CN211826516U - Depth measuring device - Google Patents
Depth measuring device Download PDFInfo
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- CN211826516U CN211826516U CN201922306982.8U CN201922306982U CN211826516U CN 211826516 U CN211826516 U CN 211826516U CN 201922306982 U CN201922306982 U CN 201922306982U CN 211826516 U CN211826516 U CN 211826516U
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Abstract
A depth measurement device, comprising: the emission module comprises a light source array consisting of a plurality of sub light sources and is used for providing output light to irradiate the target object by using a projection pattern with a plurality of spots; the acquisition module detects at least one part of reflected light which comprises the output light and is reflected back by the target object; a control and processing circuit configured to acquire a distance of the target object from a phase difference of the output light and the reflected light; the light source array comprises a plurality of discrete sub-light source arrays, and each sub-light source array is configured to be controllable to be independently turned on or synchronously turned on so that the emission module provides projection patterns with different field angles and/or different spot densities. The utility model discloses can adapt to various degree of depth measurement in a flexible way and use down to the measurement demand of target object to reduce measuring device's consumption.
Description
Technical Field
The utility model relates to a degree of depth measuring's technical field especially relates to a degree of depth measuring device.
Background
A depth measurement device based on the time-of-flight (ToF) principle is to identify and map a target object based on light reflected from the target, the core component including a light source configured to emit light towards the target object and a photoreceptor to receive reflected light reflected back by the target object.
The ToF measurement accuracy and the measurement distance are affected by the intensity of the light source, and in the existing ToF depth measurement device, the light source adopts single-form floodlight illumination to uniformly distribute the energy emitted by the light source, so that the required power consumption is large, the measurement distance is small, and the ToF depth measurement device is also single and limited in function and is not beneficial to wide application.
SUMMERY OF THE UTILITY MODEL
In order to overcome at least one of the above-mentioned defects of the prior art, the utility model provides a depth measuring device.
A depth measurement device, comprising:
an emission module comprising a light source array consisting of a plurality of sub-light sources, the emission module configured to provide output light to illuminate a target object in a projected pattern having a plurality of spots;
an acquisition module comprising an image sensor comprised of at least one pixel, the image sensor configured to detect at least a portion of reflected light including the output light reflected back through the target object;
the control and processing circuit is connected with the transmitting module and the collecting module and is configured to acquire the distance of the target object according to the phase difference of the output light and the reflected light;
the light source array comprises a plurality of discrete sub-light source arrays, and each sub-light source array is configured to be controllable to be independently turned on or synchronously turned on so that the emission module provides projection patterns with different field angles and/or different spot densities.
Further, the sub-light sources of the light source array are regularly arranged or irregularly arranged.
Further, the plurality of sub light source arrays of the light source array are arranged separately.
Further, the plurality of sub light source arrays of the light source array are arranged in a cross manner.
Further, the plurality of sub light source arrays of the light source array have different arrangement densities.
Further, the light source is a vertical cavity surface emitting laser.
Further, the image sensor is a ToF image sensor.
Further, each of the pixels includes at least two taps for collecting an electrical signal generated by the light beam reflected back through the target object.
Furthermore, the control and processing circuit controls the emission module to adopt sparse projection at a short distance and dense projection at a long distance.
Furthermore, the control and processing circuit controls the emission module to adopt small-field-angle projection at a short distance and large-field-angle projection at a long distance.
Compared with the prior art, the beneficial effects of the utility model are that:
the utility model provides a degree of depth measuring device, wherein the light source array of transmission module contains a plurality of sub-light source arrays of separating, and each sub-light source array is configured into steerable independent opening or opens in step so that the transmission module provides the projection pattern of different field angles and/or different spot density, from this, can control independently to open one in each sub-light source array according to the size of the target object that awaits measuring, the distance of the target object that awaits measuring far and near and the needs of measuring resolution ratio, perhaps open the combination of many in each sub-light source array in step. For example, if the size of the object to be measured is large, the sub-light source array can be controlled to provide a large field angle, so that more data of effective depth values can be acquired for the object to be measured; if the size of the object to be measured is smaller, the sub-light source array can be controlled to provide a smaller field angle, so that the power of the transmitting module is reduced, and the power consumption is reduced. If higher measurement resolution is required, the sub-light source array can be controlled to realize dense projection, so that the number of effective depth values is increased; if higher measurement resolution is not needed, the sub-light source array can be controlled to adopt sparse projection, so that the power of the transmitting module is reduced, and the power consumption is reduced. If short-distance measurement is needed, the sub-light source array can be controlled to realize sparse projection, the power of the emission module is reduced, and the power consumption is reduced; if remote measurement is needed, the sub-light source array can be controlled to realize dense projection, so that more effective depth data can be acquired. In a word, the utility model discloses can adapt to various depth measurement uses down to the measurement demand of target object in a flexible way to reduce measuring device's consumption.
Drawings
Fig. 1 is a schematic view of a depth measuring device according to an embodiment of the present invention.
Fig. 2a is a schematic diagram of a light source array according to an embodiment of the present invention.
Fig. 2b is a schematic diagram of a light source array according to another embodiment of the present invention.
Fig. 2c is a schematic diagram of a light source array according to yet another embodiment of the present invention.
Detailed Description
The present invention will be described in detail with reference to the following embodiments, which are not intended to limit the scope of the present invention, so as to better understand the present invention. In addition, it should be noted that the drawings provided in the following embodiments are only for illustrating the basic concept of the present invention, and the drawings only show the components related to the present invention rather than being drawn according to the number, shape and size of the components in actual implementation, and the shape, number and proportion of the components in actual implementation may be changed arbitrarily, and the layout of the components may be more complicated.
Fig. 1 is a schematic view of a depth measuring device according to an embodiment of the present invention. The depth measuring device 10 comprises a transmitting module 11, an acquisition module 12 and a control and processing circuit 13; wherein, the emission module 11 includes a light source array composed of a plurality of sub-light sources, the emission module 11 is configured to provide the output light 30 in a projection pattern with a plurality of spots, and the output light 30 can illuminate the target object 20 at the plurality of spots, wherein the light source array includes a plurality of discrete sub-light source arrays, and the control and processing circuit 13 can control the plurality of discrete sub-light source arrays to be independently turned on or turned on in a plurality of synchronization ways, so that the emission module 11 provides projection patterns with different field angles and/or different spot densities; the collection module 12 includes an image sensor 121 composed of at least one pixel, the image sensor 121 configured to detect at least a portion of the reflected light 40 including the output light 30 reflected back through the target object 20; the control and processing circuit 13 is connected to the emission module 11 and the collection module 12, and the control and processing circuit 13 is configured to calculate a phase difference between the output light 30 and the reflected light 40, and calculate a distance of the target object 20 according to the phase difference.
The emitting module 11 includes a light source array and an optical element (not shown). The light source array is composed of a plurality of sub light sources, the sub light sources can be light sources such as Light Emitting Diodes (LEDs), Edge Emitting Lasers (EELs), Vertical Cavity Surface Emitting Lasers (VCSELs), and the VCSELs are preferably adopted as the light sources.
The light source array comprises a plurality of discrete sub-light source arrays, and each discrete sub-light source array can be controlled in groups, i.e. can be independently turned on or turned on in multiple synchronizations under the control of the control and processing circuit 13.
In one embodiment, the plurality of sub-light source arrays are spatially separated or interleaved to achieve different application requirements.
In an embodiment, the arrangement of the plurality of sub light source arrays may be reasonably set according to needs, such as regular arrangement or irregular arrangement, and the arrangement of the sub light source arrays may be the same or different. For example, the first sub light source array is regularly arranged, and the second sub light source array is irregularly arranged; the arrangement density of the first sub light source array may be higher than that of the second sub light source array. The different arrangement modes can lead to outputting projection patterns of different areas, such as regular or irregular arrangement of spots in the projection patterns, dense arrangement density of spots, and the like.
In one embodiment, the number of sub-light sources in the plurality of sub-light source arrays may be set as required, for example, the number of the first sub-light source arrays is higher than the number of the second sub-light source arrays. The difference in the number of sub-light sources results in a different number of spots in the projected pattern, thereby affecting the number of active points in the measured depth image.
In a word, different application requirements can be realized by reasonably setting the arrangement mode, the number of the sub-light sources, the attributes of the sub-light sources and the like of the plurality of sub-light source arrays and reasonably controlling the plurality of sub-light source arrays. Several detailed examples will be given later using fig. 2.
The optical element receives the light beam from the light source, optically modulates the light beam, such as by diffraction, transmission, or the like, and then emits the modulated light beam toward the target object 20. The optical elements may be in the form of one or more combinations of lenses, diffractive optical elements, microlens arrays, and the like. Preferably, the optical element comprises a diffractive optical element capable of diffusing one beam of light into a plurality of beams of light to increase the number of spot projections to increase the projection density or to enlarge the field angle of the spot projections.
In one embodiment, the emitting module 11 includes a VCSEL array, a lens and a Diffractive Optical Element (DOE), and the VCSEL array will generate a replicated speckle pattern in the field of view after passing through the lens and the DOE.
In one embodiment, the emitting module 11 comprises a VCSEL light source array and a lens, and the sub-light source array will generate a speckle pattern in the field of view after passing through the lens.
In one embodiment, the emission module 11 includes a VCSEL light source array and a DOE, and the sub-light source array passes through the DOE to generate a copy spot pattern in the field of view.
In one embodiment, the emitting module 11 comprises a VCSEL light source array and a Micro Lens Array (MLA), and the VCSEL light source array passes through the MLA to generate a spot pattern in the field area.
The acquisition module 12 includes a ToF image sensor 121. The ToF image sensor 121 may be an image sensor 121 composed of a Charge Coupled Device (CCD), a Complementary Metal-Oxide-Semiconductor (CMOS), an Avalanche Diode (AD), a Single Photon Avalanche Diode (SPAD), or the like.
In general, ToF image sensor 121 may include at least one pixel, where each pixel includes more than two taps (tap for storing and reading or discharging electrical signals generated by incident photons under control of the corresponding electrode), such as two taps, three taps, four taps, etc., which are sequentially switched in a certain order within a single frame period (or a single exposure time) to collect corresponding photons for receiving the optical signals and converting into electrical signals.
The control and processing circuit 13 is connected with the transmitting module 11 and the collecting module 12, and the control and processing circuit 13 is in data communication with the transmitting module 11 and the collecting module 12. The control and processing circuit 13 supplies a demodulation signal (acquisition signal) of each tap in each pixel of the ToF image sensor 121, the tap acquires an electric signal generated by the reflected light beam 40 reflected back by the object 20 under the control of the demodulation signal, the control and processing circuit 13 calculates a phase difference based on the electric signal, and calculates the distance of the object 20 based on the phase difference.
Fig. 2a is a schematic diagram of a VCSEL light source array according to an embodiment of the present invention. In the embodiment shown in fig. 2a, a first sub-light source array is formed by a plurality of sub-light sources 201 (light sources shown as hollow) together, the first sub-light source array forming a first two-dimensional pattern and emitting a first light beam array; a second sub-light source array is formed by a plurality of sub-light sources 202 (light sources shown by black dots) together, the second sub-light source array forms a second two-dimensional pattern and can emit a second light beam array, and the first sub-light source array and the second sub-light source array are spatially arranged separately.
In one embodiment, if the size of the object to be measured is larger, the first sub light source array and the second sub light source array are preferably controlled to be synchronously started, a larger field angle is provided, and more effective depth values can be acquired for the object to be measured; if the size of the object to be measured is small, the first sub light source array or the second sub light source array can be controlled to be turned on preferentially, so that the power of the transmitting module 11 is reduced compared with the synchronous turning on of the first sub light source array and the second sub light source array, and the power consumption is reduced.
Fig. 2b is a schematic diagram of a VCSEL light source array according to yet another embodiment of the present invention. In the embodiment shown in fig. 2b, a first sub-light source array is formed by a plurality of sub-light sources 201 (light sources shown as hollow) together, the first sub-light source array forming a first two-dimensional pattern and emitting a first light beam array; a second sub-light source array is formed by a plurality of sub-light sources 202 (light sources shown by black dots) together, the second sub-light source array forms a second two-dimensional pattern and can emit a second light beam array, and the first sub-light source array and the second sub-light source array are arranged in a spatially crossed manner.
In one embodiment, if the measurement device needs a higher measurement resolution, it is preferable to control the number of the first sub-light source array and the second sub-light source array to be turned on simultaneously to achieve the dense projection so as to increase the effective depth value; if the measuring device does not need higher measuring resolution, the first sub-light source array or the second sub-light source array can be controlled to be turned on preferably to adopt sparse projection, so that the power of the transmitting module 11 is reduced compared with the synchronous turning on of the first sub-light source array and the second sub-light source array, and the power consumption is reduced.
In one embodiment, if the measuring device needs to perform short-distance measurement, it is preferable to control only the first sub-illuminant array or the second sub-illuminant array to be turned on to realize sparse projection, so that the power of the emission module 11 can be reduced, thereby reducing power consumption; if the measuring device needs to perform remote measurement, the first sub-light source array and the second sub-light source array can be controlled to be simultaneously turned on to realize dense projection, so that more effective depth data can be acquired.
Fig. 2c is a schematic diagram of a VCSEL light source array according to another embodiment of the present invention. In the embodiment shown in fig. 2c, a plurality of sub-light sources 201 (light sources shown as hollow) together form a first sub-light source array, which forms a first two-dimensional pattern and can emit a first light beam array; the plurality of sub-light sources 202 (light sources shown by black dots) jointly form a second sub-light source array, the second sub-light source array forms a second two-dimensional pattern and can emit a second light beam array, and the first sub-light source array and the second sub-light source array form a spot pattern with dense middle and sparse periphery. It is understood that the emitting module 11 in this embodiment may include a VCSEL light source array and a lens, and may also include a VCSEL light source array and an MLA.
In one embodiment, if the object to be measured is close and small in size, the second sub-light source array can be preferably controlled to be turned on to adopt small-field-angle projection, and compared with the first sub-light source array, spots of the second sub-light source array are dense, and more effective depth data can be acquired; if the object to be measured is far and large in size, the first sub-light source array can be controlled to be opened preferably to adopt large-field-angle projection, and more effective depth data can be collected. It will be appreciated that, depending on the measurement resolution required by the measurement device, it may also be possible to control the simultaneous switching on of the first sub-light-source array and the second sub-light-source array.
In one embodiment, if the object to be measured is far and small in size, the second sub-light source array can be preferably controlled to be opened to adopt small-field-angle projection, spots of the second sub-light source array are dense, and more effective depth data can be acquired; if the object to be measured is close and the size is large, the first sub-light source array can be controlled to be opened preferably to adopt large-field-angle projection, and more effective depth data can be collected. It will be appreciated that, depending on the measurement resolution required by the measurement device, it may also be possible to control the simultaneous switching on of the first sub-light-source array and the second sub-light-source array.
It is understood that in the embodiment of fig. 2a to 2c, the hollow dots 201 and the black dots 202 are only shown as differences, and actually both are light sources, and when the light sources are turned off, they may not be distinguished, and all the hollow dots 201 are controlled together, and all the black dots 202 are controlled together, i.e. the sub-light source arrays represented by the hollow dots and the black dots can be controlled independently.
Use the utility model discloses a measuring device of an embodiment carries out degree of depth measuring process includes following step:
the emission module projects output light to the target object to form projection patterns with different field angles and/or different spot densities;
the acquisition module detects at least one part of reflected light of the output light reflected by the target object;
the control and processing circuit controls the emission module to project projection patterns with different field angles and/or different spot densities to the target object, controls the collection module to detect the reflected light, and obtains the distance of the target object according to the phase difference between the output light and the reflected light.
In one embodiment, the emission module comprises a light source array composed of a plurality of sub-light sources, the light source array comprises a plurality of discrete sub-light source arrays, and the control and processing circuit controls the sub-light source arrays to be independently turned on or synchronously turned on so that the emission module provides projection patterns with different field angles and/or different speckle densities.
In one embodiment, the control and processing circuit controls each sub-light source array of the emission module to perform sparse projection on a short-distance target object and perform dense projection on a long-distance target object.
In another embodiment, the control and processing circuit controls each sub-light source array of the emission module to perform small-field-angle projection on the short-distance target object and to perform large-field-angle projection on the long-distance target object.
It is understood that, in the above embodiments, different sub light source arrays may be controlled to be turned on according to different scenes and different requirements, or multiple sub light source arrays may be controlled to be turned on simultaneously, which is not limited herein. The light source may be composed of a plurality of sub-light source arrays, and the sub-light sources may be arranged regularly or irregularly, which is not limited herein.
The foregoing is a more detailed description of the present invention, taken in conjunction with the specific/preferred embodiments thereof, and it is not intended that the invention be limited to the specific embodiments shown and described. For those skilled in the art to which the invention pertains, a plurality of alternatives or modifications can be made to the described embodiments without departing from the concept of the invention, and these alternatives or modifications should be considered as belonging to the protection scope of the invention. In the description herein, references to the description of the term "one embodiment," "some embodiments," "preferred embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Various embodiments or examples and features of various embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.
Claims (10)
1. A depth measurement device, comprising:
an emission module comprising a light source array consisting of a plurality of sub-light sources, the emission module configured to provide output light to illuminate a target object in a projected pattern having a plurality of spots;
an acquisition module comprising an image sensor comprised of at least one pixel, the image sensor configured to detect at least a portion of reflected light including the output light reflected back through the target object;
the control and processing circuit is connected with the transmitting module and the collecting module and is configured to acquire the distance of the target object according to the phase difference of the output light and the reflected light;
the light source array comprises a plurality of discrete sub-light source arrays, and each sub-light source array is configured to be controllable to be independently turned on or synchronously turned on so that the emission module provides projection patterns with different field angles and/or different spot densities.
2. The depth measurement device of claim 1, wherein the sub-light sources of the light source array are irregularly arranged.
3. The depth measurement device of claim 1, wherein the plurality of sub light source arrays of the light source array are arranged separately.
4. The depth measurement device of claim 1, wherein the plurality of sub-light source arrays of the light source array are arranged to intersect.
5. The depth measurement device of claim 1, wherein the plurality of sub-light source arrays of the light source array are arranged with different densities.
6. The depth measurement device of claim 1, wherein the light source is a vertical cavity surface emitting laser.
7. The depth measurement device of claim 1, wherein the image sensor is a ToF image sensor.
8. The depth measurement device of claim 1, wherein each of the pixels includes at least two taps for collecting an electrical signal generated by a beam of light reflected back through the target object.
9. The depth measuring apparatus of claim 1, wherein the control and processing circuit controls the emission module to use sparse projection for near distance and dense projection for far distance.
10. The depth measuring apparatus of claim 1, wherein the control and processing circuit controls the transmitting module to project with a small field angle at a short distance and project with a large field angle at a long distance.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922306982.8U CN211826516U (en) | 2019-12-18 | 2019-12-18 | Depth measuring device |
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| CN201922306982.8U CN211826516U (en) | 2019-12-18 | 2019-12-18 | Depth measuring device |
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| CN211826516U true CN211826516U (en) | 2020-10-30 |
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