CN211453799U - Full-protocol quick-charging and quick-discharging aging test equipment - Google Patents
Full-protocol quick-charging and quick-discharging aging test equipment Download PDFInfo
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- CN211453799U CN211453799U CN201921235224.5U CN201921235224U CN211453799U CN 211453799 U CN211453799 U CN 211453799U CN 201921235224 U CN201921235224 U CN 201921235224U CN 211453799 U CN211453799 U CN 211453799U
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Abstract
The utility model discloses a full-protocol quick-charging and quick-discharging aging test device, which comprises a main structure body, wherein the main structure body consists of a base, a test cabinet and a controller; the test cabinet comprises a first test cabinet, a second test cabinet and a third test cabinet, wherein single-chip microcomputers are respectively arranged in the first test cabinet, the second test cabinet and the third test cabinet, a small storage position is arranged in the first test cabinet, a medium storage position is arranged in the second test cabinet, a large storage position is arranged in the third test cabinet, and cabinet doors are respectively arranged on the first test cabinet, the second test cabinet and the third test cabinet; the controller is internally provided with a heater, a cooler, a circulating fan, a temperature sensor and a constant temperature controller; the utility model discloses compatible multiple agreement that fills soon on the market need not induce through the keysets and step up, steps up by single chip microcomputer control, realizes stepping up fast, and its comprehensiveness and compatibility are very good, have reduced the customer cost and have promoted efficiency of software testing.
Description
Technical Field
The utility model belongs to the technical field of check out test set, specifically be a full agreement fills soon and puts aging testing equipment.
Background
The aging test mainly refers to a thermal oxidation aging test for rubber, plastic products, electrical appliance insulating materials and other materials; or the ventilation aging test is carried out on electronic parts and plasticized products, and the aging test is divided into temperature aging, sunlight irradiation aging, loading aging and the like. The high-temperature aging is generally carried out in several grades, and the industrial aging generally uses 70 degrees, 4 hours, 15 degrees, 40 degrees, 55 degrees, 70 degrees and 85 degrees for several grades, and the time is generally 4 hours. The method is divided into 2 methods according to the number of aging test products: 1. the aging box is mainly used for plastic products, and the products with small quantity and volume are practical; 2. a high-temperature and severe environment testing device is mainly simulated for high-performance electronic products (such as a computer complete machine, a display, a terminal machine, an automotive electronic product, a power supply, a mainboard, a monitor, a switching charger and the like), is an important experimental device for improving the stability and the reliability of products, is an important production process for improving the quality and the competitiveness of products of various production enterprises, and is widely applied to the fields of power electronics, computers, communication, biological pharmacy and the like.
However, most of the aging test equipment in the current market induces boosting through the adapter plate, and only a specific product can be subjected to aging test, so that the compatibility is poor.
SUMMERY OF THE UTILITY MODEL
The utility model aims at solving the above problem and providing a full agreement fills soon and puts aging testing equipment soon.
The utility model realizes the above purpose by the following technical proposal, a full protocol quick charging and quick discharging aging test device, which comprises a main structure body, wherein the main structure body consists of a base, a test cabinet and a controller;
the test cabinet comprises a first test cabinet, a second test cabinet and a third test cabinet, wherein a single chip microcomputer is arranged in the first test cabinet, the second test cabinet and the third test cabinet respectively, a small storage position is formed by separating a transverse baffle and a vertical baffle in the first test cabinet, a medium storage position is formed by separating the transverse baffle in the second test cabinet, a large storage position is formed in the third test cabinet, cabinet doors are arranged on the first test cabinet, the second test cabinet and the third test cabinet respectively, and a display screen, an indicator light and a key area are arranged on the cabinet doors;
and a heater, a cooler, a circulating fan, a temperature sensor and a constant temperature controller are arranged in the controller.
Preferably, the cabinet door is provided with a switch control key.
Preferably, the indicator light consists of a red indicator light, a green indicator light and a yellow indicator light.
Preferably, a plurality of control keys are arranged in the key area.
Preferably, the base, the test cabinet and the controller are connected in sequence.
Preferably, the vertical baffle is fixedly connected with the transverse baffle, and the transverse baffle is respectively connected with the first test cabinet and the second test cabinet in a drawing and pulling manner.
Preferably, the controller is connected with a display screen, an indicator light and a control key arranged on the cabinet door in a control mode.
The utility model has the advantages that: the utility model relates to a full agreement fills soon and puts aging testing equipment soon, multiple agreement that fills soon on the compatible present market need not induce through the keysets and steps up, steps up by single chip microcomputer control, realizes stepping up fast, and its comprehensiveness and compatibility are very good, have reduced the customer cost and have promoted efficiency of software testing.
Drawings
FIG. 1 is a schematic view of the internal structure of the present invention;
FIG. 2 is a schematic view of the external structure of the present invention;
in the figure: 1. a base; 2. a test cabinet; 3. a transverse baffle plate; 4. storing a small number; 5. a vertical baffle plate; 6. a single chip microcomputer; 7. a controller; 8. a heater; 9. a temperature reducer; 10. a circulating fan; 11. a temperature sensor; 12. a thermostatic controller; 13. a first test cabinet; 14. a second test cabinet; 15. storing the middle number; 16. a third test cabinet; 17. storing a large-size storage position; 18. a cabinet door; 19. a display screen; 20. an indicator light; 21. a control key; 22. a key area; 23. the switch controls the keys.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
As shown in fig. 1-2, a full-protocol rapid charging and discharging aging test apparatus includes a main structure body, which is composed of a base 1, a test cabinet 2 and a controller 7; the test cabinet 2 comprises a first test cabinet 13, a second test cabinet 14 and a third test cabinet 16, wherein a single chip microcomputer 6 is arranged in the first test cabinet 13, the second test cabinet 14 and the third test cabinet 16 respectively, a small storage position 4 is formed by separating a transverse baffle 3 and a vertical baffle 5 in the first test cabinet 13, a medium storage position 15 is formed by separating a transverse baffle 3 in the second test cabinet 14, a large storage position 17 is arranged in the third test cabinet 16, cabinet doors 18 are arranged on the first test cabinet 13, the second test cabinet 14 and the third test cabinet 16 respectively, and a display screen 19, an indicator lamp 20 and a key area 22 are arranged on the cabinet doors 18; and a heater 8, a cooler 9, a circulating fan 10, a temperature sensor 11 and a constant temperature controller 12 are arranged in the controller 7.
In addition, a switch control key 23 is arranged on the cabinet door 18; the indicator light 20 consists of a red indicator light, a green indicator light and a yellow indicator light; a plurality of control keys 21 are arranged in the key area 22; the base 1, the test cabinet 2 and the controller 7 are sequentially connected; the vertical baffle 5 is fixedly connected with the transverse baffle 3, and the transverse baffle 3 is respectively connected with the first test cabinet 13 and the second test cabinet 14 in a drawing manner; the controller 7 is connected with a display screen 19, an indicator light 20 and a control key 21 which are arranged on the cabinet door 18 in a control mode.
It should be noted that, through the setting of the single chip microcomputer 6, the voltage can be directly controlled by the single chip microcomputer 6 to boost, so that the purpose of rapid voltage boosting is achieved, the compatibility of the aging test equipment is improved, the test efficiency is improved, and the cost of customers is reduced.
It should be noted that the test cabinet 2 is composed of a first test cabinet 13, a second test cabinet 14 and a third test cabinet 16, a small number storage position 4 is arranged in the first test cabinet 13, a medium number storage position 15 is arranged in the second test cabinet 14, a large number storage position 17 is arranged in the third test cabinet 16, and a worker can put different test cabinets for testing according to the type of a detected product, so that the compatibility of the aging equipment is improved.
It should be noted that, the display screen 19, the indicator light 20 and the control button 21 on the cabinet door 18, the staff can judge the detection state and the detection result according to the 19 level indicator lights 20 of display screen, and the staff can control the whole detection process through the control button 21, and the operation is convenient.
The working principle is as follows: the product that will carry out aging testing, according to its model, put into suitable test cabinet, close cabinet door 18, the staff controls whole test procedure through locating control button 21 on cabinet door 18, can directly observe whole test status through display screen 19, can observe the test result through pilot lamp 20, light when yellow pilot lamp and then show in testing, light when green pilot lamp and explain the test end, and the test result is qualified, light when red pilot lamp, it explains the end, and the test result is unqualified, be equipped with on-off control button 23 on cabinet door 18, one-key control test switch.
It is obvious to a person skilled in the art that the invention is not restricted to details of the above-described exemplary embodiments, but that it can be implemented in other specific forms without departing from the spirit or essential characteristics of the invention. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Furthermore, it should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art should integrate the description, and the embodiments may be combined as appropriate to form other embodiments understood by those skilled in the art.
Claims (7)
1. The full-protocol quick-charging and quick-discharging aging test equipment is characterized by comprising a structure main body, wherein the structure main body consists of a base (1), a test cabinet (2) and a controller (7);
the test cabinet (2) comprises a first test cabinet (13), a second test cabinet (14) and a third test cabinet (16), wherein a single chip microcomputer (6) is arranged in the first test cabinet (13), the second test cabinet (14) and the third test cabinet (16), a small storage position (4) is formed in the first test cabinet (13) in a separating mode through a transverse baffle (3) and a vertical baffle (5), a medium storage position (15) is formed in the second test cabinet (14) in a separating mode through the transverse baffle (3), a large storage position (17) is arranged in the third test cabinet (16), cabinet doors (18) are arranged on the first test cabinet (13), the second test cabinet (14) and the third test cabinet (16), and a display screen (19), an indicator light (20) and a key area (22) are arranged on the cabinet doors (18);
and a heater (8), a cooler (9), a circulating fan (10), a temperature sensor (11) and a constant temperature controller (12) are arranged in the controller (7).
2. The full protocol fast charging and fast discharging aging test device according to claim 1, characterized in that: and a switch control key (23) is arranged on the cabinet door (18).
3. The full protocol fast charging and fast discharging aging test device according to claim 1, characterized in that: the indicating lamp (20) consists of a red indicating lamp, a green indicating lamp and a yellow indicating lamp.
4. The full protocol fast charging and fast discharging aging test device according to claim 1, characterized in that: a plurality of control keys (21) are arranged in the key area (22).
5. The full protocol fast charging and fast discharging aging test device according to claim 1, characterized in that: the base (1), the test cabinet (2) and the controller (7) are sequentially connected.
6. The full protocol fast charging and fast discharging aging test device according to claim 1, characterized in that: the vertical baffle (5) is fixedly connected with the transverse baffle (3), and the transverse baffle (3) is respectively connected with the first test cabinet (13) and the second test cabinet (14) in a drawing mode.
7. The full protocol fast charging and fast discharging aging test device according to claim 1, characterized in that: the controller (7) is in control connection with a display screen (19), an indicator light (20) and a control key (21) which are arranged on the cabinet door (18).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921235224.5U CN211453799U (en) | 2019-08-01 | 2019-08-01 | Full-protocol quick-charging and quick-discharging aging test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921235224.5U CN211453799U (en) | 2019-08-01 | 2019-08-01 | Full-protocol quick-charging and quick-discharging aging test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211453799U true CN211453799U (en) | 2020-09-08 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201921235224.5U Expired - Fee Related CN211453799U (en) | 2019-08-01 | 2019-08-01 | Full-protocol quick-charging and quick-discharging aging test equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN211453799U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112394710A (en) * | 2020-11-18 | 2021-02-23 | 无锡科铭新汽车电子系统有限公司 | One-key starting device for aging test of urea pump controller |
| CN112630132A (en) * | 2020-12-03 | 2021-04-09 | 斯比泰电子（嘉兴）有限公司 | Car atmosphere lamp plate is ageing equipment in batches |
-
2019
- 2019-08-01 CN CN201921235224.5U patent/CN211453799U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112394710A (en) * | 2020-11-18 | 2021-02-23 | 无锡科铭新汽车电子系统有限公司 | One-key starting device for aging test of urea pump controller |
| CN112630132A (en) * | 2020-12-03 | 2021-04-09 | 斯比泰电子（嘉兴）有限公司 | Car atmosphere lamp plate is ageing equipment in batches |
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| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20200908 Termination date: 20210801 |