CN212111637U - Test tool point inspection system of test strip detecting instrument - Google Patents
Test tool point inspection system of test strip detecting instrument Download PDFInfo
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- CN212111637U CN212111637U CN202020508101.0U CN202020508101U CN212111637U CN 212111637 U CN212111637 U CN 212111637U CN 202020508101 U CN202020508101 U CN 202020508101U CN 212111637 U CN212111637 U CN 212111637U
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Abstract
The utility model discloses a system is examined to examination strip detecting instrument's test fixture point can carry out the impedance point of a plurality of standard examination strips simultaneously and examine, has improved efficiency to the instrument test accuracy that can guarantee production is examined to automatic point, and the problem that artifical record is unfavorable for the saving is solved in the processing through microprocessor and analysis subsystem. The system comprises: the system comprises an acquisition subsystem, a control subsystem and an analysis subsystem; the control subsystem comprises a microprocessor, M double-channel relays, a starting relay, a reset relay and N groups of test strip sockets, and the microprocessor is controlled to enter a point inspection mode through the starting relay and the reset relay; the microprocessor controls the on or off of the dual-channel relay; the acquisition subsystem acquires point detection measurement data of a standard test strip corresponding to the test strip socket through the N measurement channels; the microprocessor processes the point detection quantity data to obtain a point detection impedance value of the standard test strip; and the analysis subsystem analyzes the point detection impedance value of the standard test strip to obtain a point detection result.
Description
Technical Field
The utility model relates to an instrument test field especially relates to a system is examined to test fixture point of examination strip detecting instrument.
Background
At present, before each day of production, a production part of a test strip tester (e.g., a blood glucose meter) performs routine point inspection on a test fixture corresponding to each model of the tester in order to ensure accuracy of test results and product quality. The spot inspection process specifically comprises the following steps: 1. point inspection preparation (preparation of a plurality of four-bit half-multimeters and a test tool for assembling a battery); 2. controlling the test tool to enter a point inspection mode by a manual key; 3. manually measuring a first resistance value output by a standard strip of the test tool by using a universal meter, checking the reading of the universal meter and manually recording the reading; the manual key controls the standard strip of the test fixture to output a second resistance value; manually measuring a first resistance value output by a standard strip of the test tool by using a universal meter, checking the reading of the universal meter and manually recording the reading; repeating the steps of pressing keys and measuring the resistance values of other calibration strips; recording the point detection resistance value and comparing the point detection resistance value with a standard value; if the tool is qualified in point inspection, the battery is disassembled and reinstalled to reset the tool; after the tool is reset, the tool enters a test mode. The spot inspection time of each tool is about 5 min/tool. The whole production line needs 35 operators to check 105 test tools at the same time, and the total time of checking each day is 8.75 hours.
However, the existing manual key visual inspection mode has extremely low efficiency, a plurality of standard strip output resistance items exist, the possibility of missing inspection exists, each resistance point cannot be guaranteed to be in place, the inaccurate point inspection can cause inaccurate instrument test, and manual records are not beneficial to storage.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing a system is examined to examination strip detecting instrument's test fixture point can carry out the impedance point of a plurality of standard examination strips simultaneously and examine, has improved efficiency to automatic point is examined and can be avoided leaking the possibility of surveying, has guaranteed the instrument test accuracy of production, and through the processing of microprocessor and analysis subsystem, can solve artifical record and be unfavorable for the problem of saving.
The utility model provides a first aspect provides a system is examined to test fixture point of examination strip detecting instrument, include:
the system comprises an acquisition subsystem, a control subsystem and an analysis subsystem;
the acquisition subsystem is provided with N measurement channels, wherein N is a positive integer not less than 1;
the control subsystem comprises a microprocessor, M double-channel relays, a starting relay, a reset relay and N groups of test strip sockets, each group of the N groups of test strip sockets comprises X different socket types, a test strip inserting strip of each socket type corresponds to a standard test strip, M is a positive integer larger than 1, and X is a positive integer larger than 1;
the test strip testing device comprises a microprocessor, M double-channel relays, a starting relay and a reset relay, wherein the M double-channel relays, the starting relay and the reset relay are respectively connected with the microprocessor, the starting relay and the reset relay are both connected with a testing tool of a test strip testing instrument, the M double-channel relays form a relay matrix with N rows and M/N columns, and M/N is a positive integer;
each group of test strip sockets in the N groups of test strip sockets are connected with a test tool of a test strip detection instrument, the N groups of test strip sockets are in one-to-one correspondence with N rows of double-channel relays of the relay matrix, and the output end of each group of test strip sockets is connected with all the double-channel relays corresponding to the N rows;
the N measuring channels are respectively connected with the N rows of double-channel relays of the relay matrix in a one-to-one correspondence manner;
the microprocessor is used for controlling a test tool of the test strip detecting instrument to enter a point detection mode through the start relay and the reset relay;
the microprocessor is also used for controlling the on-off of the dual-channel relay, the dual-channel relay is connected with the test strip socket when being connected, and the dual-channel relay is disconnected with the test strip socket when being disconnected;
the acquisition subsystem is used for acquiring point detection measurement data of the standard test strip corresponding to the test strip socket through the N measurement channels;
the microprocessor is also used for processing the point detection quantity data to obtain a point detection impedance value of the standard test strip;
and the analysis subsystem is used for analyzing the point detection impedance value of the standard test strip to obtain a point detection result.
Furthermore, the point-check measurement data of the standard test strip corresponding to each test strip socket is obtained in a scanning mode,
the microprocessor controls the relay matrix to enable the test strip sockets of the same type in the N groups of test strip sockets to be connected, and the acquisition subsystem acquires point detection measurement data of the test strip sockets of the same type in the N groups of test strip sockets through the N measurement channels respectively.
Further, in the above-mentioned case,
the microprocessor controls the relay matrix to enable a specific test strip socket in the N groups of test strip sockets to be connected, and the acquisition subsystem acquires point detection measurement data of the specific test strip socket through a measurement channel corresponding to the specific test strip socket.
Furthermore, the acquisition subsystem comprises N multimeters, each multimeter comprises a multimeter communication module and a measurement module, the multimeter communication module is in communication connection with the microprocessor, the multimeters are respectively in one-to-one correspondence connection with the N rows of double-channel relays of the relay matrix,
the measuring module is used for acquiring point detection measuring data of the standard test strip corresponding to the test strip socket through the measuring channel;
and the multimeter communication module is used for sending the point inspection measurement data to the microprocessor.
Further, the multimeter was in 4-wire mode.
Further, the control subsystem further comprises:
the system comprises a universal meter data interface, a universal meter communication interface and an analysis subsystem communication interface;
the data interface of the universal meter is connected with a double-channel relay corresponding to the universal meter;
the universal meter communication interface is connected with the universal meter communication module and the microprocessor;
the analysis subsystem communication interface is connected with the analysis subsystem and the microprocessor.
Further, the microprocessor includes:
the system comprises a universal meter communication unit, an analysis subsystem communication unit, a data processing unit and a control unit;
the universal meter communication unit is used for establishing communication connection with the universal meter through a universal meter communication interface and receiving point detection measurement data sent by the universal meter;
the data processing unit is used for processing the point detection quantity data to obtain a point detection impedance value of the standard test strip;
the analysis subsystem communication unit is used for establishing communication connection with the analysis subsystem through the analysis subsystem communication interface and sending the point detection impedance value of the standard test strip to the analysis subsystem;
and the control unit is used for controlling the M double-channel relays, the starting relay and the resetting relay.
Further, the analysis subsystem includes: an analysis module;
and the analysis module is used for analyzing the point detection impedance value of the standard test strip according to the preset impedance upper limit value and impedance lower limit value to obtain a point detection result.
Further, the analysis subsystem further comprises: a display module;
and the display module is used for presenting the point detection result to a user, and specially marking the point detection impedance value of the standard test strip when the point detection impedance value of the standard test strip is not in the areas of the impedance upper limit value and the impedance lower limit value.
Further, the X different socket types include a 3 pin strip socket, a 4 pin strip socket, and a 5 pin strip socket.
From the above, the utility model discloses a system is examined to examination frock point of examination strip detecting instrument includes collection subsystem, control subsystem and analysis subsystem, the collection subsystem has N measuring channel, N is the positive integer not less than 1, control subsystem includes microprocessor, M binary channels relay, start relay, reset relay and N group examination strip sockets, every group in N group examination strip sockets includes X different socket types, the cutting of each socket type corresponds a standard examination strip, M is the positive integer greater than 1, X is the positive integer greater than 1, M binary channels relay, start relay and reset relay are connected with microprocessor respectively, start relay and reset relay all are connected with the examination frock of examination strip detecting instrument, M binary channels relay constitutes the relay matrix of N row and M/N row, M/N is the positive integer, each group of test strip sockets in the N groups of test strip sockets are connected with a test tool of a test strip detecting instrument, the N groups of test strip sockets are in one-to-one correspondence with N rows of double-channel relays of a relay matrix, the output end of each group of test strip sockets is connected with all the double-channel relays corresponding to the N rows, N measuring channels are respectively in one-to-one correspondence with the N rows of double-channel relays of the relay matrix, a microprocessor controls the test tool of the test strip detecting instrument to enter a point detection mode through a start relay and a reset relay, controls the on or off of the double-channel relay, the double-channel relay is connected with the test strip sockets when being switched on, the double-channel relay is disconnected with the test strip sockets when being switched off, an acquisition subsystem acquires point detection measuring data of standard test strips corresponding to the test strip sockets through the N, and the analysis subsystem analyzes the point detection impedance value of the standard test strip to obtain a point detection result. Compared with the existing manual key visual inspection mode, the impedance point inspection of a plurality of standard test strips can be simultaneously carried out, so that the efficiency is improved; the possibility of missing detection can be avoided through automatic point detection, and the test accuracy of a produced instrument is guaranteed; through the processing of the microprocessor and the analysis subsystem, the problem that manual recording is not beneficial to storage can be solved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required in the prior art and the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
Fig. 1 is a schematic structural diagram of an embodiment of a point inspection system of a test tool of a test strip testing instrument according to the present invention;
fig. 2 is a schematic structural diagram of another embodiment of a point inspection system of a test tool of a test strip testing instrument according to the present invention;
FIG. 3 is a schematic structural view of the multimeter provided by the present invention.
Detailed Description
The core of the utility model is to provide a system is examined to examination strip detecting instrument's test fixture point, can carry out the impedance point of a plurality of standard examination strips simultaneously and examine, improved efficiency to automatic point is examined and can be avoided leaking the possibility of surveying, has guaranteed the instrument test accuracy of production, through microprocessor and analysis subsystem's processing, can solve artifical record and be unfavorable for the problem of saving.
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
As shown in fig. 1, an embodiment of the present invention provides a system for point inspection of test tool of test strip detecting instrument, including:
the system comprises an acquisition subsystem 11, a control subsystem 12 and an analysis subsystem 13;
the acquisition subsystem 11 is provided with N measurement channels, wherein N is a positive integer not less than 1;
the control subsystem 12 comprises a microprocessor 121, M dual-channel relays 122, a start relay 123, a reset relay 124 and N groups of test strip sockets 125, each group of the N groups of test strip sockets comprises X different socket types, a test strip plug of each socket type corresponds to a standard test strip, M is a positive integer greater than 1, and X is a positive integer greater than 1;
the M double-channel relays 122, the starting relay 123 and the reset relay 124 are respectively connected with the microprocessor 121, the starting relay 123 and the reset relay 124 are both connected with a test tool of the test strip detection instrument, the M double-channel relays 122 form a relay matrix with N rows and M/N columns, and M/N is a positive integer;
each group of test strip sockets 125 in the N groups of test strip sockets 125 is connected with a test tool of a test strip detection instrument, the N groups of test strip sockets 125 correspond to the N rows of dual-channel relays 122 of the relay matrix one by one, and the output end of each group of test strip sockets 125 is connected with all the dual-channel relays 122 corresponding to the N rows;
the N measuring channels are respectively connected with the N rows of double-channel relays 122 of the relay matrix in a one-to-one correspondence manner;
the microprocessor 121 is used for controlling the test tool of the test strip detection instrument to enter a point detection mode through the start relay 123 and the reset relay 124;
the microprocessor 121 is further configured to control the on/off of the dual-channel relay 122, the dual-channel relay 122 is connected to the test strip socket 125 when being turned on, and the dual-channel relay 122 is disconnected from the test strip socket 125 when being turned off;
the acquisition subsystem 11 is configured to acquire point-check measurement data of the standard test strip corresponding to the test strip socket 125 through the N measurement channels;
the microprocessor 121 is further configured to process the point detection quantity data to obtain a point detection impedance value of the standard test strip;
and the analysis subsystem 13 is used for analyzing the point detection impedance value of the standard test strip to obtain a point detection result.
In the embodiment of the utility model, in the embodiment shown in fig. 1, the collection subsystem uses 4 measuring channel as an example, and the control subsystem includes microprocessor 121, and dual-channel relay 122 uses 32 as an example, has constituteed 4 rows, 8 rows' relay matrix, and it is 1 to begin relay 123 and reset relay 124, and examination strip socket 125 includes 4 groups, and every group has 3 kinds of different socket types respectively, and the socket type specifically can be 3 stitches, 4 stitches and 5 stitches. The dual-channel relay 122, the start relay 123 and the reset relay 124 are respectively connected with the microprocessor 121, the start relay 123 and the reset relay 124 are both connected with the test tool of the test strip tester, as shown in fig. 1, since the acquisition subsystem has 4 measurement channels, the test tool of the test strip tester can have 4 channels, each group of test strip sockets 125 is connected with one channel of the test tool of the test strip tester, the output end of each group of test strip sockets 125 is connected with all the dual-channel relays 122 in the corresponding row, each measurement channel is respectively connected with the dual-channel relays 122 in the corresponding row of the relay matrix, so that the microprocessor 121 controls the test tool of the test strip tester to enter a point-check mode through the start relay 123 and the reset relay 124, controls the dual-channel relays 122 to be switched on or switched off, and the dual-channel relays 122 are connected with the test strip sockets 125, when the dual-channel relay 122 is turned off, the dual-channel relay is disconnected from the test strip socket 125, the acquisition subsystem 11 acquires the point detection measurement data of the standard test strip corresponding to the test strip socket 125 through the N measurement channels, the microprocessor 121 processes the point detection quantity data to obtain the point detection impedance value of the standard test strip, and the analysis subsystem 13 analyzes the point detection impedance value of the standard test strip to obtain a point detection result. Compared with the existing manual key visual inspection mode, the impedance point inspection of a plurality of standard test strips can be simultaneously carried out, so that the efficiency is improved; the possibility of missing detection can be avoided through automatic point detection, and the test accuracy of a produced instrument is guaranteed; through the processing of the microprocessor and the analysis subsystem, the problem that manual recording is not beneficial to storage can be solved.
In the embodiment shown in fig. 1, the specific process of performing the spot inspection can be divided into two ways, which are described below.
Acquiring point inspection measurement data of a standard test strip corresponding to each test strip socket in a scanning mode;
optionally, in some embodiments of the present invention, the point-check measurement data of the standard test strip corresponding to each test strip socket is obtained by scanning,
the microprocessor controls the relay matrix to enable the test strip sockets of the same type in the N groups of test strip sockets to be connected, and the acquisition subsystem acquires point detection measurement data of the test strip sockets of the same type in the N groups of test strip sockets through the N measurement channels respectively.
In the embodiment of the present invention, referring to fig. 1, the microprocessor 121 controls the relay matrix to make the test strip sockets 125 of the same type in N groups of test strip sockets access, for example, 3-pin test strip sockets in 4 groups of test strip sockets 125, and the acquisition subsystem 11 acquires the point inspection measurement data of 3-pin test strip sockets in 4 groups of test strip sockets through 4 measurement channels respectively; then, the 4-pin test strip sockets in the 4 groups of test strip sockets 125 are accessed, and the acquisition subsystem 11 respectively acquires point detection measurement data of the 4-pin test strip sockets in the 4 groups of test strip sockets through 4 measurement channels; then, the 5-pin strip socket in the 4 groups of strip sockets 125 is connected, and the acquisition subsystem 11 acquires the point-check measurement data of the 5-pin strip socket in the 4 groups of strip sockets through 4 measurement channels.
And (II) acquiring point inspection measurement data of the specific test strip socket.
Alternatively, in some embodiments of the present invention,
the microprocessor controls the relay matrix to enable a specific test strip socket in the N groups of test strip sockets to be connected, and the acquisition subsystem acquires point detection measurement data of the specific test strip socket through a measurement channel corresponding to the specific test strip socket.
In the embodiment of the utility model, combine fig. 1, microprocessor 121 control relay matrix makes the access of specific examination strip socket among 4 groups examination strip sockets 125, gathers the measurement data that the measurement channel that the subsystem corresponds acquires specific examination strip socket through specific examination strip socket.
Optionally, as shown in fig. 2 and fig. 3, in some embodiments of the present invention, the collection subsystem 11 includes N multimeters, the multimeter includes a multimeter communication module 301 and a measurement module 302, the multimeter communication module 301 establishes a communication connection with the microprocessor 121, the multimeters are respectively connected with the N rows of dual-channel relays of the relay matrix in a one-to-one correspondence manner,
a measuring module 302, configured to obtain point-check measurement data of a standard test strip corresponding to the test strip socket through a measurement channel;
and the multimeter communication module 301 is used for sending the point detection measurement data to the microprocessor 121.
In the embodiment of the present invention, as shown in fig. 2 and fig. 3, the multimeter communication module 301 and the microprocessor 121 establish communication connection and adopt RS232 communication system.
Optionally, in some embodiments of the present invention, the multimeter is in a 4-wire mode.
To explain the above embodiments in detail, each measurement channel of the acquisition subsystem 11 may specifically correspond to a multimeter, the multimeter has a multimeter communication module 301 and a measurement module 302, where the multimeter communication module 301 is connected to the measurement module 302, and the multimeter adopts a 4-wire impedance measurement mode, because the impedance value of a standard test strip of a test strip socket is generally small, in order to make the impedance point detection more accurate, the 4-wire impedance measurement mode needs to be adopted to eliminate the influence of a measurement wire and the like.
Optionally, as shown in fig. 2 and 3, in some embodiments of the present invention, the control subsystem 12 further includes:
a multimeter data interface 201, a multimeter communication interface 202 and an analysis subsystem communication interface 203;
the multimeter data interface 201 is connected with a double-channel relay 122 corresponding to the multimeter;
the multimeter communication interface 202 is connected with the multimeter communication module 301 and the microprocessor 121;
the analysis subsystem communication interface 203 is connected to the analysis subsystem 13 and the microprocessor 121.
The embodiment of the utility model provides an in, microprocessor 121 passes through multimeter communication interface 202 and is connected with multimeter communication module 301, and microprocessor 121 passes through analysis subsystem communication interface 203 and is connected with analysis subsystem 13, because needs intercommunications, when serial communication, requires that the both sides of communication all adopt a standard interface, makes different equipment can conveniently connect and communicate. The most common serial communication interface is RS232, so both multimeter communication interface 123 and analysis subsystem communication interface 125 can be RS232 interfaces. .
In addition, the control subsystem can also include USB interface and battery interface, and the user can obtain information from the microprocessor through the USB interface, also can send information to the microprocessor through the USB interface, and the battery interface supplies energy to the microprocessor.
Optionally, in some embodiments of the present invention, the microprocessor includes:
the system comprises a universal meter communication unit, an analysis subsystem communication unit, a data processing unit and a control unit;
the universal meter communication unit is used for establishing communication connection with the universal meter through a universal meter communication interface and receiving point detection measurement data sent by the universal meter;
the data processing unit is used for processing the point detection quantity data to obtain a point detection impedance value of the standard test strip;
the analysis subsystem communication unit is used for establishing communication connection with the analysis subsystem through the analysis subsystem communication interface and sending the point detection impedance value of the standard test strip to the analysis subsystem;
and the control unit is used for controlling the M double-channel relays, the starting relay and the resetting relay.
In the embodiment of the utility model, the structure of the microprocessor is subdivided, and the microprocessor comprises a universal meter communication unit, an analysis subsystem communication unit, a data processing unit and a control unit, wherein the universal meter communication unit is used for communicating with a universal meter; the data processing unit processes the point detection quantity data to obtain a point detection impedance value of the standard test strip; the analysis subsystem communication unit is used for communicating with the analysis subsystem and sending the point detection impedance value of the standard test strip to the analysis subsystem; the control unit controls and controls the M double-channel relays, the starting relay and the resetting relay.
Optionally, in some embodiments of the present invention, the analysis subsystem includes: an analysis module;
and the analysis module is used for analyzing the point detection impedance value of the standard test strip according to the preset impedance upper limit value and impedance lower limit value to obtain a point detection result.
Further, the analysis subsystem further comprises: a display module;
and the display module is used for presenting the point detection result to a user, and specially marking the point detection impedance value of the standard test strip when the point detection impedance value of the standard test strip is not in the areas of the impedance upper limit value and the impedance lower limit value.
The embodiment of the utility model provides an in, the analysis subsystem includes outside the analysis module, still included display module, specifically can be Personal Computer (Personal Computer, PC), need have analysis processes function and display function simultaneously, analysis module is according to preset impedance upper limit value and impedance lower limit value, examine the impedance value to the point of standard examination strip and analyze, obtain the point and examine the result, display module will examine the result with the point and present the user, specifically can be when examining the impedance value when the point and not be in the region of impedance upper limit value and impedance lower limit value, carry out special mark with examining the impedance value, special mark specifically can show with different colours. It should be noted that the special mark may be made in other ways besides by different colors, such as font size, etc.
The embodiments in the present description are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other. The device disclosed by the embodiment corresponds to the method disclosed by the embodiment, so that the description is simple, and the relevant points can be referred to the method part for description.
It should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. The utility model provides a system is examined to test fixture point of examination strip detecting instrument which characterized in that includes:
the system comprises an acquisition subsystem, a control subsystem and an analysis subsystem;
the acquisition subsystem is provided with N measurement channels, wherein N is a positive integer not less than 1;
the control subsystem comprises a microprocessor, M double-channel relays, a starting relay, a reset relay and N groups of test strip sockets, each group of the N groups of test strip sockets comprises X different socket types, a test strip inserting strip of each socket type corresponds to a standard test strip, M is a positive integer larger than 1, and X is a positive integer larger than 1;
the M double-channel relays, the starting relay and the reset relay are respectively connected with the microprocessor, the starting relay and the reset relay are both connected with a test tool of the test strip detection instrument, the M double-channel relays form a relay matrix with N rows and M/N columns, and M/N is a positive integer;
each group of test strip sockets in the N groups of test strip sockets are connected with a test tool of the test strip detection instrument, the N groups of test strip sockets are in one-to-one correspondence with N rows of double-channel relays of the relay matrix, and the output end of each group of test strip sockets is connected with all the double-channel relays corresponding to N rows;
the N measuring channels are respectively connected with the N rows of double-channel relays of the relay matrix in a one-to-one correspondence manner;
the microprocessor is used for controlling a test tool of the test strip detection instrument to enter a point detection mode through the starting relay and the reset relay;
the microprocessor is also used for controlling the on-off of a dual-channel relay, the dual-channel relay is connected with the test strip socket when being switched on, and the dual-channel relay is disconnected with the test strip socket when being switched off;
the acquisition subsystem is used for acquiring point detection measurement data of the standard test strip corresponding to the test strip socket through the N measurement channels;
the microprocessor is also used for processing the point detection measurement data to obtain a point detection impedance value of the standard test strip;
and the analysis subsystem is used for analyzing the point detection impedance value of the standard test strip to obtain a point detection result.
2. The point inspection system for test tools according to claim 1, wherein the point inspection measurement data of the standard test strip corresponding to each test strip socket is obtained by scanning,
the microprocessor controls the relay matrix to enable test strip sockets of the same type in the N groups of test strip sockets to be connected, and the acquisition subsystem acquires point inspection measurement data of the test strip sockets of the same type in the N groups of test strip sockets through the N measurement channels respectively.
3. The test tool point inspection system of claim 1,
the microprocessor controls the relay matrix to enable a specific test strip socket in the N groups of test strip sockets to be connected, and the acquisition subsystem acquires point detection measurement data of the specific test strip socket through a measurement channel corresponding to the specific test strip socket.
4. The test tool point inspection system of claim 1, wherein the collection subsystem comprises N multimeters, the multimeter comprises a multimeter communication module and a measurement module, the multimeter communication module is in communication connection with the microprocessor, the multimeters are respectively in one-to-one correspondence with the N rows of dual-channel relays of the relay matrix,
the measuring module is used for acquiring point detection measuring data of a standard test strip corresponding to the test strip socket through the measuring channel;
and the multimeter communication module is used for sending the point inspection measurement data to the microprocessor.
5. The test tool point inspection system of claim 4, wherein the multimeter is in a 4 wire mode.
6. The test tool point inspection system of claim 5, wherein the control subsystem further comprises:
the system comprises a universal meter data interface, a universal meter communication interface and an analysis subsystem communication interface;
the multimeter data interface is connected with a double-channel relay corresponding to the multimeter;
the universal meter communication interface is connected with the universal meter communication module and the microprocessor;
the analysis subsystem communication interface is connected with the analysis subsystem and the microprocessor.
7. The test tool point inspection system of claim 6, wherein the microprocessor comprises:
the system comprises a universal meter communication unit, an analysis subsystem communication unit, a data processing unit and a control unit;
the multimeter communication unit is used for establishing communication connection with the multimeter through the multimeter communication interface and receiving the point detection measurement data sent by the multimeter;
the data processing unit is used for processing the point detection measurement data to obtain a point detection impedance value of the standard test strip;
the analysis subsystem communication unit is used for establishing communication connection with the analysis subsystem through an analysis subsystem communication interface and sending the point detection impedance value of the standard test strip to the analysis subsystem;
the control unit is used for controlling the M double-channel relays, the starting relay and the resetting relay.
8. The test fixture point inspection system of any one of claims 1-7, wherein the analysis subsystem comprises: an analysis module;
and the analysis module is used for analyzing the point detection impedance value of the standard test strip according to a preset impedance upper limit value and a preset impedance lower limit value to obtain a point detection result.
9. The test tool point inspection system of claim 8, wherein the analysis subsystem further comprises: a display module;
and the display module is used for presenting the point detection result to a user, and specially marking the point detection impedance value of the standard test strip when the point detection impedance value of the standard test strip is not in the areas of the impedance upper limit value and the impedance lower limit value.
10. The test tool point-check system of claim 9, wherein the X different socket types include a 3-pin test strip socket, a 4-pin test strip socket, and a 5-pin test strip socket.
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| CN202020508101.0U CN212111637U (en) | 2020-04-09 | 2020-04-09 | Test tool point inspection system of test strip detecting instrument |
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| CN202020508101.0U CN212111637U (en) | 2020-04-09 | 2020-04-09 | Test tool point inspection system of test strip detecting instrument |
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