CN211553478U - Auxiliary die for preparing shear test sample wafer - Google Patents
Auxiliary die for preparing shear test sample wafer Download PDFInfo
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- CN211553478U CN211553478U CN201922001012.7U CN201922001012U CN211553478U CN 211553478 U CN211553478 U CN 211553478U CN 201922001012 U CN201922001012 U CN 201922001012U CN 211553478 U CN211553478 U CN 211553478U
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- stainless steel
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Abstract
The utility model discloses an auxiliary die for preparing a shear test sample, which belongs to the technical field of sample preparation of shear test samples and comprises a base, a stainless steel sheet and a fixed pressing strip; a first base material is placed on the base, the first base material is perpendicular to the fixing pressing strip and is fixed by the fixing pressing strip, and a part exposed out of the first base material is coated with a material to be tested; a plurality of stainless steel sheets are stacked on the base, the stainless steel sheets are arranged in parallel with the fixed pressing strips, the stacked thickness of the stainless steel sheets is equal to the thickness of a material to be tested coated on a first base material, a second base material needing to be lapped is vertically placed with the stainless steel sheets, one end of the second base material is lapped with one end of the first base material coated with the material to be tested, and the second base material is fixed through the fixed pressing strips. The auxiliary die has the advantages of simple operation, convenience, rapidness, time saving, labor saving and the like; can prepare a plurality of sample wafers simultaneously, and has high preparation efficiency.
Description
Technical Field
The utility model belongs to the technical field of the sample is made to the shearing sample, concretely relates to auxiliary mold of shear test sample piece preparation.
Background
The shear test is taken as an important material mechanical property testing means and is widely applied to the industries of rubber, sealing materials, adhesives and the like, the thickness of a tested material (tested material) is controlled by using a plastic cushion block with fixed thickness at present, the width of the tested material (tested material) is controlled by manually measuring the width, the tested sample pieces prepared by the method are different in size, low in preparation efficiency, and the deformation of the tested sample pieces can be caused by external stress and even the weight of a base material, so that the test error is finally caused.
SUMMERY OF THE UTILITY MODEL
In order to overcome the above-mentioned defect that exists among the prior art, the utility model provides an auxiliary die of shear test sample wafer preparation makes the preparation process of shear test sample wafer simple and convenient, safe and reliable.
The utility model discloses a following technical scheme realizes:
an auxiliary die for preparing a shear test sample wafer comprises a base 1, a stainless steel sheet 2 and a fixed pressing strip 3; a first base material is placed on the base 1, the first base material is perpendicular to the fixing pressing strip 3 and is fixed by the fixing pressing strip 3, and a part exposed out of the first base material is coated with a material to be tested; a plurality of stainless steel sheets 2 are stacked on a base 1, the stainless steel sheets 2 are arranged in parallel with a fixing pressing strip 3, the thickness of the stacked stainless steel sheets 2 is equal to the thickness of a material to be tested coated on a first base material, a second base material needing to be lapped is vertically placed with the stainless steel sheets 2, one end of the second base material is lapped with one end of the first base material coated with the material to be tested, and the second base material is fixed through the fixing pressing strip 3.
Further, the base 1, the stainless steel sheet 2 and the fixing pressing strip 3 are all provided with bolt holes for fixing the fixing bolts 4, and the stainless steel sheet 2 and the fixing pressing strip 3 are fixed on the base 1 through the fixing bolts 4.
Further, the auxiliary mould also comprises an excess material scraping device 5 for scraping the brushed excess material.
Further, the excessive material scraping device 5 is a stainless steel sheet.
Compared with the prior art, the utility model has the advantages as follows:
(1) the utility model discloses an auxiliary die for preparing a shear test sample wafer, which has the advantages of simple operation, convenience, rapidness, time and labor saving and the like;
(2) the utility model discloses an auxiliary die can prepare a plurality of sample wafers simultaneously, and preparation efficiency is high.
(3) The utility model discloses an auxiliary die can reduce the cushion that the gasket used and brought and pollute to save the step of cushion clearance, saved the step of unloading the cushion, simplified preparation technology.
(4) The utility model discloses an auxiliary die has avoided the solidification difference that the cushion leads to owing to not using the cushion, and the risk of test material is glued to the cushion.
(5) The utility model discloses an auxiliary die can prepare not unidimensional shear test sample piece, avoids the shear test sample piece of multiple not unidimensional to need multiple size cushion, reduces the use of frock.
(6) The utility model discloses an auxiliary die prepares sample piece in-process whole journey all has fixedly, reduces the influence of external stress to experimental sample piece.
Drawings
Fig. 1 is a schematic structural diagram of an auxiliary mold for preparing a shear test sample wafer according to the present invention;
fig. 2 is a schematic structural view of a device for scraping off the excessive material;
in the figure: the device comprises a base 1, a stainless steel sheet 2, a fixed pressing strip 3, a fixed bolt 4 and a redundant material scraping device 5.
Detailed Description
The following detailed description of the embodiments of the present invention will be made with reference to the accompanying drawings. It is to be understood that the description of the embodiments herein is for purposes of illustration and explanation only and is not intended to limit the invention.
Example 1
An auxiliary die for preparing a shear test sample wafer comprises a base 1, a stainless steel sheet 2 and a fixed pressing strip 3; a first base material is placed on the base 1, the first base material is perpendicular to the fixing pressing strip and is fixed by the fixing pressing strip 3, and a part exposed out of the first base material is coated with a material to be tested; a plurality of stainless steel sheets 2 are stacked on the base 1, the stainless steel sheets 2 are arranged in parallel with the fixed pressing strips, the thickness of the stacked stainless steel sheets 2 is equal to the thickness of a material to be tested coated on a first base material, a second base material needing to be lapped is vertically arranged with the stainless steel sheets 2, one end of the second base material is lapped with one end of the first base material coated with the material to be tested, and the second base material is fixed by the fixed pressing strips 3;
the base 1, the stainless steel sheet 2 and the fixing pressing strip 3 are all provided with bolt holes for fixing the fixing bolts 4, and the stainless steel sheet 2 and the fixing pressing strip 3 are fixed on the base 1 through the fixing bolts.
The auxiliary die further comprises a redundant material scraping device 5, wherein the redundant material scraping device 5 is a stainless steel sheet and is used for scraping the brushed redundant material.
The utility model discloses an auxiliary die's of shear test sample wafer preparation use flow as follows:
the method comprises the steps of placing a first base material on a base, placing a stainless steel sheet on the first base material, pressing the stainless steel sheet tightly by using a fixing pressing strip, fixing the stainless steel sheet by using a fixing bolt, coating a test material on the exposed end of the first base material, overlapping a second base material on the first base material coated with the test material, adjusting the number of the stainless steel sheets below the second base material before overlapping to enable the thickness of the stainless steel sheets to be equal to the thickness of the test material coated on the base, pressing the second base material tightly by using the fixing pressing strip, fixing the stainless steel sheets by using a material scraping device, removing redundant materials, and baking or curing as required.
The preferred embodiments of the present invention have been described in detail with reference to the accompanying drawings, however, the present invention is not limited to the details of the above embodiments, and the technical concept of the present invention can be within the scope of the present invention to perform various simple modifications to the technical solution of the present invention, and these simple modifications all belong to the protection scope of the present invention.
It should be noted that the various technical features described in the above embodiments can be combined in any suitable manner without contradiction, and in order to avoid unnecessary repetition, the present invention does not need to describe any combination of the features.
In addition, various embodiments of the present invention can be combined arbitrarily, and the disclosed content should be regarded as the present invention as long as it does not violate the idea of the present invention.
Claims (4)
1. An auxiliary die for preparing a shear test sample is characterized by comprising a base (1), a stainless steel sheet (2) and a fixed pressing strip (3); a first base material is placed on the base (1), the first base material is perpendicular to the fixing pressing strip (3) and is fixed by the fixing pressing strip (3), and a part exposed out of the first base material is coated with a material to be tested; a plurality of stainless steel sheets (2) are stacked on a base (1), the stainless steel sheets (2) and a fixing pressing strip (3) are arranged in parallel, the stacked thickness of the stainless steel sheets (2) is equal to the thickness of a material to be tested coated on a first base material, a second base material needing to be lapped is vertically placed with the stainless steel sheets (2), one end of the second base material is lapped with one end of the first base material coated with the material to be tested, and the second base material is fixed through the fixing pressing strip (3).
2. The auxiliary mold for preparing the shear test sample wafer according to claim 1, wherein the base (1), the stainless steel sheet (2) and the fixing pressing strip (3) are respectively provided with a bolt hole for fixing the fixing bolt (4), and the stainless steel sheet (2) and the fixing pressing strip (3) are fixed on the base (1) by the fixing bolt (4).
3. An auxiliary mold for shear test piece preparation according to claim 1, wherein the auxiliary mold further comprises an excess material scraping means (5) for scraping excess material applied by brushing.
4. An auxiliary mold for shear test specimen preparation according to claim 3, wherein the excess material scraping means (5) is a stainless steel sheet.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922001012.7U CN211553478U (en) | 2019-11-19 | 2019-11-19 | Auxiliary die for preparing shear test sample wafer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922001012.7U CN211553478U (en) | 2019-11-19 | 2019-11-19 | Auxiliary die for preparing shear test sample wafer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211553478U true CN211553478U (en) | 2020-09-22 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201922001012.7U Active CN211553478U (en) | 2019-11-19 | 2019-11-19 | Auxiliary die for preparing shear test sample wafer |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN211553478U (en) |
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2019
- 2019-11-19 CN CN201922001012.7U patent/CN211553478U/en active Active
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