CN211856677U

CN211856677U - Electronic chip test carrier

Info

Publication number: CN211856677U
Application number: CN202020318291.XU
Authority: CN
Inventors: 蔡晓娟
Original assignee: Individual
Current assignee: Individual
Priority date: 2020-03-13
Filing date: 2020-03-13
Publication date: 2020-11-03
Anticipated expiration: 2030-03-13

Abstract

The utility model discloses an electronic chip tests carrier, which comprises a support plate, the fluting has been seted up on the top of support plate, the constant head tank has all been seted up to the grooved both sides inner wall, the one end sliding clamping of constant head tank has the locating plate, the fixed first spring that is equipped with of one end of locating plate, the one end of first spring and the other end cell wall fixed connection of constant head tank, the bottom of locating plate is equipped with the bearing plate, the top both sides of bearing plate are all fixed and are equipped with the connecting rod, the relative rectangle through-hole slip interlude of position of seting up on connecting rod and the locating plate is connected, the top swing joint. The utility model discloses a locating plate and bearing plate fix a position electronic chip, and it is effectual to fix a position, guarantees that electronic chip is detected the steadiness of time measuring, guarantees the accuracy of test result.

Description

Electronic chip test carrier

Technical Field

The utility model relates to a test carrier field, in particular to electronic chip test carrier.

Background

The electronic chip needs to utilize the detector to test the chip when producing, guarantees that electronic chip's data display is normal, is convenient for come into use, and is common to put electronic chip on the support plate when testing electronic chip and is detecting, and in the testing process, electronic chip easily takes place the skew, leads to detecting instrument detection position inaccurate, influences electronic chip's detection data accuracy, and detection efficiency is low, influences electronic chip's normal use of coming into use.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide an electronic chip tests carrier to solve the problem that proposes among the above-mentioned background art.

In order to achieve the above object, the utility model provides a following technical scheme: the utility model provides an electronic chip test carrier, includes the support plate, the fluting has been seted up on the top of support plate, the constant head tank has all been seted up to the grooved both sides inner wall, the one end sliding clamping of constant head tank has the locating plate, the one end of locating plate is fixed and is equipped with first spring, the one end of first spring and the other end cell wall fixed connection of constant head tank, the bottom of locating plate is equipped with the bearing plate, the top both sides of bearing plate all are fixed and are equipped with the connecting rod, the connecting rod alternates with the relative rectangle through-hole slip of the position of seting up on the locating plate and be connected, the top swing joint of connecting rod has.

Preferably, the buffer mechanism comprises a guide pillar, the guide pillar is in sliding clamping connection with a guide hole formed in the groove wall of the bottom end of the groove, a second spring is sleeved outside the guide pillar, one end of the second spring is fixedly connected with the bottom end of the support plate, and the other end of the second spring is fixedly connected with the groove wall of the bottom end of the groove.

Preferably, a supporting seat is arranged between the two supporting plates, the bottom end of the supporting seat is fixedly connected with the bottom groove wall of the groove, a groove is formed in the top end of the supporting seat, a T-shaped backing plate is slidably clamped at the top end of the groove, third springs are arranged at equal intervals and fixedly arranged at the bottom end of the backing plate, and one end of each third spring is fixedly connected with the bottom groove wall of the groove.

Preferably, a protective pad is embedded at the top end of the backing plate.

Preferably, one end of each of the two support plates is slidably connected with a sliding groove formed in the groove wall on the two sides of the groove.

Preferably, the shape of the limiting plate is matched with the shape of the rectangular through hole in the positioning plate.

The utility model discloses a technological effect and advantage:

the electronic chip is positioned through the positioning plate and the supporting plate, the positioning effect is good, the stability of the electronic chip when being detected is guaranteed, the accuracy of a test result is guaranteed, the bottom of the electronic chip is supported by the aid of the base plate on the supporting seat, the bending phenomenon during testing of the electronic chip is avoided, and the integrity and the accuracy during testing of the electronic chip are guaranteed.

Drawings

Fig. 1 is a schematic front structural view of the present invention.

Fig. 2 is a schematic side sectional structure view of the present invention.

Fig. 3 is a schematic view of a part of an enlarged structure at a in fig. 2 according to the present invention.

In the figure: 1. a carrier plate; 2. grooving; 3. positioning a groove; 4. positioning a plate; 5. a first spring; 6. a support plate; 7. a connecting rod; 8. a limiting plate; 9. a guide post; 10. a second spring; 11. a supporting seat; 12. a groove; 13. a base plate; 14. a protective pad; 15. and a third spring.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

The utility model provides an electronic chip testing carrier as shown in figures 1-3, which comprises a carrier plate 1, a groove 2 is arranged at the top end of the carrier plate 1, positioning grooves 3 are arranged on the inner walls of the two sides of the groove 2, a positioning plate 4 is slidably clamped at one end of the positioning groove 3, a first spring 5 is fixedly arranged at one end of the positioning plate 4, one end of the first spring 5 is fixedly connected with the groove wall of the other end of the positioning groove 3, a supporting plate 6 is arranged at the bottom of the positioning plate 4, connecting rods 7 are fixedly arranged at the two sides of the top end of the supporting plate 6, the connecting rods 7 are slidably and alternately connected with rectangular through holes arranged on the positioning plate 4 and opposite to each other, a limiting plate 8 is movably connected at the top end of the connecting rods 7, a buffer mechanism is arranged at the bottom of the supporting plate 6, one ends of the two supporting plates 6, when the limiting plate 8 passes the in-process of rectangle through-hole, limiting plate 8 and rectangle through-hole are parallel state, after limiting plate 8 passed the rectangle through-hole, limiting plate 8 and rectangle through-hole were the vertical state, utilized limiting plate 8 to play limiting displacement to connecting rod 7.

The buffer mechanism comprises a guide pillar 9, the guide pillar 9 is in sliding clamping connection with a guide hole formed in the bottom groove wall of the slot 2, a second spring 10 is sleeved outside the guide pillar 9, one end of the second spring 10 is fixedly connected with the bottom end of the supporting plate 6, and the other end of the second spring 10 is fixedly connected with the bottom groove wall of the slot 2.

Be equipped with supporting seat 11 between two bearing plates 6, the bottom of supporting seat 11 and the bottom cell wall fixed connection of fluting 2, recess 12 has been seted up on the top of supporting seat 11, the top slip joint of recess 12 has the backing plate 13 that is the T type shape, the bottom mounting of backing plate 13 is equipped with the third spring 15 that the equidistance was arranged, the one end of third spring 15 and the bottom cell wall fixed connection of recess 12, protection pad 14 has been inlayed on the top of backing plate 13, utilize second spring 10 to play the cushioning effect to bearing plate 6, utilize third spring 15 to play the cushioning effect to backing plate 13, be convenient for adjust electronic chip's the position of placing, make things convenient for locating plate 4 and bearing plate 6 to fix a position electronic chip, protection pad 14 plays the guard action to electronic chip's bottom.

The utility model discloses the theory of operation:

when the positioning plate is operated, the positioning plate 4 is firstly moved towards the inside of the positioning groove 3, at the moment, the first spring 5 is in a compressed state, the electronic chip is placed on the backing plate 13 on the supporting seat 11, the mounting holes on the electronic chip respectively penetrate through the connecting rods 7 which are oppositely positioned on the supporting plate 6, the electronic chip is pressed, the electronic chip drives the backing plate 13 and the supporting plate 6 to move downwards, the supporting plate 6 drives the guide posts 9 to move downwards, the second spring 10 is in a compressed state, the positioning plate 4 is loosened, the positioning plate 4 moves towards the outside of the positioning groove 3 under the action of the elastic force of the first spring 5, the electronic chip is loosened, the supporting plate 6 moves upwards under the action of the elastic force of the second spring 10, the supporting plate 6 drives the connecting rods 7 to move upwards, the connecting rods 7 drives the limiting plates 8 to penetrate through the rectangular through holes, therefore, the position of the electronic chip is fixed, and the stability of the electronic chip during testing is ensured.

In the description of the present invention, unless expressly stated or limited otherwise, the terms "disposed," "mounted," "connected," and "fixed" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral part; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.

The utility model discloses the standard parts that use all can purchase from the market, and dysmorphism piece all can be customized according to the record of the description with the drawing.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. The utility model provides an electronic chip test carrier, includes support plate (1), its characterized in that: the novel support plate is characterized in that a groove (2) is formed in the top end of the support plate (1), positioning grooves (3) are formed in inner walls of two sides of the groove (2), a positioning plate (4) is slidably clamped at one end of each positioning groove (3), a first spring (5) is fixedly arranged at one end of each positioning plate (4), one end of each first spring (5) is fixedly connected with the wall of the other end of each positioning groove (3), a support plate (6) is arranged at the bottom of each positioning plate (4), connecting rods (7) are fixedly arranged on two sides of the top end of each support plate (6), the connecting rods (7) are slidably and alternately connected with rectangular through holes which are formed in the positioning plates (4) and are opposite in position, limiting plates (8) are movably connected to the top ends of the connecting rods (7).

2. The electronic chip test carrier of claim 1, wherein: the buffer mechanism comprises a guide pillar (9), the guide pillar (9) is in sliding clamping connection with a guide hole formed in the bottom groove wall of the slot (2), a second spring (10) is sleeved outside the guide pillar (9), one end of the second spring (10) is fixedly connected with the bottom end of the supporting plate (6), and the other end of the second spring (10) is fixedly connected with the bottom groove wall of the slot (2).

3. The electronic chip test carrier of claim 1, wherein: a supporting seat (11) is arranged between the two supporting plates (6), the bottom end of the supporting seat (11) is fixedly connected with the bottom groove wall of the groove (2), a groove (12) is formed in the top end of the supporting seat (11), a T-shaped backing plate (13) is slidably clamped at the top end of the groove (12), third springs (15) which are arranged at equal intervals are fixedly arranged at the bottom end of the backing plate (13), and one end of each third spring (15) is fixedly connected with the bottom groove wall of the groove (12).

4. The electronic chip test carrier of claim 3, wherein: the top end of the backing plate (13) is embedded with a protective pad (14).

5. The electronic chip test carrier of claim 1, wherein: one end of each of the two support plates (6) is in sliding connection with a sliding groove arranged on the groove wall at the two sides of the corresponding groove (2).

6. The electronic chip test carrier of claim 1, wherein: the shape of the limiting plate (8) is matched with that of the rectangular through hole on the positioning plate (4).