CN212311826U - A adsorb platform for test of big dipper navigation chip - Google Patents
A adsorb platform for test of big dipper navigation chip Download PDFInfo
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- CN212311826U CN212311826U CN202020858215.8U CN202020858215U CN212311826U CN 212311826 U CN212311826 U CN 212311826U CN 202020858215 U CN202020858215 U CN 202020858215U CN 212311826 U CN212311826 U CN 212311826U
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Abstract
The utility model provides an adsorption platform for testing a Beidou navigation chip, which comprises a base and an adsorption seat; the base is of a double-layer structure, and the top of the base is provided with a sliding hole; the adsorption seats are arranged in the base, and the fixed limiting blocks and the movable limiting blocks are positioned at the top of the adsorption seats; the linkage push plate is positioned at the top of the rear end of the base, the bottom of the linkage push plate is provided with a screw hole, the bottom of the linkage push plate is connected with the adjusting bolt, and the top of the linkage push plate is connected with the movable limiting block; the five-way pipe is arranged in the front end of the base and is communicated with the vacuum pump through a pipeline; the utility model discloses can be according to the specification of the big dipper navigation chip of testing, carry out the slip adjustment to the stopper that adsorbs seat top activity, make the big dipper navigation core periphery laminate mutually with fixed stopper and activity stopper respectively to realize spacing operation to the big dipper navigation chip through fixed stopper and activity stopper, further ensure the stability of big dipper navigation chip test.
Description
Technical Field
The utility model belongs to the technical field of the chip test, more specifically say, in particular to an adsorb platform for big dipper navigation chip test.
Background
In the big dipper navigation chip manufacture process, for the different adverse circumstances of guarantee uses needs, need carry out high, low temperature test to the big dipper navigation chip usually, for this, the absorption platform that needs use the chip test adsorbs fixedly to the big dipper navigation chip, guarantee test procedure's stability.
The adsorption platform of chip test can refer to CN210347687U patent, and it mainly includes adsorbs the platform body, the one end of adsorbing the platform body transversely is provided with heating rod mounting hole and thermocouple mounting hole, and the preceding lateral wall that adsorbs the platform body is provided with the gas circuit groove, and the other end that adsorbs the platform body is provided with the suction channel who is connected and is connected with the vacuum pump and is ventilated the gas circuit groove, and the front side that adsorbs the platform body still is provided with closing cap gas circuit groove and liftable baffle of adjusting, the vertical vacuum pump suction hole that is provided with a plurality of and gas circuit groove intercommunication and is used for adsorbing the chip along horizontal interval between baffle and the adsorption platform body.
The adsorption platform of current similar chip test is when using, and the single can only adsorb fixed operation to an independent big dipper navigation chip, and is slower to big dipper navigation chip efficiency of software testing, comparatively influences big dipper navigation chip test progress to spacing effect to the big dipper navigation chip is relatively poor, relies on suction to fix big dipper navigation chip alone, leads to big dipper navigation chip actuation position to take place to become flexible easily, and then influences the stability of big dipper navigation chip test process.
SUMMERY OF THE UTILITY MODEL
In order to solve the technical problem, the utility model provides an adsorb platform for test of beidou navigation chip, adsorb the platform when using with the absorption platform that solves current similar chip test, the single can only adsorb fixed operation to a beidou navigation chip alone, it is slower to beidou navigation chip efficiency of software testing, comparatively influence beidou navigation chip test progress, and spacing effect to the beidou navigation chip is relatively poor, it fixes the beidou navigation chip to rely on suction alone, it is not hard up to lead to beidou navigation chip actuation position to take place easily, and then influence the problem of the stability of beidou navigation chip test process.
The utility model is used for the purpose and the efficiency of the absorption platform of big dipper navigation chip test are reached by following concrete technological means:
an adsorption platform for testing a Beidou navigation chip comprises a base, an adsorption seat, a linkage push plate and a five-way pipe; the base is of a double-layer structure, and the top of the base is provided with a sliding hole; the adsorption seats are arranged in the base, and the fixed limiting blocks and the movable limiting blocks are positioned at the top of the adsorption seats; the linkage push plate is positioned at the top of the rear end of the base, the bottom of the linkage push plate is provided with a screw hole, the bottom of the linkage push plate is connected with the adjusting bolt, and the top of the linkage push plate is connected with the movable limiting block; the five-way pipe is arranged inside the front end of the base and communicated with the vacuum pump through a pipeline.
Furthermore, a plurality of adsorption holes are formed in the top of the adsorption seat, an adsorption cavity is formed in the adsorption seat, the bottom of the adsorption hole is communicated with the adsorption cavity, and an exhaust port is formed in the outer side of the adsorption cavity.
Furthermore, four assembly ports are formed in the top of the base, the adsorption seats are respectively installed in the assembly ports in the top of the base, the five-way pipes are respectively communicated with exhaust ports formed in the bottoms of the four adsorption seats, and the adsorption seats are communicated with the vacuum pump through the five-way pipes.
Further, adsorb a fixed stopper is installed to seat top terminal surface front end, adsorbs seat top terminal surface rear end and has seted up three direction spouts, and the activity stopper is located adsorbs seat top terminal surface rear end, and activity stopper bottom is equipped with three sliders, and activity stopper bottom slider sliding connection is in adsorbing seat top direction spout.
Furthermore, the bottom of the linkage push plate slides in a slide hole formed in the top of the base, and the top of the linkage push plate is fixedly connected with four movable limiting blocks through screws respectively; the adjusting bolt rotates inside the rear end of the base, and is in threaded connection with the screw hole in the bottom of the linkage push plate.
Compared with the prior art, the utility model discloses following beneficial effect has:
1. the arrangement of the adsorption seat is beneficial to sucking external air into the adsorption cavity through the adsorption hole when the Beidou navigation chip is horizontally placed on the top end face of the adsorption seat and air in the adsorption cavity is pumped into the vacuum pump, the Beidou navigation chip is attached to the top end face of the adsorption seat under the influence of the suction force at the adsorption hole part, the Beidou navigation chip is adsorbed and fixed, and the test stability of the Beidou navigation chip is guaranteed; and the use of cooperation five-way pipe, accessible five-way pipe is synchronous to adsorb the air that the seat is inside adsorbs the intracavity all around and is extracted, realizes adsorbing seat top big dipper navigation chip to all around and adsorbs fixed operation in step to the personnel test four places big dipper navigation chips in proper order, promote big dipper navigation chip efficiency of software testing.
2. The arrangement of the fixed limiting block and the movable limiting block is favorable for performing sliding adjustment on the movable limiting block at the top of the adsorption seat according to the specification of the tested Beidou navigation chip, so that the periphery of the Beidou navigation chip is respectively attached to the inner walls of the fixed limiting block and the movable limiting block, thereby realizing limiting operation on the Beidou navigation chip through the fixed limiting block and the movable limiting block and further ensuring the testing stability of the Beidou navigation chip; and the use of cooperation linkage push pedal and adjusting bolt, the accessible rotates adjusting bolt and drives the linkage push pedal at base top back-and-forth movement to drive through the linkage push pedal and adsorb seat top activity stopper synchronous motion around, the guarantee adsorbs the spacing effect of seat top big dipper navigation chip.
Drawings
Fig. 1 is a schematic front side axial view structure of the present invention.
Fig. 2 is a schematic diagram of a rear axial view structure of the present invention.
Fig. 3 is a schematic view of the base and the adsorption seat of the present invention.
Fig. 4 is an axial view structure diagram of the adsorption seat of the present invention.
Fig. 5 is a schematic view of the sectional and splitting structure of the adsorption seat and the movable limiting block.
In the drawings, the corresponding relationship between the component names and the reference numbers is as follows:
1. a base; 101. an assembly port; 102. a slide hole; 2. an adsorption seat; 201. an adsorption hole; 202. a guide chute; 203. an adsorption chamber; 204. an exhaust port; 3. fixing a limiting block; 4. a movable limiting block; 401. a slider; 5. a linkage push plate; 501. a screw hole; 6. adjusting the bolt; 7. a five-way pipe.
Detailed Description
The following describes embodiments of the present invention in further detail with reference to the accompanying drawings and examples. The following examples are intended to illustrate the invention, but are not intended to limit the scope of the invention.
In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "connected" and "connected" are to be interpreted broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; may be directly connected or indirectly connected through an intermediate. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Example (b):
as shown in figures 1 to 5:
the utility model provides an adsorption platform for testing a Beidou navigation chip, which comprises a base 1, an adsorption seat 2, a linkage push plate 5 and a five-way pipe 7; the base 1 is of a double-layer structure, and the top of the base 1 is provided with a sliding hole 102; the adsorption base 2 is arranged inside the base 1, and the fixed limiting block 3 and the movable limiting block 4 are both positioned at the top of the adsorption base 2; the linkage push plate 5 is positioned at the top of the rear end of the base 1, the bottom of the linkage push plate 5 is provided with a screw hole 501, the bottom of the linkage push plate 5 is connected with an adjusting bolt 6, and the top of the linkage push plate 5 is connected with a movable limiting block 4; the bottom of the linkage push plate 5 slides in a slide hole 102 formed in the top of the base 1, and the top of the linkage push plate 5 is fixedly connected with four movable limiting blocks 4 through screws respectively; the adjusting bolt 6 rotates inside the rear end of the base 1, the adjusting bolt 6 is in threaded connection with a screw hole 501 in the bottom of the linkage push plate 5, the linkage push plate 5 can be driven to move back and forth on the top of the base 1 by rotating the adjusting bolt 6, and therefore the linkage push plate 5 drives movable limiting blocks 4 on the tops of the four adsorption seats 2 to move back and forth synchronously, and the limiting effect of a Beidou navigation chip on the top of the adsorption seat 2 is guaranteed; the five-way pipe 7 is arranged inside the front end of the base 1, and the five-way pipe 7 is communicated with the vacuum pump through a pipeline.
Wherein, the top of the adsorption seat 2 is provided with a plurality of adsorption holes 201, the inside of the adsorption seat 2 is provided with an adsorption cavity 203, the bottom of the adsorption hole 201 is communicated with the adsorption cavity 203, and the outer side of the adsorption cavity 203 is provided with an exhaust port 204; concrete effect, when big dipper navigation chip is kept flat on adsorbing 2 top end faces of seat, adsorb the chamber 203 inside air pump when sending to the vacuum pump in, outside air passes through to adsorb in the hole 201 inhales adsorbs the chamber 203, and big dipper navigation chip receives the influence laminating of adsorbing 201 position suction on adsorbing 2 top end faces of seat, adsorbs fixedly big dipper navigation chip, ensures the stability of big dipper navigation chip test.
Wherein, the top of the base 1 is provided with four assembly ports 101, the adsorption seats 2 are respectively arranged in the assembly ports 101 at the top of the base 1, the five-way pipes 7 are respectively communicated with exhaust ports 204 arranged at the bottoms of the four adsorption seats 2, and the adsorption seats 2 are communicated with the vacuum pump through the five-way pipes 7; concrete effect, the air that adsorbs in the 2 inside absorption chambeies 203 of seat is adsorbed to the everywhere in the synchronization of accessible five-way pipe 7, realizes adsorbing 2 top big dipper navigation chips of seat and adsorbing fixed operation in step to everywhere to the personnel test big dipper navigation chips everywhere in proper order, promotes big dipper navigation chip efficiency of software testing.
Wherein, the front end of the top end face of the adsorption seat 2 is provided with a fixed limiting block 3, the rear end of the top end face of the adsorption seat 2 is provided with three guide chutes 202, the movable limiting block 4 is positioned at the rear end of the top end face of the adsorption seat 2, the bottom of the movable limiting block 4 is provided with three sliding blocks 401, and the sliding blocks 401 at the bottom of the movable limiting block 4 are slidably connected in the guide chutes 202 at the top of the adsorption seat 2; the concrete effect can be according to the specification of the big dipper navigation chip of testing, carries out slide adjusting to 2 top activity stoppers 4 of adsorption seat, makes the big dipper navigation core periphery laminate with fixed stopper 3 and 4 inner walls of activity stopper mutually respectively to realize spacing operation to the big dipper navigation chip through fixed stopper 3 and activity stopper 4, further ensure the stability of big dipper navigation chip test.
The specific use mode and function of the embodiment are as follows:
when the utility model is used, the worker can slide and adjust the movable limiting block 4 at the top of the adsorption seat 2 according to the specification of the tested Beidou navigation chip, so that the distance between the movable limiting block 4 and the fixed limiting block 3 meets the limiting requirement of the Beidou navigation chip; next, a Beidou navigation chip of a worker is flatly placed on the top end face of the adsorption seat 2, so that the periphery of the Beidou navigation chip is respectively attached to the inner walls of the fixed limiting block 3 and the movable limiting block 4, a vacuum pump extracts air in an adsorption cavity 203 inside the adsorption seat 2 to the outside through a five-way pipe 7, outside air is sucked into the adsorption cavity 203 through an adsorption hole 201, and the Beidou navigation chip is attached to the top end face of the adsorption seat 2 under the influence of the suction force of the adsorption hole 201 to adsorb and fix the Beidou navigation chip; the staff can be in proper order to adsorb the fixed four beidou navigation chip of back to 2 tops of absorption seat and test the operation.
The embodiments of the present invention have been presented for purposes of illustration and description, and are not intended to be exhaustive or limited to the invention in the form disclosed. Many modifications and variations will be apparent to those of ordinary skill in the art. The embodiment was chosen and described in order to best explain the principles of the invention and the practical application, and to enable others of ordinary skill in the art to understand the invention for various embodiments with various modifications as are suited to the particular use contemplated.
Claims (5)
1. The utility model provides an adsorb platform for test of big dipper navigation chip which characterized in that: comprises a base (1), an adsorption seat (2), a linkage push plate (5) and a five-way pipe (7); the base (1) is of a double-layer structure, and the top of the base (1) is provided with a sliding hole (102); the adsorption seats (2) are arranged inside the base (1), and the fixed limiting blocks (3) and the movable limiting blocks (4) are both positioned at the top of the adsorption seats (2); the linkage push plate (5) is positioned at the top of the rear end of the base (1), a screw hole (501) is formed in the bottom of the linkage push plate (5), the bottom of the linkage push plate (5) is connected with an adjusting bolt (6), and the top of the linkage push plate (5) is connected with the movable limiting block (4); the five-way pipe (7) is arranged inside the front end of the base (1), and the five-way pipe (7) is communicated with the vacuum pump through a pipeline.
2. The adsorption platform for testing the Beidou navigation chip as set forth in claim 1, characterized in that: the top of the adsorption seat (2) is provided with a plurality of adsorption holes (201), the adsorption seat (2) is internally provided with an adsorption cavity (203), the bottom of each adsorption hole (201) is communicated with the adsorption cavity (203), and the outer side of the adsorption cavity (203) is provided with an exhaust port (204).
3. The adsorption platform for testing the Beidou navigation chip as set forth in claim 1, characterized in that: four assembling ports (101) are formed in the top of the base (1), the adsorption seats (2) are respectively installed in the assembling ports (101) in the top of the base (1), the five-way pipes (7) are respectively communicated with exhaust ports (204) formed in the bottoms of the four adsorption seats (2), and the adsorption seats (2) are communicated with a vacuum pump through the five-way pipes (7).
4. The adsorption platform for testing the Beidou navigation chip as set forth in claim 1, characterized in that: adsorb seat (2) top end face front end and install a fixed stopper (3), adsorb seat (2) top end face rear end and seted up three direction spout (202), and activity stopper (4) are located and adsorb seat (2) top end face rear end, and activity stopper (4) bottom is equipped with three slider (401), and activity stopper (4) bottom slider (401) sliding connection is in adsorbing seat (2) top direction spout (202).
5. The adsorption platform for testing the Beidou navigation chip as set forth in claim 1, characterized in that: the bottom of the linkage push plate (5) slides in a sliding hole (102) formed in the top of the base (1), and the top of the linkage push plate (5) is fixedly connected with four movable limiting blocks (4) through screws respectively; adjusting bolt (6) rotate inside base (1) rear end, and adjusting bolt (6) threaded connection is in linkage push pedal (5) bottom screw (501).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020858215.8U CN212311826U (en) | 2020-05-21 | 2020-05-21 | A adsorb platform for test of big dipper navigation chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020858215.8U CN212311826U (en) | 2020-05-21 | 2020-05-21 | A adsorb platform for test of big dipper navigation chip |
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| CN212311826U true CN212311826U (en) | 2021-01-08 |
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| CN202020858215.8U Active CN212311826U (en) | 2020-05-21 | 2020-05-21 | A adsorb platform for test of big dipper navigation chip |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113305759A (en) * | 2021-06-11 | 2021-08-27 | 常州机电职业技术学院 | Adjustable chip fixing jig for chip processing equipment |
| CN113386062A (en) * | 2021-06-11 | 2021-09-14 | 盐城工学院 | Electrochemistry test fixture |
| CN113567827A (en) * | 2021-09-26 | 2021-10-29 | 山东元捷电子科技有限公司 | Electrical performance test tool for semiconductor device |
-
2020
- 2020-05-21 CN CN202020858215.8U patent/CN212311826U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113305759A (en) * | 2021-06-11 | 2021-08-27 | 常州机电职业技术学院 | Adjustable chip fixing jig for chip processing equipment |
| CN113386062A (en) * | 2021-06-11 | 2021-09-14 | 盐城工学院 | Electrochemistry test fixture |
| CN113567827A (en) * | 2021-09-26 | 2021-10-29 | 山东元捷电子科技有限公司 | Electrical performance test tool for semiconductor device |
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