CN211453880U

CN211453880U - Test fixture

Info

Publication number: CN211453880U
Application number: CN201922214965.1U
Authority: CN
Inventors: 康增旗; 张琦; 廖贵田
Original assignee: Shenzhen Omega Intelligent Technology Co ltd
Current assignee: Shenzhen Omega Intelligent Technology Co ltd
Priority date: 2019-12-11
Filing date: 2019-12-11
Publication date: 2020-09-08
Anticipated expiration: 2029-12-11

Abstract

The application discloses a test fixture which comprises a test base, a test panel, a test board, a fixed block and a pry rod spring tripping mechanism, wherein the test base is provided with a first end and a second end; wherein, the test panel is fixedly positioned above the test base; the test panel is provided with a stepped groove for placing a test board, and the fixing block is positioned on the test panel and used for fixing the test board; the pry bar spring tripping mechanism is positioned below the test panel and is clamped with a tested product on the test board; when pressure is applied to the pry spring tripping mechanism, the tested product is separated from the test plate. The application provides a test fixture is provided with pinch bar spring tripping device, when pressing down the operation through pinch bar spring tripping device for the separation of being surveyed product and surveying the quick dropout of board, this pinch bar spring tripping device convenient operation, the atress is even, improves the passing rate of being surveyed the product, thereby improves off-the-shelf production efficiency and production yield.

Description

Test fixture

Technical Field

The application relates to the technical field of test tools, in particular to a test fixture.

Background

The lithium ion battery has the advantages of high energy ratio, long service life, high rated voltage, low self-discharge rate and the like, is widely applied to consumer electronics and digital products such as smart phones, tablet computers, notebook computers, Bluetooth headsets and the like, and becomes a mainstream product of digital products and consumer electronics batteries.

Before the lithium ion battery leaves a factory, various functional tests need to be carried out, and the current lithium ion battery functional test flow is as follows: firstly, fixing a probe module on a test fixture through screws; secondly, scanning a code by the handheld code scanning gun and activating a test program; and thirdly, after the test procedure is completed, the worker releases and separates the battery connector through hand pulling. The existing test fixture needs manual operation, is easy to damage the battery connector due to uneven stress, and leads to the improvement of the reject ratio of the battery function test, thereby reducing the production yield of finished products.

Disclosure of Invention

The application provides a test fixture to solve among the prior art test fixture and need the manual operation, and the inhomogeneous damage battery connector that just atress is easy leads to the technical problem that battery function test defective rate improves.

In order to solve the technical problem, the application adopts a technical scheme that: providing a test fixture, wherein the test fixture comprises a test base, a test panel, a test board, a fixed block and a pry bar spring tripping mechanism; the test panel is fixedly positioned above the test base; the test panel is provided with a stepped groove for placing the test board, and the fixing block is positioned on the test panel and used for fixing the test board; the pry bar spring tripping mechanism is positioned below the test panel and clamped with a tested product on the test board; when pressure is applied to the pry spring trip mechanism, the product under test is separated from the test plate.

Preferably, the pry spring tripping mechanism comprises a tripping assembly, a pry bar and a rotating shaft supporting assembly; the upper end of the tripping assembly is located on the test panel, the lower end of the tripping assembly is connected with the crowbar, and the rotating shaft supporting assembly is used for fixing the crowbar.

Preferably, the tripping assembly comprises a tripping plate, a first guide rod, a first linear bearing, a spring and a top block; the rotating shaft supporting component comprises a rotating shaft and a rotating shaft supporting block; the tripping plate is positioned on the test panel, the tripping plate is connected with the ejector block through the first guide rod, and the first linear bearing is abutted against the spring and is sleeved on the first guide rod; the pivot passes the through-hole of pinch bar is fixed on the pivot supporting shoe, the one end of pinch bar is fixed the below of kicking block, the other end of pinch bar stretches out test base, convenience of customers operates.

Preferably, the pry bar is a connecting rod with a plurality of bent positions.

Preferably, the test fixture comprises a fastening probe block mechanism, and the fastening probe block mechanism is located below the test panel and is opposite to the test board.

Preferably, the buckling probe block mechanism comprises a rack buckle, a probe mounting plate, a second linear bearing and a second guide rod; the rack is fixedly mounted below the test panel and connected with the probe mounting plate, and a probe hole is formed in the middle of the probe mounting plate and used for mounting a probe; the second guide rod is fixedly arranged below the test panel, the second linear bearing is fixedly arranged on the probe mounting plate, and the second linear bearing is sleeved on the second guide rod.

Preferably, the test panel comprises a product placing groove, and a scanning through hole is arranged in the product placing groove.

Preferably, the test fixture further comprises a code scanning support mechanism, and the code scanning support mechanism is located below the product placement groove.

Preferably, the code scanning support mechanism comprises an adjusting bottom plate, an adjusting vertical plate, a vertical plate fixing block and a scanning gun rotating fixing plate; the scanning gun rotating fixing plate is used for fixedly mounting a scanning gun, and the scanning gun is over against the product placing groove; the scanning gun rotating fixing plate is adjustably located on the vertical plate fixing block, the vertical plate fixing block is adjustably located on the adjusting vertical plate, the adjusting vertical plate is adjustably located on the adjusting bottom plate, and the adjusting bottom plate is adjustably located on the testing base.

Preferably, the test base comprises a test bottom plate and two side supporting plates, the two side supporting plates are fixedly positioned on the test bottom plate, and the test panel is fixedly installed on the two side supporting plates.

The beneficial effect of this application is: the application provides a test fixture is provided with pinch bar spring tripping device, when pressing down the operation through pinch bar spring tripping device for the separation of being surveyed product and surveying the quick dropout of board, this pinch bar spring tripping device convenient operation, the atress is even, improves the passing rate of being surveyed the product, thereby improves off-the-shelf production efficiency and production yield.

Drawings

FIG. 1 is a schematic structural diagram of an embodiment of a test fixture of the present application;

FIG. 2 is a schematic view of the test fixture of FIG. 1 from another perspective;

FIG. 3 is an enlarged schematic view of portion A of FIG. 1;

FIG. 4 is a schematic view of a portion of the test socket of FIG. 1;

FIG. 5 is a schematic view of a portion of the lever spring release mechanism of FIG. 1;

FIG. 6 is a schematic view of a portion of the snap probe block mechanism of FIG. 1;

fig. 7 is a partial structural schematic view of the code scanning bracket mechanism in fig. 1.

Detailed Description

The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

It should be noted that all the directional indicators (such as upper, lower, left, right, front and rear … …) in the embodiment of the present invention are only used to explain the relative position relationship between the components, the motion situation, etc. in a specific posture (as shown in the drawings), and if the specific posture is changed, the directional indicator is changed accordingly.

In the present application, unless expressly stated or limited otherwise, the terms "connected" and "fixed" are to be construed broadly, e.g., "fixed" may be fixedly connected or detachably connected, or integrally formed; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meaning of the above terms in the present invention can be understood according to specific situations by those skilled in the art.

In addition, descriptions in the present application as to "first", "second", and the like are for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicit to the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, the technical solutions in the embodiments may be combined with each other, but it must be based on the realization of those skilled in the art, and when the technical solutions are contradictory or cannot be realized, the combination of the technical solutions should not be considered to exist, and is not within the protection scope of the present invention.

Referring to fig. 1 to 7 together, fig. 1 and 2 are schematic structural diagrams of two viewing angles according to an embodiment of the testing fixture of the present application, and fig. 3 is an enlarged structural diagram of a portion a in fig. 1; fig. 4 to 7 are schematic partial structural diagrams of a test base, a pry spring tripping mechanism, a buckle probe block mechanism and a code scanning support mechanism in the test fixture of the present application, respectively.

Referring to fig. 1 to 4, the testing fixture 10 includes a testing base 11, a testing panel 12, a testing board 13, a fixing block 14, and a lever spring release mechanism 100.

Wherein, the testing panel 12 is fixedly positioned above the testing base 11; the test panel 12 is provided with a stepped groove 103 for placing the test board 13, and the fixing block 14 is positioned on the test panel 11 and used for fixing the test board 13; the pry spring tripping mechanism 100 is located below the test panel 12 and is clamped with a product to be tested (not shown) on the test board 13; when pressure is applied to lever spring release 100, the product under test is separated from test plate 13.

In this embodiment, the test panel 12 is provided with a stepped slot 103, the bottom of the stepped slot 103 is provided with a pin hole for positioning the test board 13 and a pin hole (not shown) for the test board, a positioning pin is installed in the pin hole, and the test board 13 is placed in the stepped slot 103 and passes through the positioning pin; two fixing blocks 14 are respectively arranged at two sides of the test board 13, and the fixing blocks 14 are pressed against the test board 13 by screws and fixed on the test panel 12.

The testing base 11 includes a testing base plate 101 and two side supporting plates 102, the two side supporting plates 102 are fixedly located on the testing base plate 101, and the testing panel 12 is fixedly installed on the two side supporting plates 102. The two side support plates 102 are fixedly mounted on the test base plate 101 by screws, and the test panel 12 is fixedly mounted on the two side support plates 102 by screws. The test base 11 of this embodiment is provided with two side support plates 102 for supporting; the skeleton of whole test fixture 10 uses thick bakelite material to make, and other both sides can perhaps not set up the baffle through being equipped with the baffle that transparent material made to can observe whole test fixture 10's inner structure, when the part is not hard up, can in time discover.

The test fixture 10 that this embodiment provided is provided with pinch bar spring tripping device 100, when pressing down the operation through pinch bar spring tripping device 100 for the product under test and the separation of surveying the quick dropout of board 13, this pinch bar spring tripping device 100 convenient operation, the atress is even, improves the passing rate of the product under test, thereby improves off-the-shelf production efficiency and production yield.

Referring to fig. 5, the lever spring trip mechanism 100 includes a trip assembly 110, a lever 120, and a shaft support assembly 130. The upper end of the trip assembly 110 is located on the test panel 12, the lower end of the trip assembly 110 is connected to the lever 120, and the rotating shaft supporting assembly 130 is used for fixing the lever 120.

Specifically, the trip assembly 110 includes a trip plate 111, a first guide bar 112, a first linear bearing 113, a spring 114, and a top block 115; the shaft support assembly 130 includes a shaft 131 and a shaft support block 132. The trip plate 111 is located on the test panel 12 (see fig. 1), the trip plate 111 is connected with the top block 115 through a first guide rod 112, a first linear bearing 113 is abutted with a spring 114 and is sleeved on the first guide rod 112, wherein the other end of the first linear bearing 113 is abutted with the test board 13, and the other end of the spring 114 is abutted with the top block 115; the rotating shaft 131 penetrates through a through hole of the pry bar 120 and is fixed on the rotating shaft supporting block 132, the rotating shaft supporting block 132 is fixed on the test panel 12, one end of the pry bar 120 is fixed below the ejecting block 115, and the other end of the pry bar 120 extends out of the test base 11, so that the operation of a user is facilitated. The pry bar 120 of the present embodiment is a connecting rod with multiple bends, and more specifically, the pry bar 120 is a connecting rod with three bends, and the pry bar 120 is integrally formed. In this embodiment, the first guide rod 112, the first linear bearing 113 and the spring 114 are all two sets, so that the structure is firm and the service life is long. In other embodiments, there may be multiple sets or groups depending on the connector of the product to be tested.

In this embodiment, when the pry spring tripping mechanism 100 is reset, the spring 114 opens the top block 115 and the first linear bearing 113, and the tripping plate 111 tightly attaches the product to be tested to the test board 13 under the action of the first guide rod 112. When the pry spring tripping mechanism 100 works, the pry spring tripping mechanism 100 transmits force to the top block 115 by pressing the pry bar 120 through the connecting rod of the pry bar 120 so as to drive the tripping plate 111 to move upwards, and the tripping plate 111 moves upwards to enable a tested product (taking a battery connecting buckle as an example in this embodiment) to be safely separated from the test board 13.

Referring to fig. 6, the test fixture 10 includes a snap probe block mechanism 200, wherein the snap probe block mechanism 200 is located under the test panel 12 and faces the test board 13.

In this embodiment, the snap probe block mechanism 200 includes a rack snap 210, a probe mounting plate 220, a second linear bearing 230, and a second guide rod 240. The two rack buckles 210 are fixedly mounted below the test panel 12 and connected to the probe mounting plate 220, and the two rack buckles 210 are respectively connected to two ends of the probe mounting plate 220. The middle part of the probe mounting plate 220 is provided with a probe hole 221 for mounting a probe; the second guide bar 240 is fixedly located below the test panel 12, the second linear bearing 230 is fixedly located on the probe mounting plate 220, and the second linear bearing 230 is sleeved on the second guide bar 240.

Specifically, probe holes 221 corresponding to the test board pin holes on the test board 13 one by one are reserved on the probe mounting board 220; the second guide 240 is fixed to the test panel 12, the second linear bearing 230 and the probe are fixed to the probe mounting plate 220, and the probe mounting plate 220 with the probe and the second linear bearing 230 mounted thereon is fixed to the test panel 12 through the rack fastener 210 through the second guide 240, wherein the probe is in close contact with the test board 13 at a position corresponding to the probe hole of the test board.

This implementation provides test fixture 10, owing to be equipped with buckle probe card mechanism 200, frame is detained 210 and is passed through the screw with whole buckle probe card mechanism 200 fixed mounting to test panel 12 on, when testing board 13 damages and need to change buckle probe card mechanism 200, its simple structure can quick replacement, saves the change time, raises the efficiency.

Referring to fig. 1 and 7, the test panel 12 includes a product placement groove 104, and a scanning through hole 105 is formed in the product placement groove 104. The size of the product placement groove 104 is larger than that of the product to be tested, so that the product to be tested can be placed in the product placement groove 104; and the size of the scanning through hole 105 is smaller than that of the product to be measured. Specifically, the length and width of the scanning through hole 105 are respectively smaller than the length and width of the product to be tested, or the length of the scanning through hole 105 is smaller than the length of the product to be tested, so that the product to be tested can be placed in the product placement groove 104 without falling down.

The test fixture 11 further comprises a code scanning support mechanism 300, the code scanning support mechanism 300 is located below the product placement groove 104, the scanning gun 350 on the code scanning support mechanism 300 is over against the scanning through hole 105 of the product placement groove 104, and the scanning range of the scanning gun is slightly larger than the scanning through hole 105. In this embodiment, product standing groove 104 can be the battery standing groove, be equipped with the battery standing groove on test panel 12, the equal milling flutes in right angle of battery standing groove keeps away the position, the two-dimensional code department milling flutes fretwork (scanning through-hole 105 promptly) at the battery back is so that the code is swept smoothly to the scanning rifle 350 that code support mechanism 300 was swept to the lower part, wherein, the two-dimensional code size at the battery back is less than the size of dimension of scanning through-hole 105, battery standing groove right side is equipped with test platform, when being surveyed the battery and placing the battery standing groove, scanning rifle 350 carries out the scanning test to the two-dimensional code at the battery back, will be surveyed the battery and place the test platform on the right side after the scanning is accomplished, wherein test platform includes foretell test board.

In this embodiment, the code scanning bracket mechanism 300 further includes an adjusting bottom plate 310, an adjusting vertical plate 320, a vertical plate fixing block 330, and a scanning gun rotation fixing plate 340. The scanning gun rotating fixing plate 340 is used for fixedly mounting the scanning gun 350, and the scanning gun 350 is over against the scanning through hole 105 on the product placement groove 104; the rotary fixing plate 340 of the scanning gun is adjustably located on the vertical plate fixing block 330, the vertical plate fixing block 330 is adjustably located on the adjusting vertical plate 320, the adjusting vertical plate 320 is adjustably located on the adjusting bottom plate 310, and the adjusting bottom plate 310 is adjustably located on the testing base 11.

Specifically, the adjusting bottom plate 310 is provided with a slotted hole to adjust the scanning gun 350 in the left-right direction, the adjusting vertical plate 320 is provided with a slotted hole to adjust the scanning gun 350 in the up-down direction, and the scanning gun rotation fixing plate 340 is provided with an arc-shaped slotted hole to rotate the scanning gun 350 in the front-back direction, so that the whole adjusting of the scanning support mechanism 300 in the three axes of XYZ is completed. Sweep a yard rifle support mechanism 300 and can adjust the position of sweeping a yard rifle 350 through above-mentioned each module for sweep a yard rifle 350 and can pinpoint the position of scanning through-hole 105, thereby can accurately discern the two-dimensional code on the battery back fast.

This implementation provides test fixture 10, owing to be equipped with and sweep a yard gimbal mechanism 300, it is fixed to sweep a yard rifle 350, has liberated production staff's both hands and can sweep a yard test fast, has saved handheld yard rifle of sweeping and has made a round trip to look for the time of bar code or two-dimensional code, improves work efficiency.

In conclusion, the technical personnel in the field understand easily that, the test fixture that this application provided is provided with pinch bar spring tripping device, when pressing down the operation through pinch bar spring tripping device for the product under test separates with the quick dropout of survey test panel, and this pinch bar spring tripping device convenient operation, the atress is even, improves the throughput rate of the product under test, thereby improves off-the-shelf production efficiency and production yield.

The above description is only for the purpose of illustrating embodiments of the present application and is not intended to limit the scope of the present application, and all modifications of equivalent structures and equivalent processes, which are made by the contents of the specification and the drawings of the present application or are directly or indirectly applied to other related technical fields, are also included in the scope of the present application.

Claims

1. A test fixture is characterized by comprising a test base, a test panel, a test board, a fixed block and a pry bar spring tripping mechanism, wherein the test base is provided with a first end and a second end; wherein the content of the first and second substances,

the test panel is fixedly positioned above the test base; the test panel is provided with a stepped groove for placing the test board, and the fixing block is positioned on the test panel and used for fixing the test board; the pry bar spring tripping mechanism is positioned below the test panel and clamped with a tested product on the test board; when pressure is applied to the pry spring trip mechanism, the product under test is separated from the test plate.

2. The test fixture of claim 1, wherein the pry spring trip mechanism comprises a trip assembly, a pry bar, and a spindle support assembly; wherein the content of the first and second substances,

the upper end of the tripping assembly is located on the test panel, the lower end of the tripping assembly is connected with the crowbar, and the rotating shaft supporting assembly is used for fixing the crowbar.

3. The test fixture of claim 2, wherein the trip assembly comprises a trip plate, a first guide rod, a first linear bearing, a spring, and a top block; the rotating shaft supporting component comprises a rotating shaft and a rotating shaft supporting block; wherein the content of the first and second substances,

the tripping plate is positioned on the test panel, the tripping plate is connected with the ejector block through the first guide rod, and the first linear bearing is abutted against the spring and is sleeved on the first guide rod;

the pivot passes the through-hole of pinch bar is fixed on the pivot supporting shoe, the one end of pinch bar is fixed the below of kicking block, the other end of pinch bar stretches out test base, convenience of customers operates.

4. The test fixture of claim 3, wherein the pry bar is a multi-bent connecting rod.

5. The test fixture of claim 1, wherein the test fixture includes a snap probe block mechanism located below the test panel and facing the test board.

6. The test fixture of claim 5, wherein the snap probe block mechanism comprises a rack snap, a probe mounting plate, a second linear bearing, and a second guide rod; wherein the content of the first and second substances,

the rack is fixedly arranged below the test panel and connected with the probe mounting plate, and a probe hole is formed in the middle of the probe mounting plate and used for mounting a probe;

the second guide rod is fixedly arranged below the test panel, the second linear bearing is fixedly arranged on the probe mounting plate, and the second linear bearing is sleeved on the second guide rod.

7. The test fixture of claim 1, wherein the test panel comprises a product placement slot, and the product placement slot is provided with a scanning through hole therein.

8. The test fixture of claim 7, further comprising a code scanning bracket mechanism located below the product placement slot.

9. The test fixture of claim 8, wherein the code scanning support mechanism comprises an adjusting bottom plate, an adjusting vertical plate, a vertical plate fixing block and a scanning gun rotating fixing plate; wherein the content of the first and second substances,

the scanning gun rotating fixing plate is used for fixedly mounting a scanning gun, and the scanning gun is over against the product placing groove;

the scanning gun rotating fixing plate is adjustably located on the vertical plate fixing block, the vertical plate fixing block is adjustably located on the adjusting vertical plate, the adjusting vertical plate is adjustably located on the adjusting bottom plate, and the adjusting bottom plate is adjustably located on the testing base.

10. The test fixture of any one of claims 1-9, wherein the test base comprises a test base plate and two side support plates, the two side support plates are fixed on the test base plate, and the test panel is fixed on the two side support plates.