CN211148477U - X-ray high resolution imaging detector - Google Patents
X-ray high resolution imaging detector Download PDFInfo
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- CN211148477U CN211148477U CN201921262785.4U CN201921262785U CN211148477U CN 211148477 U CN211148477 U CN 211148477U CN 201921262785 U CN201921262785 U CN 201921262785U CN 211148477 U CN211148477 U CN 211148477U
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Abstract
The utility model relates to an X-ray imaging technology field discloses an X-ray high resolution imaging detection device, include: the X-ray imaging device comprises an X-ray source, an object to be imaged, a scattering medium, an exit diaphragm and an X-ray camera, wherein the X-ray source emits X-rays towards the X-ray camera, and the object to be imaged, the scattering medium and the exit diaphragm are arranged between the X-ray source and the X-ray camera and are sequentially arranged along the direction of a light path. The utility model discloses a high resolution of X-ray formation of image detection device simple structure, it is with low costs, can treat through incoherent X-ray irradiation moreover that the formation of image object forms the X-ray speckle who carries the object information that awaits measuring.
Description
Technical Field
The utility model relates to an X-ray imaging detection technical field, in particular to X-ray high resolution imaging detection device.
Background
the X-ray imaging is widely applied to the fields of medical and biological imaging, industrial monitoring and flaw detection, material science, artwork detection and the like because the wavelength of the X-ray is far smaller than that of visible light, and the diffraction resolution of an imaging system can be theoretically far higher than that of the visible light (the diffraction limit resolution of an imaging system is defined as lambda × z/D, wherein lambda is the wavelength of the X-ray, z is the distance from an object to a detector, and D is the aperture of the imaging system).
Currently, X-ray imaging can be divided into lenticular imaging and lensless imaging.
Lenticular imaging is as follows: the grazing angle reflector, the X-ray Fresnel zone plate and the photon sieve are focused and the capillary tube is focused. These "lenses" for X-rays are not only technically complex and expensive, but also are typically only of the order of millimeters or even centimeters in size, resulting in poor angular resolution for their actual imaging. Therefore, in practical applications, such as medicine and industry, the method of directly detecting the emergent X-ray behind the object is often adopted without using a focusing system, and the imaging resolution is in millimeter or even centimeter level.
Lensless imaging modalities (including phase-contrast X-ray imaging) [1]、Ptychographyimaging[2]Etc.) adopts coherent diffraction mechanism to obtain the power spectrum of the object to be measured, and makes an algorithm inversion to obtain the high-resolution image of the object, and the theoretical resolution can reach the diffraction limit. But it requires the use of a coherent source of synchrotron radiation. The light source is extremely expensive, only three light sources are available in China at present, and the light source can be applied for use twice every year, and the use time is only one to two days each time. Therefore, this technique is difficult to be widely used.
The method for obtaining the power spectrum of the object can be realized by directly shooting coherent diffraction spots of the object, recording speckles (random or other forms of speckles, and diffraction spots are also one of the speckles) carrying object information, and obtaining the power spectrum by methods such as autocorrelation function calculation and the like. Therefore, the object power spectrum can be obtained by using speckle obtained after the object is irradiated with X-ray and by using a certain operation. Then, a high-resolution image of the object is inverted from the power spectrum by a corresponding algorithm (such as phase recovery, higher order stacking, etc.). Existing methods of acquiring power spectra require the use of expensive and difficult to acquire coherent X-ray sources. However, light sources widely used in laboratories, medical treatment and industry are all incoherent light sources, and therefore, a device for obtaining X-ray speckles carrying information of an object to be detected by incoherent X-ray source detection at low cost is a problem to be solved urgently.
[1]Zernike,F.(1942)."Phase contrast,a new method for the microscopicobservation of transparent objects".Physica.9(7):686–698(1942).
[2]Chapman HN."Microscopy:A new phase for X-ray imaging".Nature.467(7314):409–10.(September2010).
SUMMERY OF THE UTILITY MODEL
The utility model provides a high resolution imaging detection device of X-ray solves and can't use incoherent X light source low-cost ground to survey among the prior art and obtains the problem of carrying the X-ray speckle of the object information that awaits measuring.
The utility model discloses a high resolution imaging detection device of X-ray, include: the X-ray imaging device comprises an X-ray source, an object to be imaged, a scattering medium, an exit diaphragm and an X-ray camera, wherein the X-ray source emits X-rays towards the X-ray camera, and the object to be imaged, the scattering medium and the exit diaphragm are arranged between the X-ray source and the X-ray camera and are sequentially arranged along the direction of a light path.
Wherein, still include: an entrance aperture located between the X-ray source and the object to be imaged.
Wherein the entrance aperture is movably arranged between the X-ray source and the object to be imaged in a plane perpendicular to the optical path.
Wherein the object to be imaged is movably arranged between the X-ray source and the scattering medium in a plane perpendicular to the optical path.
Wherein the exit diaphragm is movably arranged between the scattering medium and the X-ray camera in a plane perpendicular to the light path.
The utility model discloses a high resolution of X-ray formation of image detection device simple structure, it is with low costs, can treat through incoherent X-ray irradiation moreover that the formation of image object forms the X-ray speckle who carries the object information that awaits measuring.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without inventive exercise.
Fig. 1 is the structural schematic diagram of the X-ray high resolution imaging detection device of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
The X-ray high resolution imaging detection device of the present embodiment is shown in fig. 1, and includes: the X-ray imaging device comprises an X-ray source 1, an object to be imaged 3, a scattering medium 4, an emergent diaphragm 5 and an X-ray camera 6. The X-ray source 1 emits X-rays towards the X-ray camera 6, and the object 3 to be imaged, the scattering medium 4 and the exit diaphragm 5 are arranged between the X-ray source 1 and the X-ray camera 6 and are sequentially arranged along the light path direction. A fixed track along the light path direction can be arranged, and the X-ray source 1, the object to be imaged 3, the scattering medium 4, the exit diaphragm 5 and the X-ray camera 6 are detachably mounted on the fixed track through mounting connectors respectively according to the position sequence in fig. 1.
The scattering medium 4 is a medium that scatters X-rays and forms a spatially varying intensity distribution, such as sandpaper; the X-ray camera 6 is used to record the intensity distribution of X-rays on a detection surface, such as an X-ray CCD.
the exit diaphragm 5 is used for limiting the area of X-rays transmitted from the scattering medium and defines the diffraction limit resolution of the system, the diffraction limit is defined by the aperture size of the exit diaphragm 5, lambda × z/D, wherein lambda is the wavelength of the X-rays, z is the distance from the object 3 to be imaged to the scattering medium 4, D is the diameter of an equivalent exit surface and is defined by the exit diaphragm 5, D is the diameter of the diaphragm when the exit diaphragm 5 is tightly attached to the scattering medium 4, and when the diaphragm is at a certain distance from the scattering medium 4, only a part of the X-rays on the surface of the scattering medium 4 can penetrate through the exit diaphragm 5, and D is the diameter of the part of the X-rays on the scattering surface.
In this embodiment, the X-ray source 1 is an incoherent X-ray, such as: a common desktop or handheld X-ray device; or a spatial incoherent source formed by scattering an X-ray source with high coherence by a dynamic scattering medium. A dynamic scattering medium is one whose spatial distribution of scattering particles varies with time, such as rotating sandpaper, or scattering particles moving in a fluid. The speckle generated after the X-ray is transmitted by the dynamic scattering medium changes along with time.
The X-ray high-resolution imaging detection device of the embodiment is simple in structure and low in cost, and can irradiate an object to be imaged through incoherent X-ray to form X-ray speckles carrying information of the object to be imaged.
Because the X-ray that the X-ray source sent is than comparatively dispersing, and the concentration is low, can't shine the regional of 3 appointed area sizes of waiting to form images, consequently, the X-ray high resolution imaging detection device of this embodiment still includes: and the incident pinhole 2, the incident pinhole 2 is positioned between the X-ray source 1 and the object 3 to be imaged, and the incident pinhole 2 is used for limiting the area of the X-ray irradiated on the object 3.
If the size of the object 3 to be imaged is larger than that of the incident pinhole 2, the incident pinhole 2 needs to be moved so that the X-ray can scan each area of the object, and the X-ray camera 6 records the speckle pattern obtained during each scanning. Thus, the entrance aperture 2 is movably arranged in a plane perpendicular to the optical path between the X-ray source 1 and the object 3 to be imaged. A two-dimensional displacement device may be used to translate the entrance aperture 2 in two dimensions perpendicular to the optical path.
No matter whether the incident pinhole 2 exists or not, if the object 3 to be imaged is large and the X-ray cannot scan each region of the object, the object 3 to be imaged needs to be moved, so that the object 3 to be imaged can be movably arranged between the X-ray source 1 and the scattering medium 4 in a plane perpendicular to the optical path, and if the incident pinhole 2 exists, the object 3 to be imaged is arranged between the incident pinhole 2 and the scattering medium 4.
An exit diaphragm 5 is movably disposed between the scattering medium 4 and the X-ray camera 6 in a plane perpendicular to the optical path to generate different intensity distribution patterns and to be recorded by the X-ray camera to form a speckle image.
After the speckle is recorded by the X-ray camera 6, the power spectrum of the object 3 to be imaged is generated by the power spectrum generator, and there are many specific methods, for example, the power spectrum can be directly obtained by calculating the autocorrelation function of the speckle. Then, a high-resolution image of the object is inverted from the power spectrum by a corresponding algorithm (such as phase recovery, a higher-order stacking algorithm, etc.), the theoretical resolution of which can reach the diffraction limit.
The above description is only for the preferred embodiment of the present invention, and is not intended to limit the present invention, and any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention should be included within the protection scope of the present invention.
Claims (3)
1. An X-ray high resolution imaging detection device, comprising: the X-ray imaging device comprises an X-ray source, an object to be imaged, a scattering medium, an exit diaphragm and an X-ray camera, wherein the X-ray source emits X-rays towards the X-ray camera, the object to be imaged, the scattering medium and the exit diaphragm are arranged between the X-ray source and the X-ray camera and are sequentially arranged along the direction of a light path,
Further comprising: an entrance aperture located between the X-ray source and the object to be imaged, said entrance aperture being movably arranged between the X-ray source and the object to be imaged in a plane perpendicular to the optical path by means of a two-dimensional displacement device.
2. The X-ray high resolution imaging detection apparatus of claim 1, wherein the object to be imaged is movably disposed between the X-ray source and the scattering medium in a plane perpendicular to the optical path.
3. The X-ray high resolution imaging detection device according to claim 1, wherein the exit diaphragm is movably disposed between the scattering medium and the X-ray camera in a plane perpendicular to the optical path.
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| CN114563429A (en) * | 2022-03-25 | 2022-05-31 | 深圳技术大学 | Super-resolution X-ray shadow imaging system and imaging method thereof |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN114563429A (en) * | 2022-03-25 | 2022-05-31 | 深圳技术大学 | Super-resolution X-ray shadow imaging system and imaging method thereof |
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