CN211669303U - Test system for vehicle electrical and electronic components - Google Patents
Test system for vehicle electrical and electronic components Download PDFInfo
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- CN211669303U CN211669303U CN202020104281.6U CN202020104281U CN211669303U CN 211669303 U CN211669303 U CN 211669303U CN 202020104281 U CN202020104281 U CN 202020104281U CN 211669303 U CN211669303 U CN 211669303U
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Abstract
The utility model provides a test system for vehicle electrical and electronic component, include: an upper industrial personal computer; the waveform signal generator and the switching power supply are in communication connection with the upper industrial personal computer; the data acquisition card is connected with the upper industrial personal computer; the alternative data selector is connected with the waveform signal generator and the data acquisition card; the power amplifier power supply is connected with the alternative data selector; the internal electronic load is connected with the power amplifier power supply and the switch power supply, receives a control instruction signal provided by an upper industrial personal computer through a data acquisition card and loads the generated electronic electrical load on the tested sample piece; and the external electronic load is connected with the internal electronic load and loads the simulated working condition on the sample piece to be tested through the internal electronic load. The embodiment of the utility model provides a can simplify the step of test, get rid of the influence of the instability factor that personnel subjectivity, equipment are connected, promote the reliability of test, provide possibility and high efficiency for carrying out complicated experiment.
Description
Technical Field
The utility model relates to a vehicle parts hardware function test system especially relates to a test system for vehicle electrical and electronic component.
Background
The statements in this section merely provide background information related to the present disclosure and may not constitute prior art.
An automatic test system for vehicle electrical and electronic systems/components is a test system for simulating and applying the electrical and electronic loads to which a vehicle electrical and electronic system/component should be subjected during production or transportation, during installation on a vehicle, under moderate environmental conditions in a particular test system, and the like.
Most of the existing test systems on the market are manually tested, and the following problems exist:
1. the operation is complicated, the difficulty of test execution is increased, and the test efficiency and the test quality are low;
2. a part of test items need to be completed by relying on a test program built in a test instrument of a third party, so that the test lacks autonomy and flexibility;
3. the training period of the operators is long, the efficiency is low, the project development period and cost are increased macroscopically, and the team research and development capacity and the product market competitiveness of enterprises are reduced.
It should be noted that the above background description is only for the sake of clarity and complete description of the technical solutions of the present invention, and is set forth for facilitating understanding of those skilled in the art. These solutions are not considered to be known to the person skilled in the art merely because they have been set forth in the background section of the present invention.
SUMMERY OF THE UTILITY MODEL
Based on the foregoing prior art deficiencies, embodiments of the present invention provide a test system for electrical and electronic components of a vehicle that better solves the above-mentioned problems.
In order to achieve the above object, the present invention provides the following technical solutions.
A test system for vehicle electrical and electronic components, comprising:
an upper industrial personal computer;
the waveform signal generator is in communication connection with the upper industrial personal computer;
the communication input end of the data acquisition card is connected with the upper industrial personal computer;
the first input end of the one-out-of-two data selector is connected with the output end of the waveform signal generator, and the second input end of the one-out-of-two data selector is connected with the analog signal output end of the data acquisition card;
the power amplifier power supply is connected with the output end of the alternative data selector;
the switching power supply is in communication connection with the upper industrial personal computer;
the power amplifier power supply and the switch power supply are connected with an internal electronic load, are provided with connecting terminals for connecting a tested sample piece and are used for generating an electronic electrical load simulating the tested sample piece; the internal electronic load is in communication connection with the upper industrial personal computer through the data acquisition card and can receive a control instruction signal provided by the upper industrial personal computer through the data acquisition card so as to load the generated electronic electrical load on the tested sample piece;
and the external electronic load is connected with the internal electronic load and used for simulating the working condition of the tested sample piece and loading the simulated working condition on the tested sample piece through the internal electronic load.
Preferably, the number of the switching power supplies is multiple, and the switching power supplies at least comprise a first switching power supply and a second switching power supply;
the internal electronic load includes: the voltage circuit selection module is connected with the power amplifier power supply and the plurality of switch power supplies and is provided with a power supply output end and an electrical load output end; the voltage signal output by the second switching power supply is output to the data acquisition card and the external electronic load through the power supply output end after passing through the voltage circuit selection module, and the voltage signal output by the power amplifier power supply and/or the first switching power supply is output to the connecting terminal through the electrical load output end after passing through the voltage circuit selection module.
Preferably, the internal electronic load further includes: the control end of the relay I/O module is connected with the data acquisition card, and the input end of the relay I/O module is connected with the voltage circuit selection module and the external electronic load; the connecting terminal is arranged at the output end of the relay I/O module.
Preferably, the test system further comprises: the input end of the inverter module is connected with the digital output end of the data acquisition card, and the output end of the inverter module is connected with the control end of the relay I/O module; the inverter module allows the data acquisition card to send a control instruction signal to the relay I/O module to inhibit communication from the relay I/O module to the data acquisition card.
Preferably, the test system further comprises: the voltage reduction module is connected between the power supply output end of the voltage circuit selection module and the analog signal input end of the data acquisition card; the voltage reduction module is used for reducing the voltage of the power supply voltage output by the voltage circuit selection module when the power supply voltage exceeds the range of the measuring range of the data acquisition card.
Preferably, the test system further comprises: and the input end of the current sensor is connected with the internal electronic load, and the analog output end of the current sensor is connected with the analog signal input end of the data acquisition card.
Preferably, the current sensor is configured to be connectable to the sample under test.
Preferably, the test system further comprises: and the input end of the temperature sensor is connected with the internal electronic load, and the analog output end of the temperature sensor is connected with the analog signal input end of the data acquisition card.
Preferably, the temperature sensor is configured to be connectable with the sample under test.
Preferably, the test system further comprises: and the external power supply module is connected with the external electronic load, the current sensor and the temperature sensor.
The utility model discloses a test system for vehicle electricity and electronic component can simulate the electric and electronic load that the vehicle electricity and electronic system subassembly etc. should be born by the sample under normal operating condition, abnormal operating condition to carry out functional state control and data acquisition to receiving the sample in the test procedure, and judge the functional state grade that receives the sample, store all judged results and data in real time according to data. Due to the adoption of modular hardware configuration, standardized test procedures and wiring modes, the test steps are simplified, the influences of personnel subjectivity and instability factors of equipment connection are eliminated, the test reliability is improved, and the possibility and the high efficiency are provided for executing complex experiments.
Specific embodiments of the present invention are disclosed in detail with reference to the following description and accompanying drawings, which specify the manner in which the principles of the invention may be employed. It should be understood that the embodiments of the present invention are not so limited in scope.
Features that are described and/or illustrated with respect to one embodiment may be used in the same way or in a similar way in one or more other embodiments, in combination with or instead of the features of the other embodiments.
It should be emphasized that the term "comprises/comprising" when used herein, is taken to specify the presence of stated features, integers, steps or components but does not preclude the presence or addition of one or more other features, integers, steps or components.
Drawings
The drawings described herein are for illustration purposes only and are not intended to limit the scope of the present disclosure in any way. In addition, the shapes, the proportional sizes, and the like of the respective members in the drawings are merely schematic for helping the understanding of the present invention, and do not specifically limit the shapes, the proportional sizes, and the like of the respective members of the present invention. The skilled person in the art can, under the teaching of the present invention, choose various possible shapes and proportional dimensions to implement the invention according to the specific situation. In the drawings:
FIG. 1 is a block diagram of a testing system for vehicle electrical and electronic components in accordance with an embodiment of the present invention;
fig. 2 is a circuit diagram of a test system for vehicle electrical and electronic components in accordance with an embodiment of the present invention.
Detailed Description
In order to make the technical solutions in the present invention better understood, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, but not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts shall fall within the protection scope of the present invention.
It will be understood that when an element is referred to as being "disposed on" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for illustrative purposes only and do not denote a single embodiment.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
As shown in fig. 1 and 2, a test system for vehicle electrical and electronic components according to an embodiment of the present invention includes:
an upper industrial personal computer 1;
the waveform signal generator 2 is in communication connection with the upper industrial personal computer 1;
the communication input end of the data acquisition card 3 is connected with the upper industrial personal computer 1;
the first input end of the alternative data selector 4 is connected with the output end of the waveform signal generator 2, and the second input end of the alternative data selector is connected with the analog signal output end of the data acquisition card 3;
the power amplifier power supply 5 is connected with the output end of the alternative data selector 4;
the switching power supply 6 is in communication connection with the upper industrial personal computer 1;
the power amplifier power supply 5 and the switch power supply 6 are connected with an internal electronic load 7, a connecting terminal for connecting a tested sample 8 is arranged, and the internal electronic load is used for generating an electronic electrical load simulating the test sample 8; the internal electronic load 7 is in communication connection with the upper industrial personal computer 1 through the data acquisition card 3, and can receive a control instruction signal provided by the upper industrial personal computer 1 through the data acquisition card 3 to load the generated electronic electrical load on the tested sample 8;
and the external electronic load 9 is connected with the internal electronic load 7 and is used for simulating the working condition of the sample piece 8 to be tested and loading the simulated working condition on the sample piece 8 to be tested through the internal electronic load 7.
In this embodiment, the waveform signal generator 2 is configured to generate a numerical signal according to an instruction provided by the upper industrial personal computer 1, and the waveform signal generator 2 may be any signal waveform generator, and the generated waveform signal includes, but is not limited to, a triangular wave, a sawtooth wave, a rectangular wave, and a sine/cosine wave signal. The data acquisition card 3 is used for receiving control instructions and/or analog signals sent by the upper industrial personal computer 1, storing various data generated in the test process and providing the stored data to the upper industrial personal computer 1.
The first input end of the alternative data selector 4 is used for receiving the numerical signals sent by the waveform signal generator 2, the second input end is used for receiving the analog signals sent by the data acquisition card 3, and the alternative data selector can select to output the numerical signals or the analog signals according to actual needs, for example, when a numerical signal load is needed to be applied to the sample piece 8 to be tested, the numerical signals are output; on the contrary, when it is necessary to apply an analog signal load to the sample-under-test 8, an analog signal is output.
That is, the one-out-of-two data selector 4 is equivalent to a single-pole double-throw switch, and can output one of the numerical signal and the analog signal respectively transmitted from the waveform signal generator 2 and the data acquisition card 3 according to the requirement or the selection of a user, and transmit the numerical signal and the analog signal to the power discharge source 5 for signal amplification processing.
The power amplifier power supply 5 is used for amplifying the numerical signals or analog signals output by the alternative data selector 4, and comprises voltage amplification, current amplification and power amplification. The switching power supply 6 is configured to output a constant dc voltage signal according to a control command given by the upper industrial personal computer 1, specifically, convert a level voltage (e.g., commercial power) into a voltage (e.g., dc voltage) required by the device.
The internal electronic load 7 is used for generating an electronic electrical load simulating the stress of the sample piece 8 to be tested according to the voltage signals provided by the power amplifier power supply 5 and the switching power supply 6. And, the internal electronic load 7 is also connected with the data acquisition card 3, thus realizing the communication connection with the upper industrial personal computer 1 through the data acquisition card 3. In this way, the internal electronic load 7 can be triggered to operate by receiving the control command signal provided by the upper industrial personal computer 1 through the data acquisition card 3, and the generated electronic electric load is loaded on the sample piece 8 to be tested.
The number of the switching power supplies 6 may be plural, and includes at least a first switching power supply and a second switching power supply. The internal electronic load 7 may comprise a voltage circuit selection module 701 connected to the power amplifier supply 5, the plurality of switching power supplies 6, and having a power supply output and an electrical load output, respectively as shown in fig. 1 as output B and output a. The voltage signal output by the second switching power supply is output to the data acquisition card 3 and the external electronic load 9 through the power supply output end after passing through the voltage circuit selection module 701, and the voltage signal output by the power amplifier power supply 5 and/or the first switching power supply is output to the connection terminal through the electrical load output end after passing through the voltage circuit selection module 701.
In this embodiment, the voltage circuit selection module 701 is configured to distinguish voltage signals input by the power amplifier 5 and the plurality of switching power supplies 6, and select an output mode of the input voltage according to a preset rule. The power supply output end only supplies the voltage input by the second switching power supply to output, and the voltage may be referred to as a power supply voltage and is used for providing electric energy for all electronic and electrical devices involved in the test system, or alternatively, all electronic and electrical devices involved in the test system may get power from the power supply output end of the voltage circuit selection module 701. These electronic and electrical devices include the data acquisition card 3, the external electronic load 9, and the relay I/O module 702, the current sensor 11, the temperature sensor 12, and the like, which are listed below.
The electrical load output end outputs the voltage signal input by the power amplifier power supply 5 and/or the first switch power supply to the connecting terminal so as to be loaded on the tested sample 8. That is, the electrical load output terminal is used to supply the connection terminal with an electrical load for testing the sample under test 8. According to different specific test items, the electrical load output end can output the voltage input by at least one of the power amplifier power supply 5 and the first switch power supply, or, in other words, the electrical load output end applies the voltage input by at least one of the power amplifier power supply 5 and the first switch power supply as an electronic electrical load to the sample to be tested 8.
For example, when the voltage resistance of the sample 8 under test needs to be tested, a constant voltage load may be applied only to the sample 8 under test. In this case, the electrical load output terminal outputs only the voltage signal of the power amplifier power supply 5 to the connection terminal. When the fluctuation of the sample 8 needs to be tested (for example, the voltage fluctuates during the charging and discharging processes of the storage battery), only the fluctuating voltage load can be applied to the sample 8. In this case, the electrical load output terminal may simultaneously output the voltage signals of the power amplifier power supply 5 and the first switching power supply to the connection terminal.
In general, the data acquisition card 3 has a certain voltage withstanding range (e.g. 0-10V), and the power supply voltage output from the power supply output terminal of the voltage circuit selection module 701 may exceed the range of the data acquisition card 3. In view of this, in one embodiment, the test system may further include a voltage reduction module connected between the power supply output terminal of the voltage circuit selection module 701 and the analog signal input terminal of the data acquisition card 3. The voltage reduction module is used for reducing the power supply voltage output by the voltage circuit selection module 701 when the power supply voltage exceeds the range of the data acquisition card 3. Therefore, the power supply voltage is subjected to voltage reduction processing to output a voltage suitable for the operation of the data acquisition card 3.
Further, in order to monitor the state of the test process, the test system further comprises a current sensor 11 and a temperature sensor 12. As described above, the current sensor 11 and the temperature sensor 12 need to take power from the power supply output terminal of the voltage circuit selection module 701, and thus are connected to the power supply output terminal of the voltage circuit selection module 701. The input ends of the current sensor 11 and the temperature sensor 12 are both connected with the internal electronic load 7, and the analog output ends are both connected with the analog signal input end of the data acquisition card 3.
The current sensor 11 may be an additionally configured component that is detachably connected to the internal electronic load 7, and thus can be configured to be connected to the sample under test 8 to measure the current of the sample under test 8 during the test. The temperature sensor 12 may be mounted on a circuit board of the internal electronic load 7, and may be a chip in a specific form; it may also be an additionally configured component that is removably connected to the internal electronic load 7 and therefore can be configured to connect to the sample under test 8 to measure the temperature of the sample under test 8 during testing.
In one embodiment, the test system may further include an external power module 901 connected to the external electronic load 9, the current sensor 11 and the temperature sensor 12, which may be a constant voltage power supply, such as 5V. Because the external electronic load 9, the current sensor 11 and the temperature sensor 12 need to supply direct current, under the condition that the voltage output by the power supply output end of the voltage circuit selection module 701 fluctuates, the external power supply module 901 can be selected to supply power to the external electronic load 9, the current sensor 11 and the temperature sensor 12, and the smooth operation of the whole test system is ensured.
The internal electronic load 7 may also comprise a relay I/O module 702, the control terminal of which is connected to the data acquisition card 3 and the input terminal of which is connected to the voltage circuit selection module 701 and the external electronic load 9. The number of the connection terminals is plural, so that plural test channels can be formed, the plural connection terminals are provided at the output terminal of the relay I/O module 702, and the external electronic load 9 is connected to the power supply output terminal of the voltage circuit selection module 701.
In this way, the relay I/O module 702 may be in communication connection with the upper industrial personal computer 1 through the data acquisition card 3, so that the data acquisition card 3 may receive a control instruction signal provided by the upper industrial personal computer 1 to trigger a closing or opening operation, thereby implementing the connection or disconnection between the output of the electrical load output terminal of the voltage circuit selection module 701 and the connection terminal, i.e., implementing the application or cancellation of the electrical load.
Further, the test system may further include an inverter module 10, an input end of which is connected to a digital output end of the data acquisition card 3, and an output end of which is connected to a control end of the relay I/O module 702; the inverter module 10 may allow the data acquisition card 3 to send control command signals to the relay I/O module 702 to inhibit communication from the relay I/O module 702 to the data acquisition card 3. Therefore, the inverter module 10 can realize the one-way communication between the data acquisition card 3 and the relay I/O module 702, and only the data acquisition card 3 can communicate with the relay I/O module 702, but the relay I/O module 702 is not allowed to communicate with the data acquisition card 3. Therefore, the function of avoiding signals can be achieved, signal crosstalk is avoided, and the data acquisition card 3 can accurately provide control command signals to the relay I/O module 702 to control the operation of the relay I/O module.
The external electronic load 9 is used for simulating the working condition of the sample piece 8 to be tested, and the simulated working condition is loaded on the sample piece 8 to be tested through the internal electronic load 7. For example, in one particular embodiment, the sample-under-test 8 is a transmission, and the external electronic load 9 may be used to simulate transmission sensors, switches, an engine electronic control unit, and the like. The external electronic load 9 may be any suitable conventional configuration, such as a functional test box, including but not limited to A3K functional test box, a functional test box provided under CN201259464Y, and the like, which is not limited in this embodiment.
In this embodiment, the upper industrial personal computer 1 may receive and store the voltage signals and the current signals of all the channels of the sample 8 to be tested, which are collected by the test system, the working temperature of the sample 8 to be tested, the working temperature of the test system, and the ambient temperature of the test system. In addition, since the data acquisition card 3 can store all data in the test process, the upper industrial personal computer 1 can retrieve the stored data after the test is completed, so as to realize the playback and data display of the test process.
The utility model discloses a test system for vehicle electricity and electronic component can simulate the electric and electronic system/subassembly etc. and receive the electric and electronic load that sample 8 should bear under normal operating condition, abnormal operating condition to carry out functional state control and data acquisition to receiving sample 8 in the test procedure, and judge according to data and receive all judged result and data of the functional state grade, the real-time storage of sample 8. Due to the adoption of modular hardware configuration, standardized test procedures and wiring modes, the test steps are simplified, the influences of personnel subjectivity and instability factors of equipment connection are eliminated, the test reliability is improved, and the possibility and the high efficiency are provided for executing complex experiments.
The type, size and material of all cables and connectors connected with the sample under test 8 are completely equivalent to the actual installation state on the vehicle, and the purpose is to duplicate the peripheral hardware lines of the actual electric and electronic working environment of the sample under test 8.
Each passageway can all be automatic and in the short circuit open circuit test by the 8 input/output ports of sample piece with the utility model discloses short circuit respectively between test system's the power positive pole and the negative pole, every action can be fixed a position on the time axis, instantaneous microcosmic response and the whole course macroscopic change trend that can directly perceivedly look over the test in follow-up data analysis. The existing test systems on the market are manually connected in the tests, so that the test system improves the working efficiency of personnel and the use efficiency of equipment, effectively improves the safety level and reliability of the tests, eliminates the subjectivity of the personnel and the instability factor of the equipment connection, and finally realizes the standardization of the verification tests.
The whole test system is also provided with a ground protection circuit, a leakage protection circuit and a protection circuit of an internal electronic load 7 so as to ensure that the test system operates normally.
The following description takes the test system of the embodiment of the present invention as an example for a slow voltage variation test.
The purpose of the test is as follows:
the purpose of the slow change test of the power supply voltage is to verify the resisting capability of the tested sample 8 to the change of the power supply voltage in the discharging and charging processes of the storage battery. The method for the slow variation test of the power supply voltage is to gradually reduce the power supply voltage of the sample 8 to be tested from the maximum working voltage to 0V at the rate of (0.5 +/-0.1) V/min and then increase the power supply voltage from 0V to the maximum power supply voltage at the same rate. The test passes the criteria that all functions, performance of the sample 8 under test can be performed during and after the test and within the allowable design tolerances.
The test process comprises the following steps:
1. power to all devices is turned on in sequence: turning on a switching power supply 6(IT6502D and IT6942A), turning on a waveform signal generator 2(KEYSIGHT 33500B Series), turning on an internal electronic load 7, turning on a power amplifier power supply 5(AE TECRON 7224), turning on a data acquisition card 3(I/O device NI USB-6341 and digital I/O device NI USB-6501);
2. connecting the test system with the sample under test 8 and the external electronic load 9. As shown IN fig. 2, the connection terminals LM1 to LM7 of the internal electronic load 7 are respectively connected to the signal lines KL30, KL15, IG _ IG, PSW, paddlen, CAN H, CANL of the sample under test 8, the ports L3 to L7 of the internal electronic load 7 are respectively connected to the signal lines KL30, KL15, IG _ IG, PSW, paddlen, CAN H, CAN L of the external electronic load 9, and the Power supply ports Power + Loadbox and Power-Loadbox of the internal electronic load 7 are respectively connected to the positive electrode and the negative electrode of the external Power supply module 901;
3. electronic test software for running the test system:
1) configuring an operating voltage;
2) and (4) self-checking the instrument, and automatically jumping the program to the next program after the normal self-checking is passed. In the process of waiting for the bias voltage of the power amplifier power supply 5, the self-test procedure is always waiting. If the bias is not problematic and other instruments have problems, the system judges that the self-check is overtime after the waiting time with the specified length and considers that the program can not be exited by the self-check;
3) and loading the configured configuration file. Before entering a test interface or a configuration interface, the system prompts a user to Load an existing configuration file and click Load config, and the user can also configure the configuration file by himself;
4) configuring a test item;
5) preparing to enter a test;
6) the Ignition switch is used for simulating the Ignition process of a key on a vehicle;
7) starting testing, and automatically storing the testing data of each activated Line;
8) checking the test progress; the test Progress check has two modes, namely Current Progress and timeremainingrespectively, two lamps for displaying whether to be activated are arranged beside the two Progress viewers, and the Progress of the activated viewer is taken as the standard;
9) alarming; if some instrument is abnormal in the test process, the system pops up an alarm dialog box and prompts abnormal information.
10) The test is terminated. Clicking on the Stop button terminates the test.
1l) data review. There are two ways to check the test Progress, namely Current Progress and timeremaininging, and there are two lamps to display whether to be activated beside the two Progress viewers, so that the Progress of the activated viewer is the standard. If a certain test is repeated for the same sample for many times, the data cannot be covered, but numbers are added behind file names to distinguish the data, and when the data is consulted, the latest data is searched or the required data is acquired according to the file modification names.
12) And (5) finishing the test.
The utility model discloses test system can simulate some accidental, the test of irregular electric and electronic characteristic, for example the vehicle is starting or flameout the car of crossing, and the voltage value receives to disturb in the positive pole of battery or the negative pole and appears some irregular pulse signal or unique periodic waveform, only needs to refer to the oscillogram of noting this process, the utility model discloses the distinguishable data file of test system dedicated electronic test software and the loading go into corresponding template test program and can simulate out this process, can carry out its essence reason of data reproduction analysis to the overall process after the test. The self-defined test items can supplement the standard test well, hidden unstable factors are searched and improved, and the development quality of the project and the reliability of the product are improved.
The utility model discloses test system is applicable to simulation input and installs on the vehicle to vehicle electricity and electronic component etc. by survey sample 8, arrange specific system in, assemble or transport the electric load that should bear under the in-process moderate environmental condition, relevant including but not limited to selector, shift executor, rear-view mirror, shine floor-lamp etc. device by sample 8, this test system can accomplish concrete test item, data acquisition, data status analysis and full time attitude data storage etc. automatically.
The experiment meets the requirements of ISO16750, GMW3172, VW80000, PSAB217110, Q/FPT2800001, HYUNDI, Chery, GS95024-2-1 and the like according to the standard, and typical experiment items include but are not limited to dark current measurement, potential offset test, jump voltage starting, load dropping, slow falling/slow rising of working voltage, slow falling/fast rising of power supply, reset test, pulse voltage at engine starting, pin interruption, connector interruption, high voltage resistance test, power supply reverse connection test, low voltage reset test, instantaneous power failure test, alternating current interference voltage superposition test, open circuit protection test, short circuit protection test and the like.
In a conventional electronic and electrical experiment, a sample 8 to be tested, such as a vehicle electrical component or an electronic component, operates in a static low-power consumption state, and the basic functions of the sample are verified. In actual use, the operating environment and the use of the sample under test 8 present further complications and uncertainties. The dynamic operation or high power consumption state better meets the real background condition, and can also verify the performance of the tested sample 8, even taking the limit condition as the test requirement.
It should be noted that, in the description of the present invention, the terms "first", "second", and the like are used for descriptive purposes only and for distinguishing similar objects, and no order is shown between the two, and no indication or suggestion of relative importance is understood. In addition, in the description of the present invention, "a plurality" means two or more unless otherwise specified.
The above description is only for the embodiments of the present invention, and those skilled in the art can make various changes or modifications to the embodiments of the present invention without departing from the spirit and scope of the present invention according to the disclosure of the application document.
Claims (10)
1. A test system for vehicle electrical and electronic components, comprising:
an upper industrial personal computer;
the waveform signal generator is in communication connection with the upper industrial personal computer;
the communication input end of the data acquisition card is connected with the upper industrial personal computer;
the first input end of the one-out-of-two data selector is connected with the output end of the waveform signal generator, and the second input end of the one-out-of-two data selector is connected with the analog signal output end of the data acquisition card;
the power amplifier power supply is connected with the output end of the alternative data selector;
the switching power supply is in communication connection with the upper industrial personal computer;
the power amplifier power supply and the switch power supply are connected with an internal electronic load, are provided with connecting terminals for connecting a tested sample piece and are used for generating an electronic electrical load simulating the tested sample piece; the internal electronic load is in communication connection with the upper industrial personal computer through the data acquisition card and can receive a control instruction signal provided by the upper industrial personal computer through the data acquisition card so as to load the generated electronic electrical load on the tested sample piece;
and the external electronic load is connected with the internal electronic load and used for simulating the working condition of the tested sample piece and loading the simulated working condition on the tested sample piece through the internal electronic load.
2. The test system of claim 1, wherein the number of switching power supplies is plural, including at least a first switching power supply and a second switching power supply;
the internal electronic load includes: the voltage circuit selection module is connected with the power amplifier power supply and the plurality of switch power supplies and is provided with a power supply output end and an electrical load output end; the voltage signal output by the second switching power supply is output to the data acquisition card and the external electronic load through the power supply output end after passing through the voltage circuit selection module, and the voltage signal output by the power amplifier power supply and/or the first switching power supply is output to the connecting terminal through the electrical load output end after passing through the voltage circuit selection module.
3. The test system of claim 2, wherein the internal electronic load further comprises: the control end of the relay I/O module is connected with the data acquisition card, and the input end of the relay I/O module is connected with the voltage circuit selection module and the external electronic load; the connecting terminal is arranged at the output end of the relay I/O module.
4. The test system of claim 3, wherein the test system further comprises: the input end of the inverter module is connected with the digital output end of the data acquisition card, and the output end of the inverter module is connected with the control end of the relay I/O module; the inverter module allows the data acquisition card to send a control instruction signal to the relay I/O module to inhibit communication from the relay I/O module to the data acquisition card.
5. The test system of claim 2, wherein the test system further comprises: the voltage reduction module is connected between the power supply output end of the voltage circuit selection module and the analog signal input end of the data acquisition card; the voltage reduction module is used for reducing the voltage of the power supply voltage output by the voltage circuit selection module when the power supply voltage exceeds the range of the measuring range of the data acquisition card.
6. The test system of claim 2, wherein the test system further comprises: and the input end of the current sensor is connected with the internal electronic load, and the analog output end of the current sensor is connected with the analog signal input end of the data acquisition card.
7. The test system of claim 6, wherein the current sensor is configured to be connectable with the sample under test.
8. The test system of claim 6, wherein the test system further comprises: and the input end of the temperature sensor is connected with the internal electronic load, and the analog output end of the temperature sensor is connected with the analog signal input end of the data acquisition card.
9. The test system of claim 8, wherein the temperature sensor is configured to be connectable with the sample under test.
10. The test system of claim 8, wherein the test system further comprises: and the external power supply module is connected with the external electronic load, the current sensor and the temperature sensor.
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| CN112945276A (en) * | 2021-02-06 | 2021-06-11 | 南京工业职业技术大学 | Automatic power supply environment and functional performance testing device for subway vehicle electronic odometer |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN112945276A (en) * | 2021-02-06 | 2021-06-11 | 南京工业职业技术大学 | Automatic power supply environment and functional performance testing device for subway vehicle electronic odometer |
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