CN212409631U - High-precision thickness measuring device for large-size object - Google Patents

High-precision thickness measuring device for large-size object Download PDF

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Publication number
CN212409631U
CN212409631U CN202021731520.7U CN202021731520U CN212409631U CN 212409631 U CN212409631 U CN 212409631U CN 202021731520 U CN202021731520 U CN 202021731520U CN 212409631 U CN212409631 U CN 212409631U
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laser
groups
cameras
measured
measured object
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张卫华
周涛
郑孝勇
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Suzhou Guangyunda Automation Equipment Co ltd
Shenzhen Sinhovo Technology Co ltd
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Suzhou Guangyunda Automation Equipment Co ltd
Shenzhen Sinhovo Technology Co ltd
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Abstract

The utility model relates to a high-precision thickness measuring device for large-size objects, which comprises two groups of coaxial point laser sources, two groups of cameras opposite to a lens during measurement, and a mounting frame for mounting the point laser sources and the cameras; the two groups of point laser sources respectively emit oblique first laser and oblique second laser to the upper surface and the lower surface of the object to be measured; the two groups of cameras respectively acquire a first image of a reflection point corresponding to the first laser on a measured object and a second image of a reflection point corresponding to the second laser on the measured object, and also respectively acquire a first coordinate of the reflection point corresponding to the first laser on the measured object and a second coordinate of the reflection point corresponding to the second laser on the measured object; the height of the overlapping part of the depth of field of the two groups of cameras is not less than the initial thickness of the object to be measured before processing; the device is suitable for measuring the thickness of the central point of a large plane or an oversized plane, is suitable for objects in various shapes, cannot be interfered by micro warping in thickness detection, and does not need to be provided with a relative test reference.

Description

High-precision thickness measuring device for large-size object
Technical Field
The utility model relates to a thickness detects technical field, more specifically says, relates to a high accuracy thickness measurement device to jumbo size object.
Background
When 5G supporting products are produced, a step groove is often required to be machined on a steel sheet with the size of more than 500mmx400mm and the thickness of 0.12mm-0.15mm, and the depth of the step groove is the printing height of the solder paste, namely the machining quality of the step groove directly influences the printing quality. Therefore, how to accurately measure the thickness of the steel sheet during machining is extremely critical. The current common mode is as follows:
firstly, a large micrometer is used for measurement, the measuring tool needs to be customized in the method, the larger the size of a measured object is, the higher the price of the measuring tool is, the measured object is inconvenient to place, and the measured size is inaccurate;
secondly, with the help of the marble platform, the method is suitable for the condition that only one side of the steel sheet is provided with the stepped grooves, and is not suitable for the condition that both sides of the steel sheet are provided with the stepped grooves; in addition, the extrusion of the probe can cause the steel mesh to warp, so that the measured thickness data is not accurate;
and thirdly, a side projection measurement method is adopted, which requires that the steel sheet is provided with an opening, and cannot be measured without the opening.
Therefore, there is still a need for improvement of the existing thickness measurement method to solve the above-mentioned disadvantages.
SUMMERY OF THE UTILITY MODEL
The to-be-solved technical problem of the utility model lies in, to prior art's above-mentioned defect, provide a high accuracy thickness measurement device to jumbo size object.
The utility model provides a technical scheme that its technical problem adopted is:
provided is a high-precision thickness measuring device for a large-sized object, including:
two groups of point laser sources which are coaxial during measurement; the two groups of point laser sources respectively emit oblique first laser and oblique second laser to the upper surface and the lower surface of the object to be measured; and
two groups of cameras with upright and opposite lenses during measurement; the two groups of cameras are used for respectively acquiring a first image of a reflection point corresponding to the first laser on the measured object and a second image of a reflection point corresponding to the second laser on the measured object, and also respectively acquiring a first coordinate of the reflection point corresponding to the first laser on the measured object and a second coordinate of the reflection point corresponding to the second laser on the measured object; the height of the overlapping part of the depth of field of the two groups of cameras is not less than the initial thickness of the object to be measured before processing; and
and the mounting rack is used for mounting the two groups of point laser sources and the two groups of cameras.
Preferably, the device further comprises two groups of polarized light sheets corresponding to the two groups of point laser sources one to one.
Preferably, the device further comprises a partition plate for preventing the two groups of point laser sources from emitting oppositely during debugging.
Preferably, a set of the point laser sources and a set of the cameras constitute a set of units; the mounting frame comprises a main frame body; the upper side and the lower side of the main frame body are both connected with a first movable seat which moves along the Y axis in a sliding manner; the first movable seat is connected with a second movable seat which moves along the X axis in a sliding manner; and the two groups of units are respectively arranged on the two groups of second movable seats.
The beneficial effects of the utility model reside in that:
the method is suitable for measuring the thickness of the central point of a large plane or an oversized plane. During the measurement, change some laser source's irradiation position, can carry out thickness detection to the different positions of testee, detect differently with micrometer in the past, some laser source need not have actual contact with the testee. Therefore, the size of the measured object is increased, inconvenience is not caused to the movement or irradiation of the point laser source, and the detection cost is not greatly increased;
is suitable for objects with various shapes. During measurement, the upper surface and the lower surface of a measured object are simultaneously detected, and the relative height of the upper surface and the lower surface is obtained. Therefore, the thickness detection device is suitable for thickness detection of a measured object which is not opened, a measured object with a stepped groove only on one side and a measured object with a stepped groove on both sides, and has good applicability;
the thickness detection is not disturbed by a small warpage. The arc can be regarded as being composed of a plurality of straight lines, and the method is based on the trigonometric function to calculate the thickness, so that the detected part generates tiny warping, and the accuracy of the thickness detection cannot be interfered;
no relative test reference is required. During measurement, the two groups of point laser sources form oblique direction projections in two directions, a straight line formed by connecting the two groups of point laser sources penetrates through a measured object in an oblique mode, two reflecting points are not coincident necessarily, therefore, the transverse offset is necessarily generated, a relative test reference does not need to be specially set, and the measurement is more convenient.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the present invention will be further described below with reference to the accompanying drawings and embodiments, wherein the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained without inventive work according to the drawings:
fig. 1 is a schematic structural diagram of a high-precision thickness measuring device for a large-size object according to an embodiment of the present invention;
fig. 2 is a schematic usage diagram of a high-precision thickness measuring device for a large-size object according to an embodiment of the present invention (no object to be measured exists at this time);
fig. 3 is a schematic usage diagram of a high-precision thickness measuring device for a large-size object according to an embodiment of the present invention (the object to be measured is not grooved, and the upper and lower two frames are images taken by the upper and lower two groups of cameras respectively);
fig. 4 is a schematic usage diagram of a high-precision thickness measuring device for a large-size object according to an embodiment of the present invention (only the upper surface of the object to be measured is grooved, and the upper and lower two frames are images taken by the upper and lower two groups of cameras respectively);
fig. 5 is a schematic usage diagram of a high-precision thickness measuring device for a large-size object according to an embodiment of the present invention (the upper and lower surfaces of the object to be measured are both grooved, and the upper and lower two frames are images taken by the upper and lower two sets of cameras respectively).
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, a clear and complete description will be given below with reference to the technical solutions of the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by a person of ordinary skill in the art without creative efforts belong to the protection scope of the present invention.
The embodiment of the utility model provides a high accuracy thickness measurement device to jumbo size object, as shown in figure 1, the device includes:
two groups of point laser sources 10 which are coaxial during measurement; two groups of point laser sources 10 respectively emitting oblique first laser and oblique second laser to the upper and lower surfaces of the object to be measured; and
two groups of cameras 11 with upright and opposite lenses during measurement; the two groups of cameras 11 are used for respectively acquiring a first image of a reflection point corresponding to the first laser on the measured object and a second image of a reflection point corresponding to the second laser on the measured object, and also respectively acquiring a first coordinate of the reflection point corresponding to the first laser on the measured object and a second coordinate of the reflection point corresponding to the second laser on the measured object; the height of the overlapping part of the depth of field of the two groups of cameras is not less than the initial thickness of the object to be measured before processing; and
a mounting frame 12 for mounting two sets of spot laser sources 10 and two sets of cameras 11.
The specific use steps are as follows:
step S1: two groups of point laser sources are adopted to respectively emit oblique first laser and oblique second laser to the upper surface and the lower surface of a measured object; wherein, the measured object is not a transparent object, and the two groups of point laser sources are coaxial.
Step S2: and acquiring a first coordinate of a reflection point corresponding to the first laser on the measured object, a second coordinate of a reflection point corresponding to the second laser on the measured object, and an included angle theta formed by the first laser and a horizontal plane.
Wherein, obtaining the coordinates specifically includes:
two groups of cameras are adopted to respectively obtain a first image of a reflection point corresponding to the first laser on a measured object and a second image of a reflection point corresponding to the second laser on the measured object; the lenses of the two groups of cameras are opposite, the two groups of cameras are vertically placed, and the height of the overlapped part of the depths of field of the two groups of cameras is not less than the initial thickness of the object to be measured before processing;
and respectively acquiring a first coordinate and a second coordinate according to the first image and the second image.
The camera has enough depth of field, can correctly observe the laser reflection point under the condition of small distortion in the warping range, can accurately measure the thickness smaller than the depth of field range in the visual field range, and is not influenced by the warping of a measured object or the position relation of the measured object.
Step S3: and calculating the horizontal offset delta A of the first coordinate and the preset origin and the horizontal offset delta B of the second coordinate and the preset origin.
Step S4: the thickness H | Δ a- Δ B | tag (θ) of the object to be measured.
The device has the following advantages:
the method is suitable for measuring the thickness of the central point of a large plane or an oversized plane. During the measurement, change some laser source's irradiation position, can carry out thickness detection to the different positions of testee, detect differently with micrometer in the past, some laser source need not have actual contact with the testee. Therefore, the size of the measured object is increased, inconvenience is not caused to the movement or irradiation of the point laser source, and the detection cost is not greatly increased;
is suitable for objects with various shapes. As shown in fig. 2 to 5, during measurement, the upper and lower surfaces of the object to be measured are simultaneously detected, and the relative heights of the upper and lower surfaces are obtained. Therefore, the thickness detection device is suitable for thickness detection of a measured object which is not opened, a measured object with a stepped groove only on one side and a measured object with a stepped groove on both sides, and has good applicability;
the thickness detection is not disturbed by a small warpage. The arc can be regarded as being composed of a plurality of straight lines, and the method is based on the trigonometric function to calculate the thickness, so that the detected part generates tiny warping, and the accuracy of the thickness detection cannot be interfered;
no relative test reference is required. During measurement, the two groups of point laser sources form oblique direction projections in two directions, a straight line formed by connecting the two groups of point laser sources penetrates through a measured object in an oblique mode, two reflecting points are not coincident necessarily, therefore, the transverse offset is necessarily generated, a relative test reference does not need to be specially set, and the measurement is more convenient.
Preferably, the device further includes two sets of polarizing plates (not shown in the figure) corresponding to the two sets of point laser sources 10 one to one, when the object to be measured is glass, especially thin glass, the reflection effect on laser is general, the situation that the two sets of point laser sources 10 are caused to be in opposite incidence due to too small deviation of the refraction angle is easy to occur, the opposite incidence can cause the light-emitting body of the glass to be burned out, and the situation that the light-emitting body is burned out can be avoided by additionally arranging the polarizing plates (not shown in the figure).
Preferably, the device further comprises a partition (not shown in the figures) adapted to prevent the two sets of spot laser sources from impinging 10.
Preferably, a set of point laser sources 10 and a set of cameras 11 constitute a set of cells 13; the mounting frame 12 includes a main frame 14; the upper side and the lower side of the main frame body 14 are both connected with a first movable seat 15 which moves along the Y axis in a sliding way; the first movable seat 15 is connected with a second movable seat 16 which moves along the X axis in a sliding manner; and the two groups of units 13 are respectively arranged on the two groups of second movable seats 16 so as to respectively adjust the positions of the two groups of units 13, and the use is more flexible.
It will be understood that modifications and variations can be made by persons skilled in the art in light of the above teachings and all such modifications and variations are considered to be within the scope of the invention as defined by the following claims.

Claims (4)

1. A high-precision thickness measuring device for a large-sized object, comprising:
two groups of point laser sources which are coaxial during measurement; the two groups of point laser sources respectively emit oblique first laser and oblique second laser to the upper surface and the lower surface of the object to be measured; and
two groups of cameras with upright and opposite lenses during measurement; the two groups of cameras are used for respectively acquiring a first image of a reflection point corresponding to the first laser on the measured object and a second image of a reflection point corresponding to the second laser on the measured object, and also respectively acquiring a first coordinate of the reflection point corresponding to the first laser on the measured object and a second coordinate of the reflection point corresponding to the second laser on the measured object; the height of the overlapping part of the depth of field of the two groups of cameras is not less than the initial thickness of the object to be measured before processing; and
and the mounting rack is used for mounting the two groups of point laser sources and the two groups of cameras.
2. A high precision thickness measuring device for large size objects according to claim 1, further comprising two sets of polarizers corresponding to the two sets of point laser sources one to one.
3. A high precision thickness measuring device for large size objects according to claim 1, further comprising a partition plate adapted to prevent two sets of spot laser sources from being shot-by-shot.
4. A high precision thickness measuring device for large size objects according to claim 1, wherein a set of said point laser sources and a set of said cameras constitute a set of units; the mounting frame comprises a main frame body; the upper side and the lower side of the main frame body are both connected with a first movable seat which moves along the Y axis in a sliding manner; the first movable seat is connected with a second movable seat which moves along the X axis in a sliding manner; and the two groups of units are respectively arranged on the two groups of second movable seats.
CN202021731520.7U 2020-08-14 2020-08-14 High-precision thickness measuring device for large-size object Active CN212409631U (en)

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Application Number Priority Date Filing Date Title
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114812457A (en) * 2022-06-28 2022-07-29 太原理工大学 Light path alignment self-adjusting laser ultrasonic metal composite plate thickness measuring device and method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114812457A (en) * 2022-06-28 2022-07-29 太原理工大学 Light path alignment self-adjusting laser ultrasonic metal composite plate thickness measuring device and method

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