CN211905594U

CN211905594U - Test machine table and chip test system

Info

Publication number: CN211905594U
Application number: CN202020357370.1U
Authority: CN
Inventors: 张悦
Original assignee: Hefei Yuexin Semiconductor Technology Co ltd
Current assignee: Hefei Yuexin Semiconductor Technology Co ltd; Yuexin Technology Co ltd
Priority date: 2020-03-19
Filing date: 2020-03-19
Publication date: 2020-11-10
Anticipated expiration: 2030-03-19

Abstract

The application provides a test machine and a chip test system, and relates to the technical field of chip testing. The test machine comprises: a machine table shell; the PCB is arranged inside the machine table shell; the light source device is fixedly arranged in the machine table shell, and the installation direction of the light source device and the first surface of the machine table shell form a first preset angle; the first surface is a light-emitting surface, a light-emitting port is arranged on the light-emitting surface, and light emitted by the light source device is emitted from the light-emitting port. The application provides an integrated required light source device of test in the test board, the integrated level is high, and owing to set aside the space of light source structure in the board specially, light source itself can be done bigger, is favorable to placing the better light source of light quality in the board, compares in prior art external little light source, and the light signal quality obtains promoting, simultaneously, can also reduce test time, improves efficiency of software testing.

Description

Test machine table and chip test system

Technical Field

The application relates to the technical field of chip testing, in particular to a testing machine table and a chip testing system.

Background

The CIS (cmos Image sensor) chip is a key component of the camera, and the CIS chip captures Image information by converting optical signals into digital electrical signals, which is used as a core chip of a camera product and determines the imaging quality of the camera. The testing of CIS chips is an important ring in the production of CIS chips. The existing testing machine for testing the CIS chip generally uses an external light source, the external light source is placed in a space which is less than 10 centimeters between a PCB and the machine, and limited to the external light source, the used external light source is usually small and short, the light diameter is small, the problems that the signal quality of the light source is poor, the uniformity of the light source is not good enough and the like are directly caused, and the CIS chip with high pixels cannot be effectively tested.

SUMMERY OF THE UTILITY MODEL

An object of the embodiments of the present application is to provide a testing machine and a chip testing system, so as to improve the problem of poor quality of light source signals in the prior art.

In a first aspect, an embodiment of the present application provides a test machine, including:

a machine table shell;

the PCB is arranged inside the machine table shell;

the light source device is fixedly arranged in the machine table shell, and the installation direction of the light source device and the first surface of the machine table shell form a first preset angle; the first surface is a light-emitting surface, a light-emitting port is arranged on the light-emitting surface, and light emitted by the light source device is emitted from the light-emitting port.

In the technical scheme, the light source device required by the test is integrated in the test machine table, the integration level is high, and the space of the light source structure is reserved in the machine table specially, so that the light source can be made larger, the light source with better light quality can be placed in the machine table, and the light signal quality is improved compared with an external small light source in the prior art. Meanwhile, a larger light source can bring a larger emergent light spot area, so that the number of chips which can be tested at a time is increased, the testing time is effectively reduced, and the testing efficiency is improved.

In a possible implementation manner, a slot is further formed in the machine table shell, a second preset angle is formed between the extending direction of the slot body and the first surface of the machine table shell, and the slot is used for being inserted into the PCB. In the technical scheme, the slot is formed in the test machine table, so that the flexible installation of the PCB is convenient.

In a possible implementation manner, the slot includes a first slot and a second slot, the first slot and the second slot are respectively and fixedly installed on two sides of the light source device, a first fixing member and a second fixing member are further disposed inside the machine table shell, the first fixing member abuts against one end of the light source device, the second fixing member abuts against the other end of the light source device, a first end of the first fixing member and a first end of the second fixing member are fixed on the first slot, and a second end of the first fixing member and a second end of the second fixing member are fixed on the second slot.

In the above technical scheme, the extending directions of the two fixing pieces are perpendicular to the first slot and the second slot, and the two ends of the light source device can be firmly fixed by utilizing the first slot, the second slot, the first fixing piece and the second fixing piece.

In a possible embodiment, the first end of the first fixing member and the first end of the second fixing member are fixed to the first slot by screws, and the second end of the first fixing member and the second end of the second fixing member are fixed to the second slot by screws.

In one possible embodiment, the light source device includes: the light source controller is electrically connected with the light source and used for controlling the light source to emit light.

In a possible implementation manner, the testing machine further includes: the cover plate is arranged on one side, far away from the machine table shell, of the light outlet, and the cover plate is used for covering the light outlet. The cover plate can displace relative to the first surface, and when the test machine is not tested, the light outlet can be shielded by the cover plate, so that the dust-proof and dust-proof effects are achieved; before the testing machine is used for testing, the cover plate is moved away from the upper part of the light outlet, so that light rays emitted by the light source device can be transmitted out, and the testing is finished.

In a possible implementation manner, the cover plate is detachably connected with the first surface of the machine table shell. The mounting and dismounting of the cover plate can be effected, for example, by means of screws.

In a possible embodiment, the cover plate is movably connected to the first surface of the machine base housing. The movable connection mode includes but is not limited to sliding, rotating, folding and the like.

In a possible implementation manner, a second surface and a third surface opposite to the second surface of the machine table shell are respectively provided with at least one ventilation fan, and the second surface and the third surface are connected with the first surface. When the test machine runs, the ventilation fans arranged on the two opposite surfaces can promote the air circulation inside the machine, so that the effects of heat dissipation and ventilation are achieved, and the stable running of the test machine is ensured.

In a second aspect, an embodiment of the present application provides a chip testing system, including: the test terminal is respectively connected with the signal processing device and the test machine, the signal processing device is connected with the test machine, and the test machine is used for being connected with a chip to be tested.

In order to make the aforementioned and other objects, features and advantages of the present invention comprehensible, preferred embodiments accompanied with figures are described in detail below.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are required to be used in the embodiments of the present application will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present application and therefore should not be considered as limiting the scope, and that those skilled in the art can also obtain other related drawings based on the drawings without inventive efforts.

Fig. 1 is a schematic view of an internal structure of a testing machine provided in an embodiment of the present application;

fig. 2 is a schematic view structure diagram of a testing machine according to an embodiment of the present disclosure;

fig. 3 is a schematic view illustrating another structure of a view angle of a testing apparatus according to an embodiment of the present disclosure;

FIG. 4 is a schematic view of a light source device according to an embodiment of the present application;

fig. 5 is a flowchart of chip testing in the embodiment of the present application.

Icon: 110-machine shell; 120-a light source device; 111-a first surface; 112-a second surface; 211-a first slot; 212-a second slot; 213-a first mount; 214-a cover plate; 215-ventilating fan.

Detailed Description

The technical solutions in the embodiments of the present application will be described below with reference to the drawings in the embodiments of the present application.

Referring to fig. 1 to 3, fig. 1 illustrates an internal structure schematic diagram of a testing machine provided in an embodiment of the present application, and fig. 2 and 3 illustrate external schematic diagrams of the testing machine. This test board includes: a machine station casing 110, a PCB (not shown), and a light source device 120, wherein the PCB is disposed inside the machine station casing 110, and the light source device 120 is fixedly mounted inside the machine station casing 110. The light source device 120 is installed at a first predetermined angle with respect to the first surface 111 of the machine housing 110. The first surface 111 is a light exit surface of the testing machine, and a light exit port is disposed on the light exit surface, through which light emitted from the light source device 120 passes. Fig. 4 is a schematic diagram of the light source device 120.

The chip to be tested is opposite to the light emitting surface of the testing machine table, digital signals can be generated based on light emitted from the light emitting port, and the testing machine table can simultaneously test one or more chips to be tested. The chip to be tested in the embodiment of the application is an image sensing chip, and includes but is not limited to a CCD chip and a CIS chip.

Optionally, a slot is further disposed inside the machine table shell 110, wherein an extending direction of the slot body and the first surface 111 of the machine table shell 110 form a second preset angle, and the slot is used for inserting a PCB. The first and second preset angles may be the same, and may be, for example, an angle perpendicular or close to perpendicular to the first surface 111. The PCB board is provided with a plurality of interfaces, after the PCB board is inserted into the internal slot, the test machine platform is connected with the chip to be tested and the signal processing device through the plurality of interfaces arranged on the PCB board, and the signal processing device is used for processing digital signals. For example, the Signal processing device may be a Digital Signal Processor (DSP).

In this embodiment, the number of the slots may be one or more, the number of the PCB boards may be one or more, and the specific number may be set according to an actual application scenario, which is not limited in this embodiment. The PCB board can provide signals such as power supply, clock and the like and necessary digital signals such as configuration signals for the chip to be tested, and the PCB board can be a rectangular circuit board.

In a specific embodiment, as shown in fig. 1, the slots disposed inside the machine platform include a first slot 211 and a second slot 212, and the first slot 211 and the second slot 212 are respectively and fixedly installed on two sides of the light source device 120. The machine table shell 110 is provided with a first fixing member 213 and a second fixing member (not shown), the first fixing member 213 abuts against one end of the light source device 120, the second fixing member abuts against the other end of the light source device 120, a first end of the first fixing member 213 and a first end of the second fixing member are fixed on the first slot 211, and a second end of the first fixing member 213 and a second end of the second fixing member are fixed on the second slot 212.

Optionally, an installation top plate and an installation bottom plate are arranged inside the machine table shell 110, the installation top plate and the installation bottom plate are both parallel to the first surface 111, the installation top plate is fixedly installed on one side close to the first surface 111, the installation bottom plate is fixedly installed on one side far away from the first surface 111, the first slot 211 and the second slot 212 are both vertically installed on the installation top plate and the installation bottom plate, and therefore the two ends of the first slot 211 and the two ends of the second slot 212 can be firmly fixed inside the machine table. The first fixing member 213 is mounted on the mounting base plate, and the second fixing member is mounted on the mounting top plate.

Alternatively, the first end of the first fixing member 213 and the first end of the second fixing member may be fixed to the first slot 211 by screws, and the second end of the first fixing member 213 and the second end of the second fixing member may be fixed to the second slot 212 by screws. The first fixing member 213 and the first slot 211 and the second slot 212 may be fixed together, and the second fixing member and the first slot 211 and the second slot 212 may be fixed together by other types of fasteners.

In the present embodiment, the light source device 120 includes: the light source controller is electrically connected with the light source and used for controlling the light source to emit light, and the light source controller is connected with the test terminal and can receive a test instruction of the test terminal and control the light source to emit light with a specific wavelength.

Optionally, as shown in fig. 2, the testing machine further includes: the cover plate 214 is disposed on a side of the light exit far from the machine housing 110, the cover plate 214 can displace relative to the first surface 111 of the machine housing 110, the shape of the light exit can be circular or square, and the cover plate 214 is used for covering the light exit. When the testing machine is not used for testing, the light outlet can be shielded by the cover plate 214, so that the dust-proof and dustproof effects are achieved. Before the testing machine performs the testing, the cover plate 214 is removed from above the light outlet, so that the light emitted from the light source device 120 can be transmitted out, thereby completing the testing. The cover plate 214 may be detachably connected to the first surface 111 of the machine station housing 110, for example, when the cover plate 214 needs to be used, the cover plate 214 and the first surface 111 are locked by screws to be fixed, and when the cover plate 214 does not need to be used, the screws are unscrewed and the cover plate 214 is removed. The cover 214 may be movably connected to the first surface 111, for example, the cover 214 may be movably connected to the first surface 111 by sliding, by rotating, or by folding. It should be noted that the specific connection manner of the cover plate 214 and the machine base housing 110 should not be construed as a limitation to the present application.

Optionally, as shown in fig. 2 and fig. 3, at least one ventilation fan 215 is disposed on each of the second surface 112 and the third surface of the machine base casing 110, wherein the second surface 112 and the third surface are two opposite surfaces, and the second surface 112 and the third surface are connected to the first surface 111. In this embodiment, the machine casing 110 may be a rectangular frame structure, the first surface may be a top surface of the testing machine, the second surface 112 and the third surface may be two opposite side surfaces of the testing machine, the second surface is provided with a plurality of air inlet fans, and the third surface is provided with a plurality of air exhaust fans, so that when the testing machine operates, air circulation inside the machine can be promoted, heat dissipation and ventilation effects are achieved, and stable operation of the testing machine is ensured.

The application scenario of the testing machine provided by this embodiment is as follows:

the test terminal, the signal processing device and the test machine form a chip test system, the test terminal is respectively connected with the signal processing device and the test machine, the signal processing device is connected with the test machine, and the test machine is used for being connected with a chip to be tested. Referring to fig. 5, the process of testing the chip to be tested includes:

step 310: the test terminal sends a test instruction to the test machine to enable the light source device in the test machine to emit light.

Before testing, a chip to be tested is connected to a PCB of a testing machine, the testing machine provides a power signal, a clock signal and a configuration signal for the chip to be tested through the PCB, and a register of the chip to be tested is configured to a required working state through the configuration signal. Next, the light source device in the test machine applies light with a specific wavelength to the chip to be tested, wherein the light applied to the chip to be tested includes, but is not limited to, three colors of light such as red, green, blue, and the like, and light with different brightness, and the specific applied optical signal parameters can be determined according to a chip manual.

Step 320: the test machine receives the digital signal returned by the connected chip to be tested and sends the digital signal to the signal processing device, and the digital signal is generated by the chip to be tested based on light.

The chip to be tested catches image information after sensing the optical signal, converts the optical signal into a digital signal through photoelectric conversion, and the digital signal is output through a digital pin of the chip and is output to a connected test machine. After the digital signal of the chip to be tested is collected by the testing machine, the digital signal is stored and sent to the connected DSP through the high-speed data interface.

Step 330: the signal processing device carries out parameter calculation on the digital signal and sends a calculation result to the test terminal.

Step 340: and the test terminal tests the chip to be tested according to the calculation result.

After receiving the digital signal transmitted by the test machine, the DSP performs a large amount of parameter calculation and returns a calculation result to the test terminal. And defining the qualified range of the corresponding parameters in the chip manual, comparing the calculation result transmitted by the DSP with the qualified range defined in advance by the test terminal, if the calculation result is within the defined qualified range, obtaining the result that the test is passed, and if the calculation result is not within the defined qualified range, obtaining the result that the test is not passed.

In the test process, the DSP completes data transmission and operation, and the test terminal completes judgment of a test result, wherein the test terminal can be a computer.

To sum up, the required light source device of test has been integrated in the test board that this application embodiment provided, and the integrated level is high, and because the space of light source structure has been reserved specially in the board, light source itself can be done bigger, is favorable to placing the better light source of light quality in the board, compares in external little light source among the prior art, and light signal quality obtains promoting. Furthermore, a larger light source can bring a larger emergent light spot area, so that the number of chips which can be tested at a time is increased, and if an external small light source in the prior art can test 1-2 CIS chips at a time, a large light source in the embodiment can test 4-5 CIS chips at a time, so that the test time is effectively reduced, and the test efficiency is improved.

In this document, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions.

The above description is only an example of the present application and is not intended to limit the scope of the present application, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A testing machine is characterized by comprising:

a machine table shell;

the PCB is arranged inside the machine table shell;

2. The testing machine table as claimed in claim 1, wherein a slot is further disposed inside the machine table shell, wherein a second preset angle is formed between the extending direction of the groove body and the first surface of the machine table shell, and the slot is used for inserting the PCB board.

3. The testing machine table according to claim 2, wherein the slots include a first slot and a second slot, the first slot and the second slot are respectively and fixedly mounted on two sides of the light source device, the machine table housing is further provided inside with a first fixing member and a second fixing member, the first fixing member abuts against one end of the light source device, the second fixing member abuts against the other end of the light source device, a first end of the first fixing member and a first end of the second fixing member are fixed on the first slot, and a second end of the first fixing member and a second end of the second fixing member are fixed on the second slot.

4. The testing machine table as claimed in claim 3, wherein the first end of the first fixing member and the first end of the second fixing member are fixed to the first slot by screws, and the second end of the first fixing member and the second end of the second fixing member are fixed to the second slot by screws.

5. The testing machine as claimed in claim 1, wherein the light source device comprises: the light source controller is electrically connected with the light source and used for controlling the light source to emit light.

6. The testing machine of claim 1, further comprising:

the cover plate is arranged on one side, far away from the machine table shell, of the light outlet, and the cover plate is used for covering the light outlet.

7. The testing machine of claim 6, wherein the cover is detachably connected to the first surface of the machine housing.

8. The testing machine of claim 6, wherein the cover is movably connected to the first surface of the machine housing.

9. The test machine of claim 1, wherein a second surface and a third surface opposite to the second surface of the machine housing are each provided with at least one ventilation fan, and the second surface and the third surface are connected to the first surface.

10. A chip test system, comprising: the testing machine comprises a testing terminal, a signal processing device and the testing machine platform as claimed in any one of claims 1 to 9, wherein the testing terminal is respectively connected with the signal processing device and the testing machine platform, the signal processing device is connected with the testing machine platform, and the testing machine platform is used for being connected with a chip to be tested.