CN211787062U - MCTP equipment testing arrangement - Google Patents
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- CN211787062U CN211787062U CN202020436932.1U CN202020436932U CN211787062U CN 211787062 U CN211787062 U CN 211787062U CN 202020436932 U CN202020436932 U CN 202020436932U CN 211787062 U CN211787062 U CN 211787062U
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Abstract
An MCTP device testing apparatus is provided. The testing device of the MCTP equipment comprises: the system comprises a first computer, a second computer and an embedded computer; the first computer can be set to be tested and accessed through the first interface, and the first computer also supplies power to the MCTP device; the embedded computer is coupled with the MCTP equipment through a second interface in an MCTP protocol, and the embedded computer is also coupled with the second computer through a network interface; the second computer provides test commands of the MCTP protocol to the MCTP device or receives responses to the test commands of the MCTP device through the embedded computer.
Description
Technical Field
The present application relates to a testing technology, and in particular, to a testing apparatus for testing MCTP functions of a storage device.
Background
FIG. 1 illustrates a schematic diagram of a prior art computer including a storage device. The storage device is coupled to the computer. For example, a storage device is provided on a PCIe slot of a computer so that a CPU of the computer can access the storage device through a PCIe interface. The computer and the storage device are coupled by various methods, including but not limited to, connecting the host and the storage device by, for example, SATA, IDE, USB, PCIE, NVMe (NVM Express), SAS, ethernet, fibre channel, wireless communication network, etc. The computer may be an information processing device, such as a personal computer, a tablet, a server, a portable computer, a network switch, a router, a cellular telephone, a personal digital assistant, etc., that is capable of communicating with the storage device in the manner described above.
The computer also includes, for example, a BMC (Baseboard Management Controller) and/or a BIOS (basic input output system). The BMC/BIOS communicates with the storage device via, for example, MCTP (management component Transport Protocol, available at, for example, https:// www.dmtf.org/sites/default/files/standards/documents/DSP0236_1.3.1. pdf). Coupled to the storage device by, for example, a PCIe Bus, an SMBus (System Management Bus) Bus, or an I2C (Inter-integrated circuit) Bus. Therefore, the communication between the BMC/BIOS and the storage device is independent from the communication between the CPU of the computer and the storage device. The BMC/BIOS can communicate with the storage device via the MCTP protocol even when the CPU is busy or fails to respond due to a CPU failure.
The MCTP protocol is used for communication between components of a platform (e.g., motherboard) of a computing device. A management controller (management controller) conforming to the MCTP protocol is an initiator of communication and accesses a managed device (managed device) conforming to the MCTP protocol. The MCTP controller and the managed device are both MCTP endpoints (endpoints). The MCTP endpoint uses the MCTP protocol and processes MCTP control commands.
NVMe-MI (NVM _ Express _ Management _ Interface, NVMe Management Interface, available in, for example, the https:// nvmexpress.org/wp-content/updates/NVM-Express-Management-Interface-1.1-rating.pdf) standard provides a way for an MCTP Management controller to communicate with an MCTP Management Endpoint (Endpoint) of an NVMe storage device.
In addition to using storage devices, the computer of FIG. 1 is also used to test storage devices. For example, during development, production, etc. of a memory device, the memory device is coupled to a computer for testing. A computer tests a storage device by issuing a variety of storage commands to the storage device.
SUMMERY OF THE UTILITY MODEL
The various functions of the storage device need to be adequately tested to ensure the quality and reliability of the storage device. For a storage device supporting the MCTP protocol or the NVMe-MI standard, the MCTP/NVMe-MI function of the storage device needs to be tested. In the prior art, except for a computer supplier, other people have difficulty in operating or modifying the BMC/BIOS of the computer, and further the MCTP/NVMe-MI function of the storage device cannot be tested through the BMC/BIOS of the computer in the prior art. Thus, there is a need to develop MCTP/NVMe-MI test equipment and/or test systems for NVMe storage devices.
The MCTP/NVMe-MI functionality is required to be available during normal operation of the storage device. Further, the MCTP/NVMe-MI functionality needs to be available even during periods when the host to which the storage device is coupled is not operational. For example, the MCTP/NVMe-MI functionality of the storage device should still be available when a host to which the storage device is coupled reboots or encounters an unexpected event. There is a need for an MCTP/NVMe-MI test device and/or test system that is independent of the computer to which the storage device is coupled and that is capable of communicating with the storage device via the MCTP/NVMe-MI during operation of the storage device by the computer.
And, as a test device, there is also a need to provide extensibility. To support testing multiple storage devices simultaneously.
According to a first aspect of the present application, there is provided a testing apparatus for a first MCTP device according to the first aspect of the present application, comprising: the system comprises a first computer, a second computer and an embedded computer; the first computer can be set to be tested and accessed through the first interface, and the first computer also supplies power to the MCTP device; the embedded computer is coupled with the MCTP equipment through a second interface in an MCTP protocol, and the embedded computer is also coupled with the second computer through a network interface; the second computer provides test commands of the MCTP protocol to the MCTP device or receives responses to the test commands of the MCTP device through the embedded computer.
According to a first MCTP device testing apparatus of the first aspect of the present application, there is provided a second MCTP device testing apparatus of the first aspect of the present application, wherein the embedded computer includes an MCTP management controller, the MCTP management controller coupling the second interface with the network interface; the MCTP device comprises an MCTP management endpoint; and the MCTP management controller accesses an MCTP management endpoint of the MCTP equipment according to an MCTP protocol and/or an NVMe-MI protocol.
According to the first or second MCTP device testing apparatus of the first aspect of the present application, there is provided the third MCTP device testing apparatus of the first aspect of the present application, wherein the first interface is a storage interface compliant with NVMe protocol; the second interface is an I2C interface, an SMBus interface, or a PCIe interface independent of the first interface.
The testing apparatus for a third MCTP device according to the first aspect of the present application provides the testing apparatus for a fourth MCTP device according to the first aspect of the present application, wherein the first computer, the second computer, and the embedded computer are each independently powered.
According to the second MCTP device testing apparatus of the first aspect of the present application, there is provided the fifth MCTP device testing apparatus of the first aspect of the present application, wherein the MCTP management controller obtains the test command provided by the second computer from a network interface, and forwards the test command to an MCTP management endpoint of the MCTP device using an MCTP protocol and/or an NVMe-MI protocol; the MCTP management controller receives a response returned by an MCTP management endpoint of the MCTP device for the test command and forwards the response to the second computer.
Testing apparatus for a fourth MCTP device according to the first aspect of the present application, there is provided the testing apparatus for a sixth MCTP device according to the first aspect of the present application, wherein the first computer is configured to provide a first plurality of MCTP devices, each of the first plurality of MCTP devices having an MCTP endpoint identifier; the embedded computer is coupled to the first plurality of MCTP devices through the second interface; the MCTP management controller accesses one of the first plurality of MCTP devices via an MCTP endpoint identifier.
According to the sixth MCTP device testing apparatus of the first aspect of the present application, there is provided the seventh MCTP device testing apparatus of the first aspect of the present application, comprising a plurality of first computers; each first computer is provided with a plurality of MCTP devices to be tested; the embedded computer couples one or more of the plurality of first computers through the second interface.
According to a seventh MCTP device testing apparatus of the first aspect of the present application, there is provided an eighth MCTP device testing apparatus of the first aspect of the present application, including a plurality of embedded computers, each embedded computer including a second interface and a network interface; a first embedded computer of the plurality of embedded computers is coupled with one or more MCTP devices arranged on one or more first computers through a second interface of the first embedded computer; a second embedded computer of the plurality of embedded computers is coupled with one or more MCTP devices arranged on one or more first computers through a second interface of the second embedded computer; the plurality of embedded computers are coupled to the second computer through their network interfaces.
Testing means of an eighth MCTP device according to the first aspect of the present application provide the testing means of the ninth MCTP device according to the first aspect of the present application, wherein the MCTP management controller has an MCTP endpoint identifier.
The testing apparatus for a ninth MCTP device according to the first aspect of the present application provides the testing apparatus for a tenth MCTP device according to the first aspect of the present application, wherein the first computer is configured to detachably set the MCTP device under test through the first interface; the embedded computer is detachably coupled to the MCTP device under test through the second interface.
According to the tenth MCTP device testing apparatus of the first aspect of the present application, there is provided the eleventh MCTP device testing apparatus of the first aspect of the present application, wherein the first interface and the second interface share a physical interface or each exclusively own a physical interface; the embedded computer is a raspberry pi computer.
According to a second aspect of the present application, there is provided a testing apparatus for a first MCTP device according to the second aspect of the present application, comprising: the MCTP management controller, the first interface and the second interface; the first interface is coupled with the MCTP device to be tested in MCTP protocol, and the second interface is a network interface and is used for coupling with a computer; the MCTP management controller receives a test command from the second interface.
The testing device for the first MCTP device according to the second aspect of the present application provides the testing device for the second MCTP device according to the second aspect of the present application, further comprising an embedded processor coupling the MCTP management controller, the first interface, and the second interface.
The testing device for a first or second MCTP apparatus according to the second aspect of the present application provides the testing device for a third MCTP apparatus according to the second aspect of the present application, wherein the power supply circuit of the testing device is independent of the power supply circuit of the MCTP apparatus and independent of the power supply circuit of the computer.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments described in the present application, and other drawings can be obtained by those skilled in the art according to the drawings.
FIG. 1 illustrates a schematic diagram of a prior art computer including a storage device;
FIG. 2 is a schematic diagram of an MCTP testing apparatus according to an embodiment of the present application;
FIG. 3A shows a schematic diagram of an MCTP testing apparatus according to yet another embodiment of the present application; and
figure 3B illustrates a schematic diagram of an MCTP testing apparatus according to yet another embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application are clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some, but not all, embodiments of the present application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Figure 2 is a schematic diagram of an MCTP testing apparatus according to an embodiment of the present application.
The storage device 210 is a device under test, supporting, for example, the NVMe protocol or other storage protocols. The storage device 210 also supports the MCTP protocol. It is necessary to test its memory function with the MCTP function.
The storage device 210 is coupled to a test computer 220. For example, the storage device 210 is provided in a PCIe slot of the test computer 220, so that the CPU of the test computer 220 accesses the storage device 210 through a PCIe bus. The storage device 210 provides an MCTP endpoint (also referred to as an MCTP management endpoint) that conforms to the MCTP protocol. The storage device includes at least two interfaces-a storage interface and a management interface. The storage interface is, for example, a PCIe interface for receiving storage commands from, for example, the test computer 220, and the management interface is, for example, an I2C, SMBus, PCIe interface for providing an MCTP management endpoint and coupled to the MCTP management controller. Optionally, the storage interface and the management interface are each separate physical interfaces. Still alternatively, the storage interface and the management interface share the same physical interface, for example, share the same PCIe slot, but use different pins on the slot, respectively, to ensure independence of the storage interface and the management interface. By way of example, the management interface is an I2C interface that uses two unused pins in the PCIe slot to transmit signals.
The MCTP testing apparatus according to the embodiment of the present application further includes an embedded computer and a testing computer 240. The embedded computer and the test computer 240 are independent of the test computer 220 so that the operation of the test computer 220 does not affect the operation of the embedded computer or the test computer 240.
The embedded computer is, for example, a Raspberry Pi (Raspberry Pi) or other embedded processor based computer. The embedded computer comprises a local interface, a network interface and an MCTP management controller supporting the MCTP protocol. Alternatively, when the storage device 210 is an NVMe device and supports an NVMe-MI protocol based on the MCTP protocol, the MCTP management controller accesses an MCTP management endpoint of the storage device 210 according to the NVMe-MI protocol.
Local interfaces of embedded computers are e.g. I2C, SMBUS, PCIe interfaces. The local interface is coupled to the management interface of the storage device 210 (to access its MCTP management endpoint). For example, the local interface may be coupled directly to a management interface of the storage device 210 via a cable, or coupled to a management interface of a plurality of storage devices via a hub. The local port of the embedded computer is removably or hot swappable coupled to the storage device 210.
The embedded computer also includes a network interface that couples the embedded computer to the test computer 240. Whereby the testing computer 240 operates the MCTP management controller of the embedded computer to access the MCTP management endpoint of the storage device 210. The embedded computer also includes a Web server (not shown in fig. 2) to receive test commands for the MCTP function or the NVMe-MI function from the test computer 240 through the network interface. Optionally, the MCTP management controller integrates a Web server.
The MCTP management controller is, for example, a related art MCTP management controller, and transmits a test command to the MCTP management endpoint through the local interface in accordance with the MCTP protocol or the NVMe-MI protocol and receives a response output by the MCTP management endpoint. The test commands sent by the MCTP management controller are provided by the test computer 240 to the MCTP management controller via the network port, and responses received by the MCTP management controller from the MCTP management endpoint are also provided to the test computer 240 via the network port.
The test computer 240 transmits one or more test commands to the MCTP management controller of the embedded computer through the network port and identifies whether the MCTP function or NVMe-MI function of the storage device is correct by identifying the association of a response from the embedded computer received through the network port with the transmitted test command.
According to the MCTP testing apparatus of the present embodiment, the testing computer 220 supplies power to the storage device 210 under test and simulates an operating environment of the storage device 210 by applying a storage command thereto. The MCTP/NVMe-MI functionality of the storage device 210 is affected by, and/or reflects, the operating environment. For example, the test computer 220 may simulate a power-on and power-off alternating operating environment for the storage device 210 such that hot plug operational information for the storage device 210 is accessed by an MCTP management endpoint. The embedded computer is powered independently of the test computer 210 so that even if the test computer 220 simulates a powered-down operating environment, the MCTP link provided by the embedded computer is not affected by the power outage.
The embedded computer provides the MCTP protocol channel for testing the storage device 210. And the embedded computer is low in cost and easy to move, is suitable for being disposed at a work place where the storage device 210 or the test computer 220 is located, and allows the place where the test computer 240 coupled to the embedded computer through a network is placed to be unrestricted. The embedded computer is also adapted to be placed on the production line of the memory device 210, thereby becoming part of the test fixture for the memory device 210. The tester operates the testing computer 240 to apply the testing commands to the storage device 210 and obtain the responses of the storage device 210 to the testing commands, so that the testing computer 220 is far away from the position where the environment is harsh or dangerous, and the testing of the MCTP/NVMe-MI functions can be completed.
Figure 3A shows a schematic diagram of an MCTP testing apparatus according to yet another embodiment of the present application.
Both storage device 310 and storage device 312 are coupled to test computer 320. Each storage device includes at least two interfaces-a storage interface and a management interface.
The MCTP testing apparatus according to the embodiment of the present application further includes an embedded computer and a testing computer 340. The local interface of the embedded computer couples the storage device 310 with the MCTP management endpoint of the storage device 312. For example, an embedded computer includes two local interfaces, coupled to storage device 310 and storage device 312, respectively. As yet another example, the embedded computer also includes a hub that couples both local ports to the storage device 310 and the storage device 312. Such that the storage device 310 and the MCTP management endpoint of the storage device 312 are on the same network as the MCTP management controller of the embedded computer and each have an MCTP endpoint ID and/or physical address. Such that the MCTP management endpoint accesses the MCTP management endpoint of storage device 310 or storage device 312 based on the MCTP endpoint ID and/or physical address. And the test commands that test computer 340 instructs the MCTP management controller to distinguish or not distinguish between the respective MCTP management endpoints of storage device 310 and storage device 312.
By arranging two or more storage devices on the testing computer 320 and coupling an embedded computer to the MCTP management endpoint of each storage device, the MCTP/NVMe-MI functions of the two or more storage devices are tested in parallel by a single embedded computer. The testing efficiency and speed are improved, and the number of testing computers and embedded computers in the MCTP testing device is reduced.
Figure 3B illustrates a schematic diagram of an MCTP testing apparatus according to yet another embodiment of the present application.
In the embodiment of FIG. 3B, the MCTP test apparatus includes two test computers (370, 372) with storage devices under test, two embedded computers (380, 382), and a test computer 390 that issues test commands or obtains responses.
The test computers (370, 372) are each provided with two storage devices under test. Storage devices 360 and 362 are located at test computer 370, while storage devices 364 and 368 are located at test computer 372. The MCTP management endpoints of each storage device each have an MCTP endpoint ID and/or a physical address.
The local interface of embedded computer 380 couples the MCTP management endpoints of the storage devices (360, 362, 364, and 368). It will be appreciated that the local interface of the embedded computer 380 can also couple MCTP management endpoints for a greater number of storage devices that may be located on two or more test computers.
The local port of embedded computer 382 also couples to MCTP management endpoints of one or more storage devices (not shown).
The respective network interfaces of embedded computer 380 and embedded computer 382 are coupled to a test computer 390. The embedded computer 390 tests the MCTP/NVMe-MI functions of each storage device by sending test commands to the MCTP management controller of each embedded computer (380 and 382).
The test computer 370, the test computer 372, the embedded computer 380, and the embedded computer 382 are, for example, independently powered so that the operation of these computers does not affect each other.
With the embodiment of FIG. 3B, the MCTP testing apparatus is deployed on a large scale and performs MCTP/NVMe-MI tests on multiple storage devices in parallel.
While the preferred embodiments of the present application have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including preferred embodiments and all alterations and modifications as fall within the scope of the application. It will be apparent to those skilled in the art that various changes and modifications may be made in the present application without departing from the spirit and scope of the application. Thus, if such modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is intended to include such modifications and variations as well.
Claims (10)
1. An MCTP device testing apparatus, comprising: the system comprises a first computer, a second computer and an embedded computer;
the first computer can be set to be tested and accessed through the first interface, and the first computer also supplies power to the MCTP device;
the embedded computer is coupled with the MCTP equipment through a second interface in an MCTP protocol, and the embedded computer is also coupled with the second computer through a network interface;
the second computer provides test commands of the MCTP protocol to the MCTP device or receives responses to the test commands of the MCTP device through the embedded computer.
2. The MCTP device testing apparatus of claim 1 wherein,
the embedded computer includes an MCTP management controller that couples the second interface with
The network interface;
the MCTP device comprises an MCTP management endpoint;
and the MCTP management controller accesses an MCTP management endpoint of the MCTP equipment according to an MCTP protocol and/or an NVMe-MI protocol.
3. An MCTP device testing apparatus according to claim 1 or 2 wherein,
the first interface is a storage interface conforming to the NVMe protocol;
the second interface is an I2C interface, an SMBus interface, or a PCIe interface independent of the first interface.
4. The MCTP device testing apparatus of claim 1 wherein,
the first computer, the second computer, and the embedded computer are each independently powered.
5. The MCTP device testing apparatus of claim 2 wherein,
the MCTP management controller acquires the test command provided by the second computer from a network interface and forwards the test command to an MCTP management endpoint of the MCTP equipment by using an MCTP protocol and/or an NVMe-MI protocol;
the MCTP management controller receives a response returned by an MCTP management endpoint of the MCTP device for the test command and forwards the response to the second computer.
6. The MCTP device testing apparatus of claim 2 wherein,
the first computer is provided with a first plurality of MCTP devices, each of the first plurality of MCTP devices having an MCTP endpoint identifier;
the embedded computer is coupled to the first plurality of MCTP devices through the second interface;
the MCTP management controller accesses one of the first plurality of MCTP devices via an MCTP endpoint identifier.
7. The MCTP device testing apparatus of claim 6, comprising a plurality of first computers;
each first computer is provided with a plurality of MCTP devices to be tested;
the embedded computer couples one or more of the plurality of first computers through the second interface.
8. The MCTP device testing apparatus of claim 7, comprising a plurality of embedded computers, each embedded computer comprising a second interface and a network interface;
a first embedded computer of the plurality of embedded computers is coupled with one or more MCTP devices arranged on one or more first computers through a second interface of the first embedded computer;
a second embedded computer of the plurality of embedded computers is coupled with one or more MCTP devices arranged on one or more first computers through a second interface of the second embedded computer;
the plurality of embedded computers are coupled to the second computer through their network interfaces.
9. The MCTP device testing apparatus of claim 8 wherein,
the first interface and the second interface share a physical interface or respectively monopolize the physical interface;
the embedded computer is a raspberry pi computer.
10. An MCTP device testing apparatus, comprising: the MCTP management controller, the first interface and the second interface;
the first interface is coupled with the MCTP device to be tested in MCTP protocol, and the second interface is a network interface and is used for coupling with a computer;
the MCTP management controller receives a test command from the second interface;
the power supply circuit of the testing device is independent of the power supply circuit of the MCTP equipment and independent of the power supply circuit of the computer.
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| CN112764818A (en) * | 2021-01-26 | 2021-05-07 | 曙光信息产业(北京)有限公司 | Device management method and device, electronic device and readable storage medium |
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| CN112764818A (en) * | 2021-01-26 | 2021-05-07 | 曙光信息产业(北京)有限公司 | Device management method and device, electronic device and readable storage medium |
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