CN212207579U

CN212207579U - IC electromagnetic compatibility testing device based on TEM cell

Info

Publication number: CN212207579U
Application number: CN202020331658.1U
Authority: CN
Inventors: 胡玉生; 范峻
Original assignee: Jimei University
Current assignee: Jimei University
Priority date: 2020-03-17
Filing date: 2020-03-17
Publication date: 2020-12-22
Anticipated expiration: 2030-03-17

Abstract

The utility model relates to a IC electromagnetic compatibility test field. The utility model discloses a IC electromagnetic compatibility testing arrangement based on TEM cell, including TEM cell, integrated circuit and the PCB board that is surveyed, the same order of magnitude of size of TEM cell and integrated circuit, TEM cell's bottom is equipped with an opening, open-ended size slightly is greater than integrated circuit's size, integrated circuit installs on the PCB board, integrated circuit is equipped with ground conductor and bottom ground conductor around and on the PCB board of bottom respectively around and, TEM cell establishes on integrated circuit through the opening cover of its bottom, and TEM cell's bottom and ground conductor in close contact with around form complete shielding. The utility model discloses expanded test frequency, need not to design special test PCB board, convenient operation can carry out on-line measuring.

Description

IC electromagnetic compatibility testing device based on TEM cell

Technical Field

The utility model belongs to IC (integrated circuit) electromagnetic compatibility test field specifically relates to an IC electromagnetic compatibility testing arrangement based on TEM cell.

Background

Electromagnetic compatibility (EMC) is an important technical measure for the performance of integrated circuits. Basic electromagnetic compatibility includes electromagnetic field radiation emission and electromagnetic field immunity. With the rapid development of integrated circuits toward high integration level, high density, miniaturization and low voltage, the electromagnetic disturbance of the integrated circuits and the anti-interference problem thereof become increasingly prominent. An important step in the design of an integrated circuit is to specify its electromagnetic compatibility characteristics and to propose an appropriate control strategy. Accurate and fast testing of the electromagnetic compatibility of an IC is a very important technology.

The TEM (transverse electromagnetic wave) cell can not only test the radiation emission of the integrated circuit, but also test the immunity of the integrated circuit, and the TEM cell is convenient to use and low in test cost, so that the TEM cell is very widely applied. Radiation emission testing of integrated circuits using TEM cells is recommended in the IEC61967-2 standard. The integrated circuit radiation immunity test system based on TEM cells is recommended in the IEC62132-4 standard. In the IC electromagnetic compatibility test, the test frequency of the TEM cell is usually 150 kHz-1 GHz, and a GTEM (gigahertz transverse electromagnetic wave) cell can be adopted when the test frequency is higher than 1 GHz. GTEM cells have higher operating frequencies but are more expensive to manufacture and have less field uniformity than TEM cells.

The TEM cell is a closed rectangular strip line, and two ends of the TEM cell are in a wedge-shaped structure. The method of evaluating IC radiation emission using TEM cells is described in the IEC61967-2 standard. The IC is mounted in the middle of a 10cm by 10cm PCB. The PCB (printed Circuit Board) is fixed to the wall of the TEM cell with the IC facing the cell. One 50 Ω port of the TEM cell is terminated by a 50 Ω load and the other 50 Ω port is connected to the input port of a spectrum analyzer or receiver to test the radiated radio frequency voltage that the IC is coupled to the TEM cell core.

The available test frequency of a TEM cell is limited by the TEM cell bandwidth. In addition to transmitting the TEM modes in a TEM cell, TE and TM modes can also propagate at frequencies above the cutoff frequency. The bandwidth of the TEM cell is limited by the resonance of the higher order modes, the frequency of which is related to the size of the TEM cell. The upper operating frequency of the TEM cell recommended in the IEC standard is 1 GHz. With the improvement of the working frequency and the working speed of the IC, the frequency of the electromagnetic compatibility test of the IC is required to reach 5GHz, even more than 10GHz, and the existing TEM cell test method cannot meet the high-frequency test requirement. The TEM cell requires a special PCB to be fabricated to accommodate and operate the IC during the emc testing, which greatly limits the type of devices under test, increases testing costs, and results in a delay in development time. In addition, the conventional TEM cell can only test the vertical polarization field, and cannot test the horizontal polarization field, so the application has certain limitations.

Disclosure of Invention

An object of the utility model is to provide a bandwidth is high, need not to design special test PCB board, can realize that on-line measuring's IC electromagnetic compatibility testing arrangement based on TEM cell is used for solving the above-mentioned technical problem who exists.

In order to achieve the above object, the utility model adopts the following technical scheme: the utility model provides a IC electromagnetic compatibility testing arrangement based on TEM cell, includes TEM cell, integrated circuit and the PCB board that is surveyed, the same order of magnitude of size of TEM cell and integrated circuit, the bottom of TEM cell is equipped with an opening, open-ended size slightly is greater than integrated circuit's size, integrated circuit installs on the PCB board, be equipped with ground conductor and bottom ground conductor around the integrated circuit respectively on the PCB board of integrated circuit's periphery and bottom, the TEM cell is established on integrated circuit through the opening cover of its bottom, and the bottom of TEM cell and the ground conductor in close contact with around form complete shielding.

Further, the TEM cell includes an outer conductor and a core inner conductor, the core inner conductor being switchable between a horizontal position parallel to the bottom of the TEM cell and a vertical position perpendicular to the bottom of the TEM cell.

Furthermore, a horizontal positioning block and a vertical positioning block are arranged in the TEM cell and are used for positioning the inner conductor of the core board at the horizontal position and the vertical position.

Furthermore, the horizontal positioning block and the vertical positioning block are both provided with a first fixing structure, the core board inner conductor is provided with a second fixing structure, and the core board inner conductor is fixed on the horizontal positioning block or the vertical positioning block through the matching connection of the second fixing structure and the first fixing structure.

Furthermore, the first fixing structure is a wedge-shaped groove or a wedge-shaped protrusion, and the second fixing structure is a wedge-shaped protrusion or a wedge-shaped groove.

Furthermore, the TEM cell further comprises a left radio frequency joint and a right radio frequency joint which are arranged at the left end and the right end of the TEM cell, and the core plate inner conductor is respectively and rotationally and electrically connected with the left radio frequency joint and the right radio frequency joint through the connecting sleeve, so that the core plate inner conductor can be rotationally switched between a horizontal position which is parallel to the bottom of the TEM cell and a vertical position which is vertical to the bottom of the TEM cell.

Further, still include the base, the base can be dismantled the bottom that sets up at the TEM cell, the base is equipped with the base opening, base open-ended size slightly is greater than integrated circuit's size, the TEM cell passes through the base opening cover and establishes on integrated circuit, and the bottom of base and the ground conductor in close contact with around form complete shielding.

Furthermore, the periphery of the opening of the base extends downwards to form a protruding part protruding out of the lower surface of the base.

Furthermore, when the periphery of the integrated circuit is provided with the wiring, an insulating layer is arranged between the peripheral grounding conductor and the PCB.

Furthermore, the insulating layer is made of insulating paper, and the surrounding grounding conductor is made of copper foil paper.

The utility model has the advantages of:

the utility model discloses a size of TEM cell reduces greatly to expanded the operating frequency of TEM cell, and need not to make special test PCB board, convenient operation, and can realize the on-line test to IC.

Furthermore, the utility model discloses not only can test vertical field component, can test horizontal field component moreover, remedy the not enough of current TEM cell test method.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.

Fig. 1 is a schematic structural diagram of a first embodiment of the present invention;

fig. 2 is a schematic structural diagram of another view angle according to the first embodiment of the present invention;

FIG. 3 is a structural diagram of a TEM cell according to a first embodiment of the present invention;

FIG. 4 is a partial cross-sectional view of a TEM cell according to a first embodiment of the present invention;

FIG. 5 is a cross-sectional view taken along line A-A of FIG. 4;

FIG. 6 is a partial cross-sectional view of a TEM cell from another perspective according to a first embodiment of the present invention;

fig. 7 is a structural diagram of a PCB and an IC according to a first embodiment of the present invention;

fig. 8 is a cross-sectional view of a PCB and an IC according to a first embodiment of the present invention;

fig. 9 is a bottom view of a TEM cell according to a second embodiment of the present invention;

FIG. 10 is a partial cross-sectional view of a TEM cell according to a second embodiment of the present invention;

FIG. 11 is a cross-sectional view taken along line A-A of FIG. 10;

fig. 12 is a partial structural view of a PCB according to a second embodiment of the present invention.

Detailed Description

To further illustrate the embodiments, the present invention provides the accompanying drawings. The accompanying drawings, which are incorporated in and constitute a part of this disclosure, illustrate embodiments of the invention and, together with the description, serve to explain the principles of the embodiments. With these references, one of ordinary skill in the art will appreciate other possible embodiments and advantages of the present invention. Elements in the figures are not drawn to scale and like reference numerals are generally used to indicate like elements.

The present invention will now be further described with reference to the accompanying drawings and detailed description.

As shown in fig. 1 to 8, an IC electromagnetic compatibility test apparatus based on a TEM cell includes a TEM cell 1, an Integrated Circuit (IC)3 to be tested and a PCB board 2, the size of the TEM cell 1 is of the same order of magnitude as the size of the integrated circuit 3, the bottom of the TEM cell 1 is provided with an opening 10, the size of the opening 10 is slightly larger than the size of the integrated circuit 3, and in this embodiment, each side of the opening 10 is about 3-5 mm away from the outer contour of the integrated circuit 3, but not limited thereto, the integrated circuit 3 is mounted on the PCB 2, the PCB 2 is provided with a peripheral ground conductor 21 and a bottom ground conductor 22 around and at the bottom of the integrated circuit 3, respectively, the TEM cell 1 is covered on the integrated circuit 3 through the opening 10 at the bottom thereof, and the bottom of the TEM cell 1 is in close contact with the surrounding ground conductor 22 and cooperates with the bottom ground conductor 22 to form a complete shield.

Specifically, the overall shape of TEM cell 1 is similar with current TEM cell, is the rectangle band structure in the middle of promptly, and both ends shrink gradually and are the wedge-shaped structure, and its difference with current TEM cell does the utility model discloses a same order of magnitude of size and integrated circuit 3 of TEM cell 1, the size reduces greatly to the operating frequency of TEM cell has been expanded, can allow to survey several GHz.

The TEM cell 1 comprises a left radio frequency connector 14, a right radio frequency connector 13, an outer conductor 11 and a core board inner conductor 12, wherein the left radio frequency connector 14 and the right radio frequency connector 13 are respectively arranged on the left and right ports of the TEM cell 1 and are respectively electrically connected with the core board inner conductor 12, and the specific structure can refer to the structure of the existing TEM cell, which is not described in detail.

Preferably, in this embodiment, the outer conductor 11 is assembled by the right transition section 112, the left transition section 113 and the main transmission section 111, and is easy to process and manufacture, but the invention is not limited thereto, and in other embodiments, the outer conductor 11 may be formed by an integral molding member.

In this embodiment, the right transition section 112, the left transition section 113 and the main transmission section 111 are assembled by the screws 114, and are detachable, simple to assemble and stable in structure, but not limited thereto, and in some embodiments, the right transition section 112, the left transition section 113 and the main transmission section 111 may also be fixedly connected by other conventional fixing methods, such as welding.

Preferably, in this embodiment, the core plate inner conductor 12 is switchable between a horizontal position parallel to the bottom of the TEM cell 1 (as shown in fig. 3 and 4) and a vertical position perpendicular to the bottom of the TEM cell 1.

Because the utility model discloses a TEM cell 1's size is very little, its survey result is the value in near field area, consequently, core inner conductor 12 rotates 90 degrees and carries out the near field measurement, it is little to the credibility influence of test result, the near field value accessible near far field transform of surveying obtains far field value, thereby core inner conductor 12 switches between the horizontal position (as shown in figure 3 and 4) that is on a parallel with TEM cell 1 bottom and the vertical position of perpendicular to TEM cell 1 bottom, not only can measure horizontal polarization's electric field component, also can measure vertical polarization's electric field component.

Specifically, in this embodiment, the left and right ends of the core board inner conductor 12 are respectively and rotationally and electrically connected to the left and right

radio frequency connectors

13 and 14 through the connecting sleeve 4, so that the core board inner conductor 12 can be rotationally switched between a horizontal position parallel to the bottom of the TEM cell 1 and a vertical position perpendicular to the bottom of the TEM cell 1.

In this embodiment, the left and right ends of the core board inner conductor 12 are respectively provided with a threaded hole, the inner ends of the inner conductors of the left and

right rf connectors

13 and 14 are respectively provided with an external thread, and the left and right ends of the core board inner conductor 12 are respectively screwed with the external thread of the inner end through the threaded hole to realize 90-degree rotation of the core board inner conductor 12, which is easy to realize and has a good connection effect, but not limited thereto.

Furthermore, a horizontal positioning block 15 and a vertical positioning block 16 are arranged in the TEM cell 1 and are used for positioning the core board inner conductor 12 at the horizontal position and the vertical position, so that the switching efficiency and accuracy of the core board inner conductor 12 between the horizontal position and the vertical position are improved.

Preferably, the horizontal positioning block 15 and the vertical positioning block 16 are both provided with first fixing

structures

151 and 161, the core board inner conductor 12 is provided with a second fixing structure 121, and the core board inner conductor 12 is respectively matched and connected with the first fixing

structures

151 and 161 through the second fixing structure 121 and is fixed on the horizontal positioning block or the vertical positioning block, so that the influence on the test effect caused by the position change of the core board inner conductor 12 in the test process is avoided.

Preferably, in this embodiment, the first fixing

structures

151 and 161 are wedge-shaped grooves, and the second fixing structures 121 are wedge-shaped protrusions, which are easy to fix and easy to operate, but in other embodiments, the first fixing

structures

151 and 161 may also be wedge-shaped protrusions or other fixing structures, and the second fixing structures 121 may also be wedge-shaped grooves or other fixing structures.

Since most of the integrated circuit 3 is square, in this embodiment, the opening 10 is also square, and is adapted to the shape of the integrated circuit 3, so that the structure is more compact and the processing is easy, but not limited thereto, and in other embodiments, the opening 10 may be other shapes, such as a circle.

The surrounding ground conductor 21 and the bottom ground conductor 22 are both connected to the ground plane of the PCB board 2, the PCB board 2 may be a single-layer board or a multi-layer board, for example, two inner layers are provided, which are a top layer, a power layer, a signal layer and a ground layer, respectively, and the surrounding ground conductor 21 and the bottom ground conductor 22 are connected to the ground layer by via holes.

In this embodiment, the pin of the integrated circuit 3 is routed through the via hole and routed to the inner layer, no wiring is arranged around the integrated circuit 3, the surrounding grounding conductor 21 is directly printed on the PCB 2, and the surrounding grounding conductor 21 has a square ring structure, but not limited thereto.

In the electromagnetic compatibility test, the TEM cell 1 is directly covered on the integrated circuit 3 to be tested through the opening 10, the bottom of the TEM cell 1 is in close contact with the surrounding ground conductor 22 and forms a complete shield in cooperation with the bottom ground conductor 22, and then the test can be performed, the test process is similar to that of the existing TEM cell, and reference is made to the prior art specifically, which is not described in detail. The special test PCB is not required to be manufactured, the operation is convenient, the on-line test of the integrated circuit 3 can be realized, and the accuracy is higher.

Example two

As shown in fig. 9 to 12, the difference between the present embodiment and the first embodiment is: the present embodiment further comprises a base 5, the base 5 is detachably disposed at the bottom of the TEM cell 1, the base 5 is provided with a base opening 51, the size of the base opening 51 is slightly larger than that of the integrated circuit 3, the base opening 51 is communicated with the opening 10 of the TEM cell 1, the TEM cell 1 is covered on the integrated circuit 3 through the base opening 51, and the bottom of the base 5 is in close contact with the surrounding ground conductor 22 to form a complete shield. Thus, by replacing the bases having the base openings 51 of different sizes, it is possible to adapt to the test of the integrated circuits 3 of different sizes, and to improve the applicability of the TEM cell 1, thereby reducing the cost.

Preferably, the outer periphery of the base opening 51 extends downward to form a protrusion 52 protruding from the lower surface of the base 5, the protrusion 52 is tightly fitted with the surrounding ground conductor 21 to form a complete shield, and by providing the protrusion 52, the base 5 is prevented from pressing against other electrical components of the PCB 3, thereby better realizing on-line measurement.

In this embodiment, the base 5 is fastened to the bottom of the TEM cell 1 by a countersunk screw 53, which is convenient for installation and disassembly, and has a stable structure and a good shielding effect, and of course, in other embodiments, the base 5 may be installed on the bottom of the TEM cell 1 by other detachable connection structures such as clamping connection.

The base opening 51 is preferably, but not limited to, a square configuration.

In this embodiment, the wiring is provided around the integrated circuit 3, which is not convenient for directly arranging the surrounding ground conductor 21, and therefore, the insulating layer 23 is provided between the surrounding ground conductor 21 and the PCB board 2, i.e. a layer of the insulating layer 23 is first laid on the PCB board 2 around the integrated circuit 3, and then the surrounding ground conductor 21 is laid on the insulating layer 23.

In this embodiment, the insulating layer 23 is made of insulating paper, and the peripheral ground conductor 21 is made of copper foil paper, which is easy to implement, but not limited thereto.

While the invention has been particularly shown and described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and detail may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.

Claims

1. An IC electromagnetic compatibility testing device based on a TEM cell is characterized in that: including TEM cell, integrated circuit and the PCB board that is surveyed, the same order of magnitude of size of TEM cell and integrated circuit, TEM cell's bottom is equipped with an opening, the open-ended size slightly is greater than integrated circuit's size, integrated circuit installs on the PCB board, be equipped with around ground conductor and bottom ground conductor on the PCB board of integrated circuit around and the bottom respectively, TEM cell establishes on integrated circuit through the opening cover of its bottom, and TEM cell's bottom and the ground conductor in close contact with around form complete shielding.

2. A TEM cell based IC electromagnetic compatibility test apparatus as claimed in claim 1 wherein: the TEM cell includes an outer conductor and a core inner conductor, the core inner conductor being switchable between a horizontal position parallel to a bottom of the TEM cell and a vertical position perpendicular to the bottom of the TEM cell.

3. A TEM cell based IC electromagnetic compatibility test apparatus as claimed in claim 2, wherein: and a horizontal positioning block and a vertical positioning block are arranged in the TEM cell and are used for positioning the inner conductor of the core plate at the horizontal position and the vertical position.

4. A TEM cell based IC electromagnetic compatibility test apparatus as claimed in claim 3, wherein: the horizontal positioning block and the vertical positioning block are respectively provided with a first fixing structure, the core board inner conductor is provided with a second fixing structure, and the core board inner conductor is fixed on the horizontal positioning block or the vertical positioning block through the matching connection of the second fixing structure and the first fixing structure.

5. A TEM cell-based IC electromagnetic compatibility test apparatus according to claim 4, wherein: the first fixing structure is a wedge-shaped groove or a wedge-shaped protrusion, and the second fixing structure is a wedge-shaped protrusion or a wedge-shaped groove.

6. A TEM cell based IC electromagnetic compatibility test apparatus as claimed in claim 2, wherein: the TEM cell also comprises a left radio frequency joint and a right radio frequency joint which are arranged at the left end and the right end of the TEM cell, and the core plate inner conductor is respectively and rotationally and electrically connected with the left radio frequency joint and the right radio frequency joint through the connecting sleeve, so that the core plate inner conductor can be rotationally switched between a horizontal position which is parallel to the bottom of the TEM cell and a vertical position which is vertical to the bottom of the TEM cell.

7. A TEM cell based IC electromagnetic compatibility test apparatus as claimed in claim 1 wherein: still include the base, the base can be dismantled the bottom that sets up at the TEM cell, the base is equipped with the base opening, base open-ended size slightly is greater than integrated circuit's size, the TEM cell passes through base opening cover to be established on integrated circuit, and the bottom of base and the ground conductor in close contact with around form complete shielding.

8. A TEM cell-based IC electromagnetic compatibility test apparatus according to claim 7, wherein: the periphery of the opening of the base extends downwards to form a protruding part protruding out of the lower surface of the base.

9. A TEM cell based IC electromagnetic compatibility test apparatus as claimed in claim 1 wherein: when the periphery of the integrated circuit is provided with the wiring, an insulating layer is arranged between the peripheral grounding conductor and the PCB.

10. A TEM cell based IC electromagnetic compatibility test apparatus as claimed in claim 9 wherein: the insulating layer is made of insulating paper, and the surrounding grounding conductor is made of copper foil paper.