CN212410449U - Image scanning microscopic imaging system - Google Patents
Image scanning microscopic imaging system Download PDFInfo
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- CN212410449U CN212410449U CN202021195995.9U CN202021195995U CN212410449U CN 212410449 U CN212410449 U CN 212410449U CN 202021195995 U CN202021195995 U CN 202021195995U CN 212410449 U CN212410449 U CN 212410449U
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Abstract
The utility model provides a microscopic imaging system of image scanning, include: a laser for generating illumination laser light; the light beam focusing structure is positioned on an emergent light path of the laser; the ellipsoidal reflector is provided with a first focus and a second focus, the ellipsoidal reflector is positioned on an emergent light path of the light beam focusing structure, and a focusing focus of the light beam focusing structure is superposed with the first focus; a plane mirror for receiving signal light of a sample excited by the illumination laser, the plane mirror being adapted to move on an optical axis of the signal light; and the imaging device is used for receiving the signal light reflected by the plane mirror to image according to the signal light. The utility model has the advantages that: the numerical aperture angle in the imaging system can be increased to improve the imaging resolution of the system.
Description
Technical Field
The utility model relates to a microscopic imaging technique field of image scanning particularly, relates to a microscopic imaging system of image scanning.
Background
In scientific research, high-resolution microscopic imaging of biological samples, nanostructures and the like is a technical problem to be solved urgently. In the field of microscopic imaging technology, the numerical aperture of an objective lens is a direct method for improving the imaging resolution, and an imaging system is limited by a limited aperture, so that the aperture angle is difficult to reach or exceed pi/2, and the imaging resolution cannot be greatly improved.
SUMMERY OF THE UTILITY MODEL
The utility model provides a problem how can improve the numerical aperture angle in the imaging system to improve the imaging resolution ratio of system.
In order to solve the above problem, the utility model provides a microscopic imaging system of image scanning, include:
a laser for generating illumination laser light;
the light beam focusing structure is positioned on an emergent light path of the laser;
an ellipsoidal reflector forming a first focus and a second focus, the ellipsoidal reflector being positioned on an exit light path of the beam focusing structure, a focusing focus of the beam focusing structure coinciding with the first focus,
a plane mirror for receiving signal light of a sample excited by the illumination laser, the plane mirror being adapted to move on an optical axis of the signal light;
and the imaging device is used for receiving the signal light reflected by the plane mirror to image according to the signal light.
In the technical scheme, the spherical reflector performs light path turning in a reflecting mode, so that a focusing mode of the ellipsoidal reflector is adopted, the aperture angle of focusing can be larger than pi/2, the imaging resolution of the system is improved in subsequent imaging, the planar reflector is arranged to receive signal light excited by the illumination laser of a sample and reflect the signal light to the imaging device for imaging, the planar reflector is suitable for moving on an optical axis of the signal light, different sections of an imaging object can be axially selected to be imaged on the imaging surface under the condition of no spherical aberration by moving the planar reflector, and the imaging quality is improved.
Further, the laser device further comprises a first light beam collimation and expansion system, wherein the first light beam collimation and expansion system is positioned on a light path between the laser device and the light beam focusing structure.
In this technical scheme, first beam collimation expands beam system can adjust the beam size, realizes better scanning imaging effect.
Further, the sample processing device further comprises an object stage and a spectroscope, wherein the object stage is used for bearing the sample at the second focus, the plane reflecting mirror is arranged opposite to the object stage, the spectroscope is positioned on a light path between the object stage and the plane reflecting mirror, and the spectroscope is also positioned on a light path between the plane reflecting mirror and the imaging device.
In the technical scheme, the spectroscope is arranged on the light path between the objective table and the plane reflector, so that the signal light reflected by the plane reflector can be transmitted to the imaging device for imaging, and the system is simpler in structure and easy to operate.
Furthermore, the device also comprises a second light beam collimation and expansion system, wherein the second light beam collimation and expansion system is positioned on the light path between the objective table and the spectroscope.
In this technical scheme, the second light beam collimation expands beam system can carry out the collimation to expand beam to the signal light that the sample arouses to realize better scanning imaging effect.
The sample stage is arranged on the sample, the second light beam collimation and beam expansion system is arranged on an emergent light path of the collecting objective lens, and the second light beam collimation and beam expansion system is arranged on the emergent light path of the collecting objective lens.
In this technical scheme, through setting up the signal light that collects objective to sample excitation on the objective table and carry out the light beam and collect to this can carry out the quick complete collection of light beam, the light beam after the collection is emergent to the collimation of second light beam system of expanding and is expanded beam, reaches the complete formation of image of high resolution with this.
Furthermore, the ellipsoidal reflector is provided with a hole, the objective table and the imaging device are respectively positioned at two sides of the ellipsoidal reflector, the collection objective lens is positioned between the objective table and the ellipsoidal reflector, and the hole is positioned on a light path between the second light beam collimation and expansion system and the collection objective lens.
In the technical scheme, the objective table and the imaging device are respectively positioned at two sides of the ellipsoidal reflector, holes are formed in the ellipsoidal reflector for light beams to pass through, after the signal light is emitted from a sample on the objective table, the signal light is collected by the collecting objective lens and then is transmitted to the second light beam collimation and expansion system through the holes, and finally is imaged by the multi-pixel camera transmitted to the imaging device, so that the objective table bears the sample at the second focus, namely, the sample is positioned at the inner side of the ellipsoidal reflector, and relatively, the imaging device and the second light beam collimation and expansion system are positioned at the outer side of the ellipsoidal reflector, so that the imaging device and other system components are conveniently connected and operated in actual use, and the imaging device is prevented from being positioned at the inner side to cause interference to the light beams and influence imaging.
Further, the multi-pixel camera is an sCMOS camera or an EMCCD camera.
In the technical scheme, imaging is carried out through an sCMOS camera or an EMCCD camera, so that faster response can be carried out on signal light, and the imaging sensitivity is improved.
Further, the object stage is a two-dimensional scanning platform.
In the technical scheme, the movement of the object stage can be controlled, so that the movement of the sample is directly realized, the two-dimensional scanning of the sample is carried out, the better scanning imaging effect can be realized by matching with the plane reflecting mirror, the scanning of the sample is more convenient, the operation is easy, and the system is simpler and more compact.
The scanning galvanometer is positioned on an emergent light path of the light beam focusing structure and used for receiving the illumination laser focused by the light beam focusing structure so as to scan the sample by using the illumination laser.
Among this technical scheme, adjust illumination laser through scanning galvanometer to scan the sample, with this, can reduce or avoid producing the sample and disturb, and lead to the scanning effect of sample relatively poor, with this improvement formation of image resolution.
Further, the laser device further comprises a light spot adjusting device, and the light spot adjusting device is located on a light path between the laser device and the light beam focusing structure.
In this technical scheme, through adjusting facula adjusting device to adjust the facula size, and then adjust the focus aperture angle of ellipsoidal reflector, it is more convenient with this feasible regulation operation, be convenient for control the formation of image.
Further, the laser device comprises a timing control and image processing system which is in communication connection with the laser device and the imaging device.
In the technical scheme, the laser and the imaging device can be synchronously controlled through the time sequence control and image processing system, and the imaged image is processed, so that the system is conveniently controlled, and the imaging resolution is improved.
Drawings
Fig. 1 is a first schematic structural diagram of an image scanning microscopic imaging system in an embodiment of the present invention;
fig. 2 is a schematic structural diagram of an image scanning microscopic imaging system in an embodiment of the present invention.
Description of reference numerals:
1-a laser; 2-a beam focusing structure; 3-an ellipsoidal mirror; 301-a first focal point; 302-a second focal point; 303-holes; 4-an imaging device; 401-an imaging objective lens; 402-a multi-pixel camera; 5-a first beam collimation and expansion system; 6-an objective table; 7-time sequence control and image processing system; 8-a plane mirror; 9-a second beam collimation and expansion system; 10 a-a spectroscope; 11 a-collection objective.
Detailed Description
In order to make the aforementioned objects, features and advantages of the present invention more comprehensible, embodiments accompanied with figures are described in detail below.
It is intended that the terms used in the specification and claims of the present invention and in the accompanying drawings described above
"first," "second," and the like are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the invention described herein are capable of operation in sequences other than those illustrated or otherwise described herein.
Referring to fig. 1, the utility model provides an image scanning micro-imaging system, include:
a laser 1 for generating illumination laser light;
the light beam focusing structure 2 is positioned on an emergent light path of the laser 1;
an ellipsoidal reflector 3 formed with a first focus 301 and a second focus 302, the ellipsoidal reflector 3 being located on an exit light path of the light beam focusing structure 2, a focusing focus of the light beam focusing structure 2 coinciding with the first focus 301,
a plane mirror 8 for receiving signal light of the sample excited by the illumination laser, the plane mirror 8 being adapted to move on an optical axis of the signal light;
and an imaging device 4 for receiving the signal light reflected by the plane mirror 8 to perform imaging according to the signal light.
In the related art, the imaging system is limited in the limited aperture, thereby causing the aperture angle to hardly reach or exceed pi/2, and thus, the imaging resolution cannot be greatly improved.
In the embodiment of the present invention, based on the illumination laser emitted from the laser 1 for scanning the sample, the light beam focusing structure 2 is disposed on the emitting light path of the laser 1 to focus the light beam, so that the focused light beam passes through a focusing point, the light beam focusing structure 2 is disposed on the emitting light path with an ellipsoidal mirror 3, the ellipsoidal mirror 3 has a first focus 301 and a second focus 302, it should be noted that, in the ellipsoidal mirror 3, the light passing through one focus tends to pass through another focus after being reflected by the surface of the ellipsoidal mirror 3, in this embodiment, the light beam will pass through the first focus 301 of the ellipsoidal mirror 3 and then pass through the second focus 302, the focusing focus of the light beam focusing structure 2 coincides with the first focus 301, in this embodiment, the light beam focusing structure 2 may include a focusing lens, the focus of the focusing lens coincides with the first focus 301, so that the ellipsoidal mirror 3 is used for receiving the illumination laser focused by the beam focusing structure 2 and reflecting the illumination laser to the second focus 302, at this time, a sample can be placed at the second focus 302 to scan the sample, because the ellipsoidal mirror 3 performs optical path turning in a reflection manner, and therefore, the focusing manner of the ellipsoidal mirror 3 is adopted, so that the focused aperture angle is larger than pi/2, thereby improving the imaging resolution of the system in subsequent imaging, wherein a plane mirror 8 is provided to receive the signal light excited by the illumination laser of the sample and reflect to an imaging device 4 for imaging, and the plane mirror 8 is adapted to move on the optical axis of the signal light, different sections of an imaged object can be axially selected by moving the plane mirror 8 to be imaged on an imaging surface without spherical aberration, thereby improving the imaging quality, wherein the plane mirror 8 can be driven by a connecting drive structure to move on the optical axis.
Usually, the sample is placed on the object carrying structure, and the object carrying structure has a certain volume, so that the light beam focusing structure 2 is adopted to enable the light beams to be gathered and crossed and to be different from parallel light beams, so that the shielding of the object carrying structure on the light beams can be reduced, and the influence on aberration is avoided.
In an optional embodiment of the present invention, the system further comprises a first beam collimation and beam expansion system 5, wherein the first beam collimation and beam expansion system 5 is located on the light path between the laser 1 and the beam focusing structure 2.
In this embodiment, set up first beam collimation beam expanding system 5 on the outgoing light path of laser instrument 1, specifically, first beam collimation beam expanding system 5 specifically can include and be located in proper order beam expanding lens and collimating lens on the outgoing light path of laser instrument 1 to adjust the beam size, realize better scanning imaging effect.
In an optional embodiment of the present invention, the apparatus further comprises an objective table 6 and a spectroscope 10a, wherein the objective table 6 is used for carrying the sample in the second focus 302, the plane mirror 8 is disposed opposite to the objective table 6, the spectroscope 10a is disposed on the optical path between the objective table 6 and the plane mirror 8, and the spectroscope 10a is further disposed on the optical path between the plane mirror 8 and the imaging device 4.
In this embodiment, the stage 6 is used for supporting a sample, and may be disposed at a position close to the second focus, so that the sample can be located at the second focus 302, wherein the planar mirror 8 is specifically disposed in a manner opposite to the stage 6, so that the signal light of the sample on the stage 6 can smoothly enter the planar mirror 8, thereby facilitating the reception of the sample signal light, correspondingly, the signal light reflected by the planar mirror 8 returns along the original path, and based on this, the spectroscope 10a is disposed on the light path between the stage 6 and the planar mirror 8, so that the signal light reflected by the planar mirror 8 can be transmitted to the imaging device 4 for imaging, and the system has a simpler structure and is easy to operate.
In an optional embodiment of the present invention, the imaging device 4 includes an imaging objective lens 401 and a multi-pixel camera 402, the imaging objective lens 401 and the multi-pixel camera 402 are sequentially located on the reflected light path of the plane mirror 8, specifically, on an emergent light path of the spectroscope 10a, so as to receive the signal light and perform high-quality imaging.
Wherein the multi-pixel camera 402 may be an sCMOS (scientific grade complementary metal oxide semiconductor) camera or an EMCCD (electron multiplication) camera to enable faster response to signal light and improve imaging sensitivity.
The utility model discloses an optional embodiment, still include second light beam collimation system of expanding 9, second light beam collimation system of expanding 9 is located objective table 6 with light path between spectroscope 10 a.
The second beam collimation and beam expansion system 9 may specifically include a beam expansion lens and a collimating lens, which are sequentially located on a light path between the stage 6 and the beam splitter 10a, so as to adjust the beam size, thereby facilitating implementation of a better scanning imaging effect.
A focusing lens 12a may be disposed between the beam splitter 10a and the plane mirror 8 to focus the expanded light beam to facilitate the reflection process on the plane mirror 8.
The utility model discloses an optional embodiment, still include collection objective 11a, collection objective 11a with objective 6 sets up relatively for receive the sample by the signal light that the illumination laser arouses, second beam collimation expands beam system 9 and is located on collection objective 11 a's the emergent light path.
In this embodiment, the signal light excited by the sample on the objective table 6 is collected by setting the collection objective lens 11a, so that the light beam can be rapidly and completely collected, and the collected light beam is emitted to the second light beam collimation and expansion system 9 to be collimated and expanded, so that high-resolution complete imaging is achieved.
The utility model discloses an optional embodiment, set up porose 303 on the ellipsoidal reflector 3, objective table 6 with imaging device 4 is located respectively ellipsoidal reflector 3 both sides, collection objective 11a is located objective table 6 with between the ellipsoidal reflector 3, hole 303 is located second beam collimation expands beam system 9 with collect the light path between the objective 11 a.
In this embodiment, the objective table 6 and the imaging device 4 are respectively located at two sides of the ellipsoidal reflector 3, a hole is formed in the ellipsoidal reflector 3 for a light beam to pass through, so that the signal light is emitted from a sample on the objective table 6, collected by the collection objective lens 11a, and then transmitted to the second light beam collimation and expansion system 9 through the hole 303, and finally imaged by the multi-pixel camera 402 transmitted to the imaging device 4, so that the objective table 6 supports the sample at the second focal point 302, i.e. at the inner side of the ellipsoidal reflector 3, and correspondingly, the imaging device 4 and the second light beam collimation and expansion system 9 are located at the outer side of the ellipsoidal reflector 3, thereby facilitating the connection and operation of the imaging device 4 and other system components in actual use, and avoiding the imaging device 4 being located at the inner side to interfere the light beam and affect imaging.
The utility model discloses an optional embodiment, objective table 6 is two-dimensional scanning platform to this after placing the sample on objective table 6, can pass through the motion of control objective table 6, thereby directly realize the motion of sample, in order to carry out the two-dimensional scanning of sample, cooperation plane mirror 8 can realize better scanning imaging effect promptly, makes the scanning of sample more convenient, easily operates, and makes the system simple compact more.
The utility model discloses an optional embodiment, still include the scanning galvanometer, the scanning galvanometer is located beam focusing structure 2's outgoing light path for receive the process the illumination laser after beam focusing structure 2 focuses, in order to utilize illumination laser scanning the sample.
In this embodiment, the scanning galvanometer is disposed on the emergent light path of the light beam focusing structure 2 to adjust the illumination laser, so as to scan the sample, thereby reducing or avoiding interference on the sample, resulting in poor scanning effect on the sample, and improving the imaging resolution.
In an optional embodiment of the present invention, the optical system further comprises a light spot adjusting device, wherein the light spot adjusting device is located on the light path between the laser 1 and the light beam focusing structure 2.
In this embodiment, the change accessible of the focus aperture angle of ellipsoidal reflecting mirror 3 is realized by adjusting the spot size before the focusing lens in light beam focusing structure 2, and in the imaging process, through adjusting light spot adjusting device to adjust the light spot size, and then adjust the focus aperture angle of ellipsoidal reflecting mirror 3, so that it is more convenient to adjust the operation, is convenient for control formation of image, and wherein light spot adjusting device can be aperture diaphragm.
In an optional embodiment of the present invention, the system further comprises a timing control and image processing system 7, wherein the timing control and image processing system 7 is in communication connection with the laser 1 and the imaging device 4.
In this embodiment, referring to fig. 2, the timing control and image processing system 7 can perform timing control on the laser 1 and the imaging device 4 and perform image processing when receiving imaging information transmitted by the multi-pixel camera 402 in the imaging device 4, so that each part of the system can operate synchronously when scanning and imaging a sample, thereby facilitating synchronous control and avoiding imaging failure or poor imaging quality.
When the object stage 6 is a two-dimensional scanning platform, the time sequence control and image processing system 7 can be in communication connection with the object stage 6 to synchronously control the scanning of the sample, so that the scanning is more accurate.
The timing control and image processing system 7 may include a deconvolution module to perform a deconvolution operation on the synthesized image to further improve the resolution of the imaging, among other things.
Although the present disclosure has been described above, the scope of the present disclosure is not limited thereto. Various changes and modifications may be made by those skilled in the art without departing from the spirit and scope of the present disclosure, and these changes and modifications are intended to fall within the scope of the present disclosure.
Claims (10)
1. An image scanning microscopy imaging system, comprising:
a laser (1) for generating illumination laser light;
the light beam focusing structure (2) is positioned on an emergent light path of the laser (1);
the ellipsoidal reflector (3) is provided with a first focus (301) and a second focus (302), the ellipsoidal reflector (3) is positioned on an emergent light path of the light beam focusing structure (2), and a focusing focus of the light beam focusing structure (2) is superposed with the first focus (301);
a plane mirror (8) for receiving signal light of a sample excited by the illumination laser, the plane mirror (8) being adapted to move on an optical axis of the signal light;
and the imaging device (4) is used for receiving the signal light reflected by the plane mirror (8) so as to carry out imaging according to the signal light.
2. An image scanning microscopy imaging system according to claim 1, further comprising a first beam collimation and expansion system (5), the first beam collimation and expansion system (5) being located in the optical path between the laser (1) and the beam focusing structure (2).
3. An image scanning microscopy imaging system according to claim 1, further comprising an object stage (6) for carrying the sample at the second focal point (302) and a beam splitter (10a), the plane mirror (8) being arranged opposite the object stage (6), the beam splitter (10a) being located in an optical path between the object stage (6) and the plane mirror (8), and the beam splitter (10a) being further located in an optical path between the plane mirror (8) and the imaging device (4).
4. An image scanning microscopy imaging system according to claim 3, further comprising a second beam collimation and expansion system (9), the second beam collimation and expansion system (9) being located in the optical path between the object stage (6) and the beam splitter (10 a).
5. An image scanning microscopy imaging system according to claim 4, further comprising a collection objective (11a), wherein the collection objective (11a) is disposed opposite to the stage (6) and is used for receiving the signal light excited by the illumination laser, and the second beam collimation and expansion system (9) is disposed on the emergent light path of the collection objective (11 a).
6. An image scanning microscopy imaging system according to claim 5, wherein the ellipsoidal mirror (3) is provided with a hole (303), the objective table (6) and the imaging device (4) are respectively located at two sides of the ellipsoidal mirror (3), the collection objective (11a) is located between the objective table (6) and the ellipsoidal mirror (3), and the hole (303) is located on the optical path between the second beam collimation and expansion system (9) and the collection objective (11 a).
7. An image scanning microscopy imaging system according to claim 3, characterized in that the object table (6) is a two-dimensional scanning platform.
8. The image scanning microscopy imaging system according to claim 1, further comprising a scanning galvanometer, located on an exit light path of the beam focusing structure (2), for receiving the illumination laser focused by the beam focusing structure (2) to scan the sample with the illumination laser.
9. An image scanning microscopy imaging system according to claim 1, further comprising a spot adjusting means located in the optical path between the laser (1) and the beam focusing structure (2).
10. An image scanning microscopy imaging system according to any one of claims 1 to 9, further comprising a timing control and image processing system (7), the timing control and image processing system (7) being communicatively connected to the laser (1) and the imaging device (4).
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202021195995.9U CN212410449U (en) | 2020-06-24 | 2020-06-24 | Image scanning microscopic imaging system |
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| CN202021195995.9U CN212410449U (en) | 2020-06-24 | 2020-06-24 | Image scanning microscopic imaging system |
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| CN212410449U true CN212410449U (en) | 2021-01-26 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116909014A (en) * | 2023-09-11 | 2023-10-20 | 之江实验室 | Elliptic surface-based galvanometer plane scanning device and scanning method |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116909014A (en) * | 2023-09-11 | 2023-10-20 | 之江实验室 | Elliptic surface-based galvanometer plane scanning device and scanning method |
| CN116909014B (en) * | 2023-09-11 | 2023-12-01 | 之江实验室 | Elliptic surface-based galvanometer plane scanning device and scanning method |
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