CN211959163U

CN211959163U - Bus bar assembly test tool

Info

Publication number: CN211959163U
Application number: CN202020592187.XU
Authority: CN
Inventors: 邵明升
Original assignee: Wuxi Suntech Power Co Ltd
Current assignee: Wuxi Suntech Power Co Ltd
Priority date: 2020-04-20
Filing date: 2020-04-20
Publication date: 2020-11-17
Anticipated expiration: 2030-04-20

Abstract

The utility model relates to a photovoltaic module technical field specifically discloses a busbar subassembly test fixture, wherein, include: supporting baseplate and support swash plate, supporting baseplate's one end is connected with the one end that supports the swash plate, it holds the district to form the contained angle between supporting baseplate and the support swash plate, the contained angle holds the district and is arranged in holding the busbar of the subassembly that awaits measuring in the range upon range of process, the conducting surface and the supporting baseplate contact of busbar, the insulating surface and the support swash plate contact of busbar, supporting baseplate sets up first metallic material layer towards the surface that the contained angle held the district, supporting baseplate deviates from the surface that the contained angle held the district and sets up the second metallic material layer, the surface that the support swash plate deviates from the contained angle and holds the district sets up the third metallic material layer, first metallic material layer and second metallic material layer are connected, second metallic material layer and third metallic material. The utility model provides a busbar subassembly test fixture simple structure, application scope is wide, convenient to use and low cost.

Description

Bus bar assembly test tool

Technical Field

The utility model relates to a photovoltaic module technical field especially relates to a busbar subassembly test fixture.

Background

In the prior art, in the lamination process of module manufacture, in order to ensure the quality of the welded battery piece, EL (electroluminescence) needs to be tested in the lamination process, but in the case of an all-black photovoltaic module, the black bus bar structure is as shown in fig. 1, the front surface is black (insulating surface), and the back surface is silvery white (conductive surface). When an EL test is required, the probe of the EL tester contacts the black surface (i.e., the insulating surface) of the black bus bar, and thus the power cannot be supplied, and the EL test cannot be completed.

Disclosure of Invention

The utility model provides a bus bar subassembly test fixture solves the unable problem of accomplishing the EL test to the range upon range of process of subassembly that uses black bus bar that exists among the correlation technique.

As an aspect of the utility model provides a bus bar subassembly test fixture, wherein, include: supporting baseplate and support swash plate, supporting baseplate's one end with the one end of supporting the swash plate is connected, supporting baseplate with it holds the district to form the contained angle between the swash plate, the contained angle holds the district and is arranged in holding the bus bar of the subassembly that awaits measuring in the range upon range of process, the conducting surface of bus bar with the supporting baseplate contact, the insulating surface of bus bar with support the swash plate contact, the supporting baseplate orientation the surface that the contained angle held the district sets up first metallic material layer, the supporting baseplate deviates from the surface that the contained angle held the district sets up the second metallic material layer, it deviates from to support the swash plate the surface that the contained angle held the district sets up the third metallic material layer, first metallic material layer with the second metallic material layer is connected, the second metallic material layer with the third metallic material layer is connected.

Further, the first metal material layer, the second metal material layer and the third metal material layer all comprise metal foil paper.

Further, the metal foil paper comprises aluminum foil paper.

The utility model provides a bus bar subassembly test fixture, through setting up two backup pads, then set up the metallic material layer on the surface of backup pad, the bus bar that will await measuring the subassembly in the range upon range of process is placed and is held the district at the contained angle, when realizing the EL test through the EL tester like this, the third metallic material layer of swash plate is supported in the probe contact of EL tester, through third metallic material layer, second metallic material layer conducts to first metallic material layer, because the conducting surface contact of first metallic material layer and bus bar, thereby the test to the bus bar has been realized. The utility model provides a this kind of busbar subassembly test fixture simple structure is applicable to the test of the busbar of the multiple size of the examination subassembly that awaits measuring in the range upon range of process, and application scope is wide, convenient to use and low cost.

Drawings

The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention and not to limit the invention.

Fig. 1 is a schematic view illustrating a conventional arrangement of bus bars and probes.

Fig. 2 is the utility model provides a bus bar subassembly test fixture structure sketch map.

Fig. 3 is a schematic view of a service state of the bus bar assembly testing tool provided by the present invention.

Detailed Description

It should be noted that the embodiments and features of the embodiments of the present invention may be combined with each other without conflict. The present invention will be described in detail below with reference to the accompanying drawings in conjunction with embodiments.

In order to make the technical solution of the present invention better understood, the technical solution of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts shall belong to the protection scope of the present invention.

It should be noted that the terms "first," "second," and the like in the description and claims of the present invention and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged under appropriate circumstances for purposes of describing the embodiments of the invention herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.

In the present embodiment, a bus bar assembly testing tool is provided, and fig. 2 and 3 are schematic structural diagrams of a bus bar assembly testing tool provided according to an embodiment of the present invention, as shown in fig. 2 and 3, including: a support bottom plate 22 and a support inclined plate 21, wherein one end of the support bottom plate 22 is connected with one end of the support inclined plate 21, an included angle accommodating area 30 is formed between the supporting bottom plate 22 and the supporting inclined plate 21, the included angle accommodating area 30 is used for accommodating the bus bar 10 of the component to be tested in the laminating process, the conductive surface 12 of the bus bar 10 is in contact with the support bottom plate 22, the insulating surface 11 of the bus bar 10 is in contact with the support sloping plate 21, the surface of the supporting baseplate 22 facing the included angle accommodating area 30 is provided with a first metal material layer 23, the surface of the support base plate 22 facing away from the included angle accommodating area 30 is provided with a second metal material layer 24, the surface of the inclined support plate 21 facing away from the included angle accommodating area 30 is provided with a third metal material layer 25, the first metallic material layer 23 is connected to the second metallic material layer 24, and the second metallic material layer 24 is connected to the third metallic material layer 25.

The embodiment of the utility model provides a bus bar subassembly test fixture, through setting up two backup pads, then set up the metallic material layer on the surface of backup pad, the bus bar that will await measuring the subassembly in the range upon range of process is placed and is held the district at the contained angle, when realizing the EL test through the EL tester like this, the third metallic material layer of swash plate is supported in the probe contact of EL tester, through third metallic material layer, second metallic material layer conducts to first metallic material layer, because the conducting surface contact of first metallic material layer and bus bar, thereby the test to the bus bar has been realized. The utility model provides a this kind of busbar subassembly test fixture simple structure is applicable to the test of the busbar of the multiple size of the examination subassembly that awaits measuring in the range upon range of process, and application scope is wide, convenient to use and low cost.

It should be understood that, in the embodiment of the present invention, the bus bar assembly specifically refers to a semi-finished bus bar assembly that is not installed in the junction box, and when testing the semi-finished bus bar assembly, because the insulating surface of the bus bar cannot be removed, the EL test of the semi-finished bus bar assembly can be completed through the bus bar assembly testing tool.

As shown in fig. 2, the insulating surface 11 of the bus bar 11 is a black surface, and the conductive surface 12 of the bus bar 11 is a silver surface, so that by placing the bus bar 11 in the included angle accommodating area, the probe of the EL tester contacts the third metal material layer of the supporting sloping plate 21, and the third metal material layer and the second metal material layer are conducted to the first metal material layer, and since the first metal material layer contacts the conductive surface 12 of the bus bar 11, i.e., the silver surface, the test of the bus bar 11 can be realized.

Specifically, the first metal material layer 23, the second metal material layer 24, and the third metal material layer 25 each include a metal foil paper.

Preferably, the metal foil paper comprises aluminum foil paper.

It is to be understood that the above embodiments are merely exemplary embodiments that have been employed to illustrate the principles of the present invention, and that the present invention is not limited thereto. It will be apparent to those skilled in the art that various modifications and improvements can be made without departing from the spirit and substance of the invention, and these modifications and improvements are also considered to be within the scope of the invention.

Claims

1. The utility model provides a bus bar subassembly test fixture which characterized in that includes: supporting baseplate and support swash plate, supporting baseplate's one end with the one end of supporting the swash plate is connected, supporting baseplate with it holds the district to form the contained angle between the swash plate, the contained angle holds the district and is arranged in holding the bus bar of the subassembly that awaits measuring in the range upon range of process, the conducting surface of bus bar with the supporting baseplate contact, the insulating surface of bus bar with support the swash plate contact, the supporting baseplate orientation the surface that the contained angle held the district sets up first metallic material layer, the supporting baseplate deviates from the surface that the contained angle held the district sets up the second metallic material layer, it deviates from to support the swash plate the surface that the contained angle held the district sets up the third metallic material layer, first metallic material layer with the second metallic material layer is connected, the second metallic material layer with the third metallic material layer is connected.

2. The bus bar assembly test fixture of claim 1, wherein the first metallic material layer, the second metallic material layer, and the third metallic material layer each comprise a foil.

3. The bus bar assembly test fixture of claim 2, wherein the metal foil paper comprises aluminum foil paper.