CN201852902U - ITO (information technology outsourcing) film conduction tester - Google Patents
ITO (information technology outsourcing) film conduction tester Download PDFInfo
- Publication number
- CN201852902U CN201852902U CN2010205916435U CN201020591643U CN201852902U CN 201852902 U CN201852902 U CN 201852902U CN 2010205916435 U CN2010205916435 U CN 2010205916435U CN 201020591643 U CN201020591643 U CN 201020591643U CN 201852902 U CN201852902 U CN 201852902U
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- test
- loading plate
- support platform
- pressing plate
- test probe
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Abstract
An ITO (information technology outsourcing) film conduction tester comprises a supporting platform, and a bearing plate and a pressing plate that are arranged on the supporting platform and can move up and down, wherein the pressing plate is arranged above the bearing plate; a plurality of groups of test probes that are arranged in two rows and extrude out of the supporting platform are arranged on the supporting platform; each two test probes of each group of test probes is electrically connected, and a test alarm lamp is further connected in series among the test probes of each group; the bearing plate is provided with probe holes corresponding to the test probes; and when the bearing plate moves downwards, the test probes can pass through the probe holes and can tower above the upper surface of the bearing plate. The ITO film conduction tester is simple in structure, easy for operation and capable of quick positioning for tests, saves operation time and can conduct volume production test and avoid the unfavorable phenomena of product scratching and product pollution.
Description
Technical field
The utility model relates to the pick-up unit of capacitive touch screen, refers in particular to the proving installation of the ITO film conducting in the capacitive touch screen production run.
Background technology
In recent years, along with the popularization of iphone capacitance touch screen mobile phone, capacitance touch is liked by consumers in general.Game device on electronic watch, electronic documentation, panel computer, NB, PDA, MP3, MP4, handwriting pad, the line, STB video phone, facsimile recorder, telephone set, Smartphone, GPS, portable type LCD TV, air-conditioning, refrigerator, audiovisual sound equipment, household electrical appliances now have been widely used in fields such as telepilots.
At existing capacitive touch screen production industry, in making ITO circuit (ITO Sensor) process, after production is finished, can't check whether conducting of circuit, cause bad back stream, cause the waste of back operation material.At present, the factory that has adopts manual multimeter to measure whether conducting, the two ends that i.e. craft utilizes the two poles of the earth probe of multimeter to be placed on a circuit are tested, this kind test mode efficient is too low, can't import the mass production test,, occur testing the excessive phenomenon of exerting oneself sometimes because manual test is also inhomogeneous because of the strength that operative employee's difference applies, can produce scratch damage material, problems such as contaminated materials.
Summary of the invention
Technical problem to be solved in the utility model is to make the ITO line test can carry out volume production test, and this test is widely used in during each properties of product in the production run detect; It is even that test applies strength, can not produce product material scratch damage, problems such as contaminated materials.
For solving the problems of the technologies described above, the technical scheme that the utility model provides is a kind of ITO film continuity test instrument, comprises support platform, loading plate; Wherein:
Described support platform is equipped with the array test probe that is arranged in the two outstanding described support platforms of arranging thereon, and described every group of test probe is made up of two test probes that are arranged in different rows; Be electrically connected between two test probes of described every group of test probe, also be in series with a test alarm lamp between every group of test probe, described test alarm lamp is installed in the side on the described support platform successively; Described every group of test probe is electrically connected with a power supply respectively;
Described loading plate, but described support platform top be installed in the mode level of upper and lower displacement, and be positioned at the top of described two row's test probes, on described loading plate, offer and the described two row test probe positions pin hole all corresponding with quantity; During to bottom offset, described two row's test probes can pass the pin hole on the described loading plate and make the test probe upper end exceed the upper surface of described loading plate at described loading plate.
Offer the concave surface of a placement product on described loading plate upper surface, described pin hole is positioned at described concave surface.Product is placed in this concave surface, its stationkeeping and can all around not moving, and the circuit on it just in time is positioned on the pin hole, makes the time of the line aligning pin hole on the product when having avoided placing product.
Described loading plate is horizontally fixed on described support platform top by elastic device.
Four angles of described loading plate are fixed on described support platform top by spring horizontal.By elastic device loading plate is fixedly supported on the support platform, loading plate is moved downward make test probe pass pin hole when pressurized and test, test finishes to bounce up under the elastic force effect behind the relief pressure and leaves support platform.
Side on described support platform is fixed with a supporter, and a pressing plate can be fixed on the described supporter up or down, and described pressing plate is positioned at described loading plate top.
Be installed with two limited posts on described support platform, described limited post is positioned at described supporter near described loading plate one side, is arranged with a linear axis respectively and holds on described limited post, and described pressing plate is horizontally fixed on the described two bearings; Be fixed with a trace on described pressing plate, described trace and is positioned at described pressing plate top and the handle that is fixed on the described supporter flexibly connects.
Pressing plate is set above loading plate, when test, pressing plate move down compacting on the loading plate product and drive loading plate and move downward together and test, pressing plate is exerted pressure downwards and is covered product to be tested, circuit that can product to be tested contact fully with test probe and stressed evenly, bad phenomenon such as loose contact in the time of can not producing scratch, damage or test.
ITO film continuity test instrument of the present utility model, it is simple in structure, accurate testing; And can clearly know which bar circuit for opening circuit by the light and shade of test alarm lamp, product defects is at which position; Because the utilization mechanical hook-up positions test, and is simple to operate, the save operation time, can carry out the mass production test, saved the test duration, improved the precision of test; And avoided the bad phenomenon such as scratch, pollution of product.
Description of drawings
The three-dimensional blast of Fig. 1 the utility model structural representation
Local A structure enlarged diagram among Fig. 2 Fig. 1
Local B structure enlarged diagram among Fig. 3 Fig. 1
Fig. 4 tester circuit theory diagrams
Embodiment
At the utility model, now lift a preferred embodiment and be specifically described in conjunction with graphic.ITO film continuity test instrument of the present utility model, it comprises support platform 1, loading plate 2, pressing plate 3, wherein:
Loading plate 2 referring to Fig. 1 and Fig. 2, is square plate, and its material is the solid panel of bakelite or other insulation; Loading plate 2 is by four elastic devices, the 16 unsettled tops that are fixed on support platform 1, elastic device one end is fixed on the support platform, the other end is fixed near the position, four angles of loading plate 2, can make loading plate 2 relative support platforms 1 carry out upper and lower displacement by exerting pressure; This elastic device is a spring in the present embodiment; Make it when the support platform 1 when applying pressure to loading plate 2, the area of loading plate 2 can cover the zone at test probe 11 places on the support platform 1; On loading plate 2, offer the concave surface of placing product to be tested, when this concave surface can make product be placed on it, can all around not move, be convenient to the location; Offer two row's pin holes 21 near the edge, front and back on this concave surface, row's spacing of this two rows pin hole 21, the pin hole spacing among the row and pin hole quantity are consistent with row's spacing, the test probe spacing and the test probe quantity in arranging of two row's test probes on being arranged on support platform 1; In product to be tested is placed on concave surface on the loading plate 2, the circuit exit of product 2 to be tested and the circuit of a corresponding side are just in time fitted and are positioned at one by one on the pin hole 21 on the loading plate 2, when the loading plate pressurized moves downward, be positioned at two test leads that test probe 11 on the support platform can pass the corresponding with it pin hole on the loading plate 2 and touch product to be tested;
Test probe of the present utility model is arranged and the size of loading plate all can change accordingly according to the size of product to be tested, such as, test probe can be made test pushbutton module according to product size, on support platform, offer several installation slotted eyes that are complementary with several product sizes, required test pushbutton module is installed in the installation slotted eye that is mated, then with on the test probe with electric wire be connected with power supply, and change corresponding loading plate.So design, then ITO film continuity test instrument can be adapted to the test of different product size, if setup test probe module and corresponding loading plate, and do not need to make again tester.
The use of the utility model tester: product to be tested is placed on the concave surface of loading plate 2, make on its product circuit surface to be measured down, opening power, the pulling handle moves down pressing plate 3 and compresses product to be tested and loading plate 2, and drive loading plate 2 and continue to move to test probe downwards and pass the pin hole on the loading plate and touch circuit on the product to be tested, if line conduction, it is bright then to test alarm lamp accordingly, if not conducting of circuit, then testing alarm lamp does not accordingly just work, judge and whether conducting of circuit on the product make operation easily that test result is very clear very directly perceived by watching the bright of test alarm lamp with not working.
Claims (6)
1.ITO film continuity test instrument comprises support platform, loading plate; Be characterised in that:
Described support platform is equipped with the array test probe that is arranged in the two outstanding described support platforms of arranging thereon, and described every group of test probe is made up of two test probes that are arranged in different rows; Be electrically connected between two test probes of described every group of test probe, also be in series with a test alarm lamp between every group of test probe, described test alarm lamp is installed in the side on the described support platform successively; Described every group of test probe is electrically connected with a power supply respectively;
Described loading plate, but described support platform top be installed in the mode level of upper and lower displacement, and be positioned at the top of described two row's test probes, on described loading plate, offer and the described two row test probe positions pin hole all corresponding with quantity; During to bottom offset, described two row's test probes can pass the pin hole on the described loading plate and make the test probe upper end exceed the upper surface of described loading plate at described loading plate.
2. ITO film continuity test instrument according to claim 1 is characterized in that offering a concave surface of placing product on described loading plate upper surface, described pin hole is positioned at described concave surface.
3. ITO film continuity test instrument according to claim 1 is characterized in that described loading plate is horizontally fixed on described support platform top by elastic device.
4. ITO film continuity test instrument according to claim 3 is characterized in that four angles of described loading plate are fixed on described support platform top by spring horizontal.
5. according to arbitrary described ITO film continuity test instrument in the claim 1,2,3,4, it is characterized in that the side on described support platform is fixed with a supporter, one pressing plate can be fixed on the described supporter up or down, and described pressing plate is positioned at described loading plate top.
6. ITO film continuity test instrument according to claim 5, it is characterized in that on described support platform, being installed with two limited posts, described limited post is positioned at described supporter near described loading plate one side, be arranged with a linear axis respectively and hold on described limited post, described pressing plate is horizontally fixed on the described two bearings; Be fixed with a trace on described pressing plate, described trace and is positioned at described pressing plate top and the handle that is fixed on the described supporter flexibly connects.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN2010205916435U CN201852902U (en) | 2010-11-04 | 2010-11-04 | ITO (information technology outsourcing) film conduction tester |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2010205916435U CN201852902U (en) | 2010-11-04 | 2010-11-04 | ITO (information technology outsourcing) film conduction tester |
Publications (1)
Publication Number | Publication Date |
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CN201852902U true CN201852902U (en) | 2011-06-01 |
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CN2010205916435U Expired - Fee Related CN201852902U (en) | 2010-11-04 | 2010-11-04 | ITO (information technology outsourcing) film conduction tester |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103197105A (en) * | 2013-03-13 | 2013-07-10 | 健大电业制品(昆山)有限公司 | PIN access detecting jig |
CN103323635A (en) * | 2013-06-21 | 2013-09-25 | 深圳市华星光电技术有限公司 | Probe module for detecting contacting effect |
CN109738734A (en) * | 2018-12-28 | 2019-05-10 | 南通同洲电子有限责任公司 | A kind of multifunctional set top box automatic testing tool jig |
-
2010
- 2010-11-04 CN CN2010205916435U patent/CN201852902U/en not_active Expired - Fee Related
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103197105A (en) * | 2013-03-13 | 2013-07-10 | 健大电业制品(昆山)有限公司 | PIN access detecting jig |
CN103323635A (en) * | 2013-06-21 | 2013-09-25 | 深圳市华星光电技术有限公司 | Probe module for detecting contacting effect |
CN103323635B (en) * | 2013-06-21 | 2015-12-02 | 深圳市华星光电技术有限公司 | For detecting the probe module of contact effect |
CN109738734A (en) * | 2018-12-28 | 2019-05-10 | 南通同洲电子有限责任公司 | A kind of multifunctional set top box automatic testing tool jig |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110601 Termination date: 20161104 |
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CF01 | Termination of patent right due to non-payment of annual fee |