CN211742609U

CN211742609U - OLED CELL aging test and white balance test device

Info

Publication number: CN211742609U
Application number: CN202020680326.4U
Authority: CN
Inventors: 韦文勇; 齐斌斌; 何海生; 何栢根
Original assignee: Shenzhen Chuangyuan Microelectronic Technology Co ltd
Current assignee: Shenzhen Chuangyuan Microelectronic Technology Co ltd
Priority date: 2020-04-28
Filing date: 2020-04-28
Publication date: 2020-10-23
Anticipated expiration: 2030-04-28

Abstract

The utility model discloses a OLED CELL aging testing and white balance testing arrangement, include: a Gamma probe and a tester; the tester includes: the system comprises a Gamma probe interface, a main control MCU module connected with the Gamma probe interface, a first FPGA module connected with the main control MCU module, a DAC (digital-to-analog converter) connected with the first FPGA module, an AC (alternating current) module, a DC (direct current) module and a connector interface, wherein the AC module, the DC module and the connector interface are respectively connected with the DAC; the Gamma probe is connected with the Gamma probe interface. The utility model discloses a Gamma probe that will be used for adjusting OLED CELL's white balance passes through Gamma probe interface and is in the same place with the tester integration that is used for OLED CELL aging testing, carries out OLED CELL's white balance test when carrying out aging testing to OLED CELL, can effectively reduce and occupy workshop space resource, promotes production efficiency.

Description

OLED CELL aging test and white balance test device

Technical Field

The utility model relates to a screen test field especially relates to an OLED CELL aging testing and white balance testing arrangement.

Background

The display screen built by the OLED screen with the flexible organic light-emitting material as the base material has the advantages of being light, thin, bendable, high in color contrast, capable of being independently lightened, short in screen response time and the like, which cannot be compared with an LCD screen. Also, OLED screens can light up the screen without a backlight as compared to LCD screens. Therefore, the OLED display module is simpler in structure than the LCD display module. The advantages of the above-mentioned OLED screens have led to the OLED screens becoming an increasingly strong force in the field of display screens. In short years, large-scale commercial use of OLED screens is in handheld mobile devices, intelligent wearable devices, automotive central control devices, automotive instrument panels, household appliances, and the like.

The OLED CELL, the OLED drive IC, the flexible flat cable, the glass cover plate and other main components form an OLED screen. Among them, OLESCELL is called OLED panel, which is the most important component of OLED screen. The main factor of the OLED finished screen which is expensive in manufacturing cost also comes from the OLED CELL. Because, the defective rate of the OLED CELL is always high. Therefore, OLED production enterprises can strictly detect and screen OLED CELL when leaving factory. Therefore, the OLED CELL testing device has great demand in OLED production enterprises.

The function of the existing OLED CELL test equipment in the market is single. For example: the aging test equipment of the OLED CELL only has an aging test function, and most of the equipment can only perform aging test on one OLED screen, which is not beneficial to large-scale aging test of enterprises on the OLED CELL. In addition, the white balance pre-adjustment of the OLED CELL is also a testing link of the OLED CELL. The existing equipment in the market can detect whether the OLED CELL has color deviation and other adverse phenomena by adjusting the white balance of the OLED CELL. The device for pre-adjusting the white balance of the OLED CELL in the market not only needs to be matched with an expensive optical lens for acquiring the brightness value, the color coordinate value and the like of the OLED CELL, but also needs to be equipped with a white balance lighting debugging device to normally adjust the white balance of the OLED CELL. Too many associated devices not only occupy the space resources of a workshop greatly, but also the OLED CELL repeatedly moves to the devices and cannot improve the production test efficiency.

Accordingly, the prior art is deficient and needs improvement.

SUMMERY OF THE UTILITY MODEL

The to-be-solved technical problem of the utility model is: the OLED CELL aging test and white balance test device can simultaneously perform aging test and white balance test, reduce occupied workshop space resources and improve production efficiency.

The technical scheme of the utility model as follows: the utility model provides a OLED CELL aging testing and white balance testing arrangement, includes: a Gamma probe and a tester; the tester includes: the device comprises a Gamma probe interface, a main control MCU module connected with the Gamma probe interface, a first FPGA module connected with the main control MCU module, a DAC digital-to-analog converter connected with the first FPGA module, an AC module and a DC module respectively connected with the DAC digital-to-analog converter, a first current diffusion circuit connected with the AC module, a first voltage diffusion circuit connected with the first current diffusion circuit, a second current diffusion circuit connected with the DC module, a second voltage diffusion circuit connected with the second current diffusion circuit, and a connector interface respectively connected with the first voltage diffusion circuit and the second voltage diffusion circuit; the Gamma probe is connected with the Gamma probe interface.

The tester further comprises: and the Ethernet interface module is connected with the main control MCU module.

And the master control MCU is used for controlling the operation of the whole device. The first FPGA module is used for outputting a waveform required by an aging test OLEDCell. The DAC is used for converting the numerical waveform signal into an analog voltage signal. Since the OLED CELL test uses not only AC signals but also DC signals, the AC module is used to output AC signals and the DC module is used to output DC signals. In addition, the aging test of a plurality of OLED screens is driven simultaneously when the analog voltage signals converted by the DAC are insufficient, so that the AC signals output by the AC module need to be amplified by the first current amplifying circuit and the first voltage amplifying circuit, and the DC signals output by the DC module need to be amplified by the second current amplifying circuit and the second voltage amplifying circuit, so that the aging test of a plurality of OLED screens can be driven simultaneously. The connector interface integrates the pins required by lighting the aging OLED CELL into one interface for convenient management. In addition, the Gamma probe interface module is used for matching with a Gamma probe to realize OLED CELL white balance preconditioning test, and the Gamma probe can acquire the brightness value and the color coordinate value of the OLED CELL. And the Ethernet interface module is used for outputting the test data of the OLED CELL in real time so that the management personnel can control the production test condition in real time.

The Gamma probe for adjusting the white balance of the OLED CELL is integrated with the tester for the OLED CELL aging test through the Gamma probe interface, the white balance test of the OLED CELL is carried out while the aging test of the OLED CELL is carried out, the occupied workshop space resources can be effectively reduced, and the production efficiency is improved. The alternating current signal output by the AC module is enlarged, and the direct current signal output by the DC module is enlarged, so that the aging test of a plurality of OLED screens can be driven simultaneously, and the production efficiency is further improved.

The Gamma probe comprises: the photoelectric conversion device comprises an optical lens, a shutter, a photoelectric converter, an A/D conversion module connected with the photoelectric converter, a second FPGA module connected with the A/D conversion module, a CPU module connected with the second FPGA module and a switching port connected with the CPU module; the shutter is arranged between the optical lens and the photoelectric converter; the adapter interface is matched with the Gamma probe interface. The OLED CELL is lightened, light emitted by the OLED CELL enters the photoelectric converter through the optical lens, the photoelectric converter converts an optical signal into an electric signal, the electric signal is converted into a digital signal through the A/D conversion module, the digital signal is calculated through the second FPGA module, a brightness value and a color coordinate value of the OLED CELL are obtained and output to the CPU module, the CPU module can output the brightness value and the color coordinate value of the OLED CELL to the main control MCU module, and the main control MCU module outputs test data of the OLED CELL in real time through the Ethernet interface module so that a manager can master production test conditions in real time.

The Gamma probe further comprises: and the display screen is connected with the CPU module. The display screen is used for displaying the brightness value and the color coordinate value of the OLESCELL module. The adapter interface is an RS232 interface.

Adopt above-mentioned scheme, the utility model provides a OLED CELL aging testing and white balance testing arrangement, the Gamma probe that will be used for adjusting OLED CELL's white balance passes through Gamma probe interface and is in the same place with the tester integration that is used for OLED CELL aging testing, carries out OLED CELL's white balance test when carrying out aging testing to OLED CELL, can effectively reduce and occupy workshop space resource, promotes production efficiency. The alternating current signal output by the AC module is enlarged, and the direct current signal output by the DC module is enlarged, so that the aging test of a plurality of OLED screens can be driven simultaneously, and the production efficiency is further improved.

Drawings

FIG. 1 is a functional block diagram of a tester according to the present invention;

fig. 2 is a functional block diagram of the Gamma probe of the present invention.

Detailed Description

The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments.

Referring to fig. 1 and 2, the present invention provides an OLED CELL aging test and white balance test apparatus, including: a Gamma probe and a tester; the tester includes: the system comprises a Gamma probe interface 10, a main control MCU module 11 connected with the Gamma probe interface 10, a first FPGA module 12 connected with the main control MCU module 11, a DAC (digital-to-analog converter) 13 connected with the first FPGA module 12, an AC (alternating current) module 14 and a DC (direct current) module 15 respectively connected with the DAC module 13, a first current diffusion circuit 16 connected with the AC module 14, a first voltage diffusion circuit 17 connected with the first current diffusion circuit 16, a second current diffusion circuit 18 connected with the DC module 15, a second voltage diffusion circuit 19 connected with the second current diffusion circuit 18, and a connector interface 20 respectively connected with the first voltage diffusion circuit 17 and the second voltage diffusion circuit 19; the Gamma probe is connected with the Gamma probe interface 10.

The tester further comprises: and the Ethernet interface module 21 is connected with the main control MCU module 11.

The main control MCU module 11 is used for controlling the whole device to operate. The first FPGA module 12 is configured to output a waveform required by the aging test OLED CELL. The DAC 13 is used to convert the digital waveform signal into an analog voltage signal. Since the OLED CELL test uses not only AC signals but also DC signals, the AC module 14 is used to output AC signals, and the DC module 15 is used to output DC signals. In addition, since the analog voltage signal converted by the DAC 13 is insufficient to simultaneously drive the plurality of OLED screens for the burn-in test, it is necessary to amplify the AC signal output from the AC module 14 by the first current spreading circuit 16 and the first voltage spreading circuit 17, and to amplify the DC signal output from the DC module 15 by the second current spreading circuit 18 and the second voltage spreading circuit 19, so that the plurality of OLED screens can be simultaneously driven for the burn-in test. The connector interface 20 is a convenient way to integrate the pins required for lighting the aged OLED CELL into one interface. In addition, the Gamma probe interface 10 module is used for matching with a Gamma probe to realize OLED CELL white balance preconditioning test, and the Gamma probe can acquire the brightness value and color coordinate value of OLESCell. The ethernet interface module 21 is used to output the testing data of the OLED CELL in real time so that the manager can control the production testing situation in real time.

The Gamma probe for adjusting the white balance of the OLED CELL is integrated with the tester for the OLED CELL aging test through the Gamma probe interface 10, the white balance test of the OLED CELL is carried out while the aging test of the OLED CELL is carried out, the occupied workshop space resources can be effectively reduced, and the production efficiency is improved. The alternating current signal output by the AC module 14 is expanded, and the direct current signal output by the DC module 15 is expanded, so that the aging test of a plurality of OLED screens can be driven simultaneously, and the production efficiency is further improved.

The Gamma probe comprises: the optical lens 31, the shutter 32, the photoelectric converter 33, the a/D conversion module 34 connected to the photoelectric converter 33, the second FPGA module 35 connected to the a/D conversion module 34, the CPU module 36 connected to the second FPGA module 35, and the adapter 37 connected to the CPU module 36; the shutter 32 is disposed between the optical lens 31 and the photoelectric converter 33; the adapter 37 is matched with the Gamma probe interface 10. The OLED CELL is lighted, light emitted by the OLED CELL enters the photoelectric converter 33 through the optical lens 31, the photoelectric converter 33 converts an optical signal into an electrical signal, the electrical signal is converted into a digital signal through the a/D conversion module 34, the digital signal is calculated through the second FPGA module 35, a brightness value and a color coordinate value of the OLED CELL are obtained and output to the CPU module 36, the CPU module 36 can output the brightness value and the color coordinate value of the OLED CELL to the main control MCU module 11, and the main control MCU module 11 outputs test data of the OLED CELL in real time through the ethernet interface module, so that a manager can master production test conditions in real time.

The Gamma probe further comprises: a display screen 38 connected to the CPU module 36. The display screen 38 is used for displaying the brightness value and the color coordinate value of the OLED CELL module.

The adapter port 37 is an RS232 interface.

In this embodiment, the chip type adopted by the main control MCU module 11 is: STM32F7, the chip model that first FPGA module 12 adopted is: the Xilinx Spartan-3A, the chip model number adopted by the second FPGA module 35 is: xilinx Spartan-3A, the chip model number adopted by the CPU module 36 is: STM32F 446. The model of the DAC converter 13 is: DAC11001A, the model of the AC module 14 is: AD712ZN, the model of the DC module 15 is: the OPA2604, the model number of the photoelectric converter 33 is: the model of the a/D conversion module 34 is as follows: a4350, the first current spreading circuit 16 and the second current spreading circuit 18 are both: lm2596 diffusion circuit, the first diffusion circuit 17 and the second diffusion circuit 19 are both: lm2596 diffusion circuit.

When the OLED CELL is aged, the main control MCU module 11 sends specific waveform data required by aging and lighting of the OLED CELL to the first FPGA module 12, then the first FPGA module 12 produces waveforms according to the waveform data, and the DAC (digital-to-analog converter) 13 converts digital waveforms output by the first FPGA module 12 into analog voltage waveforms, so that the aging test is carried out on the OLED CELL.

When the white balance test of the OLED CELL is carried out, the main control MCU module 11 controls the first FPGA module 12 to enable the first FPGA module to output a gray picture for OLED CELL white balance calibration, then the Gamma lens acquires the brightness value and the color coordinate value of the OLED CELL, judges whether the two data are in the white balance error range of the OLED CELL, if so, the white balance calibration is successful, and the test is passed. If the brightness value and the color coordinate value can not be adjusted simultaneously within the error range meeting the white balance, the test is failed.

To sum up, the utility model provides a OLED CELL aging testing and white balance testing arrangement, the Gamma probe that will be used for adjusting OLED CELL's white balance passes through Gamma probe interface and is in the same place with the tester integration that is used for OLED CELL aging testing, acquires OLED CELL's luminance value and color coordinate value when carrying out aging testing to OLED CELL, can effectively reduce and occupy workshop space resource, promotes production efficiency. The alternating current signal output by the AC module is enlarged, and the direct current signal output by the DC module is enlarged, so that the aging test of a plurality of OLED screens can be driven simultaneously, and the production efficiency is further improved.

The above description is only exemplary of the present invention and should not be construed as limiting the present invention, and any modifications, equivalents and improvements made within the spirit and principles of the present invention are intended to be included within the scope of the present invention.

Claims

1. An OLED CELL aging test and white balance test device is characterized by comprising: a Gamma probe and a tester; the tester includes: the device comprises a Gamma probe interface, a main control MCU module connected with the Gamma probe interface, a first FPGA module connected with the main control MCU module, a DAC digital-to-analog converter connected with the first FPGA module, an AC module and a DC module respectively connected with the DAC digital-to-analog converter, a first current diffusion circuit connected with the AC module, a first voltage diffusion circuit connected with the first current diffusion circuit, a second current diffusion circuit connected with the DC module, a second voltage diffusion circuit connected with the second current diffusion circuit, and a connector interface respectively connected with the first voltage diffusion circuit and the second voltage diffusion circuit; the Gamma probe is connected with the Gamma probe interface.

2. The OLED CELL aging test and white balance test device of claim 1, wherein said tester further comprises: and the Ethernet interface module is connected with the main control MCU module.

3. The OLED CELL aging test and white balance test device of claim 1, wherein the Gamma probe comprises: the photoelectric conversion device comprises an optical lens, a shutter, a photoelectric converter, an A/D conversion module connected with the photoelectric converter, a second FPGA module connected with the A/D conversion module, a CPU module connected with the second FPGA module and a switching port connected with the CPU module; the shutter is arranged between the optical lens and the photoelectric converter; the adapter interface is matched with the Gamma probe interface.

4. The OLED CELL aging test and white balance test device of claim 3, wherein said Gamma probe further comprises: and the display screen is connected with the CPU module.

5. The apparatus of claim 3 wherein the interface is an RS232 interface.