CN212060364U

CN212060364U - Probe card convenient to test

Info

Publication number: CN212060364U
Application number: CN202020617417.3U
Authority: CN
Inventors: 于海超; 赵梁玉; 周明
Original assignee: Maxone Semiconductor Suzhou Co Ltd
Current assignee: Strong Half Conductor Suzhou Co ltd
Priority date: 2020-04-22
Filing date: 2020-04-22
Publication date: 2020-12-01
Anticipated expiration: 2030-04-22

Abstract

The utility model discloses a probe card convenient for testing, which comprises a PCB, wherein a plurality of probes are fixedly connected with the upper end of the PCB, the probes form a rectangle around the PCB, the probes are electrically connected with the PCB, a hold-down mechanism is arranged at the upper end of the PCB, the hold-down mechanism comprises a pressure plate, a rotating ring and a spring I, rotating holes are arranged at two sides of the upper end of the PCB, the pressure plate is rotatably connected with the inside of the rotating hole, the width of the rotating hole is larger than that of the pressure plate, inserting holes are arranged inside the pressure plate, inserting pins are inserted into two sides of the PCB, the inserting pins pass through the inserting holes, the pressure plate passes through the PCB, the rotating ring is fixedly connected with two sides of the lower end of the PCB, inserting grooves are arranged inside the pressure plate, the rotating ring passes through the inserting grooves, the rotating ring is semicircular, the spring I is, the probe card is stably connected with the chip and is convenient to take out, so that the test of users is more convenient.

Description

Probe card convenient to test

Technical Field

The utility model relates to a probe card specifically is a probe card convenient to test.

Background

The high-level packaging method has high unit price, if chip test can be carried out before packaging, and the wafer is marked if defective products exist in the wafer, the marked defective products are abandoned until the back-end packaging process, and unnecessary packaging cost can be saved. Thus requiring a probe card to perform the test. The probe card is a test interface, and is mainly used for testing a bare chip, and testing parameters of the chip by connecting a test machine and the chip and transmitting signals.

However, the conventional probe card is inconvenient to connect the chip and the probe card in use. Therefore, the present invention provides a probe card convenient for testing to solve the problems proposed in the above background art.

Disclosure of Invention

An object of the utility model is to provide a probe card convenient to test to solve the problem of proposing among the above-mentioned background art.

In order to achieve the above object, the utility model provides a following technical scheme:

a probe card convenient for testing comprises a PCB, wherein the upper end of the PCB is fixedly connected with a plurality of probes, the probes surround to form a rectangle, the probes are electrically connected with the PCB, and the upper end of the PCB is provided with a pressing mechanism;

hold-down mechanism includes the clamp plate, swivel ring and spring one, the rotation hole has been seted up to PCB board upper end both sides, the downthehole portion of rotating all rotates and is connected with the clamp plate, the rotation hole width is greater than the width of clamp plate, the inside jack of having seted up of clamp plate, the bolt has been inserted to PCB board both sides, the bolt passes the jack, the clamp plate passes the PCB board, the equal fixedly connected with swivel ring in PCB board lower extreme both sides, the inside insertion groove of having seted up of clamp plate, the swivel ring passes the insertion groove, the swivel ring is semi-circular, the outside of swivel ring is equipped with spring one, spring one is located one side that the clamp plate is close to.

As a further aspect of the present invention: the pressing plate is internally provided with a sliding groove, a connecting plate is inserted into the sliding groove, the periphery of the connecting plate is fixedly connected with a sliding plate, the outer side of the sliding plate is provided with a second spring, and two ends of the second spring are fixedly connected with the sliding plate and the pressing plate.

As a further aspect of the present invention: the clamp plate is L-shaped, and the clamp plate divide into rake and vertical part, and the equal fixedly connected with rubber pad of lower extreme on the clamp plate rake.

As a further aspect of the present invention: the PCB board upper end fixedly connected with a plurality of spacing grooves, the spacing groove is located the week side of probe.

As a further aspect of the present invention: the lower end of the connecting plate is fixedly connected with a pressing plate.

As a further aspect of the present invention: a chip is placed at the upper end of the probe and is located in the limiting groove.

The utility model provides a key mechanism for probe card convenient to test, for hold-down mechanism, which comprises a pressing plate, swivel ring and spring one, the rotation hole has been seted up to PCB board upper end both sides, it is connected with the clamp plate all to rotate downthehole portion, the rotation hole width is greater than the width of clamp plate, the inside jack of having seted up of clamp plate, the bolt has been inserted to PCB board both sides, the bolt passes the jack, the clamp plate passes the PCB board, the equal fixedly connected with swivel ring in PCB board lower extreme both sides, the inside insertion groove of having seted up of clamp plate, the swivel ring passes the insertion groove, the swivel ring is semi-circular, the outside of swivel ring is equipped with spring one, spring one is located one side that the clamp.

Compared with the prior art, the beneficial effects of the utility model are that:

through the design, the pressing plate is convenient to press the chip on the probe card, so that the probe card is stably connected with the chip and is convenient to take out, and the test of a user is more convenient.

Drawings

Fig. 1 is a schematic structural diagram of a probe card for facilitating testing.

Fig. 2 is a schematic structural diagram of a pressure plate in a probe card for facilitating testing.

Fig. 3 is a perspective view of a pressure plate in a probe card for facilitating testing.

Fig. 4 is a perspective view of a PCB board in a probe card for facilitating testing.

In the figure: 1. a PCB board; 101. rotating the hole; 2. a probe; 3. pressing a plate; 301. a jack; 302. inserting the groove; 4. a rubber pad; 5. a rotating ring; 6. a first spring; 7. a chip; 8. a limiting groove; 9. a connecting plate; 10. pressing a plate; 11. a sliding plate; 12. a second spring; 13. a sliding groove; 14. and (4) a bolt.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Detailed description of the preferred embodiment

This embodiment is an embodiment of a probe card for ease of testing.

Referring to fig. 1 to 4, in an embodiment of the present invention, a probe card convenient for testing includes a PCB board 1, a plurality of probes 2 are fixedly connected to an upper end of the PCB board 1, the probes 2 surround to form a rectangle, the probes 2 are electrically connected to the PCB board 1, and a pressing mechanism is disposed at an upper end of the PCB board 1; a plurality of spacing grooves 8 are fixedly connected to the upper end of the PCB board 1, the spacing grooves 8 are located on the periphery of the probe 2, a chip 7 is placed on the upper end of the probe 2, and the chip 7 is located inside the spacing grooves 8.

Hold-down mechanism includes clamp plate 3, swivel ring 5 and spring 6, rotation hole 101 has been seted up to 1 upper end both sides of PCB board, it is connected with clamp plate 3 to rotate the inside equal rotation in hole 101, it is greater than the width of clamp plate 3 to rotate hole 101 width, jack 301 has been seted up to 3 inside of clamp plate, bolt 14 has been inserted in 1 both sides of PCB board, bolt 14 passes jack 301, clamp plate 3 passes PCB board 1, the equal fixedly connected with swivel ring 5 in 1 lower extreme both sides of PCB board, 3 inside insertion grooves 302 of having seted up of clamp plate, swivel ring 5 passes insertion groove 302, swivel ring 5 is semi-circular, the outside of swivel ring 5 is equipped with spring 6, spring 6 is located one side that clamp plate 3 is close to each other, 6 both ends of spring respectively with

clamp plate

3 and 1 fixed connection of. The pressing plate 3 is internally provided with a sliding groove 13, the connecting plate 9 is inserted into the sliding groove 13, the sliding plate 11 is fixedly connected to the periphery of the connecting plate 9, the outer side of the sliding plate 11 is provided with a second spring 12, the two ends of the second spring 12 are fixedly connected with the sliding plate 11 and the pressing plate 3, the pressing plate 3 is L-shaped, the pressing plate 3 is divided into an inclined part and a vertical part, the upper end and the lower end of the inclined part of the pressing plate 3 are fixedly connected with rubber pads 4, and the lower end of the connecting plate 9. The user will press board 10 to press to inside with the hand, make clamp plate 3 upper end rotate to both sides respectively, make 2 upper ends of probe open, the user places chip 7 on probe 2, make chip 7 can not the rock about through spacing groove 8, use to turn to loose the hand, 3 lower extremes of clamp plate rotate to both sides respectively under the effect of spring 6, make 3 upper ends of clamp plate rotate to the inboard respectively and compress tightly chip 7 on probe 2, and the probe card is when falling, when 3 upper ends of clamp plate fall to the ground earlier, rubber pad 4 through 3 upper ends of clamp plate carry out the shock attenuation, when 3 lower extremes of clamp plate fall to the ground earlier, carry out the shock attenuation of certain degree through 11 extrusion spring two 12 of sliding plate, avoid the probe card to damage.

Detailed description of the invention

This embodiment is an embodiment of a probe card hold down mechanism for ease of testing.

clamp plate

3 and 1 fixed connection of.

The utility model discloses a theory of operation is:

this device is when using, the user will press board 10 to pressing to inside with the hand, make 3 upper ends of clamp plate rotate to both sides respectively, make 2 upper ends of probe open, the user places chip 7 on probe 2, make chip 7 can not the left and right sides rock through spacing groove 8, use to turn to loose the hand, 3 lower extremes of clamp plate rotate to both sides respectively under the effect of spring 6, make 3 upper ends of clamp plate rotate to inboard respectively and compress tightly chip 7 on probe 2, and the probe card is when falling, when 3 upper ends of clamp plate fall to the ground earlier, rubber pad 4 through 3 upper ends of clamp plate carry out the shock attenuation of certain degree, when 3 lower ends of clamp plate fall to the ground earlier, extrude spring two 12 through sliding plate 11 and carry out the shock attenuation of certain degree, avoid the probe card.

The above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the utility model, the concept of which is equivalent to replace or change, should be covered within the protection scope of the present invention.

Claims

1. The probe card convenient to test is characterized by comprising a PCB (printed circuit board) 1, wherein a plurality of probes (2) are fixedly connected to the upper end of the PCB (1), the probes (2) surround to form a rectangle, the probes (2) are electrically connected with the PCB (1), and a pressing mechanism is arranged at the upper end of the PCB (1);

the pressing mechanism comprises a pressing plate (3), a rotating ring (5) and a first spring (6), rotation hole (101) have been seted up to PCB board (1) upper end both sides, it is connected with clamp plate (3) to rotate inside all rotation in hole (101), it is greater than the width of clamp plate (3) to rotate hole (101) width, jack (301) have been seted up to clamp plate (3) inside, bolt (14) have been inserted to PCB board (1) both sides, jack (301) are passed in bolt (14), PCB board (1) is passed in clamp plate (3), PCB board (1) lower extreme both sides equal fixedly connected with swivel becket (5), insertion groove (302) have been seted up to clamp plate (3) inside, swivel becket (5) pass insertion groove (302), swivel becket (5) are semi-circular, the outside of swivel becket (5) is equipped with spring one (6), spring one (6) are located one side that clamp plate (3) are close to each other, spring one (6) both ends respectively with clamp plate (3.

2. The probe card convenient for testing according to claim 1, wherein a sliding groove (13) is formed in the pressing plate (3), the connecting plate (9) is inserted into the sliding groove (13), the sliding plate (11) is fixedly connected to the periphery of the connecting plate (9), a second spring (12) is arranged on the outer side of the sliding plate (11), and two ends of the second spring (12) are fixedly connected to the sliding plate (11) and the pressing plate (3).

3. The probe card convenient for testing according to claim 1, wherein the pressing plate (3) is L-shaped, the pressing plate (3) is divided into an inclined part and a vertical part, and rubber pads (4) are fixedly connected to the upper and lower ends of the inclined part of the pressing plate (3).

4. The probe card convenient for testing according to claim 1, wherein a plurality of limiting grooves (8) are fixedly connected to the upper end of the PCB (1), and the limiting grooves (8) are located on the peripheral side of the probes (2).

5. The probe card facilitating the test according to claim 2, wherein a pressing plate (10) is fixedly connected to a lower end of the connection plate (9).

6. The probe card convenient for testing according to claim 1, characterized in that a chip (7) is placed on the upper end of the probe (2), and the chip (7) is located inside the limiting groove (8).