CN110954916A - Depth measuring device and depth measuring method - Google Patents

Depth measuring device and depth measuring method Download PDF

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Publication number
CN110954916A
CN110954916A CN201911310804.0A CN201911310804A CN110954916A CN 110954916 A CN110954916 A CN 110954916A CN 201911310804 A CN201911310804 A CN 201911310804A CN 110954916 A CN110954916 A CN 110954916A
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China
Prior art keywords
target object
pattern
spot
liquid crystal
module
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Pending
Application number
CN201911310804.0A
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Chinese (zh)
Inventor
曾海
王兆民
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Shenzhen Orbbec Co Ltd
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Shenzhen Orbbec Co Ltd
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Priority to CN201911310804.0A priority Critical patent/CN110954916A/en
Publication of CN110954916A publication Critical patent/CN110954916A/en
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/08—Systems determining position data of a target for measuring distance only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/08—Systems determining position data of a target for measuring distance only
    • G01S17/32—Systems determining position data of a target for measuring distance only using transmission of continuous waves, whether amplitude-, frequency-, or phase-modulated, or unmodulated
    • G01S17/36—Systems determining position data of a target for measuring distance only using transmission of continuous waves, whether amplitude-, frequency-, or phase-modulated, or unmodulated with phase comparison between the received signal and the contemporaneously transmitted signal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/491—Details of non-pulse systems
    • G01S7/4911—Transmitters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/491—Details of non-pulse systems
    • G01S7/4912—Receivers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/491—Details of non-pulse systems
    • G01S7/4912—Receivers
    • G01S7/4915—Time delay measurement, e.g. operational details for pixel components; Phase measurement

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Electromagnetism (AREA)
  • Measurement Of Optical Distance (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

A depth measurement device and method, the device comprising: a launch module comprising a spot projector and liquid crystal, the spot projector configured to provide output light in a spot pattern having a plurality of spots and illuminate a target object through the liquid crystal; the acquisition module is used for detecting at least part of reflected light which is reflected by the target object through the output light; the control and processor is connected with the transmitting module and the collecting module and is configured to acquire the distance of the target object according to the phase difference of the output light and the reflected light; wherein the liquid crystal is configured to be controllably switched to project a speckle pattern or a flood pattern toward the target object after receiving the speckle pattern. The invention can flexibly adapt to the measurement requirements of the target object under various depth measurement applications.

Description

Depth measuring device and depth measuring method
Technical Field
The invention relates to the technical field of depth measurement, in particular to a depth measuring device and a depth measuring method.
Background
A depth measurement device based on the time-of-flight (ToF) principle is to identify and map a target object based on light reflected from the target, the core component including a light source configured to emit light towards the target object and a photoreceptor to receive reflected light reflected back by the target object.
The ToF measurement accuracy and the measurement distance are affected by the intensity of the light source, and in the existing ToF depth measurement device, the light source adopts single-form floodlight illumination to uniformly distribute the energy emitted by the light source, so that the required power consumption is large, the measurement distance is small, and the ToF depth measurement device is also single and limited in function and is not beneficial to wide application.
Disclosure of Invention
In order to overcome at least one of the above-mentioned drawbacks of the prior art, the present invention provides a depth measuring device and a depth measuring method.
A first aspect of the present invention provides a depth measuring device comprising:
a launch module comprising a spot projector and liquid crystal, the spot projector configured to provide output light in a spot pattern having a plurality of spots and illuminate a target object through the liquid crystal;
an acquisition module comprising an image sensor comprised of at least one pixel, the image sensor configured to detect at least a portion of reflected light comprising the output light reflected back through the target object;
the control and processor is connected with the transmitting module and the collecting module and is configured to acquire the distance of the target object according to the phase difference of the output light and the reflected light;
wherein the liquid crystal is configured to be controllably switched to project a speckle pattern or a flood pattern toward the target object after receiving the speckle pattern.
Further, the liquid crystal is in a transparent state in the first state, so that the emission module projects a spot pattern to the target object.
Further, the liquid crystal is in a diffusion state in the second state, so that the transmitting module projects a floodlight pattern to the target object.
Further, the control and processor is configured to control the emission module to project a flood pattern during close-up measurement and a spot pattern during far-out measurement.
A second aspect of the present invention provides a depth measurement method, including:
the emission module projects output light to the target object to form a spot pattern or a floodlight pattern;
the acquisition module detects at least one part of reflected light of the output light reflected by the target object;
and the control and processor controls the transmitting module to project a spot pattern or a floodlight pattern to the target object and obtains the distance of the target object according to the phase difference of the output light and the reflected light.
Further, the emission module includes a spot projector configured to provide output light in a spot pattern having a plurality of spots, and a liquid crystal configured to controllably switch states to project a spot pattern or a flood pattern toward the target object after receiving the spot pattern.
Further, the liquid crystal is in a transparent state in the first state, so that the emission module projects a spot pattern to the target object.
Further, the liquid crystal is in a diffusion state in the second state, so that the transmitting module projects a floodlight pattern to the target object.
Further, the acquisition module includes an image sensor configured to detect at least a portion of reflected light including the output light reflected back through the target object.
Further, the control and processor controls the emission module to project a floodlight pattern during short-distance measurement and project a spot pattern during long-distance measurement.
Compared with the prior art, the invention has the beneficial effects that:
the invention provides a depth measuring device and a depth measuring method, wherein a transmitting module can be controlled to project spot patterns or floodlight patterns to a target object, preferably, the transmitting module can be controlled to project the floodlight patterns to the target object in short-distance measurement, and the transmitting module can be controlled to project the spot patterns to the target object in long-distance measurement. For example, when the measurement distance is short, the measurement device needs high resolution, the liquid crystal can be controlled to be in a diffusion state, and the transmitting module projects a floodlight pattern to the target object, so that the image sensor can acquire a depth value with high precision. When the measuring distance is longer, the liquid crystal can be controlled to be in a transparent state, the emission module projects a spot pattern to the target object, and the energy is concentrated on the spots by adopting spot projection, so that the distance which can be measured is longer than that of floodlight projection. The invention can select and control the transmitting module to project the floodlight pattern or the spot pattern to the target object according to different distances, and flexibly meets the measurement requirements of the target object under various depth measurement applications.
Drawings
Fig. 1 is a schematic configuration diagram of a depth measuring device according to an embodiment of the present invention.
FIG. 2 is a flow chart of a depth measurement method according to one embodiment of the invention.
Detailed Description
The present invention will be described in detail below with reference to the following embodiments in order to better understand the present invention, but the following embodiments do not limit the scope of the present invention. It should be noted that the drawings provided in the following embodiments are only for illustrating the basic concept of the present invention, and the drawings only show the components related to the present invention rather than the number, shape and size of the components in actual implementation, the shape, number and proportion of the components in actual implementation can be changed freely, and the layout of the components can be more complicated.
Fig. 1 is a schematic structural diagram of a depth measuring device 10 according to an embodiment of the present invention. The depth measuring device 10 includes a transmitting module 11, an acquiring module 12 and a control and processor 13. Wherein the emission module 11 comprises a spot projector (not shown) configured to provide output light in a spot pattern having a plurality of spots, and a liquid crystal 101 configured to controllably switch states to receive the spot pattern projected by the spot projector and project the spot pattern or a floodlight pattern toward the target object 20; the acquisition module 12 includes an image sensor 121 composed of at least one pixel, the image sensor 121 being configured to detect at least a portion of reflected light including the output light reflected back through the target object 20; the control and processor 13 is connected to the emission module 11 and the collection module 12, and the control and processor 13 is configured to calculate a phase difference between the output light and the reflected light, and calculate a distance of the target object 20 according to the phase difference.
The spot projector comprises a light source and an optical element. The light source can be light sources such as a Light Emitting Diode (LED), an Edge Emitting Laser (EEL), a Vertical Cavity Surface Emitting Laser (VCSEL) and the like, and can also be a light source array formed by a plurality of light sources. It is understood that the arrangement of the VCSEL light source arrays can be reasonably arranged according to the requirement, such as regular arrangement or irregular arrangement, and the difference in arrangement can result in outputting projection patterns of different areas, such as regular or irregular arrangement of spots in the projection patterns, dense arrangement density of spots, and the like. Preferably, with irregular arrangement, the arrangement density of the spots can be increased.
The optical element receives the light beam from the light source, optically modulates the light beam, such as by diffraction, transmission, or the like, and then emits the modulated light beam toward the target object 20. The optical elements may be in the form of one or more combinations of lenses, diffractive optical elements, microlens arrays, and the like. Preferably, the optical element comprises a diffractive optical element, which in one embodiment is capable of diffusing one beam of light into a plurality of beams of light to increase the number of spot projections to increase the projection density or to enlarge the field angle of the spot projections.
After receiving the speckle pattern projected by the speckle projector, the liquid crystal 101 projects a speckle pattern or a floodlight pattern to the target object 20 according to the state controlled by the control and processor 13.
In one embodiment, the control and processor 13 controls the liquid crystal 101 to be in a transparent state so that the emission module 11 projects a speckle pattern onto the target object 20.
In one embodiment, the control and processor 13 controls the liquid crystal 101 to be in a dispersed state so that the emission module 11 projects a floodlight pattern to the target object 20.
The acquisition module 12 includes an image sensor 121. The image sensor 121 may be a Charge Coupled Device (CCD), a Complementary Metal-Oxide-Semiconductor (CMOS), an Avalanche Diode (AD), a Single Photon Avalanche Diode (SPAD), or the like.
In general, ToF image sensor 121 may include at least one pixel, where each pixel includes more than two taps (tap for storing and reading or discharging electrical signals generated by incident photons under control of the corresponding electrode), such as two taps, three taps, four taps, etc., which are sequentially switched in a certain order within a single frame period (or a single exposure time) to collect corresponding photons for receiving the optical signals and converting into electrical signals.
The control and processor 13 is connected with the transmitting module 11 and the collecting module 12, and the control and processor 13 is in data communication with the transmitting module 11 and the collecting module 12. The control and processor 13 supplies a demodulation signal (acquisition signal) of each tap in each pixel of the ToF image sensor 121, the tap acquires an electric signal generated by a reflected light beam reflected back by the object 20 under the control of the demodulation signal, the control and processor 13 calculates a phase difference based on the electric signal, and calculates the distance of the object 20 based on the phase difference.
In one embodiment, the control and processor 13 controls the emission module 11 to project a flood pattern toward the target object 20 at a short distance and a spot pattern toward the target object 20 at a long distance.
For example, when the measurement distance is short, the measurement device needs higher resolution, preferably controls the liquid crystal 101 to be in a diffusion state, and the emission module 11 projects a floodlight pattern to the target object 20, so that the ToF image sensor 121 can acquire a depth value with higher precision.
Likewise, for example, for measuring distances that are far, it is preferable to control the liquid crystal 101 to be in a transparent state, and the emission module 11 projects a speckle pattern onto the target object 20, because using speckle projection will concentrate the energy on the speckle, which is far more distant than the distance that can be measured using flood projection.
It will be appreciated that the control and processor 13 may control the emission module 11 to project a flood pattern or a spot pattern onto the target object 20 according to different distance selections.
Fig. 2 is a flowchart of a depth measurement method in an embodiment of the present invention, the depth measurement method including the steps of:
s201, projecting output light to a target object by an emission module to form a spot pattern or a floodlight pattern;
in particular, the emission module 11 includes a spot projector configured to provide output light in a spot pattern having a plurality of spots, and a liquid crystal 101 configured to controllably switch states to project the spot pattern or a flood pattern toward the target object 20 upon receiving the spot pattern.
S202, detecting at least one part of reflected light of the output light reflected by the target object by an acquisition module;
specifically, the acquisition module 12 includes an image sensor 121 composed of at least one pixel, and the image sensor 121 is configured to detect at least a part of the reflected light including the output light reflected back by the target object.
And S203, controlling the emission module to project a spot pattern or a floodlight pattern to the target object by the control and processor, controlling the acquisition module to detect the reflected light, and calculating a phase difference according to the output light and the reflected light to obtain the distance of the target object.
The principle of the depth measuring method is the same as that of the depth measuring device, and is not described herein again.
The foregoing is a more detailed description of the invention in connection with specific/preferred embodiments and is not intended to limit the practice of the invention to those descriptions. It will be apparent to those skilled in the art that various substitutions and modifications can be made to the described embodiments without departing from the spirit of the invention, and these substitutions and modifications should be considered to fall within the scope of the invention. In the description herein, references to the description of the term "one embodiment," "some embodiments," "a preferred embodiment," "an example," "a specific example," or "some examples" or the like are intended to mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Various embodiments or examples and features of various embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.

Claims (10)

1. A depth measurement device, comprising:
a launch module comprising a spot projector and liquid crystal, the spot projector configured to provide output light in a spot pattern having a plurality of spots and illuminate a target object through the liquid crystal;
an acquisition module comprising an image sensor comprised of at least one pixel, the image sensor configured to detect at least a portion of reflected light comprising the output light reflected back through the target object;
the control and processor is connected with the transmitting module and the collecting module and is configured to acquire the distance of the target object according to the phase difference of the output light and the reflected light;
wherein the liquid crystal is configured to be controllably switched to project a speckle pattern or a flood pattern toward the target object after receiving the speckle pattern.
2. The depth measurement device of claim 1, wherein the liquid crystal is in a transparent state in the first state such that the emission module projects a speckle pattern toward the target object.
3. The depth measurement device of claim 1, wherein the liquid crystal is in a diffuse state in the second state such that the emission module projects a flood pattern toward the target object.
4. The depth measurement device of claim 1, wherein the control and processor is configured to control the emission module to project a flood pattern for close-up measurements and a spot pattern for distance measurements.
5. A depth measurement method, comprising:
the emission module projects output light to the target object to form a spot pattern or a floodlight pattern;
the acquisition module detects at least one part of reflected light of the output light reflected by the target object;
and the control and processor controls the transmitting module to project a spot pattern or a floodlight pattern to the target object, controls the collecting module to detect the reflected light, and obtains the distance of the target object according to the phase difference between the output light and the reflected light.
6. The depth measurement method of claim 5, wherein the emission module comprises a spot projector configured to provide output light in a spot pattern having a plurality of spots and a liquid crystal configured to controllably switch states to project a spot pattern or a flood pattern toward the target object after receiving the spot pattern.
7. The depth measurement device of claim 6, wherein the liquid crystal is in a transparent state in the first state such that the emission module projects a speckle pattern toward the target object.
8. The depth measurement device of claim 6, wherein the liquid crystal is in a diffuse state in the second state such that the emission module projects a flood pattern toward the target object.
9. The depth measurement method of claim 5, wherein the acquisition module comprises an image sensor configured to detect at least a portion of the reflected light including the output light reflected back through the target object.
10. The depth measurement method of claim 5, wherein the control and processor controls the emission module to project a flood pattern during close-up measurement and a spot pattern during distance measurement.
CN201911310804.0A 2019-12-18 2019-12-18 Depth measuring device and depth measuring method Pending CN110954916A (en)

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WO2023273332A1 (en) * 2021-06-30 2023-01-05 深圳市汇顶科技股份有限公司 Emission device for time-of-flight depth measurement, and electronic apparatus

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