarily close the deformation recovery notch 12 to the hollow cap sheath portion 10 in the through hole by only squeezing during assembly, and the deformation recovery notch 12 can be recovered according to the elasticity of the material by continuous releasing, so that the hollow cap sheath portion 10 is stably abutted against the inner surface of the through hole 202, the replaceable modular electrical inspection head 1 has better assembly stability, and the fixing effect can be achieved without assistance of other workpieces. For the annular brim portion 11 and the plural protruding structures 111 thereon, the present invention also discloses further technical features, such as providing a deformation tolerance space for the plural protruding structures 111 under stress through the deformation air gap space a, which not only can improve the piercing and scraping performance of the plural protruding structures 111 relative to the oxide layer of the object to be tested, but also can effectively prevent the plural protruding structures 111 from being damaged after being stressed, thereby substantially improving the structural strength and application performance of the replaceable modular electrical detection head 1.

The foregoing description is intended to be illustrative rather than limiting, and it will be appreciated by those skilled in the art that many modifications, variations or equivalents may be made without departing from the spirit and scope of the invention as defined in the appended claims.

Claims (14)

1. A replaceable modular electrical test head, comprising:

the replaceable modularized electrical detection head is a hollow cap-shaped thin-shell conductive structure and is provided with a hollow cap-shaped sheath part, an annular brim part and a deformation recovery notch, the hollow cap-shaped sheath part is of a tubular structure, the annular brim part is a part for electrical contact and is of a sheet structure, the annular brim part is formed by extending one end of the hollow cap-shaped sheath part outwards, the surface of the annular brim part is provided with a plurality of convex structures, and the deformation recovery notch is formed by bending one end of the hollow cap-shaped sheath part, passing through the annular brim part and extending to the edge of the annular brim part; the deformation recovery notch can be used for replacing and installing the replaceable modularized electrical detection head through the change of force leaning and returning and non-force returning.

2. The interchangeable modular electrical test head of claim 1 wherein the interchangeable modular electrical test head is stamped and formed with at least one side of the plurality of protruding structures attached to the annular brim portion, the annular brim portion having an opening at a location corresponding to each of the protruding structures, the opening and the protruding structures defining a deformable air gap space therebetween to allow the protruding structures to be deformed under force.

3. The replaceable modular electrical inspection head of claim 2 wherein each of the two sides of the protruding structure is connected to the annular brim portion and has a pointed-ridge triangular structure, the opening being located on the bottom side of the protruding structure such that the deformed air gap space is in a gradually widening triangular shape.

4. The interchangeable modular electrical inspection head of claim 1, wherein the interchangeable modular electrical inspection head is formed by stamping, and the plurality of protruding structures are symmetrically disposed in pairs, and one side of each protruding structure is connected to the annular brim portion, and the annular brim portion has an opening at a position between any two of the plurality of protruding structures, such that a deformed air gap space is formed between the opening and the protruding structures, and the deformed air gap space is in a gradually triangular shape, such that the protruding structures have a tolerance for deformation under stress.

5. The interchangeable modular electrical inspection head of claim 4 wherein the plurality of protruding structures are disposed in any pair and inclined toward each other such that each protruding structure is an inclined structure with a curved surface or a flat surface.

6. The interchangeable modular electrical inspection head of any of claims 1 to 5 wherein the plurality of raised structures are arranged in a single or multiple rows in a ring.

7. The replaceable modular electrical test head of any of claims 1 to 5 wherein the replaceable modular electrical test head is configured to be mounted in a bore of a test pin and forced against the deformation recovery notch to place the hollow cap sheath portion in the bore, the unstressed force of the deformation recovery notch being capable of causing the hollow cap sheath portion to outwardly support against an inner surface of the bore to form a fixed position.

8. The interchangeable modular electrical inspection head of claim 7 wherein the plurality of raised structures are arranged in a single row or a plurality of rows in a circular pattern.

9. A test pin having a replaceable modular electrical test head, comprising:

the testing probe body is hollow to accommodate the probe, one end of the testing probe body is provided with a testing part, and the testing part is provided with a through hole;

the replaceable modularized electrical detection head is assembled in the through hole, the replaceable modularized electrical detection head is a hollow cap-shaped thin-shell-shaped conductive structure and is provided with a hollow cap-shaped sheath part, an annular cap edge part and a deformation recovery gap, the hollow cap-shaped sheath part is of a tubular structure, the annular cap edge part is a part for electrically contacting an object to be detected and is of a sheet structure, the annular cap edge part is formed by extending one end of the hollow cap-shaped sheath part outwards, a plurality of protruding structures are arranged on the surface of the annular cap edge part, and the deformation recovery gap is formed by bending one end of the hollow cap-shaped sheath part, passing through the annular cap edge part and extending to the edge of the annular cap edge part; when the deformation recovery notch is forced to close, the hollow cap-shaped sheath part is arranged in the through hole of the test needle body, the hollow cap-shaped sheath part can be outwards supported and abutted against the inner surface of the through hole to form fixation by the force recovered by the unstressed deformation recovery notch, and the annular brim part is abutted against the test part; and

and the insulating part is of a tubular structure, is arranged in the through hole and is positioned in the hollow area of the replaceable modular electrical detection head, and one end of the probe penetrates through the insulating part.

10. The probe of claim 9, wherein the replaceable modular electrical test head is formed by stamping, and at least one side of the plurality of protruding structures is connected to the annular brim portion, the annular brim portion has an opening corresponding to each protruding structure, and a deformable air gap space is formed between the opening and the protruding structure, so that the protruding structure has a tolerance for deformation under stress.

11. The probe pin with replaceable modular electrical inspection head of claim 10, wherein the two sides of each protruding structure are connected to the annular brim and have a pointed-ridge triangular structure, the opening is located at the bottom side of the protruding structure, so that the deformed air gap space has a gradually widened triangular shape.

12. The probe of claim 9, wherein the replaceable modular electrical inspection head is formed by stamping, and the plurality of protruding structures are symmetrically disposed in pairs, and one side of each protruding structure is connected to the annular brim portion, and the annular brim portion has an opening formed at a position between any two of the plurality of protruding structures, such that a deformed air gap space is formed between the opening and the protruding structures, and the deformed air gap space is gradually widened and triangular, such that the protruding structures have a tolerance for deformation under stress.

13. The probe pin with replaceable modular electrical inspection head of claim 12, wherein the plurality of protruding structures disposed symmetrically are inclined toward each other, so that each protruding structure is an inclined structure with a curved surface or a flat surface.

14. The probe with replaceable modular electrical inspection head of any of claims 9 to 13, wherein the plurality of protruding structures are arranged in a single or multiple rows in a ring.

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