CN210954236U - Diode test seat - Google Patents
Diode test seat Download PDFInfo
- Publication number
- CN210954236U CN210954236U CN201921781054.0U CN201921781054U CN210954236U CN 210954236 U CN210954236 U CN 210954236U CN 201921781054 U CN201921781054 U CN 201921781054U CN 210954236 U CN210954236 U CN 210954236U
- Authority
- CN
- China
- Prior art keywords
- base
- groove
- pen
- diode
- mounting hole
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 43
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 5
- 229910052709 silver Inorganic materials 0.000 claims description 5
- 239000004332 silver Substances 0.000 claims description 5
- 230000006978 adaptation Effects 0.000 claims 1
- 238000012372 quality testing Methods 0.000 abstract description 13
- 238000013522 software testing Methods 0.000 abstract description 3
- 238000007689 inspection Methods 0.000 description 4
- 238000001514 detection method Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Images
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses a diode test seat, including the base, the lower fixed surface of base is connected with the supporting leg, and a plurality of supporting legs are rectangular array at the lower surface of base and distribute, and first mounting hole and second mounting hole have been seted up respectively to the upper surface of base, and first mounting hole and second mounting hole all are rectangular array at the upper surface of base and distribute, and the back of base is provided with testing arrangement, and testing arrangement is including the connecting block, the front of connecting block and the back fixed connection of base. This diode test seat is provided with testing arrangement through the back that sets up the base, and testing arrangement is including the connecting block, the front of connecting block and the back fixed connection of base to have quality testing personnel when needing to test not unidimensional diode body, effectively improve quality testing personnel to diode body efficiency of software testing's characteristics through using this device.
Description
Technical Field
The utility model relates to the field of semiconductor technology, more specifically say, it relates to a diode test seat.
Background
In a diode electronic component, a device with two electrodes only allows current to flow in a single direction, many of the devices use the function of rectification, and a varactor diode is used as an electronic adjustable capacitor, most diodes have the current directivity which is generally called as the function of rectification, and the most common function of the diode is to allow current to flow in a single direction only and block the current in the reverse direction, so the diode can be thought of as an electronic check valve.
After the diode is manufactured, sampling quality inspection needs to be carried out on the diode by quality inspection personnel, and the conventional method for testing the diode by the quality inspection personnel usually comprises the steps of firstly extracting the diode manufactured by the quality inspection personnel and then testing the diode in batches by a universal meter.
SUMMERY OF THE UTILITY MODEL
Not enough to prior art exists, the utility model aims to provide a diode test seat, it has when testing not unidimensional diode, improves quality testing personnel efficiency of software testing's characteristics.
In order to achieve the above purpose, the utility model provides a following technical scheme:
the utility model provides a diode test seat, includes the base, and the lower fixed surface of base is connected with the supporting leg, and a plurality of supporting legs are rectangular array and distribute at the lower surface of base, and first mounting hole and second mounting hole have been seted up respectively to the upper surface of base, and first mounting hole and second mounting hole all are rectangular array and distribute at the upper surface of base, and the back of base is provided with testing arrangement, and testing arrangement is including the connecting block, the front of connecting block and the back fixed connection of base.
Further, first standing groove and second standing groove have been seted up respectively to the upper surface of connecting block, and the cross-section of first standing groove and second standing groove all is half circular shape, and a plurality of first standing grooves and second standing groove all are the rectangular array and distribute at the upper surface of connecting block.
Furthermore, the inner wall of the first placing groove is movably connected with a positive meter pen, the inner wall of the second placing groove is movably connected with a negative meter pen, the back surface of the base is respectively provided with a first mounting groove and a second mounting groove, and the first mounting grooves and the second mounting grooves are distributed on the back surface of the base in a rectangular array;
through above-mentioned technical scheme, positive pen-shape metre uses with the cooperation of first standing groove, and negative pen-shape metre uses with the cooperation of second standing groove, is convenient for support respectively well pen-shape metre and negative pen-shape metre fixedly, effectively improves quality testing personnel's detection efficiency.
Furthermore, the diode body is sleeved on the inner wall of the first mounting hole and the inner wall of the second mounting hole in a sliding mode, the inner bottom wall of the first mounting groove and the inner bottom wall of the second mounting groove are fixedly connected with contact rods, multimeters are arranged on the back face of the positive meter pen and the back face of the negative meter pen, and the positive meter pen and the negative meter pen are electrically connected with the multimeters;
through above-mentioned technical scheme, the first mounting hole and the second mounting hole of different positions correspond not unidimensional diode body to be convenient for quality testing personnel test not unidimensional diode body.
Furthermore, the contact rod is made of silver materials, a semicircular hole is formed in the outer surface of the contact rod, the inner wall of the semicircular hole is in sliding sleeve connection with the outer surface of the diode body, a clamping groove is formed in the back surface of the contact rod, and the section of the clamping groove is conical;
through above-mentioned technical scheme, the contact rod is made by silver material because silver has good electric conductivity.
Furthermore, the inner wall of the semicircular hole is matched with the outer surface of the diode, and the outer surface of the positive meter pen and the outer surface of the negative meter pen are both clamped with the inner wall of the clamping groove;
through above-mentioned technical scheme, positive pen-shape metre and burden pen-shape metre and draw-in groove joint to the quality testing personnel of being convenient for test the diode body.
Furthermore, the axes of the first mounting hole, the first mounting groove, the clamping groove and the first placing groove are all located on the same axis, and the outer surface of the positive meter pen and the outer surface of the negative meter pen are both matched with the inner wall of the clamping groove;
through above-mentioned technical scheme, the axis of first mounting hole, first mounting groove, draw-in groove and first standing groove all is located the same axis to the concentricity has been guaranteed.
To sum up, the utility model discloses following beneficial effect has:
be provided with testing arrangement through the back that sets up the base, and testing arrangement is including the connecting block, the front of connecting block and the back fixed connection of base to have quality testing personnel when needing to test diode body not unidimensional, effectively improve quality testing personnel to diode body efficiency of software testing's characteristics through using this device.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a cross-sectional view of the base structure of the present invention;
FIG. 3 is a top view of the base structure of the present invention;
FIG. 4 is a rear view of the base structure of the present invention;
fig. 5 is a perspective view of the contact rod structure of the present invention.
In the figure: 1. a base; 2. supporting legs; 3. a first mounting hole; 4. a second mounting hole; 5. connecting blocks; 51. a first placing groove; 52. a second placing groove; 53. a watch correcting pen; 54. a negative meter pen; 55. a first mounting groove; 56. a second mounting groove; 57. a diode body; 58. a contact bar; 59. a universal meter; 510. a semicircular hole; 511. a clamping groove.
Detailed Description
Example (b):
the present invention will be described in further detail with reference to fig. 1 to 5.
The utility model provides a diode test seat, as shown in fig. 1-4, including base 1, the lower fixed surface of base 1 is connected with supporting leg 2, a plurality of supporting legs 2 are rectangular array at the lower surface of base 1 and distribute, first mounting hole 3 and second mounting hole 4 have been seted up respectively to the upper surface of base 1, first mounting hole 3 and second mounting hole 4 all are rectangular array at the upper surface of base 1 and distribute, the back of base 1 is provided with testing arrangement, and testing arrangement is including connecting block 5, the front of connecting block 5 and the back fixed connection of base 1.
As shown in fig. 1 to 3, further, a first placing groove 51 and a second placing groove 52 are respectively formed in the upper surface of the connecting block 5, the cross sections of the first placing groove 51 and the second placing groove 52 are both semicircular, and a plurality of first placing grooves 51 and a plurality of second placing grooves 52 are distributed in a rectangular array on the upper surface of the connecting block 5;
as shown in fig. 1 to 4, further, a positive meter pen 53 is movably connected to an inner wall of the first placing groove 51, a negative meter pen 54 is movably connected to an inner wall of the second placing groove 52, a first mounting groove 55 and a second mounting groove 56 are respectively formed in the back surface of the base 1, and the plurality of first mounting grooves 55 and the plurality of second mounting grooves 56 are distributed in a rectangular array on the back surface of the base 1;
as shown in fig. 1 to 5, further, the inner walls of the first mounting hole 3 and the second mounting hole 4 are both slidably sleeved with a diode body 57, the inner bottom wall of the first mounting groove 55 and the inner bottom wall of the second mounting groove 56 are both fixedly connected with contact bars 58, the back surfaces of the positive meter pen 53 and the negative meter pen 54 are both provided with a multimeter 59, and the positive meter pen 53 and the negative meter pen 54 are both electrically connected with the multimeter 59;
as shown in fig. 1 to 5, further, the contact rod 58 is made of a silver material, a semicircular hole 510 is formed in the outer surface of the contact rod 58, the inner wall of the semicircular hole 510 is slidably sleeved with the outer surface of the diode body 57, a clamping groove 511 is formed in the back surface of the contact rod 58, and the section of the clamping groove 511 is conical;
as shown in fig. 1-5, further, the inner wall of the semicircular hole 510 is matched with the outer surface of the diode, and the outer surface of the positive meter pen 53 and the outer surface of the negative meter pen 54 are both clamped with the inner wall of the clamping groove 511;
as shown in fig. 1 to 5, further, the axes of the first mounting hole 3, the first mounting groove 55, the card slot 511 and the first placement groove 51 are all located on the same axis, and the outer surface of the positive meter pen 53 and the outer surface of the negative meter pen 54 are all adapted to the inner wall of the card slot 511;
as shown in fig. 1-4, further, a testing device is arranged on the back surface of the base 1, and the testing device includes a connecting block 5, and the front surface of the connecting block 5 is fixedly connected with the back surface of the base 1, so that the device has the characteristic that when quality testing personnel need to test diode bodies 57 with different sizes, the testing efficiency of the quality testing personnel on the diode bodies 57 is effectively improved by using the device;
the working principle is as follows: step one, preparation work is carried out, when quality testing personnel need to test the manufactured diode body 57, the quality testing personnel firstly randomly draw from the manufactured diode body 57, the quality testing personnel control the universal meter 59 to start working, then the positive meter pen 53 and the negative meter pen 54 are clamped with the clamping groove 511 on the contact rod 58, and the first placing groove 51 and the second placing groove 52 are arranged to facilitate fixing of the positive meter pen 53 and the negative meter pen 54;
step two, when the test is started, a quality inspector inserts a needed diode body 57 into the first mounting hole 3 and the second mounting hole 4 to contact with the semicircular hole 510 on the contact rod 58, and at the moment, the quality inspector observes a test result from the universal meter 59, and the first mounting hole 3 and the second mounting hole 4 are arranged, so that the first quality inspector can test the diode bodies 57 with different sizes according to the first mounting hole 3 and the second mounting hole 4 at different positions, and the detection efficiency of the quality inspector is improved;
and step three, finally testing the diode bodies 57 with different sizes.
The present embodiment is only for explaining the present invention, and it is not limited to the present invention, and those skilled in the art can make modifications to the present embodiment without inventive contribution as required after reading the present specification, but all of them are protected by patent laws within the scope of the claims of the present invention.
Claims (7)
1. A diode test socket, includes base (1), its characterized in that: the lower fixed surface of base (1) is connected with supporting leg (2), and is a plurality of supporting leg (2) are rectangle array distribution at the lower surface of base (1), first mounting hole (3) and second mounting hole (4) have been seted up respectively to the upper surface of base (1), first mounting hole (3) and second mounting hole (4) all are rectangle array distribution at the upper surface of base (1), the back of base (1) is provided with testing arrangement, and testing arrangement is including connecting block (5), the front of connecting block (5) and the back fixed connection of base (1).
2. The diode test socket of claim 1, wherein: the upper surface of connecting block (5) has seted up first standing groove (51) and second standing groove (52) respectively, the cross-section of first standing groove (51) and second standing groove (52) all is the semicircle form, and is a plurality of first standing groove (51) and second standing groove (52) all are the rectangular array distribution at the upper surface of connecting block (5).
3. The diode test socket of claim 2, wherein: the utility model discloses a table pen, including base (1), first standing groove (51), the inner wall swing joint of first standing groove (51) has positive pen-shape metre (53), the inner wall swing joint of second standing groove (52) has negative pen-shape metre (54), first mounting groove (55) and second mounting groove (56) have been seted up respectively to the back of base (1), and is a plurality of first mounting groove (55) and second mounting groove (56) all are the rectangle array and distribute at the back of base (1).
4. The diode test socket of claim 3, wherein: diode body (57) have all been cup jointed in the sliding of the inner wall of first mounting hole (3) and the inner wall of second mounting hole (4), the equal fixedly connected with contact stick (58) of the interior diapire of first mounting groove (55) and the interior diapire of second mounting groove (56), the back of positive pen-shape metre (53) and the back of negative pen-shape metre (54) all are provided with universal meter (59), positive pen-shape metre (53) and negative pen-shape metre (54) all with universal meter (59) electric connection.
5. The diode test socket of claim 4, wherein: the material of contact stick (58) is made for silver material, semicircle orifice (510) have been seted up to the surface of contact stick (58), the inner wall of semicircle orifice (510) and the surface slip of diode body (57) cup joint, draw-in groove (511) have been seted up to the back of contact stick (58), the cross-section of draw-in groove (511) is conical shape.
6. The diode test socket of claim 5, wherein: the inner wall of semicircle orifice (510) and the surface looks adaptation of diode, the surface of positive meter pen (53) and the surface of negative meter pen (54) all with the inner wall joint of draw-in groove (511).
7. The diode test socket of claim 5, wherein: the axes of the first mounting hole (3), the first mounting groove (55), the clamping groove (511) and the first placing groove (51) are all located on the same axis, and the outer surface of the positive meter pen (53) and the outer surface of the negative meter pen (54) are both matched with the inner wall of the clamping groove (511).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921781054.0U CN210954236U (en) | 2019-10-23 | 2019-10-23 | Diode test seat |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921781054.0U CN210954236U (en) | 2019-10-23 | 2019-10-23 | Diode test seat |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN210954236U true CN210954236U (en) | 2020-07-07 |
Family
ID=71380168
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201921781054.0U Expired - Fee Related CN210954236U (en) | 2019-10-23 | 2019-10-23 | Diode test seat |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN210954236U (en) |
-
2019
- 2019-10-23 CN CN201921781054.0U patent/CN210954236U/en not_active Expired - Fee Related
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN210954236U (en) | Diode test seat | |
| CN218331013U (en) | Pressure resistance detection device suitable for metal display board frame body | |
| CN208833876U (en) | A kind of high voltage resistant testing device of semiconductor chip | |
| CN206405550U (en) | A kind of spark machine quick clip | |
| CN106940412B (en) | System for quick capacitance polarity measurement | |
| CN108286956B (en) | Automatic diameter measuring device for copper wire for photovoltaic transformer | |
| CN205666800U (en) | Suns voc testing arrangement | |
| CN209327385U (en) | A kind of photoelectrical coupler test adapter | |
| CN210360028U (en) | Clamping tool for production and processing of switching power supply | |
| CN107332512B (en) | Solar cell module testing device and method | |
| CN207866968U (en) | A kind of SG2803/DESC series triode array test adapter | |
| CN211318492U (en) | Electrical characteristic testing device for sheet-shaped soft magnetic ferrite magnetic core | |
| CN204043905U (en) | Simple terminal pull-out test instrument | |
| CN201281761Y (en) | Automatic short-circuit automatic connection device for novel single-phase multifunctional electric energy meter calibration stand | |
| CN216669231U (en) | Instrument is used in inspection of tweezers tooth integrality | |
| CN204927449U (en) | Device of test mobile terminal battery | |
| CN203659834U (en) | Silicon chip clamp for plasma etching | |
| CN220399507U (en) | Probe module, resistance test equipment and resistance test system | |
| CN212781145U (en) | Battery voltage and internal resistance detection device with adjusting function | |
| CN217766798U (en) | Multi-port pull-plug testing device | |
| CN212569066U (en) | Voltage testing device for lithium ion battery | |
| CN214672583U (en) | Integrated circuit packaging test device | |
| CN220373036U (en) | Clamp structure for processing electronic components | |
| CN206832887U (en) | A kind of device for determining fruit electrical parameter | |
| CN208276784U (en) | A kind of more size terminals fixing tools |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20200707 |