CN106841971A - A kind of multifunctional semiconductor electrical properties device for quick testing - Google Patents
A kind of multifunctional semiconductor electrical properties device for quick testing Download PDFInfo
- Publication number
- CN106841971A CN106841971A CN201710239678.9A CN201710239678A CN106841971A CN 106841971 A CN106841971 A CN 106841971A CN 201710239678 A CN201710239678 A CN 201710239678A CN 106841971 A CN106841971 A CN 106841971A
- Authority
- CN
- China
- Prior art keywords
- test
- test box
- probe
- draw
- electrical properties
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a kind of multifunctional semiconductor electrical properties device for quick testing, including test box body, test box body is divided into test box base and test box cover, test box base and test box cover are flexibly connected, multiple draw-in grooves are provided with test box base, and Paar paster is fixed with draw-in groove, the front end of draw-in groove is provided with test probe, and elastic telescopic component of the test probe connect setting below test probe, test probe difference connecting PCB board, and test probe is connected in parallel the voltmeter and ammeter being arranged on test box base respectively, test box cover inner side is provided with elastic rubber column, structural principle of the present invention is simple, the quick test to semiconductor devices can be realized, and probe is hardly damaged, long service life；The electrical parameter for measuring simultaneously can show in real time.
Description
Technical field
The present invention relates to semiconductor test technical field, specially a kind of multifunctional semiconductor electrical properties quickly test dress
Put.
Background technology
In prior art, for the electrical performance testing of semiconductor devices, it would be desirable to obtain the voltage of device, flow through
The electric current of device, for the luminous intensity information that luminescent device also needs to acquisition device.During test, typically pass through agrafe by electricity
The respective electrode of the both positive and negative polarity and semiconductor devices of potential source or current source is coupled together, so as to semiconductor devices provide voltage or
Electric current, makes device in running order.Generally for ensure test process in contact good between voltage source or current source and device
It is good, it is necessary to agrafe is designed to very sharp very hard, be so clipped in device two ends just very possible that electrode holder is bad；If to be measured
Semiconductor devices is luminescent device, in addition it is also necessary to which an extra spectrometer passes through light intensity of the probe to defocused measurement luminescent device,
So need to build a whole set of optics electrical testing system, it is cumbersome and costly.
The content of the invention
It is an object of the invention to provide a kind of multifunctional semiconductor electrical properties device for quick testing, to solve the above-mentioned back of the body
The problem proposed in scape technology.
To achieve the above object, the present invention provides following technical scheme：A kind of multifunctional semiconductor electrical properties are quickly surveyed
Trial assembly is put, including test box body, and the test box body is divided into test box base and test box cover, the testing cassete bottom
Seat and test box cover are flexibly connected, and are provided with multiple draw-in grooves, and the draw-in groove in the test box base and are fixed with Peltier
Piece, the front end of the draw-in groove is provided with test probe, and elastic telescopic of the test probe connect setting below test probe
Component.
Preferably, the elastic telescopic component includes sliding axle, sliding bearing, fixed block, compression spring, set screw,
The sliding axle is fixedly installed on probe side, and the sliding bearing is arranged on sliding axle, and the fixed block is arranged on slip
Bearing both sides, the compression spring is arranged on sliding bearing top, and the set screw bottom passes through compression spring and sliding axle
Hold tip contact.
Preferably, the test probe, Paar paster difference connecting PCB board, and test probe is connected in parallel setting respectively
Voltmeter and ammeter on test box base.
Preferably, the test box cover inner side is provided with elastic rubber column, and the test box cover uses clear glass.
Preferably, the draw-in groove sets 2-5.
Compared with prior art, the beneficial effects of the invention are as follows：Structural principle of the present invention is simple, can realize to semiconductor
The quick test of device；In test probe lower end, elastic telescopic component is set, can be automatic to test probe in test process
Stretched, it is ensured that completely attach to and probe is hardly damaged, long service life；Test probe is connected in parallel is arranged on respectively simultaneously
Voltmeter and ammeter on test box base；The electrical parameter for measuring can show in real time, facilitate tester to check test number
According to.
Brief description of the drawings
Fig. 1 is schematic structural view of the invention；
Fig. 2 is elastic telescopic modular construction schematic diagram of the invention.
Specific embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete
Site preparation is described, it is clear that described embodiment is only a part of embodiment of the invention, rather than whole embodiments.It is based on
Embodiment in the present invention, it is every other that those of ordinary skill in the art are obtained under the premise of creative work is not made
Embodiment, belongs to the scope of protection of the invention.
Fig. 1-2 is referred to, the present invention provides a kind of technical scheme：A kind of multifunctional semiconductor electrical properties quickly test dress
Put, including test box body 1,1 point of the test box body is test box base 2 and test box cover 3, the testing cassete bottom
Seat 2 and test box cover 3 are flexibly connected, and multiple draw-in grooves 4 are provided with the test box base 2, and draw-in groove 4 sets 2-5, sets many
Individual draw-in groove, it is convenient to test multiple semiconductor devices simultaneously；And Paar paster 5 is fixed with the draw-in groove 4, before the draw-in groove 4
End is provided with test probe 6, and elastic telescopic component 7 of the test connect setting of probe 6 below test probe 6.
In the present embodiment, elastic telescopic component 7 includes sliding axle 8, sliding bearing 9, fixed block 10, compression spring 11, tune
Section screw 12, the sliding axle 8 is fixedly installed on the side of probe 6, and the sliding bearing 9 is arranged on sliding axle 8, the fixation
Block 10 is arranged on the both sides of sliding bearing 9, and the compression spring 11 is arranged on the top of sliding bearing 9, the bottom of the set screw 12
Through compression spring 11 and the tip contact of sliding bearing 9.In the present invention, elastic telescopic component, energy are set in test probe lower end
It is enough that test probe is stretched automatically in test process, it is ensured that to completely attach to and probe is hardly damaged, long service life.
In the present embodiment, test probe 6, Paar paster 5 distinguish connecting PCB board 13, and test probe 6 is connected in parallel respectively
It is arranged on voltmeter 14 and ammeter 15 on test box base 2.
In addition, in the present embodiment, the inner side of test box cover 3 is provided with elastic rubber column 16, and the test box cover 3 is used
Clear glass 17.Using elastic rubber column, it is easy in test, when covering on testing cassete, elastic rubber column withstands semiconductor
Device, makes semiconductor devices contact tightr with test probe；Using clear glass, light emitting diode is this kind of partly leads for convenient test
Body device.
The beneficial effects of the invention are as follows：Structural principle of the present invention is simple, can realize the quick test to semiconductor devices；
Elastic telescopic component is set in test probe lower end, automatic in test process test probe can be stretched, it is ensured that complete
Full connected and probe is hardly damaged, long service life；Test probe is connected in parallel is arranged on test box base respectively simultaneously
Voltmeter and ammeter；The electrical parameter for measuring can show in real time, facilitate tester to check test data.
Although an embodiment of the present invention has been shown and described, for the ordinary skill in the art, can be with
Understanding can carry out various changes, modification, replacement to these embodiments without departing from the principles and spirit of the present invention
And modification, the scope of the present invention be defined by the appended.
Claims (5)
1. a kind of multifunctional semiconductor electrical properties device for quick testing, including test box body（1）, it is characterised in that：It is described
Test box body（1）It is divided into test box base（2）With test box cover（3）, the test box base（2）With test box cover
（3）It is flexibly connected, the test box base（2）Inside it is provided with multiple draw-in grooves（4）, and the draw-in groove（4）Inside it is fixed with Paar paster
（5）, the draw-in groove（4）Front end be provided with test probe（6）, and the test probe（6）Connect setting is in test probe（6）Under
The elastic telescopic component of side（7）.
2. a kind of multifunctional semiconductor electrical properties device for quick testing according to claim 1, it is characterised in that：It is described
Elastic telescopic component（7）Including sliding axle（8）, sliding bearing（9）, fixed block（10）, compression spring（11）, set screw
（12）, the sliding axle（8）It is fixedly installed on probe（6）Side, the sliding bearing（9）It is arranged on sliding axle（8）On, it is described
Fixed block（10）It is arranged on sliding bearing（9）Both sides, the compression spring（11）It is arranged on sliding bearing（9）Top, the tune
Section screw（12）Bottom passes through compression spring（11）With sliding bearing（9）Tip contact.
3. a kind of multifunctional semiconductor electrical properties device for quick testing according to claim 1, it is characterised in that：It is described
Test probe（6）, Paar paster（5）Difference connecting PCB board（13）, and test probe（6）It is connected in parallel respectively and is arranged on test
Box base（2）On voltmeter（14）And ammeter（15）.
4. a kind of multifunctional semiconductor electrical properties device for quick testing according to claim 1, it is characterised in that：It is described
Test box cover（3）Inner side is provided with elastic rubber column（16）, and the test box cover（3）Using clear glass（17）.
5. a kind of multifunctional semiconductor electrical properties device for quick testing according to claim 1, it is characterised in that：It is described
Draw-in groove（4）Set 2-5.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710239678.9A CN106841971A (en) | 2017-04-13 | 2017-04-13 | A kind of multifunctional semiconductor electrical properties device for quick testing |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710239678.9A CN106841971A (en) | 2017-04-13 | 2017-04-13 | A kind of multifunctional semiconductor electrical properties device for quick testing |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106841971A true CN106841971A (en) | 2017-06-13 |
Family
ID=59146867
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710239678.9A Withdrawn CN106841971A (en) | 2017-04-13 | 2017-04-13 | A kind of multifunctional semiconductor electrical properties device for quick testing |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106841971A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114563666A (en) * | 2022-02-27 | 2022-05-31 | 广州嘉逸电子科技有限公司 | Insulation characteristic test system for liquid crystal semiconductor insulation test |
-
2017
- 2017-04-13 CN CN201710239678.9A patent/CN106841971A/en not_active Withdrawn
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114563666A (en) * | 2022-02-27 | 2022-05-31 | 广州嘉逸电子科技有限公司 | Insulation characteristic test system for liquid crystal semiconductor insulation test |
| CN114563666B (en) * | 2022-02-27 | 2023-02-03 | 广州嘉逸电子科技有限公司 | Insulation characteristic test system for liquid crystal semiconductor insulation test |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WW01 | Invention patent application withdrawn after publication |
Application publication date: 20170613 |
|
| WW01 | Invention patent application withdrawn after publication |