CN102486534A - Photoelectric parameter measuring system of LED fluorescent lamp - Google Patents

Photoelectric parameter measuring system of LED fluorescent lamp Download PDF

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Publication number
CN102486534A
CN102486534A CN2010105678893A CN201010567889A CN102486534A CN 102486534 A CN102486534 A CN 102486534A CN 2010105678893 A CN2010105678893 A CN 2010105678893A CN 201010567889 A CN201010567889 A CN 201010567889A CN 102486534 A CN102486534 A CN 102486534A
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China
Prior art keywords
tester
luminous flux
photoelectric
led lamp
measured
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Pending
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CN2010105678893A
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Chinese (zh)
Inventor
胡剑峰
张超
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Xian Dayu Optoelectronic Technology Co Ltd
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Xian Dayu Optoelectronic Technology Co Ltd
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Priority to CN2010105678893A priority Critical patent/CN102486534A/en
Publication of CN102486534A publication Critical patent/CN102486534A/en
Pending legal-status Critical Current

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Abstract

The invention discloses a photoelectric parameter measuring system of an LED fluorescent lamp. The system comprises: an alternating current electric quantity tester; an integrating sphere, which is used for carrying out multi-time reflection on lights emitted by a measured LED lamp; a photoelectric probe, which is laid at an inner side of the integrating sphere; a luminous flux tester, which is used for carrying out testing on a luminous flux of the measured LED lamp; a test analytical system, which is used for carrying out analytical processing on signals that are tested by the alternating current electric quantity tester and the luminous flux tester, correspondedly carrying out determination on a photoelectric performance of the luminous flux tester according to a result by the analytical processing and automatically deducing whether the measured LED lamp is replaced or not according to a determined result; and a replacing prompting device, which is used for using the test analytical system to carry out controlling. Besides, the laying position of the photoelectric probe is rightly opposite to the laying position of the measured LED lamp. According to the invention, the system has advantages of simple structure and operation, high intelligent degree, good using effect, high testing efficiency, and comprehensive function; moreover, photoelectric performance testing and automatic replacing prompting processes of an LED fluorescent lamp can be conveniently completed with high efficiency.

Description

LED daylight lamp photoelectric parameter measuring system
Technical field
The present invention relates to a kind of photoelectric parameter measuring system, especially relate to a kind of LED daylight lamp photoelectric parameter measuring system.
Background technology
The LED daylight lamp is a semi-conductor lighting lamp, as light source, because of it is a kind of solid-state cold light source, has characteristics such as environment friendly and pollution-free, little power consumption, light efficiency is high, the life-span is long with light emitting diode.The LED daylight lamp develops rapidly at home in recent years; Also obtained simultaneously using widely; Given this, be badly in need of a kind ofly carrying out accurately, measuring fast and can judge whether need intelligent photoelectric parameter measuring apparatus that LED daylight lamp to be tested is changed to photoelectric properties such as the power of LED daylight lamp, luminous flux, light efficiencies according to measurement result.
Summary of the invention
Technical matters to be solved by this invention is to above-mentioned deficiency of the prior art; A kind of LED daylight lamp photoelectric parameter measuring system is provided; Its degree height simple in structure, easy and simple to handle, intelligent and result of use is good, testing efficiency is high, complete function, the photoelectric properties test that can accomplish the LED daylight lamp simply, efficiently with change the prompting process automatically.
For solving the problems of the technologies described above; The technical scheme that the present invention adopts is: a kind of LED daylight lamp photoelectric parameter measuring system; It is characterized in that: comprise ac electric tester that working current, WV, power and power factor to measured LED lamp detect synchronously in real time, measured LED lamp emitted light is repeatedly reflected with the integrating sphere effectively measured, is laid in the inboard photoelectric probe of integrating sphere, the luminous flux tester the luminous flux of measured LED lamp tested through photoelectric probe, ac electric tester and luminous flux tester institute test signal carried out analyzing and processing and judged and whether infer detecting and analysing system that measured LED lamp is changed and the replacing prompting device of being controlled by detecting and analysing system automatically according to judged result according to the photoelectric properties that analysis processing result is tackled measured LED lamp mutually; Said ac electric tester and measured LED lamp join and it is serially connected in the current supply circuit of measured LED lamp; Said ac electric tester and luminous flux tester all join with detecting and analysing system; And change prompting device and detecting and analysing system and join, said photoelectric probe and luminous flux tester join; The installation position of the installation position of said photoelectric probe and measured LED lamp over against.
Above-mentioned LED daylight lamp photoelectric parameter measuring system, it is characterized in that: said ac electric tester and luminous flux tester all carry out two-way communication through serial ports and detecting and analysing system.
Above-mentioned LED daylight lamp photoelectric parameter measuring system, it is characterized in that: said detecting and analysing system is a PC.
Above-mentioned LED daylight lamp photoelectric parameter measuring system is characterized in that: also comprise the upper monitoring machine that joins with communication and detecting and analysing system.
The present invention compared with prior art has the following advantages:
1, simple in structure, cost is low and each assembly is easy for installation.
2, use easy and simple to handle and realize convenient, testing efficiency is high; Mainly comprise ac electric tester, integrating sphere, photoelectric probe, luminous flux tester, detecting and analysing system, change prompting device and upper monitoring machine, wherein the ac electric tester is measured electric current, voltage, power and the power factor of LED daylight lamp in real time; Photoelectric probe places in the integrating sphere and the luminous flux tester passes through the luminous flux that photoelectric probe is measured the LED daylight lamp; Because LED light has good directivity; Installation position to photoelectric probe during actual measurement requires and strictness; Thereby adopt integrating sphere to make light path repeatedly reflect among the present invention, reach the purpose of gathering LED light path information accurately and effectively; Said detecting and analysing system carries out comprehensive analysis processing through internal processes to ac electric tester and luminous flux tester institute test result; Whether and the photoelectric properties of the measured LED lamp of corresponding judgement and duty, need change etc., and detecting and analysing system carries out corresponding control according to result of determination to changing prompting device.
3, result of use is good and practical value is high, and the present invention can carry out high performance measurement to the LED daylight lamp, comprises power, luminous flux, light efficiency etc., is convenient to confirming LED daylight lamp photoelectric properties.In measuring process, the photometry probe places in the integrating sphere, gathers the light signal of LED daylight lamp.Luminous flux tester and ac electric tester are delivered to main control computer with measurement result.Thereby the present invention can carry out high performance measurement to the LED daylight lamp, comprises power, luminous flux, light efficiency etc., be convenient to the confirming of LED daylight lamp photoelectric properties, and can be according to confirming that the result carry out corresponding control to changing prompting device.Thereby the present invention can effectively solve the test of LED daylight lamp photoelectric properties and be difficult for implementing, measuring difficult problem.
In sum, the present invention's degree height simple in structure, easy and simple to handle, intelligent and result of use is good, testing efficiency is high, complete function, the photoelectric properties test that can accomplish the LED daylight lamp simply, efficiently with change the prompting process automatically.
Through accompanying drawing and embodiment, technical scheme of the present invention is done further detailed description below.
Description of drawings
Fig. 1 is a schematic block circuit diagram of the present invention.
Description of reference numerals:
The measured LED lamp of 1-; 2-ac electric tester; The 3-integrating sphere;
The 4-photoelectric probe; 5-luminous flux tester; The 6-detecting and analysing system;
7-changes prompting device; 8-upper monitoring machine.
Embodiment
As shown in Figure 1; The present invention includes ac electric tester 2 that working current, WV, power and power factor to measured LED lamp 1 detect synchronously in real time, measured LED lamp 1 emitted light is repeatedly reflected with the integrating sphere 3 effectively measured, is laid in the inboard photoelectric probe 4 of integrating sphere 3, the luminous flux tester 5 tested through the luminous flux of 4 pairs of measured LED lamps 1 of photoelectric probe, 5 test signals of ac electric tester 2 and luminous flux tester carried out analyzing and processing and judged and whether infer detecting and analysing system 6 that measured LED lamp 1 is changed and the replacing prompting device of being controlled by detecting and analysing system 67 automatically according to judged result according to the photoelectric properties that analysis processing result is tackled measured LED lamp 1 mutually; Said ac electric tester 2 joins with measured LED lamp 1 and it is serially connected in the current supply circuit of measured LED lamp 1; Said ac electric tester 2 all joins with detecting and analysing system 6 with luminous flux tester 5; And change prompting device 7 and join with detecting and analysing system 6, said photoelectric probe 4 is joined with luminous flux tester 5.During actual the laying, the installation position of the installation position of said photoelectric probe 4 and measured LED lamp 1 over against.
In the present embodiment, said ac electric tester 2 all carries out two-way communication through serial ports and detecting and analysing system 6 with luminous flux tester 5.Said detecting and analysing system 6 is a PC.In the actual use, for realizing remote monitoring, the present invention also comprises the upper monitoring machine 8 that joins with communication and detecting and analysing system 6.
In the actual use, working current, WV, power and the power factor of 2 pairs of measured LED lamps 1 of said ac electric tester are measured in real time, and measured signal Synchronization is sent to detecting and analysing system 6; Photoelectric probe 4 places the inside of integrating sphere 3, and luminous flux tester 5 is measured through the luminous flux of 4 pairs of measured LED lamps 1 of photoelectric probe; After measured LED lamp 1 repeatedly reflects in integrating sphere 3; Built-in photoelectric probe 4 is delivered to luminous flux tester 5 with the light signal of gathering; Luminous flux tester 5 again with the luminous flux test result synchronous driving of being tested to detecting and analysing system 6; Whether detecting and analysing system 6 carries out comprehensive analysis processing through internal processes to ac electric tester 2 and 5 test results of luminous flux tester, and the photoelectric properties of the measured LED lamp 1 of corresponding judgement and duty, need change etc.When photoelectric properties and the duty that draws measured LED lamp 1 when judgement do not meet preset requirement, then carry out corresponding control to changing prompting device 7.
The above; It only is preferred embodiment of the present invention; Be not that the present invention is done any restriction, every technical spirit changes any simple modification, change and the equivalent structure that above embodiment did according to the present invention, all still belongs in the protection domain of technical scheme of the present invention.

Claims (4)

1. LED daylight lamp photoelectric parameter measuring system; It is characterized in that: comprise ac electric tester (2) that working current, WV, power and power factor to measured LED lamp (1) detect synchronously in real time, measured LED lamp (1) emitted light is repeatedly reflected with the integrating sphere (3) effectively measured, is laid in the inboard photoelectric probe (4) of integrating sphere (3), the luminous flux tester (5) the luminous flux of measured LED lamp (1) tested through photoelectric probe (4), ac electric tester (2) and luminous flux tester (5) institute test signal carried out analyzing and processing and judged and whether infer detecting and analysing system (6) that measured LED lamp (1) is changed and the replacing prompting device of being controlled by detecting and analysing system (6) (7) automatically according to judged result according to the photoelectric properties that analysis processing result is tackled measured LED lamp (1) mutually; Said ac electric tester (2) joins with measured LED lamp (1) and it is serially connected in the current supply circuit of measured LED lamp (1); Said ac electric tester (2) and luminous flux tester (5) all join with detecting and analysing system (6); And change prompting device (7) and join with detecting and analysing system (6), said photoelectric probe (4) is joined with luminous flux tester (5); The installation position of the installation position of said photoelectric probe (4) and measured LED lamp (1) over against.
2. according to the described LED daylight lamp of claim 1 photoelectric parameter measuring system, it is characterized in that: said ac electric tester (2) and luminous flux tester (5) all carry out two-way communication through serial ports and detecting and analysing system (6).
3. according to claim 1 or 2 described LED daylight lamp photoelectric parameter measuring systems, it is characterized in that: said detecting and analysing system (6) is a PC.
4. according to claim 1 or 2 described LED daylight lamp photoelectric parameter measuring systems, it is characterized in that: also comprise the upper monitoring machine (8) that joins with communication and detecting and analysing system (6).
CN2010105678893A 2010-12-01 2010-12-01 Photoelectric parameter measuring system of LED fluorescent lamp Pending CN102486534A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
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Application Number Priority Date Filing Date Title
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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103292977A (en) * 2012-12-17 2013-09-11 天津思博科科技发展有限公司 LED street lamp optical parameter online collecting device
CN104483017A (en) * 2014-12-02 2015-04-01 科世达(上海)管理有限公司 Method and device for calibrating and correcting errors of light quantity sensor
WO2015067012A1 (en) * 2013-11-06 2015-05-14 Zhejiang Shenghui Lighting Co.,Ltd Electrical circuit and method for measuring power consumption of led lighting device
CN104730471A (en) * 2015-04-16 2015-06-24 顺德职业技术学院 LED lamp testing circuit
CN104779325A (en) * 2014-01-10 2015-07-15 先进科技新加坡有限公司 LED test process and correction method for same
CN108196206A (en) * 2017-05-31 2018-06-22 北京西门子西伯乐斯电子有限公司 Stroboscopic lamp luminous efficiency measurement system, method and storage medium

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CN1959366A (en) * 2006-11-30 2007-05-09 复旦大学 Luminous flux measurement device of using standard light source in narrow beam for LED, and testing method
CN101430223A (en) * 2008-09-28 2009-05-13 上海半导体照明工程技术研究中心 LED instantaneous light flux test method and apparatus in PWM activation technology
US20100079747A1 (en) * 2008-10-01 2010-04-01 Park Seong Chong Instrument and method for measuring total luminous flux of luminous elements
US20100296082A1 (en) * 2009-05-22 2010-11-25 Otsuka Electronics Co., Ltd. Apparatus and method for measuring total luminous flux
CN201955458U (en) * 2010-12-01 2011-08-31 西安大昱光电科技有限公司 LED fluorescent lamp photoelectrical parameter measuring system

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1758036A (en) * 2005-07-26 2006-04-12 潘建根 Integrating light radiation degree measuring system and method with spectrum analysis correction
CN1959366A (en) * 2006-11-30 2007-05-09 复旦大学 Luminous flux measurement device of using standard light source in narrow beam for LED, and testing method
CN101430223A (en) * 2008-09-28 2009-05-13 上海半导体照明工程技术研究中心 LED instantaneous light flux test method and apparatus in PWM activation technology
US20100079747A1 (en) * 2008-10-01 2010-04-01 Park Seong Chong Instrument and method for measuring total luminous flux of luminous elements
US20100296082A1 (en) * 2009-05-22 2010-11-25 Otsuka Electronics Co., Ltd. Apparatus and method for measuring total luminous flux
CN201955458U (en) * 2010-12-01 2011-08-31 西安大昱光电科技有限公司 LED fluorescent lamp photoelectrical parameter measuring system

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103292977A (en) * 2012-12-17 2013-09-11 天津思博科科技发展有限公司 LED street lamp optical parameter online collecting device
WO2015067012A1 (en) * 2013-11-06 2015-05-14 Zhejiang Shenghui Lighting Co.,Ltd Electrical circuit and method for measuring power consumption of led lighting device
CN104779325A (en) * 2014-01-10 2015-07-15 先进科技新加坡有限公司 LED test process and correction method for same
CN104779325B (en) * 2014-01-10 2017-08-25 先进科技新加坡有限公司 LED testing process and for this modification method
CN104483017A (en) * 2014-12-02 2015-04-01 科世达(上海)管理有限公司 Method and device for calibrating and correcting errors of light quantity sensor
CN104483017B (en) * 2014-12-02 2018-07-10 科世达(上海)管理有限公司 The error calibration modification method and device of optical sensors
CN104730471A (en) * 2015-04-16 2015-06-24 顺德职业技术学院 LED lamp testing circuit
CN108196206A (en) * 2017-05-31 2018-06-22 北京西门子西伯乐斯电子有限公司 Stroboscopic lamp luminous efficiency measurement system, method and storage medium
CN108196206B (en) * 2017-05-31 2020-08-18 北京西门子西伯乐斯电子有限公司 System and method for measuring luminous efficiency of stroboscopic lamp and storage medium

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Application publication date: 20120606