CN211292987U - Novel infrared emission board capability test anchor clamps - Google Patents
Novel infrared emission board capability test anchor clamps Download PDFInfo
- Publication number
- CN211292987U CN211292987U CN201922021808.9U CN201922021808U CN211292987U CN 211292987 U CN211292987 U CN 211292987U CN 201922021808 U CN201922021808 U CN 201922021808U CN 211292987 U CN211292987 U CN 211292987U
- Authority
- CN
- China
- Prior art keywords
- circuit board
- infrared emission
- spring seat
- rod
- base
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
The utility model relates to an electronic manufacturing production field provides a novel infrared emission board capability test anchor clamps, include: a clamp body; the jig main body includes: the circuit board pressing device comprises a base, a circuit board pressing cover, a connecting rod, a supporting structure, a pressing rod connecting device, a manual pressing rod, a pressing column and a spring seat plate; a support structure is fixedly arranged on the base, a pressure rod connecting device is arranged at the upper end of the support structure, and a manual pressure rod is hinged to the upper end of the pressure rod connecting device; the manual pressure lever is also hinged with one end of a pressure lever connecting piece, and the other end of the pressure lever connecting piece is hinged with a connecting rod; the bottom end of the connecting rod is provided with a circuit board gland; the bottom surface of the gland is fixedly provided with a crimping column; the circuit board placing device is characterized in that a spring seat plate is arranged below the gland, the spring seat plate is movably arranged on the base, and a circuit board placing groove to be tested is formed in the spring seat plate. The utility model discloses the test is simple convenient, the measuring accuracy is high, and the performance of guarantee circuit board that awaits measuring avoids the defective products to flow.
Description
Technical Field
The utility model relates to an electronic manufacturing production field especially relates to a novel infrared emission board capability test anchor clamps.
Background
Generally, a circuit board and an electronic component need to be tested to determine whether the quality thereof is in accordance with the specification, and a common testing method is to arrange a test card between the circuit board, the electronic component and a related testing device so that each contact of the circuit board and the electronic component can be electrically connected with a corresponding contact of the testing device to execute each testing operation.
The test fixture for the performance of the circuit board is equipment for measuring PCBA (printed circuit board assembly) and is used for detecting the short circuit or open circuit condition of the blank PCBA, and the circuit board to be tested is assembled into a finished product after the circuit board to be tested has normal functions. The existing test fixture generally has the problems of low test precision, complex operation during testing, undetachable device and the like.
SUMMERY OF THE UTILITY MODEL
The utility model discloses mainly solve technical problems such as prior art's test fixture measuring accuracy is low, complex operation, provide a novel infrared emission board capability test anchor clamps, the test is simple convenient, the measuring accuracy is high, and the record test data can be traceed back, and the performance of guarantee infrared emission board avoids the defective products to flow.
The utility model provides a novel infrared emission board capability test anchor clamps, include: a clamp body;
the jig main body includes: the circuit board pressing device comprises a base (1), a circuit board pressing cover (2), a connecting rod (3), a supporting structure (5), a pressing rod connecting device (6), a manual pressing rod (7), a pressing column (9) and a spring seat plate (10);
a supporting structure (5) is fixedly arranged on the base (1), a pressure rod connecting device (6) is arranged at the upper end of the supporting structure (5), and a manual pressure rod (7) is hinged to the upper end of the pressure rod connecting device (6); the manual pressure lever (7) is also hinged with one end of a pressure lever connecting piece (8), and the other end of the pressure lever connecting piece (8) is hinged with the connecting rod (3); the bottom end of the connecting rod (3) is provided with a circuit board gland (2);
the bottom surface of the circuit board gland (2) is fixedly provided with a plurality of crimping posts (9); the circuit board placing device is characterized in that a spring seat plate (10) is arranged below the circuit board gland (2), the spring seat plate (10) is movably arranged on the base (1), and a circuit board placing groove (12) to be tested is formed in the spring seat plate (10).
Preferably, the testing device further comprises a communication circuit board arranged inside the base (1), one end of the communication circuit board is electrically connected with the metal probe arranged in the circuit board placing groove to be tested through a wire, and the other end of the communication circuit board is externally connected with a computer.
Preferably, the communication circuit board is provided with an IO port and is connected to the computer through a USB socket.
Preferably, the circuit board gland (2) is wound with a black diffuse reflection adhesive tape.
Preferably, the bottom end of the pressure bar connecting device (6) is provided with a fixing ring (4), and the fixing ring (4) is sleeved on the outer side of the connecting rod (3).
Preferably, a guide rod (11) is arranged in the supporting structure (5), and the guide rod (11) penetrates through one end of the circuit board gland (2).
Preferably, the spring seat plate (10) is movably arranged on the base (1) through a plurality of spring rods.
Preferably, the base (1) is made of red bakelite.
Preferably, the spring seat plate (10) is made of black FR4 material.
Preferably, the circuit board gland (2) is made of organic glass.
The utility model provides a pair of novel infrared transmitting plate capability test anchor clamps, the test is simple convenient, the measuring accuracy is high, and the record test data can be traceed back, can reduce the test technology threshold, and the performance of guarantee infrared transmitting plate avoids the defective products to flow to can take notes test data, guarantee the product traceability.
Drawings
Fig. 1 is a schematic structural view of a novel infrared emission plate performance test fixture provided by the present invention;
fig. 2 is a top view of the novel infrared emission plate performance test fixture provided by the present invention;
fig. 3 is a schematic structural view of the base top surface provided by the present invention;
fig. 4 is a schematic structural diagram of the circuit board gland provided by the present invention;
fig. 5 is a schematic structural view of the spring seat plate provided by the present invention.
Reference numerals: 1. a base; 2. a circuit board gland; 3. a connecting rod; 4. a fixing ring; 5. a support structure; 6. a compression bar connecting device; 7. a manual compression bar; 8. a compression bar connecting piece; 9. a crimp post; 10. a spring seat plate; 11. a guide bar; 12. a circuit board placing groove to be tested; 13. a circuit board to be tested; 14. and a power switch.
Detailed Description
In order to make the technical problem solved by the present invention, the technical solution adopted by the present invention and the technical effect achieved by the present invention clearer, the present invention will be further described in detail with reference to the accompanying drawings and the embodiments. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some but not all of the relevant portions of the present invention are shown in the drawings.
Fig. 1 is the utility model provides a novel infrared emission board capability test anchor clamps's schematic structure view. Fig. 2 is a top view of the novel infrared emission plate performance test fixture provided by the utility model. As shown in fig. 1 and 2, the embodiment of the utility model provides a novel infrared emission board capability test anchor clamps, include: the communication circuit board of anchor clamps main part and setting in base 1 inside.
The jig main body includes: the circuit board pressing device comprises a base 1, a circuit board pressing cover 2, a connecting rod 3, a supporting structure 5, a pressing rod connecting device 6, a manual pressing rod 7, a pressing column 9 and a spring seat plate 10.
Fig. 3 is a schematic structural view of the base top surface provided by the present invention; fig. 4 is a schematic structural diagram of the circuit board gland provided by the present invention; fig. 5 is a schematic structural view of the spring seat plate provided by the present invention. As shown in fig. 3-5, a support structure 5 is fixedly arranged on the base 1, a pressure lever connecting device 6 is arranged at the upper end of the support structure 5, and a manual pressure lever 7 is hinged to the upper end of the pressure lever connecting device 6; the manual compression bar 7 is also hinged with one end of a compression bar connecting piece 8, and the other end of the compression bar connecting piece 8 is hinged with the connecting rod 3; the bottom end of the connecting rod 3 is provided with a circuit board gland 2.
A plurality of crimping posts 9 are fixedly arranged on the bottom surface of the gland 2; the lower part of gland 2 sets up spring seat board 10, spring seat board 10 activity sets up on base 1, spring seat board 10 sets up circuit board standing groove 12 that awaits measuring. A plurality of metal probes are arranged in the circuit board placing groove 12 to be tested, and the metal probes are electrically connected with the communication circuit board arranged in the base 1 through wires. And gold plating is carried out on the surface of the metal probe.
In this embodiment, the base 1 is made of red bakelite, and the power switch 14 is disposed on the base 1, and the power switch 14 is electrically connected to the communication circuit board. The communication circuit board is placed in the base 1, the top surface of the base 1 is matched with the spring seat plate 10 to be used as a needle plate, and as shown in fig. 3, a plurality of mounting holes and probe holes are formed in the top surface of the base 1. The central mounting holes are used for placing the spring rods of the spring seat plate 10 and the edge mounting holes are used for mounting the support structure 5. The base 1 is rectangular as a whole, and the side walls can be opened through hinges.
In this embodiment, circuit board gland 2 adopts organic glass to make, circuit board gland 2 twines black diffuse reflection sticky tape, and simulation dim light environment test infrared illumination. The bottom of the pressure bar connecting device 6 is provided with a fixing ring 4, the fixing ring 4 is sleeved outside the connecting rod 3, and the connecting rod 3 penetrates through the fixing ring 4 when moving up and down. Set up guide bar 11 in the bearing structure 5, guide bar 11 passes the one end of circuit board gland 2, and circuit board gland 2 can reciprocate along guide bar 11. The circuit board cover 2 can protect the circuit board 13 to be tested from external force. The circuit board gland 2 is made of organic glass. The spring seat plate 10 is made of black FR4 material. The spring seat plate 10 is movably arranged on the base 1 through a plurality of spring rods, and when the circuit board gland 2 is pressed downwards, the spring seat plate 10 can move downwards along the spring rods; after the pressure is removed, the spring rod drives the circuit board gland 2 to move upwards for resetting. The spring seat plate 10 is provided with a plurality of holes for receiving the probe and the guide bar 11. The spring seat plate 10 is processed into a corresponding placing groove 12 of the circuit board to be tested according to the size of the circuit board to be tested, and is used for fixing the circuit board to be tested and completing the connection and communication between the probe and the circuit board.
In this embodiment, one end of the communication circuit board is electrically connected to the metal probe disposed in the placement groove of the circuit board to be tested through a wire, and the other end is externally connected to the computer. The communication circuit board is provided with an IO port and is connected with a computer through a USB socket. The communication circuit board can use an MCU board, the MCU board uses serial port communication to replace the complicated signal control of input and output, and the working state is simulated. The MCU board is used for communicating with a computer, outputting a test result and recording a test content number, so that the test state of the circuit board can be traced. The metal probe is fixed on the top surface of the base 1, the top of the metal probe is a gold-plated plum blossom seat which can be directly contacted with the exposed part of the circuit board 13 to be tested, and the bottom of the metal probe can be connected with a lead through soldering tin to realize the electric connection with other components.
This embodiment is when using, places the circuit board standing groove 12 that awaits measuring at spring seat board 10 with the circuit board 13 that awaits measuring, through pushing down manual depression bar 7, drives connecting rod 3 downstream, and connecting rod 3 drives circuit board gland 2 downwards, and crimping post 9 withstands circuit board and the spring seat board 10 that awaits measuring and fixes downwards on base 1. The circuit board 13 to be tested is contacted with the metal probe and is communicated with the communication circuit board through the metal probe, so that the test of the circuit board 13 to be tested is realized. The novel infrared emission plate performance test fixture of the embodiment tests the emission and receiving performance of an infrared emission plate, and the infrared emission plate is provided with an infrared emission lamp and an infrared sensor; 2 winding black diffuse reflection sticky tapes of circuit board gland, simulation dim light environment test infrared ray illuminance, when the test, the infrared emission lamp emission infrared ray on the circuit board that awaits measuring, infrared sensor receives infrared signal, and in sending infrared signal to external computer through communication circuit board, judge and the record by the performance of computer to infrared emission board, guarantee test performance avoids the defective products to flow, and can take notes test data, guarantee product traceability.
The test fixture manufactured by the red bakelite, the gold-plated probe and the communication circuit board can realize the alignment of the circuit board to be tested (the infrared emission board) and the probe, and the circuit board to be tested realizes the communication with the communication circuit board through the probe; the purpose of testing the performance of the infrared transmitting plate is achieved through the communication between the communication circuit board and the circuit board to be tested. The test fixture of this embodiment, the test is simple convenient, the measuring accuracy is high, and the record test data can be traceed back, can reduce the test technology threshold, can improve production efficiency, less bad dismantlement step of equipment.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: it is to be understood that modifications may be made to the technical solutions described in the foregoing embodiments, or some or all of the technical features may be equivalently replaced, without substantially departing from the scope of the technical solutions of the embodiments of the present invention.
Claims (10)
1. The utility model provides a novel infrared emission board capability test anchor clamps which characterized in that includes: a clamp body;
the jig main body includes: the circuit board pressing device comprises a base (1), a circuit board pressing cover (2), a connecting rod (3), a supporting structure (5), a pressing rod connecting device (6), a manual pressing rod (7), a pressing column (9) and a spring seat plate (10);
a supporting structure (5) is fixedly arranged on the base (1), a pressure rod connecting device (6) is arranged at the upper end of the supporting structure (5), and a manual pressure rod (7) is hinged to the upper end of the pressure rod connecting device (6); the manual pressure lever (7) is also hinged with one end of a pressure lever connecting piece (8), and the other end of the pressure lever connecting piece (8) is hinged with the connecting rod (3); the bottom end of the connecting rod (3) is provided with a circuit board gland (2);
the bottom surface of the circuit board gland (2) is fixedly provided with a plurality of crimping posts (9); the circuit board placing device is characterized in that a spring seat plate (10) is arranged below the circuit board gland (2), the spring seat plate (10) is movably arranged on the base (1), and a circuit board placing groove (12) to be tested is formed in the spring seat plate (10).
2. The novel infrared emission plate performance test fixture as claimed in claim 1, further comprising a communication circuit board disposed inside the base (1), wherein one end of the communication circuit board is electrically connected with the metal probe disposed in the placement groove of the circuit board to be tested through a wire, and the other end is externally connected with a computer.
3. The novel infrared emission plate performance test fixture as claimed in claim 2, wherein the communication circuit board is provided with an IO port and is connected with a computer through a USB socket.
4. The novel infrared emission plate performance test fixture as claimed in claim 1, wherein the circuit board gland (2) is wound with black diffuse reflection adhesive tape.
5. The novel infrared emission plate performance test fixture as claimed in claim 1, wherein a fixing ring (4) is arranged at the bottom end of the pressure bar connecting device (6), and the fixing ring (4) is sleeved outside the connecting rod (3).
6. The novel infrared emission plate performance test fixture as claimed in claim 1, wherein a guide rod (11) is arranged in the support structure (5), and the guide rod (11) penetrates through one end of the circuit board gland (2).
7. The novel infrared emission plate performance test fixture as claimed in claim 1, wherein the spring seat plate (10) is movably arranged on the base (1) through a plurality of spring rods.
8. The novel infrared emission plate performance test fixture as claimed in claim 1, wherein the base (1) is made of red bakelite.
9. The new infrared emission panel performance test fixture as claimed in claim 1, characterized in that said spring seat plate (10) is made of black FR4 material.
10. The novel infrared emission plate performance test fixture as claimed in claim 1, wherein the circuit board gland (2) is made of organic glass.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922021808.9U CN211292987U (en) | 2019-11-21 | 2019-11-21 | Novel infrared emission board capability test anchor clamps |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922021808.9U CN211292987U (en) | 2019-11-21 | 2019-11-21 | Novel infrared emission board capability test anchor clamps |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211292987U true CN211292987U (en) | 2020-08-18 |
Family
ID=72018773
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201922021808.9U Active CN211292987U (en) | 2019-11-21 | 2019-11-21 | Novel infrared emission board capability test anchor clamps |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN211292987U (en) |
-
2019
- 2019-11-21 CN CN201922021808.9U patent/CN211292987U/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104614610A (en) | Modular needle bed fixture for testing PCBA | |
| CN106526452A (en) | System and method for achieving PCBA automatic detection by use of probe | |
| CN214225335U (en) | Multichannel board card-level BFT test platform | |
| CN203054014U (en) | Light emitting diode fixing device | |
| CN211292987U (en) | Novel infrared emission board capability test anchor clamps | |
| CN209690357U (en) | Multifunction chip fixes device | |
| WO2018028033A1 (en) | Semi-finished touchscreen tester based on magnetic switches | |
| CN211348346U (en) | Circuit board performance verification clamp utilizing multiple groups of probes | |
| CN211292986U (en) | Wireless transmission board performance test fixture based on touch panel | |
| CN205450198U (en) | Thick film hybrid integrated circuit tester | |
| CN211348345U (en) | Novel power supply test board performance test clamp | |
| CN212965292U (en) | Portable plug testing device | |
| CN214845399U (en) | Vertical downward-pressing type screen test fixture | |
| CN204576255U (en) | A kind of high frequency electric source controller test fixture | |
| CN205404750U (en) | Thick film hybrid integrated circuit test system | |
| TWM478824U (en) | Signal adapting line of probe detector | |
| CN211905455U (en) | Testing device for PCB | |
| CN102788919A (en) | Wire detecting device and wire detecting method | |
| CN111289782A (en) | Mini/MicroLED short circuit test fixture and test method | |
| CN219876249U (en) | FPC structure with ZIF connector | |
| CN203595765U (en) | Non-destructive testing device for LIV normal temperature performance of laser | |
| CN218956738U (en) | JTAG tool for testing | |
| CN110519587B (en) | Device for testing photographing function and camera lifting function | |
| CN112269119B (en) | High-density measuring point switching test fixture and switching method | |
| CN216926884U (en) | PCBA testing arrangement |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |