CN211122927U - Low-frequency noise test fixture for photoelectric coupler - Google Patents
Low-frequency noise test fixture for photoelectric coupler Download PDFInfo
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- CN211122927U CN211122927U CN201920917668.0U CN201920917668U CN211122927U CN 211122927 U CN211122927 U CN 211122927U CN 201920917668 U CN201920917668 U CN 201920917668U CN 211122927 U CN211122927 U CN 211122927U
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- photoelectric coupler
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Abstract
The utility model relates to a low-frequency noise test fixture of a photoelectric coupler, belonging to electronic device detection equipment, comprising a base; the circuit board is arranged in the base, a positioning tube seat for mounting a tested photoelectric coupler is arranged on the circuit board, and a test circuit for testing the photoelectric coupler is arranged on the circuit; and the shielding structure is arranged on the base and provides a space for shielding the interference signal of the test circuit and the external interference signal for the circuit board. The utility model discloses can shield interfering signal in the testing process, improve the accuracy of test result.
Description
Technical Field
The utility model relates to a photoelectric coupler low frequency noise test fixture belongs to electron device check out test set.
Background
The inherent noise of the electronic device, especially the low-frequency noise, can sensitively reflect the microscopic or defect difference caused by different materials, structures, processes and the like of the device. Therefore, the low-frequency noise of the electronic device can also be applied to the research of the quality and reliability characterization of the device. As can be seen from low frequency noise theory, imperfections in the semiconductor device can cause low frequency noise. By testing the noise of the device with incompleteness, the deep level defect energy level of the device, the degeneracy degree of a capture interface and the defect, the space distribution information and the energy distribution information of the defect and the like can be obtained.
The photoelectric coupler is an electric-optical-electric converter using light as medium to transmit electric signal, and is composed of two portions of luminous source and light receiver. The light source and the light receiver are assembled in the same closed shell and are isolated from each other by a transparent insulator. The pin of the light source is an input end, the pin of the light receiver is an output end, the common light source is a light emitting diode, and the light receiver is a photosensitive diode, a phototriode and the like.
Because the low-frequency noise of the photoelectric coupler is strongly correlated with the long-term reliability, if the correlation is completely confirmed in tests and theories, the low-frequency noise test can be used for early pre-estimating the parameter drift failure of the device and predicting the potential defects of the device, thereby becoming a new means for evaluating the long-term reliability and screening the reliability of the photoelectric coupler. Compared with the traditional life evaluation test method, the method has the outstanding advantages of rapidness, economy, non-destructiveness and the like. Therefore, the low-frequency noise test is an important test for researching the reliability of the photoelectric coupler. However, when the quality of the photoelectric coupler is detected by low-frequency noise, an interference signal is generated, which affects the detection result.
SUMMERY OF THE UTILITY MODEL
To the problem, the utility model provides a photoelectric coupler low frequency noise test fixture can shield interfering signal in the testing process, improves the accuracy of test result.
The utility model provides a photoelectric coupler low frequency noise test fixture, include:
A base;
The circuit board is arranged in the base, a positioning tube seat for mounting a tested photoelectric coupler is arranged on the circuit board, and a test circuit for testing the photoelectric coupler is arranged on the circuit; and
The shielding structure is arranged on the base and provides a space for shielding the interference signal of the test circuit and the external interference signal for the circuit board.
The utility model discloses a further improvement lies in, the test circuit includes ANDOE end regulating circuit, is used for providing the direct current operating voltage to the photoelectric coupler of quilt measurement;
A noise path for providing a low noise voltage to the measured opto-electric coupler;
And the microstrip line is used for collecting the low-noise signal output by the photoelectric coupler to be detected.
The utility model discloses a further improvement lies in, the circuit board is the PCB board, the location tube socket sets up the middle part of PCB board, ANDOE end regulating circuit the noise path with the microstrip line all sets up on the PCB board, and connect the location tube socket.
The utility model discloses a further improvement lie in on the circuit board ANDOE end regulating circuit's both sides the both sides of noise route and the both sides of microstrip line all are provided with one row of ground connection hole, the ground connection hole passes through base ground connection.
The utility model is further improved in that the base comprises a rectangular bottom plate and a plurality of side plates arranged at the edge of the bottom plate;
The side plate is provided with a first joint, a second joint and a third joint, wherein the first joint is connected with the ANDOE end adjusting circuit, the second joint is connected with the noise passage, and the third joint is connected with the microstrip line.
The utility model discloses a further improvement lies in, first joint, second joint and third joint adopt the SMA female joint.
The utility model discloses a further improvement lies in, the location tube socket includes the first pin of connecting the ANDOE end regulating circuit, is used for installing the first pin of measured photoelectric coupler;
The second pin is connected with the grounding hole and is used for installing a second pin of the photoelectric coupler to be tested;
The third pin is connected with the noise path and is used for installing a third pin of a photoelectric coupler to be measured;
And the fourth pin is connected with the microstrip line and is used for installing a fourth pin of the photoelectric coupler to be detected.
The utility model discloses a further improvement lies in, be provided with bypass electric capacity on the noise route.
The utility model discloses a further improvement lies in, shielding structure includes the metal lid, and the metal lid covers on the base, and with the base forms inclosed space.
The utility model is further improved in that the main body of the positioning tube seat is made of polytetrafluoroethylene material, and the pin is made of metal material; the base with the metal box cover all adopts the brass material.
Compared with the prior art, the utility model has the advantages of:
Photoelectric coupler low frequency noise test fixture, can shield interfering signal in the testing process, improve the accuracy of test result. The series of clamps are suitable for photoelectric couplers of different specifications and models, are simple and accurate in positioning and convenient to install, can effectively avoid the attenuation phenomenon caused by the introduction of a power supply, ensure that the devices do not generate the self-excitation phenomenon in the test process, and improve the accuracy and the repeatability of test results. The low-frequency noise test of the photoelectric coupler can be realized.
In the utility model discloses in the low frequency noise test fixture of photoelectric coupler, the circuit board adopts the PCB version, and the microstrip line both sides and board picture border periphery all have a large amount of ground connection holes that the diameter is 0.5mm in the PCB board picture, and this ground connection hole can eliminate the distribution parameter influence that high frequency signal introduced to a certain extent, realizes exchanging simultaneously and direct current ground equipotential; the bypass capacitor can filter out high-frequency noise in the signal, and the main function of the bypass capacitor is to generate an alternating current shunt circuit so as to eliminate unwanted energy entering a susceptible area; after the brass box cover is buckled, the inside of the test circuit can be isolated from an external electromagnetic field, and the interference to the test circuit caused by the external electromagnetic field is avoided to a certain extent.
Drawings
Fig. 1 is a schematic structural view of a low-frequency noise test jig of a photoelectric coupler according to an embodiment of the present invention;
Fig. 2 is an exploded view of a structure of a low-frequency noise test jig of a photocoupler according to an embodiment of the present invention;
Fig. 3 is a schematic structural diagram of a circuit board according to an embodiment of the present invention;
Fig. 4 is a schematic structural view of a base according to an embodiment of the present invention;
Fig. 5 is a schematic structural view of a first joint according to an embodiment of the present invention.
Fig. 6 is a schematic structural view of a metal box cover according to an embodiment of the present invention.
In the drawings, like parts are provided with like reference numerals. The figures are not drawn to scale.
The meaning of the reference symbols in the drawings is as follows: 1. the device comprises a shell, 2, a circuit board, 3, a measured photoelectric coupler, 11, a base, 12, a metal box cover, 13, a first joint hole, 14, a second joint hole, 15, a third joint hole, 16, a screw hole, 21, a positioning tube seat, 22, an ANDOE end adjusting circuit, 23, a noise passage, 24, a microstrip line, 25, a first joint, 26, a second joint, 27, a third joint, 28, a connecting sheet, 29 and a through hole.
Detailed Description
The present invention will be further explained with reference to the accompanying drawings.
Fig. 1 schematically shows a low-frequency noise test fixture for a power photoelectric coupler according to an embodiment of the present invention. According to the utility model discloses a photoelectric coupler low frequency noise test fixture especially can shield interfering signal in the testing process, improves the accuracy of test result.
As shown in fig. 1 and 2, the low-frequency noise test fixture for a photocoupler according to the present embodiment includes a base 11. The base 11 is internally provided with a circuit board 2, and the circuit board 2 is provided with a positioning tube seat 21 for installing the measured photoelectric coupler 3. The circuit board 2 is provided with a test circuit, the test circuit is used for testing the photoelectric coupler, and the quality of the photoelectric coupler is tested by connecting low noise voltage and the photoelectric coupler. The test circuit is communicated with the positioning tube seat 21 and provides low-noise voltage for the tested photoelectric coupler through the positioning tube seat 21, and simultaneously receives a current signal output by the tested photoelectric coupler 3 through the positioning tube seat 21. The base 11 is provided with a shielding structure, the shielding structure and the base 11 form a space, and the circuit board 2 is located in the space. The shielding structure is configured to shield the test circuit from an external interference signal.
When the low-frequency noise test fixture of the photoelectric coupler is used, the tested photoelectric coupler 3 is mounted on the positioning tube seat 21, the test circuit is connected with a low-noise voltage source, the low-noise power source provides voltage and current for testing, and low-noise signals output by the photoelectric coupler are collected through a drain electrode or a grid electrode; the ground noise signal is filtered by a low-pass filter to remove high-frequency noise signals, the interference of high frequency to low-frequency signals is avoided, the ground noise signal is amplified by a low-noise preamplifier, and the amplified noise signals are collected by a data acquisition card. Finally, after analog-to-digital conversion, noise analysis software is used for realizing time domain analysis and frequency domain analysis of the noise signal, such as realizing conversion from a data time domain to a frequency domain, measuring a voltage power spectrum, analyzing noise spectrum components, point frequency noise, broadband noise, calculating white noise amplitude, 1/f noise amplitude, frequency index gamma and turning frequency of noise information by curve fitting, generating and storing a test report, and the like.
In one embodiment, shown in fig. 3, the test circuit includes an andse end adjustment circuit 22 for providing a dc operating voltage to the measured opto-electric coupler 3; a noise path 23 for supplying a low noise voltage to the measured photoelectric coupler 3; and the microstrip line 24 is used for collecting a low-noise signal output by the photoelectric coupler 3 to be detected.
In one embodiment, the circuit board 2 is a PCB board, preferably a rogers PCB board. The positioning tube seat 21 is arranged in the middle of the PCB, and an andse end adjusting circuit 22 is arranged on the PCB and is used for providing a direct current working voltage to the measured photoelectric coupler 3; the PCB is also provided with a noise passage 23 connected with a low-noise voltage source and used for providing low-frequency noise for the measured photoelectric coupler 3, and the PCB is also provided with a microstrip line 24 connected with a filter amplifying circuit. The microstrip line 24 can function to shield electromagnetic signals.
When the low-frequency noise test fixture for the photoelectric coupler according to the embodiment is used, a current signal of a low-noise voltage source enters the photoelectric coupler through a noise circuit, and the low-noise signal passing through the photoelectric coupler is connected with a filter amplification circuit through a microstrip line 24 and is collected through a data collection card.
In one embodiment, the circuit board 2 is provided with a grounding hole, and a row of grounding holes is provided on both sides of the andse end adjusting circuit 22, both sides of the noise path 23, and both sides of the microstrip line 24, and the grounding holes are grounded through the base 11. In this embodiment, the grounding hole is a 0.5mm grounding hole, and the grounding hole can eliminate the distribution parameter influence introduced by the high-frequency signal to a certain extent, and simultaneously realize the equal potential of alternating current and direct current grounding.
In a preferred embodiment, as shown in fig. 4, the base 11 is in the shape of a rectangular parallelepiped, and the base 11 includes a bottom plate, which is rectangular and can be grounded. The edge of bottom plate is provided with a plurality of curb plates, and in this embodiment, the quantity of curb plate is four. The side plates are provided with a plurality of joints connected with external devices, and the joints comprise a first joint 25 connected with the ANDOE end adjusting circuit 22, a second joint 26 connected with the noise path 23, and a third joint 27 connected with the microstrip line 24.
Preferably, the side of the base 11 is provided with a first joint hole 13, and the first joint 25 is arranged in the first joint hole 13. In the present embodiment, the first joint hole 13 is provided with a butterfly-shaped or wing-shaped connecting piece 28, and as shown in fig. 5, the connecting piece 28 is provided with a connecting hole; the first connector 25 is provided at both sides thereof with screw holes 16, and when the first connector 25 is mounted in the first connector hole 13, the coupling holes of the coupling piece 28 are aligned with the screw holes 16 and coupled by M2 screws. The base 11 is further provided with a second joint hole 14 and a third joint hole 15, the second joint hole 14 is used for installing a second joint 26, the third joint hole 15 is used for installing a third joint 27, and joints of the second joint hole 14 and the third joint hole 15 are the same as those of the first joint hole 13.
In one embodiment, the first joint 25, the second joint 26 and the third joint 27 are SMA female joints. The cable matched with the clamp externally is an electromagnetic shielding cable in an SMA male interface mode. By adopting the first connector 25, the second connector 26 and the third connector 27 as female connectors, interference signals in the circuit can be effectively generated.
In one embodiment, the positioning socket 21 includes four pins, i.e., a first pin, a second pin, a third pin and a fourth pin. The first pin is connected to an ANDOE end adjusting circuit 22 on the circuit board 2, and is used for mounting a first pin of the photoelectric coupler, namely an anode input end; the second pin is connected with a grounding hole on the circuit board 2 and is used for mounting a second pin of the photoelectric coupler, namely a cathode input end; the third pin is connected with a noise passage 23 on the circuit board 2 and is used for mounting a third pin of the photoelectric coupler and a C pole output end; the fourth pin is connected with a microstrip line 24 on the circuit board 2 and is used for mounting the fourth pin of the photoelectric coupler and the output end of the E pole.
In one embodiment, a bypass capacitor is disposed on the noise path. The bypass capacitor filters out high frequency noise from the signal and its main function is to create an ac shunt to cancel unwanted energy into the vulnerable zone.
In one embodiment, the shielding structure includes a metal cover 12, the metal cover 12 covers the base 11, and the metal cover 12 and the base 11 cooperate to form a housing 1, the interior of which forms a closed space. As shown in fig. 6, the metal box cover 12 is rectangular parallelepiped, has a boundary size compatible with the base 11, has a cavity structure inside, and has the same wall thickness as the brass base 11. The installation is carried out in a vertical buckling cover mode. After the metal box cover 12 is buckled, the inside of the test circuit can be isolated from an external electromagnetic field, so that the interference on the test circuit caused by the external electromagnetic field is avoided to a certain extent, and the accuracy of the test result is improved.
In a preferred embodiment, the main body of the positioning tube seat 21 is made of teflon, and the pins of the positioning tube seat 21, i.e. the first pin, the second pin, the third pin and the fourth pin, are made of metal. The base 11 with the lid all adopts the brass material.
While the invention has been described with reference to a preferred embodiment, various modifications may be made and equivalents may be substituted for elements thereof without departing from the scope of the invention. In particular, the technical features mentioned in the embodiments can be combined in any way as long as there is no structural conflict. The present invention is not limited to the particular embodiments disclosed herein, but encompasses all technical solutions falling within the scope of the claims.
Claims (10)
1. The utility model provides a photoelectric coupler low frequency noise test fixture which characterized in that includes:
A base (11);
The circuit board (2) is arranged in the base (11), a positioning tube seat (21) for installing the tested photoelectric coupler (3) is arranged on the circuit board (2), and a test circuit for testing the photoelectric coupler is arranged on the circuit; and
The shielding structure is arranged on the base (11) and provides a space for shielding the interference signal of the test circuit and the external interference signal for the circuit board (2).
2. The low-frequency noise test fixture of a photoelectric coupler according to claim 1, characterized in that the test circuit comprises an ANDOE end adjusting circuit (22) for providing a direct-current working voltage to the tested photoelectric coupler (3);
A noise path (23) that supplies a low noise voltage to the measured photoelectric coupler (3);
And a microstrip line (24) for collecting the low-noise signal output by the photoelectric coupler (3).
3. The clamp for testing the low-frequency noise of the photoelectric coupler as claimed in claim 2, wherein the circuit board (2) is a PCB, the positioning tube seat (21) is arranged in the middle of the PCB, and the ANDOE end adjusting circuit (22), the noise passage (23) and the microstrip line (24) are all arranged on the PCB and connected with the positioning tube seat (21).
4. The low-frequency noise test fixture of a photocoupler according to claim 3, wherein a row of grounding holes are arranged on the circuit board (2) on both sides of the ANDOE end adjusting circuit (22), both sides of the noise path (23) and both sides of the microstrip line (24), and the grounding holes are grounded through the base (11).
5. The clamp for testing the low-frequency noise of the photoelectric coupler of any one of claims 2 to 4, wherein the base (11) comprises a rectangular bottom plate and a plurality of side plates arranged at the edge of the bottom plate;
The side plate is provided with a first joint (25) connected with the ANDOE end adjusting circuit (22), a second joint (26) connected with the noise path (23), and a third joint (27) connected with the microstrip line (24).
6. The clamp for testing the low-frequency noise of the photoelectric coupler as claimed in claim 5, wherein the first joint (25), the second joint (26) and the third joint (27) adopt SMA female joints.
7. The clamp for testing low-frequency noise of the photoelectric coupler according to claim 4, wherein the positioning pipe seat (21) comprises a first pin connected with the ANDOE end adjusting circuit (22) and used for mounting a first pin of the tested photoelectric coupler (3);
The second pin is connected with the grounding hole and is used for installing a second pin of the photoelectric coupler (3) to be tested;
A third pin connected with the noise path (23) and used for installing a third pin of the photoelectric coupler (3) to be measured;
And the fourth pin is connected with the microstrip line (24) and is used for mounting a fourth pin of the photoelectric coupler (3) to be detected.
8. The clamp for testing low-frequency noise of a photoelectric coupler as claimed in claim 7, wherein a bypass capacitor is arranged on the noise passage.
9. The clamp for testing the low-frequency noise of the photoelectric coupler as claimed in claim 8, wherein the shielding structure comprises a metal box cover (12), and the metal box cover (12) covers the base (11) and forms a closed space with the base (11).
10. The clamp for testing the low-frequency noise of the photoelectric coupler as claimed in claim 9, wherein the main body of the positioning tube seat (21) is made of polytetrafluoroethylene material, and the pin is made of metal material; the base (11) and the metal box cover (12) are both made of brass.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920917668.0U CN211122927U (en) | 2019-06-18 | 2019-06-18 | Low-frequency noise test fixture for photoelectric coupler |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920917668.0U CN211122927U (en) | 2019-06-18 | 2019-06-18 | Low-frequency noise test fixture for photoelectric coupler |
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| CN211122927U true CN211122927U (en) | 2020-07-28 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110361566A (en) * | 2019-06-18 | 2019-10-22 | 武汉格物芯科技有限公司 | Photoelectrical coupler low frequency noise measurement fixture |
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- 2019-06-18 CN CN201920917668.0U patent/CN211122927U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110361566A (en) * | 2019-06-18 | 2019-10-22 | 武汉格物芯科技有限公司 | Photoelectrical coupler low frequency noise measurement fixture |
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