CN211206710U - Aging test board and aging test frame thereof - Google Patents
Aging test board and aging test frame thereof Download PDFInfo
- Publication number
- CN211206710U CN211206710U CN201922032500.4U CN201922032500U CN211206710U CN 211206710 U CN211206710 U CN 211206710U CN 201922032500 U CN201922032500 U CN 201922032500U CN 211206710 U CN211206710 U CN 211206710U
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- China
- Prior art keywords
- board
- burn
- fixed
- temperature control
- test
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- 238000012360 testing method Methods 0.000 title claims abstract description 74
- 230000032683 aging Effects 0.000 title claims abstract description 31
- 238000004891 communication Methods 0.000 claims description 7
- 238000003780 insertion Methods 0.000 claims description 4
- 230000037431 insertion Effects 0.000 claims description 4
- 238000010998 test method Methods 0.000 abstract 1
- 238000010438 heat treatment Methods 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000002431 foraging effect Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
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Abstract
The utility model discloses an aging testing board, including printing board, temperature control board and the multi-path connector who is used for transmitting the multichannel signal, the temperature control board sets up on the printing board, the multi-path connector is fixed the one end of printing board, the multi-path connector with temperature control board signal connection, be provided with a plurality of jacks that are used for connecting the device that awaits measuring on the temperature control board. The aging test plate is arranged in the plurality of fixed frames. The device test method can meet the condition of a device to be tested which needs multiple paths of test signals in an aging test.
Description
Technical Field
The utility model relates to the field of electronic technology, especially, relate to an ageing testing board and ageing testing frame thereof.
Background
The aging test board is a commonly used test component for testing chips and integrated circuit boards to wait for testing electronic devices, is generally arranged on an aging test frame, and is loaded in an aging test device to perform aging test on the devices to be tested.
However, the existing device to be tested has large information capacity and various functions to be tested, and needs multi-channel test signals for testing, and the existing burn-in board has few channels of test signals, cannot transmit multi-channel test signals at the same time, and cannot meet the test requirements of the device to be tested which needs multi-channel test signals.
SUMMERY OF THE UTILITY MODEL
In order to overcome the defects of the prior art, one of the purposes of the present invention is to provide an aging test board, which can satisfy the condition of the device to be tested requiring multiple paths of test signals for aging test;
the utility model discloses a second purpose provides an aging testing frame.
The utility model discloses an one of the purpose adopts following technical scheme to realize:
the utility model provides an aging testing board, includes printing board, temperature control board and the multi-path connector that is used for transmitting the multichannel signal, the temperature control board sets up on the printing board, the multi-path connector is fixed the one end of printing board, the multi-path connector with temperature control board signal connection, be provided with a plurality of jacks that are used for connecting the device under test on the temperature control board.
Preferably, the multipath connector includes a multipath signal base, the multipath signal base includes a first base and a plurality of signal pins for communication, the first base is fixed on the printed board, and the plurality of signal pins are fixed on the first base at intervals.
Preferably, the multipath connector further comprises a multipath socket, the multipath socket comprises a second seat body and a plurality of sockets for communication or power supply, the second seat body is fixed on the printed board, and the plurality of sockets are fixed on the second seat body at intervals.
Preferably, the burn-in board further comprises a fixing seat, the fixing seat is fixed on the printed board, and the temperature control board is connected with the printed board through the fixing seat.
Preferably, a plurality of loading holes are formed in the fixing seat, and the loading holes are communicated with the jacks one by one.
Preferably, the fixing base further comprises a switch and a movable clamp for clamping a pin of a device to be tested, the movable clamp is connected with the switch, the movable clamp is arranged in the loading hole, and when the switch is closed, the movable clamp extends out of the loading hole and enters the jack.
Preferably, the temperature control plate is further provided with a notch corresponding to the switch.
The second purpose of the utility model is realized by adopting the following technical scheme:
the utility model provides a burn-in test frame, includes any one of the aforesaid burn-in test board, the burn-in test frame still includes a plurality of fixed frames, the burn-in test board sets up in a plurality of fixed frames.
Preferably, the aging test frame further comprises a plurality of side plates, the side plates are respectively fixed on the two inner side walls of the fixed frame, and the aging test plate is connected with the fixed frame through the side plates.
Preferably, a sliding groove is formed in the side plate, and the aging test plate is in sliding connection with the side plate through the sliding groove.
Compared with the prior art, the beneficial effects of the utility model reside in that:
the aging test board is provided with a multipath connector for transmitting multipath signals, and the multipath connector can simultaneously transmit multipath test signals and can meet the condition of a device to be tested which needs multipath test signals for aging test.
Drawings
FIG. 1 is a schematic structural diagram of an aging test board according to the present invention;
FIG. 2 is a side view of the burn-in board of the present invention;
FIG. 3 is an enlarged schematic view of the structure at A in FIG. 2;
FIG. 4 is a schematic structural view of the burn-in board of the present invention with part of the temperature control board removed;
fig. 5 is a schematic structural view of the fixing base of the present invention;
fig. 6 is a schematic structural view of a temperature control plate according to the present invention;
fig. 7 is a schematic structural view of an aging testing jig of the present invention;
fig. 8 is an enlarged schematic view of the structure at B in fig. 7.
In the figure: 10. an aging test board; 11. printing a board; 12. a temperature control plate; 121. a jack; 122. a notch; 13. a multi-way connector; 131. a plurality of signal seats; 132. a multi-way socket seat; 133. a first seat body; 134. a signal pin; 135. a slot; 136. a second seat body; 137. a socket; 14. a fixed seat; 141. a switch; 142. a loading aperture; 20. an aging test frame; 21. a fixing frame; 22. a side plate; 221. a chute.
Detailed Description
The invention will be further described with reference to the accompanying drawings and specific embodiments:
in the description of the present invention, it should be noted that the terms "upper", "lower", "left", "right", "horizontal", "longitudinal", "horizontal", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, or orientations or positional relationships that are conventionally placed when the products of the present invention are used, and are only for convenience of description and simplification of the description, but do not indicate or imply that the devices or elements indicated must have a specific orientation, be constructed in a specific orientation, and be operated, and thus should not be construed as limiting the present invention. Furthermore, the terms "first," "second," "third," and the like are used solely to distinguish one from another and are not to be construed as indicating or implying relative importance.
As shown in fig. 1-3, the utility model discloses an aging testing board 10, including printing board 11, temperature control board 12 and the multi-way connector 13 that is used for transmitting the multichannel signal, temperature control board 12 sets up on the printing board 11, multi-way connector 13 is fixed the one end of printing board 11, multi-way connector 13 with temperature control board 12 signal connection, be provided with a plurality of jacks 121 that are used for connecting the device under test on the temperature control board 12.
In the above embodiment, can set up polylith control by temperature change board 12 on the printing board 11, realize the simultaneous test of a plurality of devices to be tested, can set up the heating block on the control by temperature change board 12 and heat, can also set up temperature sensor on the control by temperature change board 12, work as the temperature of control by temperature change board 12 reaches a definite value, and the heating block stops heating, jack 121 is convenient for the device to be tested is connected to control by temperature change board 12. The multi-path connector 13 can transmit multi-path test signals at the same time, and can meet the conditions of aging test of large-capacity or multifunctional devices to be tested.
As shown in fig. 2 to 3, in a preferred embodiment, the multipath connector 13 includes a multipath signal socket 131 and a multipath socket 132, the multipath signal socket 131 includes a first socket body 133 and a plurality of signal pins 134 for communication, the first socket body 133 is fixed on the printed board 11, and the plurality of signal pins 134 are fixed on the first socket body 133 at intervals. The multi-way socket 132 includes a second socket body 136 and a plurality of sockets 137 for communication or power supply, the second socket body 136 is fixed on the printed board 11, and the plurality of sockets 137 are fixed on the second socket body 136 at intervals.
In the above embodiment, each signal pin 134 may transmit a test signal, the multi-path signal socket 131 is provided with a plurality of signal pins 134, so that transmission of multi-path test signals may be achieved, and signal interference may be prevented by disposing a plurality of signal pins 134 at intervals. The plurality of jacks 137 can supply power to the temperature control board 12 and the device to be tested, and can also transmit other signals, such as parameter signals or voltage and current signals, and the plurality of jacks 137 are arranged at intervals to prevent short circuit.
As shown in fig. 8, the first base 133 may further be provided with a slot 135 electrically connected to the signal pins 134, and the slot 135 facilitates the signal pins 134 to be electrically connected to the thermal control board 12 or the device under test.
As shown in fig. 4-5, in another preferred embodiment, the burn-in board 10 further includes a fixing base 14, a switch 141, and a movable clamp (not shown) for clamping a pin of a device under test, the fixing base 14 is fixed on the printed board 11, and the thermal control board 12 is connected to the printed board 11 through the fixing base 14. Preferably, the fixing base 14 is provided with a plurality of loading holes 142, and the plurality of loading holes 142 are communicated with the plurality of insertion holes 121 one by one. The movable clip is connected to the switch 141, the movable clip is disposed in the loading hole 142, and when the switch 141 is closed, the movable clip extends out of the loading hole 142 and enters the insertion hole 121. As shown in fig. 6, the thermal control plate 12 is further provided with a notch 122 corresponding to the switch 141.
In the above embodiment, the fixing base 14 is made of a high temperature resistant material, which can prevent the temperature control board 12 from heating up and burning the printed board 11. When the switch 141 is closed, the movable clamp extends out of the loading hole 142 and enters the jack 121 to clamp the pin of the device to be tested, so that the device to be tested is stable; when the switch 141 is turned off, the movable clamp retracts from the insertion hole 121 into the loading hole 142, and releases the pin of the device under test, so that the device under test is released. The structure can enable the device to be tested to be stably tested on the temperature control board 12 without welding the device to be tested, and the device to be tested can be easily taken away from the temperature control board 12, so that the testing is more convenient and quicker, and the gap 122 on the temperature control board 12 is beneficial to closing the switch 141.
As shown in fig. 7-8, the utility model also discloses an aging testing frame 20, include aging testing board 10, a plurality of fixed frame 21 and a plurality of curb plate 22, aging testing board 10 sets up in a plurality of fixed frames 21, and a plurality of curb plates 22 are fixed respectively on the double-phase internal wall of fixed frame 21, aging testing board 10 passes through curb plate 22 with fixed frame 21 is connected.
In the above embodiment, the fixing frames 21 and the side plates 22 make the burn-in board 10 more stable, and the burn-in boards 10 can be mounted thereon, and the burn-in boards 10 are spaced apart to facilitate heat dissipation. The plurality of fixed frames 21 also facilitate handling of the burn-in jig 20, and the burn-in jig 20 can be installed in an oven for testing devices to be tested.
Preferably, the side plate 22 is provided with a sliding groove 221, and the burn-in board 11 is slidably connected with the side plate 22 through the sliding groove 221. The sliding groove 221 facilitates the mounting and dismounting of the burn-in board 10, and also allows the position of the burn-in board 10 to be adjusted.
In summary, the burn-in board is provided with a multi-path connector 13 for transmitting multi-path signals, and the multi-path connector 13 can simultaneously transmit multi-path test signals and can meet the condition of burn-in testing a device under test requiring multi-path test signals. In addition, the test device is also provided with a fixed seat 14, so that the test is more convenient and quicker.
Various other modifications and changes may be made by those skilled in the art based on the above-described technical solutions and concepts, and all such modifications and changes are intended to fall within the scope of the claims.
Claims (10)
1. The utility model provides an aging testing board, its characterized in that, is including printing board, temperature control board and the multi-path connector who is used for transmitting multichannel signal, the temperature control board sets up on the printing board, the multi-path connector is fixed the one end of printing board, the multi-path connector with temperature control board signal connection, be provided with a plurality of jacks that are used for connecting the device under test on the temperature control board.
2. The burn-in board according to claim 1, wherein the multi-path connector comprises a multi-path signal holder, the multi-path signal holder comprises a first holder and a plurality of signal pins for communication, the first holder is fixed on the printed board, and the plurality of signal pins are fixed on the first holder at intervals.
3. The burn-in board according to claim 2, wherein the multi-way connector further comprises a multi-way socket, the multi-way socket comprises a second housing and a plurality of sockets for communication or power supply, the second housing is fixed on the printed board, and the plurality of sockets are fixed on the second housing at intervals.
4. The burn-in board according to claim 1, further comprising a fixing base, wherein the fixing base is fixed on the printed board, and the temperature control board is connected to the printed board through the fixing base.
5. The burn-in board according to claim 4, wherein the holder has a plurality of loading holes, the plurality of loading holes being in one-to-one communication with the plurality of insertion holes.
6. The burn-in board according to claim 5, wherein the holder further comprises a switch and a movable clip for holding the pin of the device under test, the movable clip is connected to the switch, the movable clip is disposed in the loading hole, and when the switch is closed, the movable clip protrudes from the loading hole and enters the socket.
7. The burn-in board of claim 6, wherein said thermal control board further comprises notches corresponding to said switches.
8. A burn-in board according to any one of claims 1 to 7, comprising a plurality of fixing frames, wherein the burn-in board is disposed in the plurality of fixing frames.
9. The weathering test jig of claim 8, further comprising a plurality of side plates fixed to the opposite inner sidewalls of the fixing frame, respectively, the weathering test plate being connected to the fixing frame through the side plates.
10. The burn-in test rack of claim 9, wherein the side plate is provided with a sliding slot, and the burn-in test board is slidably connected with the side plate through the sliding slot.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922032500.4U CN211206710U (en) | 2019-11-26 | 2019-11-26 | Aging test board and aging test frame thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201922032500.4U CN211206710U (en) | 2019-11-26 | 2019-11-26 | Aging test board and aging test frame thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN211206710U true CN211206710U (en) | 2020-08-07 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201922032500.4U Expired - Fee Related CN211206710U (en) | 2019-11-26 | 2019-11-26 | Aging test board and aging test frame thereof |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN211206710U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI747539B (en) * | 2020-10-05 | 2021-11-21 | 儀騰科技有限公司 | Optical device aging test device |
-
2019
- 2019-11-26 CN CN201922032500.4U patent/CN211206710U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI747539B (en) * | 2020-10-05 | 2021-11-21 | 儀騰科技有限公司 | Optical device aging test device |
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20200807 |
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| CF01 | Termination of patent right due to non-payment of annual fee |