CN211905613U - Open circuit voltage testing device - Google Patents

Open circuit voltage testing device Download PDF

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Publication number
CN211905613U
CN211905613U CN201922386795.5U CN201922386795U CN211905613U CN 211905613 U CN211905613 U CN 211905613U CN 201922386795 U CN201922386795 U CN 201922386795U CN 211905613 U CN211905613 U CN 211905613U
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China
Prior art keywords
mounting hole
probe
base
circuit voltage
open circuit
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Application number
CN201922386795.5U
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Chinese (zh)
Inventor
韩任杰
赖信华
郑珊珊
孔明娇
申建阳
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Chengdu Yinlong New Energy Industry Technology Research Co ltd
Yinlong New Energy Co Ltd
Hebei Yinlong New Energy Co Ltd
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Chengdu Yinlong New Energy Industry Technology Research Co ltd
Yinlong New Energy Co Ltd
Hebei Yinlong New Energy Co Ltd
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Application filed by Chengdu Yinlong New Energy Industry Technology Research Co ltd, Yinlong New Energy Co Ltd, Hebei Yinlong New Energy Co Ltd filed Critical Chengdu Yinlong New Energy Industry Technology Research Co ltd
Priority to CN201922386795.5U priority Critical patent/CN211905613U/en
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Abstract

The utility model provides an open circuit voltage testing arrangement, this open circuit voltage testing arrangement includes: a probe comprising a first segment and a second segment connected to each other; a base having a first mounting hole; the cover plate is connected with the base, the cover plate is provided with a second mounting hole, the second mounting hole corresponds to the first mounting hole, the probe is adjustably arranged in the first mounting hole and the second mounting hole in a penetrating mode, and the first section is penetrated out through the first mounting hole. Through the technical scheme provided by the application, the problems of short service life and high cost in the prior art can be solved.

Description

Open circuit voltage testing device
Technical Field
The utility model relates to a battery testing arrangement technical field particularly, relates to an open circuit voltage testing arrangement.
Background
At present, the battery needs to be detected in the production process of the battery so as to ensure the quality of the battery. Wherein, in the production process of the battery, one battery needs to test the voltage and the internal resistance for at least 4 times. The battery is generally tested using an OCV (Open Circuit Voltage) test fixture, which includes a main body and a probe, the main body and the probe are integrally formed, and the probe is inserted into the battery to test the battery.
In prior art, OCV test fixture is after long-time the use, and the probe can appear wearing and tearing, leads to anchor clamps and battery surface contact failure, and anchor clamps are poor with the battery plane degree, can't accomplish the detection. Because probe and main part integrated into one piece, be not convenient for maintain, can only change new OCV test fixture, cause the wasting of resources. Therefore, the prior art has the problems of low service life and high cost.
SUMMERY OF THE UTILITY MODEL
The utility model provides an open circuit voltage testing arrangement to solve the low and with high costs problem of life among the prior art.
The utility model provides an open circuit voltage testing arrangement, open circuit voltage testing arrangement includes: a probe comprising a first segment and a second segment connected to each other; a base having a first mounting hole; the cover plate is connected with the base, the cover plate is provided with a second mounting hole, the second mounting hole corresponds to the first mounting hole, the probe is adjustably arranged in the first mounting hole and the second mounting hole in a penetrating mode, and the first section is penetrated out through the first mounting hole.
Furthermore, the open circuit voltage testing device also comprises a reset assembly, the reset assembly is arranged between the base and the cover plate, the probe is movably arranged in the first mounting hole and the second mounting hole, and the reset assembly is used for resetting the probe.
Further, the reset assembly includes: the spring is sleeved on the probe and is positioned between the base and the cover plate; the limiting part is arranged on the probe, one end of the spring is abutted to the limiting part, and the other end of the spring is abutted to the cover plate.
Further, be provided with helicitic texture on the second section, the locating part includes the nut, nut and second section threaded connection, nut and the one side looks butt of the orientation apron of base.
Further, the apron includes main part and curb plate, and the second mounting hole sets up in the main part, and the curb plate setting is in the both sides of main part, and the curb plate orientation extends near the direction of base.
Furthermore, the end part of the side plate is provided with a connecting plate, the connecting plate is attached to the base, a third mounting hole is formed in the base, a fourth mounting hole is formed in the connecting plate and corresponds to the third mounting hole, and a fastener is arranged in the third mounting hole and the fourth mounting hole in a penetrating mode so as to achieve connection of the base and the cover plate.
Further, open circuit voltage testing arrangement includes a plurality of probes, is provided with a plurality of first mounting holes on the base, and a plurality of probes set up with a plurality of first mounting holes one-to-one.
Furthermore, the open-circuit voltage testing device further comprises an acquisition line, the acquisition line is electrically connected with the probe, and the acquisition line is arranged in a staggered mode relative to the first mounting holes.
Furthermore, a fifth mounting hole is formed in the base, and the base is connected with the driving mechanism through the fifth mounting hole.
Furthermore, the probe is made of a copper alloy material.
Use the technical scheme of the utility model, this open circuit voltage testing arrangement includes probe, base and apron, and the apron is connected with the base. The probe comprises a first section and a second section which are connected with each other, the base is provided with a first mounting hole, the cover plate is provided with a second mounting hole, and the second mounting hole is arranged corresponding to the first mounting hole. Specifically, the probe position is adjustably worn to establish in first mounting hole and second mounting hole, and first section is worn out by first mounting hole, inserts first section inside the battery and can detect the battery. Adopt above-mentioned structure, after open circuit voltage testing arrangement used for a long time, if wearing and tearing appear in the probe, after the operation personnel polished the probe, stretch out the size of first mounting hole through adjusting the probe, can continue to use the device, so can hoisting device's life, reduce device's cost.
Drawings
The accompanying drawings, which form a part of the present application, are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention and not to limit the invention. In the drawings:
fig. 1 is a schematic structural diagram illustrating a probe of an open circuit voltage testing apparatus according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram illustrating a base of an open-circuit voltage testing apparatus according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram illustrating a cover plate of an open-circuit voltage testing apparatus according to an embodiment of the present invention;
fig. 4 is a schematic structural diagram of a cover plate of an open-circuit voltage testing apparatus according to an embodiment of the present invention;
fig. 5 shows a schematic structural diagram of a battery provided by an embodiment of the present invention.
Wherein the figures include the following reference numerals:
10. a probe; 11. a first stage; 12. a second stage;
20. a base; 21. a first mounting hole; 22. a third mounting hole; 23. a fifth mounting hole;
30. a cover plate; 31. a second mounting hole; 32. a main body; 33. a side plate; 34. a connecting plate; 341. a fourth mounting hole;
40. collecting a line; 50. a battery.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application, or uses. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
As shown in fig. 1 to 5, an embodiment of the present invention provides an open circuit voltage testing apparatus, which includes a probe 10, a base 20, and a cover plate 30, wherein the cover plate 30 is connected to the base 20. Wherein the probe 10 comprises a first section 11 and a second section 12 connected to each other, the first section 11 of the probe being arranged corresponding to the battery. Specifically, the base 20 has a first mounting hole 21, the cover 30 has a second mounting hole 31, and the second mounting hole 31 is disposed corresponding to the first mounting hole 21. In this embodiment, the probe 10 is inserted into the first mounting hole 21 and the second mounting hole 31 in a position-adjustable manner, the first section 11 is inserted into the battery through the first mounting hole 21, and the open-circuit voltage testing device can be used to detect the voltage and the internal resistance of the battery. In this embodiment, probe 10 is removably attached to base 20 and cover 30, thereby facilitating removal of probe 10 for polishing after probe 10 is worn. Or, because the probe 10 is adjustably inserted into the first mounting hole 21 and the second mounting hole 31, when the probe 10 is worn, the length of the probe 10 extending out of the first mounting hole 21 can be increased, so as to grind the probe 10.
Use the open circuit voltage testing arrangement that this embodiment provided, after open circuit voltage testing arrangement used for a long time, if the probe wearing and tearing appear, because probe 10 position is worn to establish in first mounting hole 21 and second mounting hole 31 adjustably, the operating personnel of being convenient for polish the probe, after finishing polishing, through the length and size that adjusts probe 10 and stretch out first mounting hole 21, can continue to use the device, so can promote device's life, reduce device's cost, improve the test accuracy of battery voltage and internal resistance. By adopting the structure, the device does not have the phenomenon of poor contact, does not need to be tested again, can promote the production efficiency and reduce the production and detection cost.
The open circuit voltage testing device further comprises a resetting component, the resetting component is arranged between the base 20 and the cover plate 30, the probe 10 is movably arranged in the first mounting hole 21 and the second mounting hole 31, and the resetting component is used for resetting the probe 10. Moreover, when the probe 10 is inserted into a battery, the resetting component can play a role in buffering, so that the abrasion of the probe 10 can be reduced, and the service life of the probe is prolonged. Wherein, the subassembly that resets includes structures such as hydraulic stem, reset spring and the shell fragment that resets, as long as can play the effect that resets and cushion.
In this embodiment, the reset assembly includes a spring and a limiting member, and the spring is sleeved on the probe 10 and located between the base 20 and the cover plate 30, so that the spring can perform the functions of resetting and buffering on the probe 10. The limiting member is disposed on the probe 10, one end of the spring abuts against the limiting member, the other end of the spring abuts against the cover plate 30, and the limiting member can limit the positions of the spring and the probe 10. Specifically, the stopper is disposed on a side of the base 20 close to the cover 30, and the spring is in a compressed or original state when the probe 10 is in the initial position.
Specifically, the second segment 12 is provided with a threaded structure, the limiting member includes a nut, the nut is in threaded connection with the second segment 12, the nut abuts against one side of the base 20 facing the cover plate 30, and the probe 10 and the spring can be fixed by the nut. By adopting the structure, the connecting device has the advantages of convenient connection and simple and reliable structure. In particular, the second section 12 has a size M3 × 0.35. Wherein, the second section 12 of the probe 10 is provided with external threads, the total length of the threads is 60mm, and the reserved abrasion loss is 30 mm.
As shown in fig. 3 and 4, the cover plate 30 includes a main body 32 and side plates 33, the second mounting holes 31 are provided on the main body 32, the side plates 33 are provided on both sides of the main body 32, and the side plates 33 extend toward a direction close to the base 20. Specifically, the two side plates 33 are perpendicular to the main body 32, and the spring and the nut are located between the main body 32 and the base 20.
Specifically, the end of the side plate 33 is provided with a connecting plate 34, and the connecting plate 34 is attached to the base 20. Wherein the connecting plate 34 is perpendicular to the side plate 33. Through setting up third mounting hole 22 on base 20, set up fourth mounting hole 341 on connecting plate 34, make fourth mounting hole 341 correspond the setting of third mounting hole 22, wear to establish the fastener in third mounting hole 22 and fourth mounting hole 341, utilize the fastener can realize being connected of base 20 and apron 30, have the advantage of the dismouting of being convenient for, the follow-up length of stretching out to probe 10 of being convenient for is adjusted.
In this embodiment, the open circuit voltage testing apparatus includes a plurality of probes 10, a plurality of first mounting holes 21 are disposed on the base 20, and the plurality of probes 10 and the plurality of first mounting holes 21 are disposed in a one-to-one correspondence. By adopting the structure, the battery can be detected by utilizing the plurality of probes 10 together, the contact area between the device and the battery can be increased, even if the detection of the individual probe 10 fails, the rest probes 10 can still complete the detection, and the accuracy and the stability of the detection can be improved.
As shown in fig. 2, the open circuit voltage testing apparatus further includes a collecting line 40, the collecting line 40 is electrically connected to the probe 10, and the collecting line 40 is staggered with respect to the plurality of first mounting holes 21. Wherein the collection wire 40 is connected to the end of the second section 12 of the probe distal to the first section 11 by a fastener. Through setting up collection line 40 crisscross relative a plurality of first mounting holes 21, can promote collection line 40's the connection effect to can promote and detect the precision.
Wherein, still be provided with fifth mounting hole 23 on the base 20, base 20 is connected with actuating mechanism through fifth mounting hole 23, so can utilize actuating mechanism drive open circuit voltage testing arrangement to remove relative battery to accomplish the detection.
In the present embodiment, the probe 10 is made of a copper alloy material. Wherein, the copper alloy material has the advantage that the internal resistance is little, hardness is high and the wearability is good, so can promote and detect precision and life.
As shown in fig. 1, an end of the first section 11 remote from the second section 12 has a puncturing structure for puncturing the battery. In this embodiment, the end of the first segment 11 is pointed to form a piercing structure.
In this embodiment, the open circuit voltage testing device is used for testing the lithium titanate battery.
As shown in fig. 5, the positive and negative electrodes of the battery 50 are located on the same side of the battery body, so that the open circuit voltage test device can simultaneously connect the positive and negative electrodes of the battery.
In this embodiment, the assembly steps of the device are as follows:
(1) fixing the probe 10 to the first mounting hole 21 of the base 20 by using 1M 3 nut at the junction of the first section 11 and the second section 12 of the probe 10;
(2) a gasket is added on the nut, a spring is placed on the gasket, the outer diameter of the spring is 5mm, and the length of the spring is 30 mm;
(3) after the probe 10 and the spring are mounted on the base 20, the second mounting hole 31 of the cover 30 is inserted through the probe 10, the cover 30 is pressed against the spring, and the cover 30 is fastened to the base 20 with screws.
In this embodiment, the using step of the device comprises:
(1) fixing the probe 10 at a corresponding position, and then connecting the base 20 with a driving mechanism to perform an OCV test on the battery in the corresponding tray;
(2) the testing instrument adopts a universal method for testing the internal resistance by using 1KHZ alternating current, 4 lines, two current lines and two voltage lines are led out from the instrument, and the positive electrode and the negative electrode of the battery respectively need one current line and one voltage line;
(3) 12 probes 10 are respectively arranged on the positive pole and the negative pole of the battery, 6 probes are connected with a current line, 6 probes are connected with a voltage line, the acquisition lines 40 are arranged in a staggered mode, the acquisition lines 40 are fixed on the end portions of the probes 10, and the acquisition lines 40 are fixed through two M3 nuts;
(4) the device is connected with the driving mechanism through the adapter plate at the position of the fifth mounting hole, two batteries are tested at one time conventionally, and two groups of devices can be connected to the adapter plate.
The elasticity of the spring, the up-and-down movement range of the adjusting device, the sharpness of the surface of the probe 10 and the like can be adjusted according to the test condition in the use process, so that the contact between the probe 10 and the surface of the battery pole column is increased, and the test efficiency of the battery is improved.
Through the device that this embodiment provided, after open circuit voltage testing arrangement used for a long time, if probe 10 appeared wearing and tearing, the operation personnel can polish the back again and continue to use, can promote device's life, reduce device's cost, promote detection speed. By arranging the plurality of probes 10, the contact area between the device and the battery can be increased, and the test accuracy of the voltage and the internal resistance of the battery is improved. Moreover, the device has the advantages of simple structure and convenience in disassembly and assembly.
It is noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of example embodiments according to the present application. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, and it should be understood that when the terms "comprises" and/or "comprising" are used in this specification, they specify the presence of stated features, steps, operations, devices, components, and/or combinations thereof, unless the context clearly indicates otherwise.
Unless specifically stated otherwise, the relative arrangement of the components and steps, the numerical expressions, and numerical values set forth in these embodiments do not limit the scope of the present invention. Meanwhile, it should be understood that the sizes of the respective portions shown in the drawings are not drawn in an actual proportional relationship for the convenience of description. Techniques, methods, and apparatus known to those of ordinary skill in the relevant art may not be discussed in detail but are intended to be part of the specification where appropriate. In all examples shown and discussed herein, any particular value should be construed as merely illustrative, and not limiting. Thus, other examples of the exemplary embodiments may have different values. It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, further discussion thereof is not required in subsequent figures.
In the description of the present invention, it should be understood that the orientation or positional relationship indicated by the orientation words such as "front, back, up, down, left, right", "horizontal, vertical, horizontal" and "top, bottom" etc. are usually based on the orientation or positional relationship shown in the drawings, and are only for convenience of description and simplification of description, and in the case of not making a contrary explanation, these orientation words do not indicate and imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation, and therefore, should not be interpreted as limiting the scope of the present invention; the terms "inner and outer" refer to the inner and outer relative to the profile of the respective component itself.
Spatially relative terms, such as "above … …," "above … …," "above … …," "above," and the like, may be used herein for ease of description to describe one device or feature's spatial relationship to another device or feature as illustrated in the figures. It will be understood that the spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. For example, if a device in the figures is turned over, devices described as "above" or "on" other devices or configurations would then be oriented "below" or "under" the other devices or configurations. Thus, the exemplary term "above … …" can include both an orientation of "above … …" and "below … …". The device may be otherwise variously oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.
It should be noted that the terms "first", "second", and the like are used to define the components, and are only used for convenience of distinguishing the corresponding components, and if not stated otherwise, the terms have no special meaning, and therefore, the scope of the present invention should not be construed as being limited.
The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (10)

1. An open circuit voltage testing apparatus, comprising:
a probe (10) comprising a first section (11) and a second section (12) connected to each other;
a base (20) having a first mounting hole (21);
the cover plate (30) is connected with the base (20), the cover plate (30) is provided with a second mounting hole (31), the second mounting hole (31) corresponds to the first mounting hole (21), the probe (10) is arranged in the first mounting hole (21) and the second mounting hole (31) in a penetrating mode in an adjustable mode, and the first section (11) penetrates out of the first mounting hole (21).
2. The open circuit voltage testing device according to claim 1, further comprising a reset assembly disposed between the base (20) and the cover plate (30), the probe (10) being movably disposed within the first mounting hole (21) and the second mounting hole (31), the reset assembly being configured to reset the probe (10).
3. The open circuit voltage testing arrangement according to claim 2, wherein said reset assembly comprises:
the spring is sleeved on the probe (10) and is positioned between the base (20) and the cover plate (30);
the limiting piece is arranged on the probe (10), one end of the spring is abutted against the limiting piece, and the other end of the spring is abutted against the cover plate (30).
4. The open circuit voltage testing device according to claim 3, wherein a threaded structure is provided on the second segment (12), and the limiting member comprises a nut, the nut is in threaded connection with the second segment (12), and the nut abuts against a side of the base (20) facing the cover plate (30).
5. The open circuit voltage test device according to claim 1, wherein the cover plate (30) includes a main body (32) and side plates (33), the second mounting hole (31) is provided on the main body (32), the side plates (33) are provided on both sides of the main body (32), and the side plates (33) extend toward a direction close to the base (20).
6. The open circuit voltage testing device according to claim 5, wherein a connecting plate (34) is arranged at an end of the side plate (33), the connecting plate (34) is attached to the base (20), a third mounting hole (22) is arranged on the base (20), a fourth mounting hole (341) is arranged on the connecting plate (34), the fourth mounting hole (341) is arranged corresponding to the third mounting hole (22), and a fastener is arranged in the third mounting hole (22) and the fourth mounting hole (341) in a penetrating manner so as to connect the base (20) and the cover plate (30).
7. The open circuit voltage testing device according to claim 1, wherein the open circuit voltage testing device comprises a plurality of the probes (10), a plurality of the first mounting holes (21) are disposed on the base (20), and a plurality of the probes (10) and a plurality of the first mounting holes (21) are disposed in a one-to-one correspondence.
8. The open circuit voltage test device according to claim 7, further comprising a pickup line (40), wherein the pickup line (40) is electrically connected to the probe (10), and wherein the pickup line (40) is staggered with respect to the plurality of first mounting holes (21).
9. The open circuit voltage testing device according to claim 1, wherein a fifth mounting hole (23) is further disposed on the base (20), and the base (20) is connected to the driving mechanism through the fifth mounting hole (23).
10. The open circuit voltage test device according to claim 1, wherein the probe (10) is made of a copper alloy material.
CN201922386795.5U 2019-12-26 2019-12-26 Open circuit voltage testing device Active CN211905613U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201922386795.5U CN211905613U (en) 2019-12-26 2019-12-26 Open circuit voltage testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201922386795.5U CN211905613U (en) 2019-12-26 2019-12-26 Open circuit voltage testing device

Publications (1)

Publication Number Publication Date
CN211905613U true CN211905613U (en) 2020-11-10

Family

ID=73295636

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201922386795.5U Active CN211905613U (en) 2019-12-26 2019-12-26 Open circuit voltage testing device

Country Status (1)

Country Link
CN (1) CN211905613U (en)

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