CN211669230U - Paster diode detects frock - Google Patents
Paster diode detects frock Download PDFInfo
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- CN211669230U CN211669230U CN201922013619.7U CN201922013619U CN211669230U CN 211669230 U CN211669230 U CN 211669230U CN 201922013619 U CN201922013619 U CN 201922013619U CN 211669230 U CN211669230 U CN 211669230U
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Abstract
The utility model relates to a semiconductor testing field, specific is a paster diode detects frock. The test board is provided with stepped grooves, the cathode end and the anode end are respectively arranged on different steps of the stepped grooves, the body is arranged in the stepped grooves, the number of the pressing devices is two, and the two pressing devices are symmetrically arranged along the transverse central axis of the stepped grooves. The utility model discloses an useful part lies in: through the setting of transfer pole and pressure strip in closing device for the transfer pole drives the pressure strip and presses and hug closely the piece diode, thereby makes the negative pole end and the positive pole end of paster diode all with metal sheet in close contact with, thereby overcomes among the prior art paster diode testing process, contact failure's defect, thereby improves the detection precision to the paster diode, improves the reliability and the accuracy of testing result.
Description
Technical Field
The utility model relates to a semiconductor testing field, specific is a paster diode detects frock.
Background
The surface mount diode is an electronic device with unidirectional conduction current, and is widely applied to electronic equipment, the surface mount diode needs to be detected before being delivered or used, so that a tool needs to be designed to limit the position of the surface mount diode, the tool in the prior art mainly aims at the detection of a single diode, the diode needs to be replaced manually during each detection, in order to overcome the problem, the application number is CN201721521170.X, the waveform testing jig with the patent name of surface mount diode discloses that the waveform testing jig of the surface mount diode comprises a long chassis and a cover plate matched with the chassis, the chassis is provided with a stepped groove matched with the surface mount diode, the body is matched at the bottom of the groove, the anode and the cathode are respectively lapped on the steps of the groove, but the technical scheme can not compress the two poles of the surface mount diode, resulting in poor contact between the patch diode and the test meter and thus inaccurate detection.
Disclosure of Invention
In order to overcome at least partial defect among the prior art, the embodiment of the utility model provides a paster diode detects frock, its simple structure, convenient to use, detection efficiency is high, and it is more accurate reliable to detect the structure.
The embodiment of the application discloses: a chip diode detection tool is used for detecting a chip diode, the chip diode comprises an anode end, a cathode end and a body, the chip diode is arranged in a material pipe in parallel before being tested, the diode detection tool comprises a test board, two test boards and two pressing devices, a stepped groove is formed in each test board, the cathode end and the anode end are respectively arranged on different steps of the stepped groove, the body is arranged in the stepped groove, the number of the pressing devices is two, the two pressing devices are symmetrically arranged along the transverse central axis of the stepped groove, each pressing device comprises a supporting seat, a rotating rod and a pressing plate, the supporting seats are mounted on the test board, the rotating rods are rotatably connected onto the supporting seats, the rotating rods are defined with a first end close to the stepped groove and a second end far away from the stepped groove, the pressure strip is connected on the first end, be provided with the metal strip on the ladder, the pressure strip sets up the top of metal strip.
Further, closing device is still including setting up the jacking device of second end, jacking device includes jacking cylinder and ejector pin, the one end of ejector pin is connected on the jacking cylinder, and the other end is connected on the second end.
Furthermore, an elastic pad is arranged on the compression plate and is arranged above the anode end and the cathode end.
Further, a rotating shaft is arranged on the supporting seat, and the rotating rod is connected to the rotating shaft.
Further, the distance from the first end to the rotating shaft is smaller than the distance from the second end to the rotating shaft.
Furthermore, the outer side of the metal strip is bent upwards to form a connecting plate, and a through hole is formed in the connecting plate.
Further, the elastic pad is a rubber elastic pad.
Further, a mounting groove is formed in the step, and at least part of the metal strip is located in the mounting groove.
Furthermore, the left side and the right side of the test board are respectively provided with a material injection plate and a material discharge plate which are matched with the material pipe, and the material injection plate and the material discharge plate are respectively provided with a guide groove matched with the surface mount diode.
The utility model has the advantages as follows: the utility model relates to a compressing device in a chip diode detection tool, which comprises a supporting seat, a rotating rod and a compressing plate, wherein the supporting seat is arranged on a test board, the rotating rod is rotatably connected on the supporting seat, the rotating rod is defined to be close to a first end of a stepped groove and a second end far away from the stepped groove, the compressing plate is connected on the first end, a metal strip is arranged on the step, the compressing plate is arranged above the metal strip, and the rotating rod drives the compressing plate to press and tightly attach a chip diode through the arrangement of the rotating rod and the compressing plate in the compressing device, so that the cathode end and the anode end of the chip diode are both in close contact with the metal plate, thereby overcoming the defect of poor contact in the chip diode detection process in the prior art and improving the detection precision of the chip diode, the reliability and the accuracy of the detection result are improved.
In order to make the aforementioned and other objects, features and advantages of the present invention comprehensible, preferred embodiments accompanied with figures are described in detail below.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is the utility model discloses in the embodiment, paster diode detects frock schematic structure.
Fig. 2 is a schematic view of the structure of the compressing device of fig. 1.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1 and 2, in a preferred embodiment of the present invention, a chip diode testing tool is used for testing a chip diode 1, where the chip diode 1 includes an anode end 11, a cathode end 12 and a body 13, the chip diode 1 is juxtaposed in a material pipe 2 before being tested, the diode testing tool includes a testing table 3, a testing board 4 and two pressing devices 5, the testing board 4 is provided with a stepped groove 41, the cathode end 12 and the anode end 11 are respectively disposed on different steps 411 of the stepped groove 41, the body 13 is disposed in the stepped groove 41, the number of the pressing devices 5 is two, the two pressing devices 5 are symmetrically disposed along a transverse central axis of the stepped groove 41, the pressing devices 5 include a supporting seat 51, a rotating rod 52 and a pressing plate 53, the supporting seat 51 is mounted on the testing table 3, the rotating rod 52 is rotatably connected to the supporting seat 51, the rotating rod 52 is defined to be close to a first end 521 of the stepped groove 41 and to be far away from a second end 522 of the stepped groove 41, the pressing plate 53 is connected to the first end 521, a metal strip 6 is arranged on the step 411, and the pressing plate 53 is arranged above the metal strip 6. Through the setting of transfer lever 52 and pressure strip 53 in closing device 5 for transfer lever 52 drives pressure strip 53 and compresses tightly paster diode 1, thereby makes the negative pole end 12 and the positive pole end 11 of paster diode 1 all with metal sheet 6 in close contact with, thereby overcomes among the prior art paster diode 1 testing process, contact failure's defect, thereby improves the detection precision to paster diode 1, improves the reliability and the accuracy of testing result.
Referring to fig. 1 and 2, in the above embodiment, the pressing device 5 further includes a jacking device 54 disposed at the second end 522, the jacking device 54 includes a jacking cylinder 541 and a jacking rod 542, one end of the jacking rod 542 is connected to the jacking cylinder 541, and the other end is connected to the second end 522. The jacking cylinder 541 in the jacking device 54 jacks the jacking rod 542, so as to drive the rotating rod 52 connected to the jacking rod 542 to rotate, the second end 522 of the rotating rod 52 rises, the first end 521 descends, further the pressing plate 53 connected to the first end 521 is pressed down, the cathode end 12 and the anode end 11 of the chip diode 1 are pressed to the metal plate 6, and then the testing needle 7 of the testing meter (not shown) is connected to the metal plate 6 arranged on the ladder, so that the detection of the chip diode 1 is completed.
Referring to the drawings, in the above embodiment, the pressing plate 53 is provided with an elastic pad (not shown) disposed above the anode terminal 11 and the cathode terminal 12. Through the setting of elastic pad, can prevent that pressure strip 53 from direct rigid contact with positive pole end 11 or negative pole end 12 of paster diode 1 to reduce the impaired probability of paster diode 1. In the practical implementation process, the elastic cushion is a rubber elastic cushion. Indeed, other insulating elastic materials may be used to form the elastic pad in other embodiments.
Referring to fig. 1 and 2, in the above embodiment, the support base 51 is provided with a rotation shaft 55, and the rotation shaft 52 is connected to the rotation shaft 55. The rotating lever 52 is connected to the support base 51 through a rotating shaft 55, thereby facilitating the rotation of the rotating lever 52.
Referring to fig. 1 and 2, in the above embodiment, in order to improve the pressing force and thus the stability of the contact of the anode terminal 11 or the cathode terminal 12 of the chip diode 1 with the metal sheet 6, the distance from the first end 521 to the rotation axis 55 is smaller than the distance from the second end 522 to the rotation axis 55. Through the arrangement, a lever structure can be formed between the rotating rod 52 and the rotating shaft 55, and the requirement of driving force is saved.
Referring to fig. 1, in the above embodiment, the metal strip 6 is bent upward to form a connecting plate 61, and the connecting plate 61 is provided with a through hole (not shown). Insert test needle 7 on the test meter in this through-hole to realize being connected and switching on of test needle 7 and connecting plate 61, thereby improve the stability and the reliability that test needle 7 and metal strip 6 are connected, and then improve the stability and the reliability that test meter and paster diode 1 are connected.
Referring to fig. 1 and 2, in the above embodiment, a mounting groove (not shown) is formed on the step 411, and the metal strip 6 is at least partially located in the mounting groove 41. Through setting up metal strip 6 in the mounting groove, can improve the steadiness of metal strip 6 installation, reduce the probability that metal strip 6 breaks away from step 411.
Referring to fig. 1 and 2, in the above embodiment, the left and right sides of the test board 4 are respectively provided with the injection board 8 and the discharge board 9 matching the material pipe 2, and the injection board 8 and the discharge board 9 are both provided with guide grooves (not shown) matching the chip diodes 1. Through the setting of notes flitch 8 and play flitch 9, made things convenient for material loading and unloading to paster diode 1 to improve the detection efficiency to paster diode 1.
The present invention has been explained by using specific embodiments, and the explanation of the above embodiments is only used to help understand the method and the core idea of the present invention; meanwhile, for the general technical personnel in the field, according to the idea of the present invention, there are changes in the specific implementation and application scope, to sum up, the content of the present specification should not be understood as the limitation of the present invention.
Claims (9)
1. The utility model provides a paster diode detects frock for detect the paster diode, the paster diode includes positive pole end, negative pole end and body, before the test of paster diode parallel in the material pipe, its characterized in that: the diode detection tool comprises a test board, a test board and a pressing device, wherein the test board is provided with a stepped groove, the cathode end and the anode end are respectively arranged on different steps of the step-shaped groove, the body is arranged on the step-shaped groove, the number of the pressing devices is two, the two pressing devices are symmetrically arranged along the transverse central axis of the stepped groove, the pressing device comprises a supporting seat, a rotating rod and a pressing plate, the supporting seat is arranged on the test board, the rotating rod is rotatably connected to the supporting seat and is defined with a first end close to the stepped groove and a second end far away from the stepped groove, the pressure strip is connected on the first end, be provided with the metal strip on the ladder, the pressure strip sets up the top of metal strip.
2. The patch diode detection tool of claim 1, wherein: the pressing device further comprises a jacking device arranged at the second end, the jacking device comprises a jacking cylinder and an ejector rod, one end of the ejector rod is connected to the jacking cylinder, and the other end of the ejector rod is connected to the second end.
3. The patch diode detection tool of claim 1, wherein: and the pressing plate is provided with an elastic pad which is arranged above the anode end and the cathode end.
4. The patch diode detection tool of claim 1, wherein: the supporting seat is provided with a rotating shaft, and the rotating rod is connected to the rotating shaft.
5. The patch diode detection tool of claim 4, wherein: the distance from the first end to the rotating shaft is smaller than the distance from the second end to the rotating shaft.
6. The patch diode detection tool of claim 1, wherein: the outer side of the metal strip is bent upwards to form a connecting plate, and a through hole is formed in the connecting plate.
7. The patch diode detection tool of claim 3, wherein: the elastic cushion is a rubber elastic cushion.
8. The patch diode detection tool of claim 1, wherein: a mounting groove is formed in the ladder, and at least part of the metal strip is located in the mounting groove.
9. A patch diode detection tool according to any one of claims 1-8, wherein: the left side and the right side of the test board are respectively provided with a material injection plate and a material discharge plate which are matched with the material pipe, and guide grooves matched with the surface mounted diodes are formed in the material injection plate and the material discharge plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922013619.7U CN211669230U (en) | 2019-11-20 | 2019-11-20 | Paster diode detects frock |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922013619.7U CN211669230U (en) | 2019-11-20 | 2019-11-20 | Paster diode detects frock |
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| Publication Number | Publication Date |
|---|---|
| CN211669230U true CN211669230U (en) | 2020-10-13 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201922013619.7U Active CN211669230U (en) | 2019-11-20 | 2019-11-20 | Paster diode detects frock |
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| CN (1) | CN211669230U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112928100A (en) * | 2021-02-25 | 2021-06-08 | 扬州国宇电子有限公司 | Test structure of vertical type constant current diode and preparation method and application thereof |
| CN113567826A (en) * | 2021-07-26 | 2021-10-29 | 广东钜兴电子科技有限公司 | Test equipment and test method for plastic package surface mount diode |
| CN115097280A (en) * | 2022-08-29 | 2022-09-23 | 北京京瀚禹电子工程技术有限公司 | Special tool for testing high-power diode module |
-
2019
- 2019-11-20 CN CN201922013619.7U patent/CN211669230U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112928100A (en) * | 2021-02-25 | 2021-06-08 | 扬州国宇电子有限公司 | Test structure of vertical type constant current diode and preparation method and application thereof |
| CN113567826A (en) * | 2021-07-26 | 2021-10-29 | 广东钜兴电子科技有限公司 | Test equipment and test method for plastic package surface mount diode |
| CN113567826B (en) * | 2021-07-26 | 2022-03-18 | 广东钜兴电子科技有限公司 | Test equipment and test method for plastic package surface mount diode |
| CN115097280A (en) * | 2022-08-29 | 2022-09-23 | 北京京瀚禹电子工程技术有限公司 | Special tool for testing high-power diode module |
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