CN211220568U

CN211220568U - 3m method electric wave room high frequency test table

Info

Publication number: CN211220568U
Application number: CN201921631986.7U
Authority: CN
Inventors: 刘振东; 韦文喜; 安金龙
Original assignee: Xinghua Testing Tianjin Co ltd
Current assignee: Xinghua Testing Co.,Ltd.
Priority date: 2019-09-28
Filing date: 2019-09-28
Publication date: 2020-08-11
Anticipated expiration: 2029-09-28

Abstract

The utility model discloses a 3m method electric wave room high frequency test table, including testboard, table, support frame, test panel, control box, rubber pad, electric telescopic handle, rise button, decline button, switch and treater, the table top is equipped with the testboard, testboard top central authorities are equipped with test panel, the table bottom is equipped with the support frame, the support frame bottom all is equipped with the rubber pad, the support frame is equipped with the control box on the right side of the top in front, the left side of control box inner wall top is equipped with the rise button, rise button right side is equipped with the decline button, decline button right side is equipped with the switch, decline button below is equipped with the treater, the inside four corners of support frame all is equipped; the utility model relates to a 3m method electric wave room high frequency test table through the electric telescopic handle of the inside setting of support frame, can rise or reduce the testboard according to the test actual conditions, adjusts to suitable test height, and electric wave room high frequency test table material dielectric constant itself is less than 1.2, and is less with the test result difference.

Description

3m method electric wave room high frequency test table

Technical Field

The utility model relates to a high frequency test technical field specifically is a 3m method electric wave room high frequency test table.

Background

The anechoic chamber is a closed shielding chamber which is mainly used for simulating an open field and is simultaneously used for radiating radio disturbance and measuring radiation sensitivity, the size of the anechoic chamber and the selection of radio frequency wave-absorbing materials are mainly determined by the dimension of an external line of a tested device (EUT) and test requirements and are divided into a 1m method, a 3m method or a 10m method;

in the prior art, the test results of radiation disturbance are different due to different dielectric constants of test tables made of different materials, so that the test results are greatly different, and the high-frequency test table of the 3 m-method electric wave chamber does not have a lifting function, so that the test is very inconvenient.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a 3m method electric wave room high frequency test table has and can rise according to the test condition testboard and reduce, the rubber pad antiskid, dielectric constant is less than 1.2's advantage, has solved the problem among the prior art.

In order to achieve the above object, the utility model provides a following technical scheme: a3 m method electric wave chamber high frequency test table comprises a test table, a table plate, a support frame, a test panel, an operation box, a rubber pad, an electric telescopic rod, an ascending button, a descending button, a switch and a processor, wherein the test table is arranged at the top of the table plate and fixed on the table plate through screws, the test panel is arranged at the center of the top of the test table and fixed on the test table through embedding, the support frame is arranged at the bottom of the table plate, the table plate is arranged on the support frame, the rubber pad is arranged at the bottom of the support frame, the rubber pad is fixed on the support frame through screws, the operation box is arranged at the right side above the front of the support frame, the operation box is fixed on the support frame through embedding, the ascending button is arranged at the left side above the inner wall of the operation box and fixed on the inner wall, the descending button is fixed on the inner wall of the operation box through a screw, a switch is arranged on the right side of the descending button, the switch is fixed on the inner wall of the operation box through a screw, a processor is arranged below the descending button, and the processor is fixed on the inner wall of the operation box through a screw;

the four corners inside the support frame are all provided with electric telescopic rods, the bottoms of the electric telescopic rods are fixed on the inner wall of the support frame through bolts, and the tops of the electric telescopic rods are fixed on the table plate through bolts.

Preferably, the dielectric constant of the material of the test table is less than one point two, and the test table can bear three hundred kilograms.

Preferably, the top of the electric telescopic rod is provided with a through hole corresponding to the support frame.

Preferably, the switch is connected with the power through a cable, the switch is connected with the electric telescopic rod, the ascending button, the descending button and the processor through cables, and the processor is electrically connected with the electric telescopic rod, the ascending button and the descending button.

Preferably, the electric telescopic rod is KTKC-75, and the treater model is KY 02S.

Compared with the prior art, the beneficial effects of the utility model are as follows: the utility model relates to a 3m method electric wave room high frequency test table through the electric telescopic handle of the inside setting of support frame, can rise or reduce the testboard according to the test actual conditions, adjusts to suitable test height, and electric wave room high frequency test table material dielectric constant itself is less than 1.2, and is less with the test result difference.

Drawings

FIG. 1 is a schematic view of the overall structure of a 3 m-method electric wave chamber high-frequency test table of the present invention;

FIG. 2 is a schematic side view of a 3 m-method electric wave chamber high-frequency test table of the present invention;

FIG. 3 is a schematic view of the internal structure of a 3 m-method electric wave chamber high-frequency test table of the present invention;

fig. 4 is a schematic view of the internal structure of the operation box of the 3m method electric wave chamber high-frequency test table of the present invention.

The figures are labeled as follows: the device comprises a test board 1, a table 2, a support frame 3, a test panel 4, an operation box 5, a rubber pad 6, an electric telescopic rod 7, an ascending button 8, a descending button 9, a switch 10 and a processor 11.

Detailed Description

The technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, rather than all embodiments, and all other embodiments obtained by a person of ordinary skill in the art without creative work belong to the protection scope of the present invention based on the embodiments of the present invention.

In the description of the present invention, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.

Referring to fig. 1-4, a 3m method electric wave chamber high frequency test table comprises a test table 1, a table plate 2, a support frame 3, a test panel 4, an operation box 5, a rubber pad 6, an electric telescopic rod 7, a lifting button 8, a descending button 9, a switch 10 and a processor 11, wherein the test table 1 is arranged on the top of the table plate 2, the test table 1 is fixed on the table plate 2 through screws, the test panel 4 is arranged in the center of the top of the test table 1, the test panel 4 is fixed on the test table 1 through an embedding manner, the support frame 3 is arranged at the bottom of the table plate 2, the table plate 2 is arranged on the support frame 3, the rubber pad 6 is arranged at the bottom of the support frame 3, the rubber pad 6 is fixed on the support frame 3 through screws, the operation box 5 is arranged on the right side of the upper front of the support frame 3, the operation box 5 is fixed on the support, a descending button 9 is arranged on the right side of the ascending button 8, the descending button 9 is fixed on the inner wall of the operation box 5 through screws, a switch 10 is arranged on the right side of the descending button 9, the switch 10 is fixed on the inner wall of the operation box 5 through screws, a processor 11 is arranged below the descending button 9, the processor 11 is fixed on the inner wall of the operation box 5 through screws, and the model of the processor 11 is KY 02S;

all be equipped with electric telescopic handle 7 in the inside four corners of support frame 3, bolt fastening is passed through to electric telescopic handle 7 bottom on 3 inner walls of support frame, bolt fastening is passed through on table 2 at 7 tops of electric telescopic handle, 7 models of electric telescopic handle are KTKC-75, the material dielectric constant of test table itself is less than one bit two, but three hundred kilograms of test table bearing, the through-hole has all been seted up with 3 corresponding departments of support frame in 7 tops of electric telescopic handle, switch 10 is connected with the power through the cable, electric telescopic handle 7 is connected respectively through the cable to switch 10, the button 8 rises, decline button 9 and treater 11, treater 11 and electric telescopic handle 7, the button 8 and the button 9 electric connection that descends rise.

The working principle is as follows: the utility model relates to a 3m method electric wave room high frequency test table, the power passes through cable linked switch 10, when needing the height of adjustment testboard 1, open switch 10, when needing to rise, press rise button 8, processor 11 detects the electric current of rise button 8, rise simultaneously through cable control electric telescopic handle 7, when rising to suitable height, loosen rise button 8 can, when needing to descend, press decline button 9, processor 11 detects the electric current of decline button 9, descend simultaneously through cable control electric telescopic handle 7, when descending to suitable height, loosen decline button 9 can, then close switch 10, place the product that will need the test in test panel 4 top, it can to test.

Having shown and described the basic principles and principal features of the invention and advantages thereof, it will be apparent to those skilled in the art that the invention is not limited to the details of the foregoing exemplary embodiments, but is capable of other specific forms without departing from the spirit or essential characteristics thereof; the present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein, and any reference signs in the claims are not intended to be construed as limiting the claim concerned.

Furthermore, it should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art should integrate the description, and the embodiments may be combined as appropriate to form other embodiments understood by those skilled in the art.

Claims

1. A3 m method electric wave chamber high frequency test table, characterized by; comprises a test board (1), a table board (2), a support frame (3), a test panel (4), an operation box (5), a rubber pad (6), an electric telescopic rod (7), a lifting button (8), a descending button (9), a switch (10) and a processor (11), the top of the table plate (2) is provided with a test board (1), the test board (1) is fixed on the table plate (2) through screws, a test panel (4) is arranged in the center of the top of the test bench (1), the test panel (4) is fixed on the test bench (1) by embedding, the bottom of the table plate (2) is provided with a support frame (3), the table plate (2) is arranged on the support frame (3), the bottom of the support frame (3) is provided with a rubber pad (6), the rubber pads (6) are fixed on the support frame (3) through screws, and the right side of the upper front part of the support frame (3) is provided with an operation box (5);

the operation box (5) is fixed on the support frame (3) through embedding, an ascending button (8) is arranged on the left side above the inner wall of the operation box (5), the ascending button (8) is fixed on the inner wall of the operation box (5) through a screw, a descending button (9) is arranged on the right side of the ascending button (8), the descending button (9) is fixed on the inner wall of the operation box (5) through a screw, a switch (10) is arranged on the right side of the descending button (9), the switch (10) is fixed on the inner wall of the operation box (5) through a screw, a processor (11) is arranged below the descending button (9), and the processor (11) is fixed on the inner wall of the operation box (5) through a screw;

the novel table is characterized in that electric telescopic rods (7) are arranged at four inner corners of the support frame (3), the bottoms of the electric telescopic rods (7) are fixed on the inner wall of the support frame (3) through bolts, and the tops of the electric telescopic rods (7) are fixed on the table plate (2) through bolts.

2. A 3m faradic chamber high frequency test table as claimed in claim 1, wherein; the dielectric constant of the material of the test table is less than one point two.

3. A 3m faradic chamber high frequency test table as claimed in claim 1, wherein; the top of the electric telescopic rod (7) is provided with a through hole corresponding to the support frame (3).

4. A 3m faradic chamber high frequency test table as claimed in claim 1, wherein; switch (10) are connected with the power through the cable, switch (10) are connected electric telescopic handle (7), rise button (8), decline button (9) and treater (11) respectively through the cable, adopt electric connection between treater (11) and electric telescopic handle (7), rise button (8) and decline button (9).

5. A 3m faradic chamber high frequency test table as claimed in claim 1, wherein; the electric telescopic rod (7) is KTKC-75 in type, and the processor (11) is KY02S in type.