CN210982663U

CN210982663U - L ED lamp testing device

Info

Publication number: CN210982663U
Application number: CN201921797894.6U
Authority: CN
Inventors: 黄志文
Original assignee: Zhongshan Barley Lighting Co ltd
Current assignee: Zhongshan Barley Lighting Co ltd
Priority date: 2019-10-24
Filing date: 2019-10-24
Publication date: 2020-07-10
Anticipated expiration: 2029-10-24

Abstract

The utility model discloses an L ED lamps and lanterns testing arrangement, including lamps and lanterns testing arrangement main part, the testboard, top cap and master control platform, the middle fixedly connected with testboard of lamps and lanterns testing arrangement main part, bottom fixedly connected with singlechip in the middle of the inside of testboard, the top swing joint of testboard has the top cap, the bottom fixedly connected with master control platform of testboard, fixedly connected with base all around the bottom of master control platform, inboard embedding is connected with the darkwindow in the middle of the top of top cap, the testing personnel of being convenient for observe and discover unusual and timely processing work to L ED lamps and lanterns test condition in the test groove, embodied the utility model discloses a practicality, the adapter, the testing personnel of being convenient for observe and data record work, improve test quality, the top cap, improve test quality, ensure later stage L ED lamps and lanterns in service behavior, electrically conductive sensor, the testing personnel of being convenient for observe and later stage classification work to L ED lamps and lanterns test result.

Description

L ED lamp testing device

Technical Field

The utility model relates to an L ED lamps and lanterns test technical field specifically is a L ED lamps and lanterns testing arrangement.

Background

L ED basic structure is an electroluminescent semiconductor material chip, solidified on the support with silver glue or white glue, then connected with the chip and the circuit board with silver or gold thread, sealed with epoxy resin around, playing the role of protecting the internal core wire, finally installed with the shell, so the L ED lamp has good anti-seismic performance, application field relates to the daily household electrical and mechanical production aspects such as mobile phone, desk lamp, household electrical appliances, etc. L ED energy-saving lamp is a new lighting source, with the remarkable characteristics of energy saving, health, environmental protection and long life, has received the favor of people and the strong support of the state.

The current L ED lamps and lanterns detection mode is manual detection mostly, if to L ED lamps and lanterns circular telegram observe whether it lights up can, this detection mode is comparatively simple and convenient, can't carry out the check-out work and ensure L ED lamps and lanterns to the multinomial data of L ED lamps and lanterns and life and quality, and the practicality is relatively poor, and current L ED lamps and lanterns detection mode simultaneously, the efficiency is lower can't carry out the check-out work to a plurality of L ED lamps and lanterns simultaneously.

Therefore, how to design an L ED lamp testing device becomes a problem to be solved currently.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide an L ED lamps and lanterns testing arrangement to propose the relatively poor and comparatively simple and convenient problem of detection mode of degree of practicality in solving above-mentioned background art.

In order to achieve the purpose, the utility model provides an L ED lamps and lanterns testing arrangement, including lamps and lanterns testing arrangement main part, testboard, top cap and master control platform, the middle fixedly connected with testboard of lamps and lanterns testing arrangement main part, bottom fixedly connected with singlechip in the middle of the inside of testboard, the top swing joint of testboard has the top cap, the bottom fixedly connected with master control platform of testboard, the bottom fixedly connected with base all around of master control platform, the inboard embedding is connected with the control cabinet in the middle of the front of master control platform, the inboard embedding in the middle of the top of testboard is connected with the top cap, the inboard embedding of test groove is connected with a plurality of lamps and lanterns mounting groove, the opposite side embedding of lamps and lanterns mounting groove is connected with the pilot lamp, the inboard embedding in both sides of top of testboard is connected with the spout, the inboard embedding in the middle of one end of testboard is connected with.

Preferably, the bottom both sides fixedly connected with pulley of top cap, the opposite side bottom embedding of top cap is connected with the top cap hasp, inside one side top fixedly connected with light sense control cabinet of top cap, the opposite side linear connection of light sense control cabinet has the light dark sensor.

Preferably, the top end of the single chip microcomputer is linearly connected with a plurality of conductive sensors.

Preferably, an adapter is embedded and connected to one side of the interior of the test board.

Preferably, the inner side of the top end of the top cover is embedded and connected with a dark window.

Preferably, the test board is composed of a single chip microcomputer at the bottom of the middle inside, a conductive sensor at the top end of the single chip microcomputer, a lamp mounting groove at the top end of the conductive sensor, an indicator lamp at the other end of the lamp mounting groove and an adapter at one side inside.

Preferably, the top cover is composed of pulleys on two sides of the bottom, a top cover lock catch at the bottom end of the other side, a light sensation console at the top of one side inside the top cover, and light and dark sensors at two ends of the top of the inner side.

Compared with the prior art, the beneficial effects of the utility model are that:

1. this kind of L ED lamps and lanterns testing arrangement, the testboard mainly plays and carries out real-time detection work to L ED lamps and lanterns electric conductive property and current output rate, can directly show the test result through the pilot lamp simultaneously, (if green lamp passes through, yellow light retest, red light test disqualification etc.), and the tester of being convenient for observes L ED lamps and lanterns test result and later stage classification work.

2. This kind of L ED lamps and lanterns testing arrangement, the top cap, after all L ED lamps and lanterns light in the testboard, can lead to light dark sensor and detect and data record the bright dark of the inside L ED lamps and lanterns of testboard respectively, and carry out single control to it through the singlechip rather than mutual switching, and with data transmission to control cabinet, the display through on the control cabinet shows the work of showing L ED lamps and lanterns bright data, be convenient for the tester chooses the selection to L ED lamps and lanterns after the test, improve test quality, ensure later stage L ED lamps and lanterns in service behavior.

Drawings

Fig. 1 is a schematic view of the overall structure of the present invention;

FIG. 2 is a schematic view of the main body of the lamp testing device according to the present invention;

FIG. 3 is a schematic diagram of a partial cross-sectional structure of the test table of the present invention;

fig. 4 is a schematic view of a partial cross-sectional structure of the console of the present invention.

In the figure: 1. lamps and lanterns testing arrangement main part, 2, the testboard, 201, the singlechip, 202, the conductive sensor, 203, lamps and lanterns mounting groove, 204, pilot lamp, 205, the adapter, 3, the top cap, 301, the pulley, 302, the top cap hasp, 303, the light sense control cabinet, 304, the light dark sensor, 4, the master control platform, 5, the base, 6, the control cabinet, 7, the test groove, 8, the spout, 9, the data switching groove, 10, the data adapter, 11, the darkwindow.

Detailed Description

The technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, rather than all embodiments, and all other embodiments obtained by a person of ordinary skill in the art without creative work belong to the protection scope of the present invention based on the embodiments of the present invention.

In the first embodiment, please refer to fig. 1-4, the utility model provides a L ED lamp testing device, including lamp testing device main part 1, testboard 2, top cap 3 and master console 4, the middle fixedly connected with testboard 2 of lamp testing device main part 1, bottom fixedly connected with singlechip 201 in the middle of the inside of testboard 2, the top swing joint of testboard 2 has top cap 3, the bottom fixedly connected with master console 4 of testboard 2, fixedly connected with base 5 around the bottom of master console 4, the inboard embedding in the middle of the front of master console 4 is connected with control cabinet 6, the inboard embedding in the middle of the top of testboard 2 is connected with test groove 7, the inboard embedding of inboard of 7 is connected with a plurality of lamp mounting grooves 203, the other side embedding of lamp mounting groove 203 is connected with pilot lamp 204, the inboard embedding in both sides of the top of testboard 2 is connected with spout 8, the inboard embedding in the middle of one end of testboard 2 is connected with data switching groove 9, the inboard embedding in one.

Preferably, pulleys 301 are fixedly connected to two sides of the bottom of the top cover 3, a top cover latch 302 is connected to the bottom end of the other side of the top cover 3 in an embedded manner, a light sensing console 303 is fixedly connected to the top of one side of the inside of the top cover 3, and a light and dark sensor 304 is linearly connected to the other side of the light sensing console 303.

Preferably, the top end of the single chip microcomputer 201 is linearly connected with the plurality of conductive sensors 202, the conductive sensors 202 are used for mainly detecting the conductive performance and the current output evaluation rate of L ED lamps in real time, firstly, the conductive performance of the L ED lamps is evaluated, if L ED lamps are not lit after being connected with electricity or the lamp source is always in a flickering state, abnormal data are transmitted into the single chip microcomputer 201 at the bottom end through the conductive sensors 202, the single chip microcomputer 201 can control the conductive sensors 202 to start the indicator lamps 204 at the other side of the conductive sensors, test results are directly displayed through the indicator lamps 204, (for example, green lamps pass, yellow lamps are tested again, red lamps are tested unqualified, and the like), and testers can conveniently observe and classify test results of the L ED lamps at later stages.

Preferably, the inside one side embedding of testboard 2 is connected with adapter 205, through adapter 205, it mainly plays when testboard 2 is connected with top cap 3, peg graft each other through data switching groove 9 and data adapter 10, can reach the mutual transmission work of different test data between testboard 2 and the top cap 3, and carry out unified integration and control work to test data through singlechip 201, and with data unified transmission to control cabinet 6 on, show it through the display on the control cabinet 6, be convenient for the tester to observe and data record work, improve test quality.

Preferably, inboard embedding is connected with darkwindow 11 in the middle of the top of top cap 3, through darkwindow 11, can be convenient for the tester observe L ED lamps and lanterns in test groove 7 under top cap 3 closed state, darkwindow 11 itself has adopted the semi-insulating material of light source to make simultaneously, can avoid external light source to constitute the influence to test structure in test groove 7, the tester of also being convenient for simultaneously observes and discovers unusual and timely processing work to L ED lamps and lanterns test condition in test groove 7, has embodied the utility model discloses a practicality.

Preferably, the test bench 2 is composed of a single chip microcomputer 201 at the bottom in the middle of the inside, a conductive sensor 202 at the top end of the single chip microcomputer 201, a lamp mounting groove 203 at the top end of the conductive sensor 202, an indicator lamp 204 at the other end of the lamp mounting groove 203 and an adapter 205 at one side of the inside, firstly, a tester can cut the top cover 3 at the top end of the test bench 2 to one side, then, L ED lamps to be tested are installed in the lamp mounting groove 203 arranged in the test slot 7 one by one, the lamp mounting groove 203 and an existing lamp holder are of the same structure, then, the conductive sensor 202 is arranged at the bottom end of the lamp mounting groove 203, the tester mainly performs real-time detection work on L ED lamp conductive performance and current output evaluation rate, and is convenient for observing L lamp test.

Preferably, the top cover 3 is composed of pulleys 301 on two sides of the bottom, a top cover lock catch 302 at the bottom end of the other side, a light sensation console 303 at the top of one side of the inside and light dark sensors 304 at two ends of the top of the inside, firstly, it needs to be known that the light dark sensors 304 are linearly connected with the light sensation console 303, when all L ED lamps in the test board 2 are lighted, the light dark sensors 304 can respectively detect the brightness of L ED lamps in the test board 2 and record data, and singly control the lamps through the single chip microcomputer 201 mutually switched with the single chip microcomputer, and transmit the data to the console 6, the brightness data of L ED lamps are displayed through the console 6, so that testers can select L ED lamps after the test is finished, the test quality is improved, and the use condition of later-stage L ED lamps is ensured.

The working principle is as follows: firstly, the adaptor 205 is mainly used for achieving mutual transmission work of different test data between the test board 2 and the top cover 3 by inserting the data adaptor 10 into the data adaptor groove 9 when the test board 2 is connected with the top cover 3, performing unified integration and control work on the test data through the single chip microcomputer 201, transmitting the data to the control board 6 in a unified manner, displaying the data through a display on the control board 6, facilitating observation and data recording work of testers and improving test quality;

then, a tester can cut the top cover 3 at the top end of the test platform 2 to one side, then L ED lamps to be tested are installed in the lamp installation grooves 203 arranged in the test groove 7 one by one, the lamp installation grooves 203 and the existing lamp holder are in the same structure, then the test platform mainly performs real-time detection work on the conductivity and the current output evaluation rate of the L ED lamps through the conductive sensor 202, firstly, the conductivity of the L ED lamps is evaluated, for example, when the L ED lamps are not bright after being connected with electricity or the lamp source is always in a flickering state, abnormal data can be transmitted to the single chip microcomputer 201 at the bottom end through the conductive sensor 202, the single chip microcomputer 201 can control the conductive sensor 202 to start the indicator lamps 204 at the other side, and the test results can be directly displayed through the indicator lamps 204 (for example, green lamps pass, yellow lamps test again, red lamps test fail and the like), so that the tester can conveniently observe L ED lamp test results and perform later stage classification work;

next, it is required to know that the light and dark sensor 304 is linearly connected with the light sensation console 303, when all L ED lamps in the test board 2 are lighted, the light and dark sensor 304 can be used for respectively detecting the brightness of L ED lamps in the test board 2 and recording data, the lamps are singly controlled by the single chip microcomputer 201 which is mutually connected with the lamps, the data are transmitted to the console 6, the brightness data of L ED lamps are displayed by the console 6, so that testers can conveniently select the L ED lamps after the test is finished, the test quality is improved, and the use condition of the L ED lamps in the later period is ensured;

finally, through darkwindow 11, can be convenient for the tester observe L ED lamps and lanterns in testing groove 7 under the closed state of top cap 3, darkwindow 11 itself has adopted the semi-insulating material of light source to make simultaneously, can avoid external light source to constitute the influence to test structure in testing groove 7, and the tester of also being convenient for simultaneously observes and discovers unusual and in time handle work to L ED lamps and lanterns test condition in testing groove 7, has embodied the utility model discloses a practicality, this is this kind of L ED lamps and lanterns testing arrangement's theory of operation.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. The L ED lamp testing device comprises a lamp testing device main body (1), a testing platform (2), a top cover (3) and a main control platform (4), and is characterized in that the middle of the lamp testing device main body (1) is fixedly connected with the testing platform (2), the bottom of the interior of the testing platform (2) is fixedly connected with a single chip microcomputer (201), the top end of the testing platform (2) is movably connected with the top cover (3), the bottom of the testing platform (2) is fixedly connected with the main control platform (4), the bottom of the main control platform (4) is fixedly connected with a base (5) all around, the front middle inner side of the main control platform (4) is embedded and connected with a control platform (6), the top middle inner side of the testing platform (2) is embedded and connected with a testing groove (7), the inner side of the testing groove (7) is embedded and connected with a plurality of lamp mounting grooves (203), the other side of the lamp mounting grooves (203) is embedded and connected with an indicator lamp (204), the inner sides of the top end of the testing platform (2) are embedded and connected with a sliding groove (8), the inner side of one end of.

2. The L ED lamp testing device according to claim 1, wherein pulleys (301) are fixedly connected to two sides of the bottom of the top cover (3), a top cover lock catch (302) is connected to the bottom end of the other side of the top cover (3) in an embedded manner, a light sensing console (303) is fixedly connected to the top of one side of the inside of the top cover (3), and a light and dark sensor (304) is linearly connected to the other side of the light sensing console (303).

3. The L ED lamp testing device of claim 1, wherein the top end of the single chip microcomputer (201) is linearly connected with a plurality of conductive sensors (202).

4. An L ED luminaire testing device according to claim 1, characterized in that an adaptor (205) is embedded and connected to one side of the interior of the testing table (2).

5. An L ED lamp testing device according to claim 1, wherein the top end of the top cover (3) is embedded and connected with a dark window (11) at the inner side of the middle.

6. The L ED lamp testing device according to claim 1, wherein the testing platform (2) is composed of a single chip microcomputer (201) at the bottom of the middle of the interior, a conductive sensor (202) at the top end of the single chip microcomputer (201), a lamp mounting groove (203) at the top end of the conductive sensor (202), an indicator lamp (204) at the other end of the lamp mounting groove (203), and an adapter (205) at one side of the interior.

7. The L ED lamp testing device of claim 1, wherein the top cover (3) is composed of pulleys (301) at two sides of the bottom, a top cover lock catch (302) at the bottom end of the other side, a light sensation console (303) at the top of one side of the inside, and light and dark sensors (304) at two ends of the top of the inside.