CN211374957U - Jig for ICT test - Google Patents
Jig for ICT test Download PDFInfo
- Publication number
- CN211374957U CN211374957U CN201921636182.6U CN201921636182U CN211374957U CN 211374957 U CN211374957 U CN 211374957U CN 201921636182 U CN201921636182 U CN 201921636182U CN 211374957 U CN211374957 U CN 211374957U
- Authority
- CN
- China
- Prior art keywords
- plate
- fixedly connected
- board
- test
- data
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
The utility model provides a tool is used in ICT test. Tool is used in ICT test, including the drain pan, the left side fixedly connected with bottom plate at drain pan top, the board is placed to the top fixedly connected with of bottom plate, the equal fixed link in front side and the rear side at drain pan top has the reference column, the equal fixedly connected with fixing base in left front side and the rear side of drain pan, two the fixing base top all is provided with the spliced pole, two the top of fixing base just is located two the relative one side of spliced pole all runs through there is the guide shaft, two the equal sliding connection in top on spliced pole surface has the shell, two the first frock board of bottom fixedly connected with of shell. The utility model provides a tool is used in ICT test has, places the area at board top great when the design, just so can place and test great data board in the test, the versatility when having improved the device test greatly, both testable less also can test great data board.
Description
Technical Field
The utility model relates to a data detection field especially relates to a tool is used in ICT test.
Background
The data board can provide a series of joints for the processor, the display card, the sound effect card, the hard disk, the memory, the external equipment and other equipment to joint. They are usually plugged directly into the relevant slot or wired.
However, when the data board is tested during use, due to limitation of the data board testing device, the data board may not be monitored and tested in all directions due to the fact that a part of the data board is too large, and thus the data board may fail during use.
Therefore, it is necessary to provide a jig for ICT testing to solve the above technical problems.
SUMMERY OF THE UTILITY MODEL
The utility model provides a tool is used in ICT test has solved comparatively difficult problem in the test when the data board is great.
In order to solve the technical problems, the utility model provides a jig for ICT test, which comprises a bottom shell, wherein the left side of the top of the bottom shell is fixedly connected with a bottom plate, the top of the bottom plate is fixedly connected with a placing plate, the front side and the rear side of the top of the bottom shell are fixedly connected with positioning columns, the front side and the rear side of the left side of the bottom shell are fixedly connected with fixing seats, the tops of the two fixing seats are respectively provided with a connecting column, guide shafts penetrate through the tops of the two fixing seats and the opposite sides of the two connecting columns, the tops of the surfaces of the two connecting columns are respectively connected with a casing in a sliding way, the bottoms of the two casings are fixedly connected with a first tooling plate, the surfaces of the front side and the rear side of the bottom of the first tooling plate, which are respectively positioned on the two connecting columns and the two guide shafts, are respectively provided with bearings, the bottoms of the two bearings, the bottom of first frock board is provided with the second frock board, the bottom of second frock board is provided with the probe support plate, the right side of probe support plate bottom is provided with the connecting block, the bottom of connecting block is provided with the contact plate, two the right side of bearing and the left side fixed connection of second frock board, two the right side of connecting plate and the left side fixed connection of probe support plate.
Preferably, the top of first frock board is provided with first support column, the top of first support column is provided with first roof.
Preferably, the front side and the rear side of the top of the first tooling plate are fixedly connected with a second supporting column, and the top of the second supporting column is fixedly connected with a second top plate.
Preferably, the front side and the rear side of the top of the bottom shell are both fixedly connected with supporting plates.
Preferably, the left side and the right side of the bottom shell are both fixedly connected with a first handle, and the left side of the top of the first tooling plate is fixedly connected with a second handle.
Preferably, a peripheral connection port is arranged on the right side of the bottom shell.
Compared with the prior art, the utility model provides a tool is used in ICT test has following beneficial effect:
the utility model provides a tool for ICT test, firstly, place the data board on the placing board, the external device is connected with the external connector on the right side of the bottom shell, then manually press the second top board, at this time, the second top board will move downwards, then the second top board will be fixedly connected with the first tooling board because of the second supporting column, and the first tooling board is fixedly connected with the casing, so the second top board will drive the casing to move downwards when moving downwards, because the casing is connected with the connecting column in a sliding way, at this time, the casing will slide downwards along the connecting column, at this time, the first tooling board will drive the second tooling board and the probe carrier board to move downwards, until the probe on the probe carrier board contacts the data board, the pressing downwards is stopped, then the probe is always contacted with the board data board because of the strength, then the power-on test is carried out to the data board, at this time, because the connecting block is fixedly connected with the probe carrier board, the connecting block is fixedly connected with the contact plate, at the moment, the contact plate can be contacted with the top of the bottom shell when the probe carrier plate is contacted with the data plate, the data generated after the data plate is tested can be transmitted to the contact plate and then transmitted to the bottom shell by the contact plate, because the right side of the bottom shell is provided with the data connecting port of the peripheral equipment, the tested data can be transmitted to the peripheral equipment through the connecting port for data result display, after the test is finished, the pressing force is released, the top of the second top plate is provided with the device with the sucker, then the device starts to suck the second top plate and the part connected with the second top plate (the device stops sucking when being pressed), then the probe carrier plate can move upwards to leave the data plate, the area of the top of the placing plate is larger during design, so that a larger data plate can be placed and tested during the test, the device has the advantages that the device test versatility is greatly improved, the device test can be carried out on smaller data boards and larger data boards, the design of the positioning columns can ensure that the probe support board moves in the same vertical direction when moving downwards, the contact board and the top of the bottom shell and the probe support board are in contact with the data boards on the placing board more accurately, the design of the guide shafts also ensures that the probe support board moves in the same vertical direction when moving downwards, the springs sleeved on the surfaces of the connecting columns can save more labor when being pressed by people, the design of the first handle and the second handle can make the device more convenient to carry, the design of the support plates facilitates the connection of the device and other devices, the design of the bearings and the connecting boards can be changed to increase the contact area between the second tooling board and the probe support board and the surfaces of the connecting columns, so that the second tooling board and the probe support board can move downwards more conveniently and the second tooling board and the probe support board can be prevented from moving downwards in the sliding process The phenomenon of easy breakage caused by too long right extension.
Drawings
Fig. 1 is a schematic structural diagram of a preferred embodiment of a jig for ICT testing according to the present invention;
fig. 2 is a side view of the bottom chassis shown in fig. 1.
Reference numbers in the figures: 1. bottom shell, 2, bottom plate, 3, place the board, 4, reference column, 5, fixing base, 6, spliced pole, 7, guide shaft, 8, cover shell, 9, first frock board, 10, bearing, 11, connecting plate, 12, second frock board, 13, probe support plate, 14, connecting block, 15, contact plate, 16, first support column, 17, first roof, 18, second support column, 19, second roof, 20, backup pad, 21, the first in command, 22, the second in command.
Detailed Description
The present invention will be further described with reference to the accompanying drawings and embodiments.
Please refer to fig. 1 and fig. 2 in combination, wherein fig. 1 is a schematic structural diagram of a preferred embodiment of a jig for ICT testing according to the present invention; fig. 2 is a side view of the bottom chassis shown in fig. 1. The ICT test jig comprises a bottom shell 1, wherein a bottom plate 2 is fixedly connected to the left side of the top of the bottom shell 1, a placing plate 3 is fixedly connected to the top of the bottom plate 2, the placing plate 3 is connected with the front side and the rear side of the two sides of the bottom plate through connecting pieces (iron sheets), positioning columns 4 are fixedly connected to the front side and the rear side of the top of the bottom shell 1, fixing seats 5 are fixedly connected to the front side and the rear side of the left side of the bottom shell 1, connecting columns 6 are arranged at the tops of the two fixing seats 5, guide shafts 7 penetrate through the opposite sides of the two connecting columns 6, a sleeve 8 is slidably connected to the tops of the surfaces of the two connecting columns 6, a first tooling plate 9 is fixedly connected to the bottoms of the sleeve 8, bearings 10 are arranged on the front side and the rear side of the left bottom of the first tooling plate 9 and on the surfaces of the two connecting columns 6 and the two guide shafts 7, the bottom of the two bearings 10 and the surfaces of the two connecting columns and the two guide shafts 7 are provided with connecting plates 11, a second tooling plate 12 is arranged at the bottom of the first tooling plate 9, a probe carrier plate 13 is arranged at the bottom of the second tooling plate 12, the bottom of the probe carrier plate 13 is provided with a probe, the right side of the bottom of the probe carrier plate 13 is provided with a connecting block 14, a contact plate 15 is arranged at the bottom of the connecting block 14, a data hole matched with the contact plate 15 is arranged at the top of the bottom shell 1, the bottom of contact plate 15 is seted up the locating hole that uses with reference column 4 cooperation, the relative one side of connecting plate 11 and fixing base 5 just is located the surface of spliced pole 6 is provided with the spring, two the right side of bearing 10 and the left side fixed connection of second frock board 12, two the right side of connecting plate 11 and the left side fixed connection of probe support plate 13.
The top of first frock board 9 is provided with first support column 16, the top of first support column 16 is provided with first roof 17.
The equal fixedly connected with second support column 18 in front side and the rear side at first frock board 9 top, the top fixedly connected with second roof 19 of second support column 18, the top of second roof 19 is provided with the adsorption equipment who has the sucking disc that uses with the device cooperation.
The front side and the rear side of the top of the bottom shell 1 are both fixedly connected with a support plate 20.
The left side and the right side of the bottom shell 1 are both fixedly connected with a first handle 21, and the left side of the top of the first tooling plate 9 is fixedly connected with a second handle 22.
And a peripheral connecting port is arranged on the right side of the bottom shell 1.
The utility model provides a tool is used in ICT test's theory of operation as follows:
firstly, the data board is placed on the placing board 3, the external equipment is connected with the external connection port on the right side of the bottom shell 1, then the second top board 19 is manually pressed, at the moment, the second top board 19 moves downwards, then the second top board 19 is fixedly connected with the first tooling board 9 because of the second supporting column 18, and the first tooling board 9 is fixedly connected with the casing 8, so that the casing 8 is driven to move downwards when the second top board 19 moves downwards, because the casing 8 is in sliding connection with the connecting column 6, at the moment, the casing 8 slides downwards along the connecting column 6, at the moment, the first tooling board 9 drives the second tooling board 12 and the probe carrier board 13 to move downwards until the probes on the probe carrier board 13 contact the data board, the downward pressing is stopped, then the strength is kept so that the probes always contact the data board, and then the data board is subjected to power-on test, because the connection block 14 is fixedly connected with the probe carrier plate 13, and the connection block 14 is fixedly connected with the contact plate 15, at this time, because the probe carrier 13 is in contact with the data board, the contact board 15 is also in contact with the top of the bottom case 1, at this time, data generated after the data board test is transferred to the contact board 15, and then transferred from the contact board 15 to the bottom case 1, because the right side of the bottom shell 1 is provided with the data connecting port of the peripheral equipment, the tested data can be transmitted to the peripheral equipment through the data connecting port to display the result of the data, when the detection is finished, the pressing force is released, the top of the second top board 19 is connected with a device with suction cups, the device then starts to suck up the second top plate 19 and the part attached to the second top plate 19 (the device stops sucking when pressed down) and the probe carrier plate 13 will then move upwards away from the data plate.
Compared with the prior art, the utility model provides a tool is used in ICT test has following beneficial effect:
firstly, the data board is placed on the placing board 3, the external equipment is connected with the external connection port on the right side of the bottom shell 1, then the second top board 19 is manually pressed, at the moment, the second top board 19 moves downwards, then the second top board 19 is fixedly connected with the first tooling board 9 because of the second supporting column 18, and the first tooling board 9 is fixedly connected with the casing 8, so that the casing 8 is driven to move downwards when the second top board 19 moves downwards, because the casing 8 is in sliding connection with the connecting column 6, at the moment, the casing 8 slides downwards along the connecting column 6, at the moment, the first tooling board 9 drives the second tooling board 12 and the probe carrier board 13 to move downwards until the probes on the probe carrier board 13 contact the data board, the downward pressing is stopped, then the strength is kept so that the probes always contact the data board, and then the data board is subjected to power-on test, at this time, because the connection block 14 is fixedly connected with the probe carrier plate 13 and the connection block 14 is fixedly connected with the contact plate 15, at this time, because the probe carrier plate 13 is in contact with the data plate, the contact plate 15 is also in contact with the top of the bottom case 1, at this time, data generated after the data plate test is transmitted to the contact plate 15 and then transmitted to the bottom case 1 by the contact plate 15, because the right side of the bottom case 1 is provided with a data connection port of peripheral equipment, then the tested data is transmitted to the peripheral equipment through the connection port for data result display, after the detection is finished, the pressing force is released, the top of the second top plate 19 is connected with a suction cup device, then the device starts to suck the second top plate 19 and a part connected with the second top plate 19 (when the device stops sucking when being pressed), and then the probe carrier plate 13 moves upwards to leave the data plate, the area of the top of the placing plate 3 is large in design, so that a large data plate can be placed and tested in testing, the versatility of the device in testing is greatly improved, a small data plate and a large data plate can be tested, the design of the positioning column 4 can ensure that when the probe carrier plate 13 moves downwards, the contact plate 15 and the top of the bottom shell 1 and the probe carrier plate 13 are more accurate in position when being contacted with the data plate on the placing plate 3, the design of the guide shaft 7 also ensures that the probe carrier plate 13 moves in the same vertical direction when moving downwards, the springs sleeved on the surface of the connecting column 6 can save more labor when being pressed by people, the design of the first handle 21 and the second handle 22 can make the device more convenient in carrying, the design of the supporting plate 20 facilitates the connection of the device and other devices, the design of the bearing 10 and the connecting plate 11 can be changed to increase the second tooling plate 12 and the probe carrier plate 13 to be connected with the connecting plate The contact area of the surfaces of the posts 6 can facilitate the downward movement of the second tooling plate 12 and the probe carrier plate 13, thereby preventing the second tooling plate 12 and the probe carrier plate 13 from being easily broken due to the rightward extension during the sliding process.
The above only is the embodiment of the present invention, not limiting the scope of the present invention, all the equivalent structures or equivalent processes of the present invention are used in the specification and the attached drawings, or directly or indirectly applied to other related technical fields, and the same principle is included in the protection scope of the present invention.
Claims (6)
1. The utility model provides a tool is used in ICT test, includes drain pan (1), its characterized in that: the left side of the top of the bottom shell (1) is fixedly connected with a bottom plate (2), the top of the bottom plate (2) is fixedly connected with a placing plate (3), the front side and the rear side of the top of the bottom shell (1) are fixedly connected with positioning columns (4), the left front side and the rear side of the bottom shell (1) are fixedly connected with fixing seats (5), the tops of the two fixing seats (5) are respectively provided with a connecting column (6), the tops of the two fixing seats (5) and the side opposite to the two connecting columns (6) are respectively provided with a guide shaft (7) in a penetrating manner, the tops of the surfaces of the two connecting columns (6) are respectively connected with a casing (8) in a sliding manner, the bottoms of the two casings (8) are fixedly connected with a first tooling plate (9), the left front side and the rear side of the bottom of the first tooling plate (9) are respectively provided with a bearing (10) and the surfaces of the two connecting columns, two the bottom of bearing (10) just is located two spliced pole and two the surface of guide shaft (7) all is provided with connecting plate (11), the bottom of first frock board (9) is provided with second frock board (12), the bottom of second frock board (12) is provided with probe carrier plate (13), the right side of probe carrier plate (13) bottom is provided with connecting block (14), the bottom of connecting block (14) is provided with contact plate (15), two the right side of bearing (10) and the left side fixed connection of second frock board (12), two the right side of connecting plate (11) and the left side fixed connection of probe carrier plate (13).
2. The ICT test jig according to claim 1, characterized in that a first supporting column (16) is disposed on the top of the first tooling plate (9), and a first top plate (17) is disposed on the top of the first supporting column (16).
3. The ICT test jig of claim 1, characterized in that, the front side and the back side of the top of the first tooling plate (9) are fixedly connected with a second supporting column (18), and the top of the second supporting column (18) is fixedly connected with a second top plate (19).
4. The ICT test fixture of claim 1, wherein the front side and the rear side of the top of the bottom shell (1) are fixedly connected with support plates (20).
5. The ICT test jig of claim 1, characterized in that, a first handle (21) is fixedly connected to both the left side and the right side of the bottom shell (1), and a second handle (22) is fixedly connected to the left side of the top of the first tooling plate (9).
6. The ICT test fixture according to claim 1, characterized in that a peripheral connector is disposed on the right side of the bottom case (1).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921636182.6U CN211374957U (en) | 2019-09-29 | 2019-09-29 | Jig for ICT test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921636182.6U CN211374957U (en) | 2019-09-29 | 2019-09-29 | Jig for ICT test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211374957U true CN211374957U (en) | 2020-08-28 |
Family
ID=72154319
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201921636182.6U Active CN211374957U (en) | 2019-09-29 | 2019-09-29 | Jig for ICT test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN211374957U (en) |
-
2019
- 2019-09-29 CN CN201921636182.6U patent/CN211374957U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107850637A (en) | A kind of electronic product testing jig | |
| CN205193386U (en) | Carry on liquid crystal module testing tool of special -shaped flexible line way board | |
| CN209766820U (en) | Connector assembling equipment | |
| CN115963441A (en) | Automatic calibration test fixture | |
| CN211374957U (en) | Jig for ICT test | |
| CN208780111U (en) | Handset bracket roughness detection equipments | |
| CN212749146U (en) | Integrated performance testing device | |
| CN208026762U (en) | A kind of liquid crystal module testing impedance fixture | |
| CN217181130U (en) | Detection apparatus convenient to test circuit board | |
| CN215676843U (en) | Automatic testing arrangement of counterpointing | |
| CN214895653U (en) | Auxiliary clamp for flying probe test | |
| CN210571686U (en) | Tensile test smelting tool | |
| CN213090827U (en) | Test equipment for notebook computer touch pad | |
| CN211453703U (en) | Pin test fixture suitable for integrated circuit sorting machine | |
| CN211669319U (en) | Mainboard testing device | |
| CN208224409U (en) | A kind of line detection apparatus of pcb board | |
| CN210420674U (en) | Point location device for tailoring | |
| CN108663550B (en) | Clamping jig for conductivity test of fingerprint chip | |
| CN219038673U (en) | Touch screen testing device | |
| CN220208029U (en) | Touch scribing detection device | |
| CN219669394U (en) | Carrier fixing mechanism | |
| CN221302683U (en) | Vibration test bench for server main board | |
| CN211697897U (en) | Electronic component detection clamp | |
| CN216082849U (en) | Special detection tool | |
| CN213780152U (en) | Battery capacity detection device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |