CN201852902U - ITO (information technology outsourcing) film conduction tester - Google Patents

ITO (information technology outsourcing) film conduction tester Download PDF

Info

Publication number
CN201852902U
CN201852902U CN2010205916435U CN201020591643U CN201852902U CN 201852902 U CN201852902 U CN 201852902U CN 2010205916435 U CN2010205916435 U CN 2010205916435U CN 201020591643 U CN201020591643 U CN 201020591643U CN 201852902 U CN201852902 U CN 201852902U
Authority
CN
China
Prior art keywords
test
loading plate
support platform
pressing plate
test probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2010205916435U
Other languages
Chinese (zh)
Inventor
姜波
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SUZHOU NEW TOUCH TECHNOLOGY CO LTD
Original Assignee
SUZHOU NEW TOUCH TECHNOLOGY CO LTD
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SUZHOU NEW TOUCH TECHNOLOGY CO LTD filed Critical SUZHOU NEW TOUCH TECHNOLOGY CO LTD
Priority to CN2010205916435U priority Critical patent/CN201852902U/en
Application granted granted Critical
Publication of CN201852902U publication Critical patent/CN201852902U/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Abstract

An ITO (information technology outsourcing) film conduction tester comprises a supporting platform, and a bearing plate and a pressing plate that are arranged on the supporting platform and can move up and down, wherein the pressing plate is arranged above the bearing plate; a plurality of groups of test probes that are arranged in two rows and extrude out of the supporting platform are arranged on the supporting platform; each two test probes of each group of test probes is electrically connected, and a test alarm lamp is further connected in series among the test probes of each group; the bearing plate is provided with probe holes corresponding to the test probes; and when the bearing plate moves downwards, the test probes can pass through the probe holes and can tower above the upper surface of the bearing plate. The ITO film conduction tester is simple in structure, easy for operation and capable of quick positioning for tests, saves operation time and can conduct volume production test and avoid the unfavorable phenomena of product scratching and product pollution.

Description

ITO film continuity test instrument
Technical field
The utility model relates to the pick-up unit of capacitive touch screen, refers in particular to the proving installation of the ITO film conducting in the capacitive touch screen production run.
Background technology
In recent years, along with the popularization of iphone capacitance touch screen mobile phone, capacitance touch is liked by consumers in general.Game device on electronic watch, electronic documentation, panel computer, NB, PDA, MP3, MP4, handwriting pad, the line, STB video phone, facsimile recorder, telephone set, Smartphone, GPS, portable type LCD TV, air-conditioning, refrigerator, audiovisual sound equipment, household electrical appliances now have been widely used in fields such as telepilots.
At existing capacitive touch screen production industry, in making ITO circuit (ITO Sensor) process, after production is finished, can't check whether conducting of circuit, cause bad back stream, cause the waste of back operation material.At present, the factory that has adopts manual multimeter to measure whether conducting, the two ends that i.e. craft utilizes the two poles of the earth probe of multimeter to be placed on a circuit are tested, this kind test mode efficient is too low, can't import the mass production test,, occur testing the excessive phenomenon of exerting oneself sometimes because manual test is also inhomogeneous because of the strength that operative employee's difference applies, can produce scratch damage material, problems such as contaminated materials.
Summary of the invention
Technical problem to be solved in the utility model is to make the ITO line test can carry out volume production test, and this test is widely used in during each properties of product in the production run detect; It is even that test applies strength, can not produce product material scratch damage, problems such as contaminated materials.
For solving the problems of the technologies described above, the technical scheme that the utility model provides is a kind of ITO film continuity test instrument, comprises support platform, loading plate; Wherein:
Described support platform is equipped with the array test probe that is arranged in the two outstanding described support platforms of arranging thereon, and described every group of test probe is made up of two test probes that are arranged in different rows; Be electrically connected between two test probes of described every group of test probe, also be in series with a test alarm lamp between every group of test probe, described test alarm lamp is installed in the side on the described support platform successively; Described every group of test probe is electrically connected with a power supply respectively;
Described loading plate, but described support platform top be installed in the mode level of upper and lower displacement, and be positioned at the top of described two row's test probes, on described loading plate, offer and the described two row test probe positions pin hole all corresponding with quantity; During to bottom offset, described two row's test probes can pass the pin hole on the described loading plate and make the test probe upper end exceed the upper surface of described loading plate at described loading plate.
Offer the concave surface of a placement product on described loading plate upper surface, described pin hole is positioned at described concave surface.Product is placed in this concave surface, its stationkeeping and can all around not moving, and the circuit on it just in time is positioned on the pin hole, makes the time of the line aligning pin hole on the product when having avoided placing product.
Described loading plate is horizontally fixed on described support platform top by elastic device.
Four angles of described loading plate are fixed on described support platform top by spring horizontal.By elastic device loading plate is fixedly supported on the support platform, loading plate is moved downward make test probe pass pin hole when pressurized and test, test finishes to bounce up under the elastic force effect behind the relief pressure and leaves support platform.
Side on described support platform is fixed with a supporter, and a pressing plate can be fixed on the described supporter up or down, and described pressing plate is positioned at described loading plate top.
Be installed with two limited posts on described support platform, described limited post is positioned at described supporter near described loading plate one side, is arranged with a linear axis respectively and holds on described limited post, and described pressing plate is horizontally fixed on the described two bearings; Be fixed with a trace on described pressing plate, described trace and is positioned at described pressing plate top and the handle that is fixed on the described supporter flexibly connects.
Pressing plate is set above loading plate, when test, pressing plate move down compacting on the loading plate product and drive loading plate and move downward together and test, pressing plate is exerted pressure downwards and is covered product to be tested, circuit that can product to be tested contact fully with test probe and stressed evenly, bad phenomenon such as loose contact in the time of can not producing scratch, damage or test.
ITO film continuity test instrument of the present utility model, it is simple in structure, accurate testing; And can clearly know which bar circuit for opening circuit by the light and shade of test alarm lamp, product defects is at which position; Because the utilization mechanical hook-up positions test, and is simple to operate, the save operation time, can carry out the mass production test, saved the test duration, improved the precision of test; And avoided the bad phenomenon such as scratch, pollution of product.
Description of drawings
The three-dimensional blast of Fig. 1 the utility model structural representation
Local A structure enlarged diagram among Fig. 2 Fig. 1
Local B structure enlarged diagram among Fig. 3 Fig. 1
Fig. 4 tester circuit theory diagrams
Embodiment
At the utility model, now lift a preferred embodiment and be specifically described in conjunction with graphic.ITO film continuity test instrument of the present utility model, it comprises support platform 1, loading plate 2, pressing plate 3, wherein:
Support platform 1, referring to Fig. 1, Fig. 3, Fig. 4, it is the leveling board that is supported by square bracing frame, itself and square bracing frame are fixedly connected to form square box 10; Its material is bakelite or other solid insulation plates; On support platform 1, wear and be fixed with the array test probe 11 that is arranged in two rows, the upper surface of the outstanding support platform 1 of the test port that contacts with product to be tested of test probe 11, the lower surface of the outstanding support platform 1 in its lower end; The spacing distance difference of every row's test probe, wherein the line pitch of the conduction port of the circuit exit of a row spacing distance and product is consistent, and an other row's spacing distance is consistent with the line pitch of the corresponding side of conduction port of exit; Every group of test probe is made up of two test probes, and these two test probes lay respectively at different test probe rows; Be electrically connected by electric wire between every group of test probe, between every group of test probe, all be in series with a test alarm lamp 12, this test alarm lamp can be LED, common miniature bulb etc., the test alarm lamp is arranged the close leading edge position that is fixedly mounted on the support platform 1 in order, and the test alarm lamp is positioned at the suitable distance in front side of two row's test probes; Connecting the connection electric wire (not shown) that reaches between the test probe between test probe and the test alarm lamp all is placed in the square box 10, described connection electric wire all is electrically connected with a power supply (not shown) that is positioned at square box 10, this power supply supply voltage is 5V, is provided with power switch 15 in a side of square box 10;
Loading plate 2 referring to Fig. 1 and Fig. 2, is square plate, and its material is the solid panel of bakelite or other insulation; Loading plate 2 is by four elastic devices, the 16 unsettled tops that are fixed on support platform 1, elastic device one end is fixed on the support platform, the other end is fixed near the position, four angles of loading plate 2, can make loading plate 2 relative support platforms 1 carry out upper and lower displacement by exerting pressure; This elastic device is a spring in the present embodiment; Make it when the support platform 1 when applying pressure to loading plate 2, the area of loading plate 2 can cover the zone at test probe 11 places on the support platform 1; On loading plate 2, offer the concave surface of placing product to be tested, when this concave surface can make product be placed on it, can all around not move, be convenient to the location; Offer two row's pin holes 21 near the edge, front and back on this concave surface, row's spacing of this two rows pin hole 21, the pin hole spacing among the row and pin hole quantity are consistent with row's spacing, the test probe spacing and the test probe quantity in arranging of two row's test probes on being arranged on support platform 1; In product to be tested is placed on concave surface on the loading plate 2, the circuit exit of product 2 to be tested and the circuit of a corresponding side are just in time fitted and are positioned at one by one on the pin hole 21 on the loading plate 2, when the loading plate pressurized moves downward, be positioned at two test leads that test probe 11 on the support platform can pass the corresponding with it pin hole on the loading plate 2 and touch product to be tested;
Pressing plate 3, referring to Fig. 1, it is a flat board, material is the PC transparent material, certainly, also can be other materials; On support platform 1, the suitable distance of rear side that is positioned at two row's test probes is provided with two limited posts 17, erects in the suitable fixed distance of the rear side of this limited post 17 supporting walls 18 is installed; Be arranged with a linear bearing that can move up and down along limited post on two limited posts 17 respectively, an end of pressing plate 3 is fixedly mounted on two linear bearings; On pressing plate 3, be installed with a trace 31, this trace 31 flexibly connects with the handle 32 that is fixed on the sway brace 18 that is positioned at its top, when handle moves, can drive trace 31 moves up and down, trace 31 drives pressing plate 3 and moves up and down, by limited post 17, pressing plate 3 can all around not rock; Pressing plate 3 satisfies when moving down, can compress loading plate 2 and the product to be tested that is placed on the loading plate 2, and drive loading plate 2 and product to be tested moves down, make to be installed in test probe 11 on the support platform 1 and to pass the circuit that pin hole on the loading plate 2 touches product to be tested.
Test probe of the present utility model is arranged and the size of loading plate all can change accordingly according to the size of product to be tested, such as, test probe can be made test pushbutton module according to product size, on support platform, offer several installation slotted eyes that are complementary with several product sizes, required test pushbutton module is installed in the installation slotted eye that is mated, then with on the test probe with electric wire be connected with power supply, and change corresponding loading plate.So design, then ITO film continuity test instrument can be adapted to the test of different product size, if setup test probe module and corresponding loading plate, and do not need to make again tester.
The use of the utility model tester: product to be tested is placed on the concave surface of loading plate 2, make on its product circuit surface to be measured down, opening power, the pulling handle moves down pressing plate 3 and compresses product to be tested and loading plate 2, and drive loading plate 2 and continue to move to test probe downwards and pass the pin hole on the loading plate and touch circuit on the product to be tested, if line conduction, it is bright then to test alarm lamp accordingly, if not conducting of circuit, then testing alarm lamp does not accordingly just work, judge and whether conducting of circuit on the product make operation easily that test result is very clear very directly perceived by watching the bright of test alarm lamp with not working.

Claims (6)

1.ITO film continuity test instrument comprises support platform, loading plate; Be characterised in that:
Described support platform is equipped with the array test probe that is arranged in the two outstanding described support platforms of arranging thereon, and described every group of test probe is made up of two test probes that are arranged in different rows; Be electrically connected between two test probes of described every group of test probe, also be in series with a test alarm lamp between every group of test probe, described test alarm lamp is installed in the side on the described support platform successively; Described every group of test probe is electrically connected with a power supply respectively;
Described loading plate, but described support platform top be installed in the mode level of upper and lower displacement, and be positioned at the top of described two row's test probes, on described loading plate, offer and the described two row test probe positions pin hole all corresponding with quantity; During to bottom offset, described two row's test probes can pass the pin hole on the described loading plate and make the test probe upper end exceed the upper surface of described loading plate at described loading plate.
2. ITO film continuity test instrument according to claim 1 is characterized in that offering a concave surface of placing product on described loading plate upper surface, described pin hole is positioned at described concave surface.
3. ITO film continuity test instrument according to claim 1 is characterized in that described loading plate is horizontally fixed on described support platform top by elastic device.
4. ITO film continuity test instrument according to claim 3 is characterized in that four angles of described loading plate are fixed on described support platform top by spring horizontal.
5. according to arbitrary described ITO film continuity test instrument in the claim 1,2,3,4, it is characterized in that the side on described support platform is fixed with a supporter, one pressing plate can be fixed on the described supporter up or down, and described pressing plate is positioned at described loading plate top.
6. ITO film continuity test instrument according to claim 5, it is characterized in that on described support platform, being installed with two limited posts, described limited post is positioned at described supporter near described loading plate one side, be arranged with a linear axis respectively and hold on described limited post, described pressing plate is horizontally fixed on the described two bearings; Be fixed with a trace on described pressing plate, described trace and is positioned at described pressing plate top and the handle that is fixed on the described supporter flexibly connects.
CN2010205916435U 2010-11-04 2010-11-04 ITO (information technology outsourcing) film conduction tester Expired - Fee Related CN201852902U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2010205916435U CN201852902U (en) 2010-11-04 2010-11-04 ITO (information technology outsourcing) film conduction tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2010205916435U CN201852902U (en) 2010-11-04 2010-11-04 ITO (information technology outsourcing) film conduction tester

Publications (1)

Publication Number Publication Date
CN201852902U true CN201852902U (en) 2011-06-01

Family

ID=44095290

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2010205916435U Expired - Fee Related CN201852902U (en) 2010-11-04 2010-11-04 ITO (information technology outsourcing) film conduction tester

Country Status (1)

Country Link
CN (1) CN201852902U (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103197105A (en) * 2013-03-13 2013-07-10 健大电业制品(昆山)有限公司 PIN access detecting jig
CN103323635A (en) * 2013-06-21 2013-09-25 深圳市华星光电技术有限公司 Probe module for detecting contacting effect
CN109738734A (en) * 2018-12-28 2019-05-10 南通同洲电子有限责任公司 A kind of multifunctional set top box automatic testing tool jig

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103197105A (en) * 2013-03-13 2013-07-10 健大电业制品(昆山)有限公司 PIN access detecting jig
CN103323635A (en) * 2013-06-21 2013-09-25 深圳市华星光电技术有限公司 Probe module for detecting contacting effect
CN103323635B (en) * 2013-06-21 2015-12-02 深圳市华星光电技术有限公司 For detecting the probe module of contact effect
CN109738734A (en) * 2018-12-28 2019-05-10 南通同洲电子有限责任公司 A kind of multifunctional set top box automatic testing tool jig

Similar Documents

Publication Publication Date Title
CN203785652U (en) Electrical core thickness and width test machine
CN104777417A (en) Modular PCB testing jig
CN201852902U (en) ITO (information technology outsourcing) film conduction tester
CN102004337A (en) Liquid crystal display (LCD) test fixture and test method thereof
CN204044247U (en) A kind of flex circuit application resistance tester
CN206002626U (en) A kind of semi-finished product testing touch screen machine
CN202472177U (en) Backlight module detection device
CN102967845A (en) Method and device for testing electric parameters of electric energy measuring module
CN102680765B (en) Method for testing current of camera connecting plate and clamp thereof
CN204154745U (en) A kind of screen testing device
CN204347134U (en) Testing impedance servicing unit and system
CN203455421U (en) Novel transformer testing assembly
CN204087751U (en) A kind of LCDs electric detection means
CN106124904B (en) A kind of electric connector electric property detecting system
CN204925163U (en) Liquid crystal product test frame
CN204614408U (en) The display screen module with contact pin connection protective device lights testing apparatus
CN204129083U (en) A kind of frock detecting 090-590000-22TV board detects pin platform
CN205982547U (en) Circuit board testing tool
CN214845399U (en) Vertical downward-pressing type screen test fixture
CN205810340U (en) A kind of display module test fixture
CN205283821U (en) Function machine mobile phone motherboard test fixture
CN205067627U (en) Probe testing apparatus
CN205280865U (en) Electronic equipment mainboard conduction testing device
CN209513987U (en) A kind of pcb board test device
CN202948065U (en) Auxiliary test tool

Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20110601

Termination date: 20161104

CF01 Termination of patent right due to non-payment of annual fee