CN212255570U - Open type board card test platform - Google Patents
Open type board card test platform Download PDFInfo
- Publication number
- CN212255570U CN212255570U CN202020065912.8U CN202020065912U CN212255570U CN 212255570 U CN212255570 U CN 212255570U CN 202020065912 U CN202020065912 U CN 202020065912U CN 212255570 U CN212255570 U CN 212255570U
- Authority
- CN
- China
- Prior art keywords
- test
- board card
- vpx
- board
- open
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 99
- 230000017525 heat dissipation Effects 0.000 claims description 11
- 230000005540 biological transmission Effects 0.000 claims description 4
- 238000004519 manufacturing process Methods 0.000 abstract description 4
- 238000001816 cooling Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000009423 ventilation Methods 0.000 description 1
Images
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
The utility model discloses an open integrated circuit board test platform, include: the test kit comprises at least one group of test systems, wherein each group of test systems comprises a 3U VPX board card slot and two 6U VPX board card slots; the integrated interface is uniformly provided with a plurality of interfaces; the power supply module supplies power to all the power utilization components. The open type board card test platform can test a plurality of 6U VPX board cards and 3U VPX board cards at the same time, so that the working efficiency is improved, the production cost is reduced, and the application range is expanded; all the interfaces are integrated on an interface board and led out through a cable, so that the condition that the external cable interferes the test result due to poor contact when a vibration test is carried out is avoided. The whole operation is simple and convenient, and the reliability and stability of the test work are ensured.
Description
Technical Field
The utility model belongs to the technical field of the test of VPX integrated circuit board and specifically relates to an open integrated circuit board test platform is related to.
Background
The VPX bus, as a new generation of industrial bus standard, is a natural evolution of VME technology, which uses high-speed serial bus instead of parallel bus and the latest connector technology, divided into two versions of 3U and 6U size. Compared with the similar bus, the bus has great advantages in the aspects of data transmission bandwidth and structural performance, and is more suitable for the requirements of various functions, complex operation, large data volume and high-speed real-time processing. Can be widely applied to the fields of aviation, aerospace, radar, submarine exploration, communication and the like.
In order to meet the requirement on the reliability of a VPX board card in numerous fields, a VPX test platform is important, the conventional VPX test platform cannot ensure the simplicity and effectiveness of the test, and only one VPX board card which can be tested by the conventional test platform at a time needs to be tested, a 3U test board and a 3U test structure are needed when a 3U board card is tested, and a 6U test board card and a 6U structure are needed when a 6U board card is tested; and the test cables that need connect during the test are numerous, have the external cable and lead to the condition of disturbing the test result because of contact failure when doing the vibration test.
SUMMERY OF THE UTILITY MODEL
The utility model discloses aim at solving one of the technical problem that exists among the prior art at least. Therefore, the utility model provides an open integrated circuit board test platform, test platform can test a plurality of 6U VPX integrated circuit boards and 3U VPX integrated circuit boards simultaneously, has improved work efficiency, has reduced manufacturing cost, has enlarged application range.
According to the utility model discloses open integrated circuit board test platform, include:
the test system comprises a test kit, wherein the test kit is provided with at least one group of test systems, each group of test systems comprises a 3U VPX board card slot for clamping a 3U VPX board card and two 6U VPX board card slots for clamping 6U VPX board cards, and one 3U VPX board card slot is electrically connected with the two 6U VPX board card slots;
the integrated interface board is provided with a plurality of interfaces for connecting data transmission lines, and each interface is electrically connected with the 3U VPX board card;
and the power supply module is used for providing a power supply for the test system.
According to the utility model discloses open integrated circuit board test platform has following beneficial effect at least: the test platform can test the 6U VPX board card and the 3U VPX board card simultaneously, improves the working efficiency, reduces the production cost and enlarges the application range.
According to some embodiments of the utility model, open integrated circuit board test platform contains two sets of test systems.
According to the utility model discloses a some embodiments, in two sets of test system, two 3U VPX integrated circuit board slot locates side by side the tester vanning bottom, four two liang of corresponding of 6U VPX integrated circuit board slot establishes in the both sides of tester vanning, just inside one side of tester vanning is equipped with and is used for 3U VPX integrated circuit board slot with 6U VPX integrated circuit board slot carries out electric connection's bottom plate.
According to some embodiments of the utility model, integrated interface board establishes on the terminal surface of 3U VPX integrated circuit board, integrated interface board's interface includes RS232 standard serial ports, giga ethernet mouth, singlechip JTAG download mouth and power source.
According to the utility model discloses a some embodiments, open integrated circuit board test platform still contains cooling system to an electrical part for testing the frock incasement dispels the heat.
According to the utility model discloses a some embodiments, cooling system includes radiator fan and the air vent of setting in test fixture case one side, radiator fan's air outlet is towards the air vent in order to be used for to test fixture incasement air supply.
According to some embodiments of the utility model, radiator fan with the connection can be dismantled to the test fixture case.
According to some embodiments of the utility model, the test frock is in the opposite side that radiator fan is relative is equipped with the ventilation hole.
According to some embodiments of the utility model, power module is a direct current power supply and relevant cable, provides +12V operating voltage.
Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
The above and/or additional aspects and advantages of the present invention will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:
fig. 1 is a schematic structural diagram of an open board card test platform according to an embodiment of the present invention.
Fig. 2 is a signal transmission schematic diagram of the open board card test platform according to the embodiment of the present invention.
Reference numerals:
Detailed Description
The following describes in detail embodiments of the present invention, examples of which are illustrated in the accompanying drawings. The embodiments described below with reference to the drawings are exemplary only for the purpose of explaining the present invention, and should not be construed as limiting the present invention.
In the description of the present invention, it should be understood that the orientation or positional relationship referred to in the description of the orientation, such as the top, bottom, left, right, etc., is the orientation or positional relationship shown on the drawings, and is only for convenience of description and simplification of description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore, should not be construed as limiting the present invention.
In the description of the present invention, unless there is an explicit limitation, the words such as setting, installation, connection, etc. should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above words in combination with the specific contents of the technical solution.
An open board test platform according to an embodiment of the present invention is described below with reference to fig. 1 and 2.
According to the utility model discloses open integrated circuit board test platform, include:
the test equipment box 100 is provided with at least one group of test systems, each group of test systems comprises a 3U VPX board card slot 110 for clamping a 3U VPX board card 130 and two 6U VPX board card slots 120 for clamping 6U VPX board cards 140, and one 3U VPX board card slot 110 is electrically connected with the two 6U VPX board card slots 120;
the integrated interface board 200 is provided with a plurality of interfaces for connecting data transmission lines, and each interface is electrically connected with the 3U VPX board card 130;
and a power supply module (not shown in fig. 1) for supplying power to the test system.
In some embodiments of the present invention, the structure of the open board card testing platform is as shown in fig. 1, including: the test kit 100 includes two sets of test systems, two of the 3U VPX board slots 110 are disposed side by side at the bottom of the test kit, four of the 6U VPX board slots 120 are vertically disposed at the upper portion of the 3U VPX board slots 110, and one side of the test kit is open to insert the 3U VPX boards 130 and the 6U VPX boards 140, and the other opposite side of the inside thereof is provided with a bottom plate (not shown in fig. 1) for electrically connecting the 3U VPX board slots 110 and the 6U VPX board slots 120. In addition, the 3U VPX board 130 and the 6U VPX board 140 are fixed in the 3U VPX board slot 110 and the 6U VPX board slot 120, respectively, by locking bars.
The open type board card test platform comprises two groups of test systems, and can simultaneously test 4 6U VPX board cards and 2 3U VPX board cards, so that the working efficiency is improved, the production cost is reduced, and the application range is expanded.
The integrated interface board 200 is arranged on the end face of the 3U VPX board 130, the integrated interface board 200 is connected with the 3U VPX board 130, wherein on the integrated interface board 200, an RS232 standard serial port, a gigabit Ethernet port, a single chip JTAG download port and a power supply port are arranged side by side, all the ports are integrated on one interface board and led out through a debugging cable, on one hand, the wiring difficulty is reduced, on the other hand, a plurality of testing cables need to be connected during testing, and therefore the condition that an external cable interferes with a testing result due to poor contact during vibration testing is avoided.
In some embodiments of the present invention, as shown in fig. 1, the open board card testing platform further includes a heat dissipation system for dissipating heat from the electric device in the testing tool box. The heat dissipation system includes a heat dissipation fan 300 and an air vent disposed on one side of the test tool box 100, and an air outlet of the heat dissipation fan 300 faces the air vent to supply air into the test tool box 100. Wherein, the cooling fan 300 is detachably connected to the test case 100 by bolts. Due to the design, the cleaning, the maintenance and the like of the cooling fan 300 are more convenient and quick, and the cooling effect during testing is also ensured.
In addition, the test tool box 100 is provided with a vent hole at the other side opposite to the cooling fan 300. In some cases, the heat dissipation can be assisted, and the application range is enlarged.
In addition, the power supply module is a direct current power supply and related cables, as shown in fig. 2, the direct current power supply provides +12V working voltage to the electric device of the open board card test platform and the external test computer through the related cables.
In the description herein, references to the description of the term "one embodiment," "some embodiments," "an illustrative embodiment," "an example," "a specific example," or "some examples" or the like mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
While embodiments of the present invention have been shown and described, it will be understood by those of ordinary skill in the art that: various changes, modifications, substitutions and alterations can be made to the embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the claims and their equivalents.
Claims (9)
1. An open board card test platform, comprising:
the test system comprises a test kit, wherein the test kit is provided with at least one group of test systems, each group of test systems comprises a 3U VPX board card slot for clamping a 3U VPX board card and two 6U VPX board card slots for clamping 6U VPX board cards, and one 3U VPX board card slot is electrically connected with the two 6U VPX board card slots;
the integrated interface board is provided with a plurality of interfaces for connecting data transmission lines, and each interface is electrically connected with the 3U VPX board card;
and the power supply module is used for providing a power supply for the test system.
2. The open board test platform of claim 1, wherein the open board test platform comprises two sets of test systems.
3. The open board card testing platform of claim 2, wherein in the two testing systems, two of the 3U VPX board card slots are arranged at the bottom of the tester box side by side, four of the 6U VPX board card slots are arranged at two sides of the tester box in a pairwise correspondence manner, and a bottom plate for electrically connecting the 3U VPX board card slots with the 6U VPX board card slots is arranged at one side inside the tester box.
4. The open board card test platform of claim 1, wherein the integrated interface board is disposed on an end surface of the 3U VPX board card, and the interface of the integrated interface board includes an RS232 standard serial port, a gigabit ethernet port, a single chip JTAG download port, and a power interface.
5. The open board test platform of claim 1, further comprising a heat dissipation system for dissipating heat from an electrical device in the test fixture box.
6. The open board card test platform of claim 5, wherein the heat dissipation system comprises a heat dissipation fan and an air vent arranged on one side of the test fixture box, and an air outlet of the heat dissipation fan faces the air vent to supply air into the test fixture box.
7. The open board card test platform of claim 6, wherein the heat dissipation fan is detachably connected to the test tool box through bolts.
8. The open board card test platform of claim 6, wherein the test kit is provided with vent holes on the opposite side of the heat dissipation fan.
9. The open board card test platform of any one of claims 1 to 8, wherein the power supply module is a dc power supply and associated cables providing +12V operating voltage.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020065912.8U CN212255570U (en) | 2020-01-13 | 2020-01-13 | Open type board card test platform |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020065912.8U CN212255570U (en) | 2020-01-13 | 2020-01-13 | Open type board card test platform |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN212255570U true CN212255570U (en) | 2020-12-29 |
Family
ID=73989975
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202020065912.8U Active CN212255570U (en) | 2020-01-13 | 2020-01-13 | Open type board card test platform |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN212255570U (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113259205A (en) * | 2021-07-01 | 2021-08-13 | 湖南博匠信息科技有限公司 | Method and system for testing internal interconnection interface of multi-board system |
| CN114325321A (en) * | 2021-12-28 | 2022-04-12 | 保定飞凌嵌入式技术有限公司 | Embedded board card set testing tool and method based on power integration |
| WO2023027789A1 (en) * | 2021-08-26 | 2023-03-02 | Western Digital Technologies, Inc. | Testing apparatus for data storage devices |
| US20230060664A1 (en) | 2021-08-26 | 2023-03-02 | Western Digital Technologies, Inc. | Testing apparatus for temperature testing of electronic devices |
| CN113326218B (en) * | 2021-05-18 | 2023-08-18 | 中国科学院计算技术研究所 | Communication and debugging equipment circuit and embedded intelligent computing system using same |
-
2020
- 2020-01-13 CN CN202020065912.8U patent/CN212255570U/en active Active
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113326218B (en) * | 2021-05-18 | 2023-08-18 | 中国科学院计算技术研究所 | Communication and debugging equipment circuit and embedded intelligent computing system using same |
| CN113259205A (en) * | 2021-07-01 | 2021-08-13 | 湖南博匠信息科技有限公司 | Method and system for testing internal interconnection interface of multi-board system |
| CN113259205B (en) * | 2021-07-01 | 2021-12-03 | 湖南博匠信息科技有限公司 | Method and system for testing internal interconnection interface of multi-board system |
| WO2023027789A1 (en) * | 2021-08-26 | 2023-03-02 | Western Digital Technologies, Inc. | Testing apparatus for data storage devices |
| US20230060664A1 (en) | 2021-08-26 | 2023-03-02 | Western Digital Technologies, Inc. | Testing apparatus for temperature testing of electronic devices |
| US11698408B2 (en) | 2021-08-26 | 2023-07-11 | Western Digital Technologies, Inc. | Testing apparatus for data storage devices |
| US11828793B2 (en) | 2021-08-26 | 2023-11-28 | Western Digital Technologies, Inc. | Testing apparatus for temperature testing of electronic devices |
| CN114325321A (en) * | 2021-12-28 | 2022-04-12 | 保定飞凌嵌入式技术有限公司 | Embedded board card set testing tool and method based on power integration |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN212255570U (en) | Open type board card test platform | |
| CN107046198B (en) | That supports hot plug outputs and inputs subsystem | |
| US7983039B1 (en) | Reversible airflow fan tray design for electronic device in a data center | |
| US6947287B1 (en) | Universal modular power supply carrier | |
| CN103139106B (en) | Server rack system | |
| CN102478949B (en) | Server | |
| EP3806592A1 (en) | Circuit board combination and electronic device | |
| EP2830257B1 (en) | Atca backplane | |
| CN109951988A (en) | A kind of untethered connecting test platform of multistage | |
| CN106647963A (en) | Server | |
| CN211375494U (en) | Electronic computing device | |
| CN209895300U (en) | Power supply adapter plate applied to power supply of server | |
| CN103677152A (en) | Storage server and rack system thereof | |
| CN210605597U (en) | Electronic computing device | |
| CN111007924A (en) | Electronic computing device | |
| CN221040008U (en) | Hardware-in-loop testing device and testing system | |
| CN217739757U (en) | Centralized controller and unmanned ship | |
| CN110780718A (en) | Electronic computing device | |
| CN216751863U (en) | Image signal generator | |
| CN112788908A (en) | Interconnection structure for electronic device and assembling method thereof | |
| CN109936970A (en) | A kind of VPX cooling cabinet of integrated form multiplex roles interconnection | |
| CN217116643U (en) | Subway network control system | |
| CN217789551U (en) | Distributed frequency converter | |
| CN219352133U (en) | Power supply system of data center and data center | |
| CN213718459U (en) | CPCI board card |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |