CN211786017U

CN211786017U - Multilayer heap Mini/micro LED test fixture

Info

Publication number: CN211786017U
Application number: CN202020015658.0U
Authority: CN
Inventors: 张凯
Original assignee: Wessent Dongguan Technology Co ltd
Current assignee: Wessent Dongguan Technology Co ltd
Priority date: 2020-01-06
Filing date: 2020-01-06
Publication date: 2020-10-27
Anticipated expiration: 2030-01-06

Abstract

The utility model discloses a multilayer heap Mini/micro LED test fixture, including the frame, the frame is equipped with the multilayer support frame, is equipped with the product test layer on each support frame, and the multilayer the support frame includes roller board and connecting plate, the roller board is located product test layer both sides, and roller board and product test layer sliding connection, the connecting plate is located product test layer rear side, be equipped with a plurality of probe modules on the connecting plate, be equipped with many connection guide pins on a plurality of probe modules, and is multilayer product test layer and a plurality of probe modules pass through many connection guide pins electric connection, through the multilayer product test layer sets up, multilayer product test layer heap design, this spatial structure design, further save space to can test a large amount of Mini/micro LED products simultaneously and test; the utility model discloses practice thrift the space, laborsaving test fixture has wholly improved detection efficiency.

Description

Multilayer heap Mini/micro LED test fixture

Technical Field

The utility model relates to a LED detection area technical field specifically is a multilayer heap Mini/micro LED test fixture.

Background

The device with the display screen on the market realizes projection basically through LED lamps, for example, devices such as mobile phones and televisions, now, backlight of many display products is gradually replaced by Mini/MicroLED from traditional LED, and devices with the display screen are increasing, so that the Mini/MicroLED needs to meet market requirements through mass production, but the Mini/MicroLED after mass production needs to be detected through detection equipment to ensure quality.

Relevant technical laws and regulations or standards are put forward in some important LED regional markets all over the world, and certification requirements are put forward for application of LED illumination certification. The detection standard of the LED product is used for making unified inspection items and inspection descriptions for lamps produced by companies, and the items detected by the LED product comprise electrical performance parameters, optical parameters, structural appearance and reliability tests; however, the theoretical life of the LED lamp is very long, and the measurement of the LED product is obviously unrealistic, so it is necessary to adopt an accelerated aging life test for the LED product, and now the Mini/micro LED lamp market is gradually expanded, the productivity needs to be increased, and the efficiency of the old fixture cannot keep pace with. In order to save space, reduce manual operation, increase test efficiency, develop multilayer and pile up the test fixture of easily more gentle formula.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a multilayer heap Mini micro LED test fixture to solve the problem that above-mentioned technical background proposed.

The utility model provides a multilayer heap Mini/micro LED test fixture, includes the frame, the frame is equipped with the multilayer support frame, is equipped with the product test layer on every layer of support frame, and the multilayer the support frame includes gyro wheel board and connecting plate, the gyro wheel board is located product test layer both sides, and gyro wheel board and product test layer sliding connection, the connecting plate is located product test layer rear side, be equipped with a plurality of probe modules on the connecting plate, the multilayer the product test layer is through a plurality of probe modules and many connection guide pin electric connection.

Preferably, the product testing layer comprises a product tray and a testing component, the testing component is arranged at the rear side of the upper end face of the product tray, a product placing groove is arranged at the front of the testing component on the upper end face of the product tray, slide bars are arranged at the left side and the right side of the product tray, a connecting strip is arranged at the rear side of the product tray, the testing component comprises an installation block, a connecting block and a plurality of probe blocks arranged on the connecting block, fixing screws are arranged at the two sides of the installation block, the installation block is pairwise arranged on the connecting strip through the fixing screws, the lower end of the connecting block is mutually matched with the upper end of the installation block, the lower end of the connecting block is movably connected with the upper end of the installation block through a compression spring, bolt connection components are arranged at the two sides of the connecting block, a limiting screw and a reset spring are arranged, reset spring cup joints on limit screw, limit screw lower extreme and installation piece spiro union, reset spring is located between spacing portion of annular and the installation piece, the connecting block is equipped with a plurality of mounting grooves, and is a plurality of the probe piece sets up in a plurality of mounting grooves, and is a plurality of inside needle piece pcb board that is equipped with of probe piece, and is a plurality of both sides are equipped with many probes around the probe piece, needle piece pcb board and many probe electric connection.

Preferably, the upper end of the connecting strip is provided with a plurality of probe holes for inserting probes, and the rear end of the connecting strip is provided with a plurality of wire holes for inserting connecting guide needles.

Preferably, the gyro wheel board up end is equipped with a plurality of horizontal gyro wheels, and is a plurality of horizontal gyro wheel is the array distribution, the terminal surface that the gyro wheel board is close to product test layer one side is equipped with a plurality of perpendicular gyro wheels, and is a plurality of perpendicular gyro wheel is the array distribution, and is a plurality of perpendicular gyro wheel, a plurality of horizontal gyro wheel all are connected with the draw runner that product test layer set up, the terminal surface is connected with perpendicular gyro wheel contact under the draw runner, the terminal surface and the horizontal gyro wheel contact connection of product test layer one side are kept away from to the draw runner.

Preferably, the frame is located a plurality of connecting plate position front ends and all is equipped with buckle assembly, buckle assembly is equipped with "V" type groove and screens piece, rotatable coupling is made at "V" type inslot to the screens piece.

Compared with the prior art, the beneficial effects of the utility model are as follows:

1. the utility model discloses a setting of probe module can make product test layer and signal source machine or PC end electric connection, and the product test layer is carried with the different electric control circuit to the connection guide pin on the accessible probe module, and the product test layer can carry out different tests to the product, if light the test, aging testing, performance detection and so on.

2. The utility model discloses a multilayer product test layer sets up, multilayer product test layer heap design, and this spatial structure design further saves space to can test a large amount of Mini/micro LED product concurrent test simultaneously, wholly improve efficiency of software testing.

Drawings

Fig. 1 is a schematic structural view of the present invention;

FIG. 2 is an exploded view of a test layer of the product of the present invention;

FIG. 3 is a schematic structural view of the support frame and the buckle assembly of the present invention;

fig. 4 is an exploded view of the probe module according to the present invention.

The reference numerals and names in the figures are as follows:

1. a machine frame; 2. a product test layer; 3. a support frame; 4. a roller plate; 5. a transverse roller; 6. a vertical roller; 7. a connecting plate; 8. a probe module; 9. connecting a guide pin; 10. a buckle assembly; 11. a clamping piece; 12. a V-shaped groove; 21. a product tray; 22. a product placement groove; 23. mounting blocks; 24. connecting blocks; 25. a probe block; 26. a slide bar; 27. a connecting strip; 28. fixing screws; 29. a compression spring; 30. a screw connection component; 31. a limiting screw; 32. a return spring; 33. an annular limiting part; 34. mounting grooves; 35. a pin block pcb; 36. a probe; 37. a probe hole; 38. and (6) a guide pin hole.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1 to 4, the present invention provides an embodiment: the utility model provides a multilayer heap Mini/micro LED test fixture, includes frame 1, its characterized in that: frame 1 is equipped with multilayer support frame 3, is equipped with product test layer 2, multilayer on every layer of support frame 3 includes gyro wheel board 4 and connecting plate 7, gyro wheel board 4 is located product test layer 2 both sides, and gyro wheel board 4 and product test layer 2 sliding connection, connecting plate 7 is located product test layer 2 rear sides, be equipped with a plurality of probe module 8 on the connecting plate 7, the multilayer product test layer 2 is through a plurality of probe module 8 and many connection guide pin 9 electric connection. The setting of a multilayer heap Mini/micro LED test fixture of this embodiment to a MINI/micro LED lamp piece of taking PIN point, can make product test layer 2 and signal source machine or PC end electric connection through setting up of probe module 8, and product test layer 2 can be carried to the automatically controlled circuit of difference to the connection guide PIN 9 on the accessible probe module 8, and product test layer 2 can carry out different tests to the product.

Specifically, the product testing layer 2 comprises a product tray 21 and a testing component, the testing component is arranged at the rear side of the upper end face of the product tray 21, a product placing groove 22 is arranged at the front of the testing component at the upper end face of the product tray 21, slide bars 26 are arranged at the left side and the right side of the product tray 21, a connecting bar 27 is arranged at the rear side of the product tray 21, the testing component comprises an installation block 23, a connecting block 24 and a plurality of probe blocks 25 arranged on the connecting block 24, fixing screws 28 are arranged at the two sides of the installation block 23, the installation block 23 is pairwise arranged on the connecting bar 27 through the fixing screws 28, the lower end of the connecting block 24 is mutually matched with the upper end of the installation block 23, the lower end of the connecting block 24 is movably connected with the upper end of the installation block 23 through a compression spring 29, bolt connection components 30 are arranged at the two sides of the connecting block 24, a limit screw 31 and, be equipped with the spacing portion 33 of an annular in the middle of the stop screw 31, reset spring 32 cup joints on stop screw 31, stop screw 31 lower extreme and installation piece 23 spiro union, reset spring 32 is located between the spacing portion 33 of annular and the installation piece 23, connecting block 24 is equipped with a plurality of mounting grooves 34, and is a plurality of probe piece 25 sets up in a plurality of mounting grooves 34, and is a plurality of probe piece 25 is inside to be equipped with needle piece pcb board 35, and is a plurality of both sides are equipped with many probes 36 around the probe piece 25, needle piece pcb board 35 and many probes 36 electric connection. Put into product standing groove 22 with the product, make connecting block 24 and probe piece 25 move down through the spacing screw 31 on the rotatory spiro union subassembly 30, the probe 36 that is close to product one side moves down and is connected with the PIN point contact on the product, the probe 36 who keeps away from product one side inserts the probe hole 37 on the connecting strip 27, rather than electric connection, and in the same way, reverse rotation spacing screw 31, reset spring 32 resets spacing screw 31, compression spring 29 bounces connecting block 24, make probe 36 and PIN point on the product and the probe hole 37 on the connecting strip 27 break away from the connection.

Specifically, the upper end of the connecting strip 27 is provided with a plurality of probe holes 37 for inserting the probes 36, and the rear end of the connecting strip 27 is provided with a plurality of wire holes 38 for inserting the connecting guide needles 9. When the probe 36 close to one side of the product is in point contact with the PIN point on the product, the probe 36 far away from one side of the product is inserted into the probe hole 37 on the connecting strip 27, the connecting guide PIN 9 is inserted into the wire guide hole 38 and is electrically connected with the wire guide hole, and the electric control circuit can be transmitted to the product lamp panel through the PIN pcb 35.

Specifically, 4 up end of roller board is equipped with a plurality of horizontal gyro wheels 5, and is a plurality of horizontal gyro wheel 5 is the array distribution, the terminal surface that roller board 4 is close to product test layer 2 one side is equipped with a plurality of perpendicular gyro wheels 6, and is a plurality of perpendicular gyro wheel 6 is the array distribution, and is a plurality of perpendicular gyro wheel 6, a plurality of horizontal gyro wheel 5 all are connected with draw runner 26 that product test layer 2 set up, and this setting can reduce the frictional force between product test layer 2 and the gyro wheel, and is more laborsaving when making slip product test layer 2, terminal surface and perpendicular gyro wheel 6 contact are connected under the draw runner 26, the terminal surface that product test layer 2 one side was kept away from to draw runner 26 is connected with horizontal gyro wheel 5 contact.

Specifically, frame 1 is located a plurality of connecting plates 7 position front ends and all is equipped with buckle assembly 10, buckle assembly 10 is equipped with "V" type groove 12 and screens piece 11, rotatable coupling is made in "V" type groove 12 to screens piece 11. When the product testing layer 2 is pushed into the machine frame 1, the clamping part 11 is turned inwards, so that the product testing layer 2 is clamped on the supporting frame 3.

Specifically, the number of the product testing layer 2 and the multilayer support frame 3 is two or more. The number of layers can be increased appropriately according to the demand of production.

The working principle is as follows: the utility model discloses a multilayer heap Mini/micro LED test fixture needs to use in the heating furnace, put into product standing groove 22 with the product, make connecting block 24 and probe piece 25 move downwards through spacing screw 31 on rotatory spiro union subassembly 30, the probe 36 that is close to product one side moves downwards and is contacted with PIN point on the product and be connected, the probe 36 that is far away from product one side inserts probe hole 37 on connecting strip 27, impel product test layer 2 inwards, impel to the bottom, make the guide PIN hole on connecting strip 27 embolia on the connection guide PIN 9 of probe module 8, then overturn the screens piece 11 of corresponding buckle subassembly 10 to the inside side, make product test layer 2 screens on support frame 3, after having installed multilayer product test layer 2 one by one, connect signal source machine or PC end through probe module 8, make the heating furnace reach about 80 degrees, signal source machine or PC end output electric control circuit, probe module 8 is through connecting guide pin 9, connecting strip 27 and keeping away from product one side probe 36 with electric control circuit transmission to needle piece pcb board 35 on, the rethread is close to product one side probe 36 and exports electric control circuit to the product lamp piece on, the product lamp piece carries out quick ageing according to electric control circuit.

It is obvious to a person skilled in the art that the invention is not restricted to details of the above-described exemplary embodiments, but that it can be implemented in other specific forms without departing from the spirit or essential characteristics of the invention. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.

Claims

1. The utility model provides a multilayer heap Mini/micro LED test fixture, includes frame (1), its characterized in that: frame (1) is equipped with multilayer support frame (3), is equipped with product test layer (2), multilayer on every layer of support frame (3) are including gyro wheel board (4) and connecting plate (7), gyro wheel board (4) are located product test layer (2) both sides, and gyro wheel board (4) and product test layer (2) sliding connection, connecting plate (7) are located product test layer (2) rear side, be equipped with a plurality of probe module (8) on connecting plate (7), the multilayer product test layer (2) are through a plurality of probe module (8) and many connection guide pin (9) electric connection.

2. The stacked Mini/micro led testing tool of claim 1, wherein: the product testing layer (2) comprises a product tray (21) and a testing component, the testing component is arranged on the rear side of the upper end face of the product tray (21), the upper end face of the product tray (21) is positioned in front of the testing component and is provided with a product placing groove (22), sliding strips (26) are arranged on the left side and the right side of the product tray (21), a connecting strip (27) is arranged on the rear side of the product tray (21), the testing component comprises an installation block (23), a connecting block (24) and a plurality of probe blocks (25) arranged on the connecting block (24), fixing screws (28) are arranged on two sides of the installation block (23), the installation block (23) is pairwise arranged on the connecting strip (27) through the fixing screws (28), the lower end of the connecting block (24) is matched with the upper end of the installation block (23), the lower end of the connecting block (24) is movably connected with the upper end of the installation block (23) through a compression spring (29), connecting block (24) both sides are equipped with spiro union subassembly (30), spiro union subassembly (30) inside is equipped with stop screw (31) and reset spring (32), be equipped with spacing portion of annular (33) in the middle of stop screw (31), reset spring (32) cup joint on stop screw (31), stop screw (31) lower extreme and installation piece (23) spiro union, reset spring (32) are located between spacing portion of annular (33) and installation piece (23), connecting block (24) are equipped with a plurality of mounting grooves (34), and are a plurality of probe piece (25) set up in a plurality of mounting grooves (34), and are a plurality of inside needle piece pcb board (35) that is equipped with of probe piece (25), it is a plurality of both sides are equipped with many probes (36) around probe piece (25), needle piece pcb board (35) and many probes (36) electric connection.

3. The stacked Mini/micro led testing tool of claim 2, wherein: the upper end of the connecting strip (27) is provided with a plurality of probe holes (37) for inserting probes (36), and the rear end of the connecting strip (27) is provided with a plurality of wire holes (38) for inserting connecting guide needles (9).

4. The stacked Mini/micro led testing tool of claim 1, wherein: the up end of roller board (4) is equipped with a plurality of horizontal gyro wheel (5), and is a plurality of horizontal gyro wheel (5) are the array and distribute, the terminal surface that roller board (4) is close to product test layer (2) one side is equipped with a plurality of perpendicular gyro wheel (6), and is a plurality of perpendicular gyro wheel (6) are the array and distribute, and are a plurality of perpendicular gyro wheel (6), a plurality of horizontal gyro wheel (5) all are connected with draw runner (26) that product test layer (2) set up, the terminal surface is connected with perpendicular gyro wheel (6) contact under draw runner (26), the terminal surface that product test layer (2) one side was kept away from in draw runner (26) is connected with horizontal gyro wheel (5) contact.

5. The stacked Mini/micro led testing tool of claim 1, wherein: frame (1) is located a plurality of connecting plates (7) position front end and all is equipped with buckle assembly (10), buckle assembly (10) are equipped with "V" type groove (12) and screens piece (11), rotatable coupling is made in "V" type groove (12) in screens piece (11).