CN211741374U

CN211741374U - Single-head universal test frame of PCB probe

Info

Publication number: CN211741374U
Application number: CN202020291508.2U
Authority: CN
Inventors: 刘义柏
Original assignee: Nanning Yanhua Electronic Technology Co ltd
Current assignee: Nanning Yanhua Electronic Technology Co ltd
Priority date: 2020-03-11
Filing date: 2020-03-11
Publication date: 2020-10-23
Anticipated expiration: 2030-03-11

Abstract

The utility model relates to a single-end universal test jig of PCB probe, including the test panel subassembly, erect the clamp plate, heavily press from both sides, elasticity depression bar and counter weight steel ball, survey the test panel subassembly and place on surveying the board, its characterized in that: the large clamp is clamped at one side of the test board, an elastic pressure rod is vertically and upwards hinged on the large clamp, and a counterweight steel ball is fixedly arranged at the head of the elastic pressure rod; and a vertical pressing plate is embedded and pressed at the position of the elastic pressing rod corresponding to the test plate component, and the lower bottom of the vertical pressing plate is movably hinged on the test plate component. The test rack is scientific in design and ingenious in conception, the counterweight steel balls are used for static pressure application, so that the application force of the probes on the circuit board is balanced and stable in contact pressure, the hollow sleeves for connecting the pressing plates and the metal solid columns for the test board support are coaxially and movably connected, the positioning at any angle of the probe assembly is realized, test contacts at different positions on the same integrated circuit test board can be tested, and the test contacts are not influenced and limited by structures of different integrated circuit boards.

Description

Single-head universal test frame of PCB probe

Technical Field

The utility model belongs to the technical field of integrated circuit board, a probe test of integrated circuit board is related to, especially a single-end universal test jig of PCB probe.

Background

Many automated integrated circuit boards now have to pass testing before they can be used. In particular, in the field of automobiles, the control of the automobile is increasingly electrified and automated, and the number of various types of control computer boards of one automobile reaches dozens at most, so that the work of testing the computer boards in the industry is very heavy. At present, probes are generally used for testing a computer board, but most of the probes are one-to-one probe modules, namely, a computer board needs to be specially designed with a special probe, so that the testing is complicated, the workload is large, and the working efficiency is low.

Through the search of published patent documents, two patent documents relevant to the present patent application are found as follows:

1. a test probe and test apparatus (107102181B), comprising: the probe card comprises a needle frame and a movable needle which at least partially extends into the needle frame and can move relative to the needle frame, wherein the movable needle is configured to be electrically connected with the needle frame to output a test signal in a first stroke of moving relative to the needle frame and be electrically disconnected with the needle frame in a second stroke of moving relative to the needle frame; the needle frame is including holding the passageway of eedle and be in the one end of passageway is provided with the opening, the eedle includes: the first conducting part is arranged in the channel of the needle frame, the first conducting part is arranged close to one end of the opening and extends to the second conducting part outside the needle frame through the opening, and the second conducting part is arranged far away from the needle head on one end of the first conducting part.

2. An electrical test probe and test system (109997045A). The electrical test probe includes a test stick (210), a tube (220), and an elastic element (230). The test bar (210) has a first terminal (211) arranged to make contact with a power module to be tested and a second terminal (212) arranged to be connected with a test apparatus. The test stick (210) also has a first stopper (213) between the first terminal (211) and the second terminal (212). The tube (220) has a stopper (221) extending inside. The tube (220) is installed around the test stick (210) in the longitudinal direction of the test stick (210). The elastic element (230) is accommodated between a first stop (213) of the test rod (210) and an internally extending stop (221) of the tube (220). The tube (220) and the test stick (210) may have a relative movement within the elastic range of the elastic element (230). The area of the cross section of the test stick (210) is much larger than the area of the cross section of the elastic element (230). A power module test system (600) is also provided that includes at least one electrical test probe (200).

Through comparison of technical characteristics, the two published patent documents are different from and similar to the technical scheme and the invention purpose of the patent application, so that the creativity and the novelty of the patent application are not damaged.

Disclosure of Invention

An object of the utility model is to overcome prior art's weak point, provide a single-end universal test jig of PCB probe, this test jig design science, convenient to use, the welding is exempted from to the circuit board of being tested.

The purpose of the utility model is realized like this:

a single-head universal test frame of a PCB probe comprises a test board assembly, a vertical pressing board, a large clamp, an elastic pressing rod and a counterweight steel ball, wherein the test board assembly is placed on the test board; and a vertical pressing plate is embedded and pressed at the position of the elastic pressing rod corresponding to the test plate component, and the lower bottom of the vertical pressing plate is movably hinged on the test plate component.

And the test board assembly consists of a test board bracket and probes fixedly arranged on the lower bottom of the test board assembly bracket, and a solid metal column which is vertically upward is manufactured on the test board bracket.

And a pressure rod seat is fixedly arranged on the movable pressure handle of the large force clamp through a bolt and a nut, the lower end of the elastic pressure rod is hinged in the pressure rod seat, a hand screw is arranged in the radial direction of the pressure sensing seat, and the hand screw is locked after the elastic pressure rod swings and is positioned.

And the elastic pressure rod metal hose and the externally applied silica gel are wrapped coaxially to prepare the medical pressure rod.

And the central part of the upper end of the vertical pressing plate is provided with a groove for embedding the elastic pressing rod, the central part of the lower part of the vertical pressing plate is provided with a vertical strip groove, a hollow sleeve is fixedly arranged in the vertical strip groove, and the hollow sleeve is coaxially arranged in a solid metal column manufactured by the test plate bracket.

The utility model has the advantages that:

1. the test rack is scientific in design and ingenious in conception, the counterweight steel balls are used for static pressure application, so that the application force of the probes on the circuit board is balanced and stable in contact pressure, the hollow sleeves for connecting the pressing plates and the metal solid columns for the test board support are coaxially and movably connected, the positioning at any angle of the probe assembly is realized, test contacts at different positions on the same integrated circuit test board can be tested, and the test contacts are not influenced and limited by structures of different integrated circuit boards.

2. The elastic pressure rod of the test frame can realize swinging and rotating of three-dimensional angles, and is positioned in a smooth manner, so that the use is convenient and quick; and the contact pressure of the contact can be adjusted by replacing the counterweight steel ball and transmitting the pressure of the vertical pressing plate.

3. The test board assembly of the test rack can test various different integrated circuit boards, and is fixed on objects such as a table top and the like by using the large force clamp and also can be fixed on the circuit board, so that the test rack is not limited by a work place.

4. The test frame can test the contacts of different patterns only by replacing local test board assemblies, the tested circuit board is free from welding, and a single or a plurality of through holes can be formed in the circuit test board; single or multiple chip pins may also be tested; single or multiple patch pads may be tested.

Drawings

Fig. 1 is a schematic perspective view of the present invention;

FIG. 2 is a front view of the structure of the present invention;

FIG. 3 is a left side view of FIG. 1;

FIG. 4 is a sectional view taken along line B-B of FIG. 3;

FIG. 5 is an enlarged view of the part A of FIG. 1;

FIG. 6 is an enlarged view of the structure of the portion C of FIG. 4;

fig. 7 is a schematic structural view of the test board assembly of the present invention being an E-head.

Detailed Description

The embodiments of the present invention will be further explained with reference to the accompanying drawings: the following examples are illustrative and not intended to be limiting, and the scope of the present invention is not limited by the following examples.

The utility model provides a single-end universal test frame of PCB probe, install on integrated circuit's survey test panel 7, including test panel subassembly 8, erect clamp plate 2, heavily press from both sides 6, elasticity depression bar 3 and counter weight steel ball 1, survey the test panel subassembly and place on surveying the test panel, heavily press from both sides the centre gripping at a side of surveying the test panel, the vertical elasticity depression bar of hinge dress that makes progress on heavily pressing from both sides, a counter weight steel ball is adorned admittedly to the head of this elasticity depression bar, survey test panel subassembly position at the elasticity depression bar correspondence and inlay and press one and erect the clamp plate, the activity hinge of should erectting the lower bottom of.

The structure of the test board assembly is shown in fig. 5, and the test board assembly comprises a test board assembly support and probes 14 fixedly arranged on the lower bottom of the test board assembly support, wherein a solid metal column 13 which is vertically upward is formed on the test board support.

Referring to fig. 1, 2 and 4, the movable pressing handle of the large clamp is fixedly provided with a pressing rod seat 5 through a bolt and a nut 11, the lower end of the elastic pressing rod is hinged in the pressing rod seat, a hand screw 4 is radially arranged on the pressure sensing seat, and the hand screw is locked after the elastic pressing rod swings and is positioned.

The structure of the elastic pressure lever is made by coaxially wrapping a metal hose 9 and externally-applied silica gel 10, and the formed elastic pressure lever has a function of conformal positioning, and is convenient for adjustment of any three-dimensional angle and elastic positioning, as shown in fig. 4.

The structure of the vertical pressing plate is shown in fig. 3 and 6, a groove capable of being embedded with an elastic pressing rod is formed in the center of the upper end of the vertical pressing plate, a vertical strip groove is formed in the center of the lower portion of the vertical pressing plate, a hollow sleeve 12 is fixedly installed in the vertical strip groove, the hollow sleeve can be coaxially installed in a solid metal column made of a test plate support, therefore, the connection between a test plate assembly and the vertical pressing plate can be achieved, and a probe can rotate around the plane of the test plate at any angle.

The present application relates to a test board assembly, which has many forms, and in this embodiment, the test board assembly of the B head is taken as an example for description, and the test board assembly 15 of the E head is shown in fig. 7, but the test method is the same.

The utility model discloses a theory of operation is:

1. firstly, opening a large force clamp, clamping the large force clamp at a position without an element on the edge of an integrated circuit test board, installing an elastic pressure rod on the large force clamp by adopting a hand-screwed screw, and adjusting the height, direction and angle of the elastic pressure rod to be matched with the position of a contact point of a tested circuit board to be tested;

2. sleeving a hollow sleeve of the vertical pressing plate on a solid metal column made of a test plate bracket, enabling a probe on the test plate assembly to contact a contact to be tested on a test plate of the integrated circuit, and simultaneously embedding an elastic pressing rod into a groove made on the upper part of the vertical pressing plate;

3. the angle and the height of the elastic pressure rod are adjusted finely at will, and the fine adjustment probe is rotated by 360 degrees in the horizontal direction of the test board, so that the fine adjustment probe is vertically contacted with a tested contact on the test board and the contact force is moderate, and the reliable circuit communication is ensured; when necessary, the counterweight steel ball can be replaced;

4. and finally, the socket on the test board assembly is communicated with external equipment through the flexible flat cable, and is connected with different external equipment according to different test functions, so that the welding-free connection test function is finally realized.

Claims

1. The utility model provides a single-end universal test jig of PCB probe, includes the test panel subassembly, erects the clamp plate, heavily presss from both sides, elasticity depression bar and counter weight steel ball, and the test panel subassembly is place on surveying the board, its characterized in that: the large clamp is clamped at one side of the test board, an elastic pressure rod is vertically and upwards hinged on the large clamp, and a counterweight steel ball is fixedly arranged at the head of the elastic pressure rod; and a vertical pressing plate is embedded and pressed at the position of the elastic pressing rod corresponding to the test plate component, and the lower bottom of the vertical pressing plate is movably hinged on the test plate component.

2. The single-ended gimbal test fixture of a PCB probe of claim 1, wherein: the test board assembly consists of a test board bracket and probes fixedly arranged on the lower bottom of the test board assembly bracket, and a solid metal column which is vertically upward is manufactured on the test board bracket.

3. The single-ended gimbal test fixture of a PCB probe of claim 1, wherein: the movable pressure handle of the large clamp is fixedly provided with a pressure rod seat through a bolt and a nut, the lower end of an elastic pressure rod is hinged in the pressure rod seat, and a hand-screwed screw is arranged in the radial direction of the pressure-sensitive seat and locked after the elastic pressure rod swings and is positioned.

4. The single-ended gimbal test fixture of a PCB probe of claim 1, wherein: the elastic pressure rod metal hose and the silica gel coated outside are coaxially wrapped.

5. The single-ended gimbal test fixture of a PCB probe of claim 1, wherein: the central part of the upper end of the vertical pressing plate is provided with a groove for embedding the elastic pressing rod, the central part of the lower part of the vertical pressing plate is provided with a vertical strip groove, a hollow sleeve is fixedly arranged in the vertical strip groove, and the hollow sleeve is coaxially arranged in a solid metal column manufactured by the test plate bracket.