CN210894427U

CN210894427U - Quick test fixture for deconcentrators

Info

Publication number: CN210894427U
Application number: CN201921469189.3U
Authority: CN
Inventors: 崔强
Original assignee: Shenzhen Ideal Key Electronic Development Co ltd
Current assignee: Shenzhen Ideal Key Electronic Development Co ltd
Priority date: 2019-09-04
Filing date: 2019-09-04
Publication date: 2020-06-30
Anticipated expiration: 2029-09-04

Abstract

The utility model discloses a quick test tool for a wire divider, which relates to the field of conductive connecting devices, and has the technical scheme that the quick test tool comprises a supporting frame, wherein a clamping mechanism for embedding a wiring terminal into a clamping groove and limiting the wiring terminal in the clamping groove is arranged on the supporting frame; a wiring frame is arranged in the supporting frame and comprises a PCB circuit board, a conductive probe and an external wire, wherein the conductive probe is in conductive connection with the PCB circuit board; the wiring frame is slidably sleeved inside the supporting frame, and the supporting frame is provided with a pressing mechanism and a return elastic mechanism. The technical effect is that, adopt test fixture, utilize fixture to the binding post centre gripping to promote the connection frame through pushing down the mechanism and slide in supporting frame, butt joint the electrically conductive probe on the PCB circuit board to binding post's conducting part, no longer need take off the bolt on the binding post, avoid loaded down with trivial details manual operation, install the circular telegram fast and detect, save the cost of labor.

Description

Quick test fixture for deconcentrators

Technical Field

The utility model relates to an electrically conductive connecting device field, in particular to quick test fixture of line splitter.

Background

In the electronic field such as a communication cabinet, an electrical appliance cabinet or a power distribution cabinet, a connecting terminal is used as a conductive element and is required to be arranged on the outer side of a cabinet body generally, the products are required to be subjected to product function testing or maintenance testing or aging testing, conductive connection is inevitably required in the testing process, the traditional mode is that the conductive part of a testing device is connected to the conductive part of a connecting terminal, the connecting part of the connecting terminal is generally composed of a copper sheet and a nut, and the conductive sheet of the conductive wire of a detection device is required to be embedded on the copper sheet of the connecting terminal and is screwed and fixed by the nut. When the required detection position is changed every time, bolts on each wiring terminal need to be unscrewed respectively, and then the next detection position is installed and fixed. The detection process is extremely inefficient because of the inconvenience of the conductive connection.

SUMMERY OF THE UTILITY MODEL

The utility model aims at providing a quick test fixture of line divider, it has quick electrically conductive switch-on binding post, is convenient for form electrically conductive test, and the fast-assembling promotes efficiency of software testing's advantage.

The above technical purpose of the present invention can be achieved by the following technical solutions:

a quick test tool for a wire divider comprises a supporting frame, wherein a clamping mechanism for embedding a wiring terminal into a clamping groove and limiting the wiring terminal in the clamping groove is arranged on the supporting frame;

a wiring frame is arranged in the supporting frame and comprises a PCB circuit board, a conductive probe and an external wire, wherein the conductive probe is in conductive connection with the PCB circuit board;

the wiring frame is sleeved inside the supporting frame in a sliding mode, a pressing mechanism which drives the wiring frame to slide and is linked with the conductive probe to slide into the clamping groove to abut against the wiring terminal and an elastic mechanism which provides restoring force for the wiring frame when the pressing mechanism is in a contact pressing state are arranged on the supporting frame.

Through adopting above-mentioned technical scheme, adopt test fixture, utilize fixture to the terminal centre gripping of binding post to promote the wiring frame through pushing down the mechanism and slide in supporting frame, butt joint the conductive probe on the PCB circuit board to binding post's conducting part, no longer need take off the bolt on the binding post, avoid loaded down with trivial details manual operation, install the circular telegram fast and detect, save the cost of labor.

Further setting: the clamping mechanism comprises a lever, a hook part and a locking block, wherein the lever is pivoted to the supporting frame from the middle section, the hook part is arranged at one end of the lever, the locking block is arranged at the other end of the lever, the locking block is of a cam structure and is pivoted with the lever, the lever enables the hook part to rotatably extend into the clamping groove according to the pivoting of the middle section, and the locking block at one end of the lever is rotatably abutted to the side edge of the supporting frame to enable the hook part at the other end to be abutted to a wiring terminal.

By adopting the technical scheme, the hook part at the bottom of the lever of the clamping mechanism can rotate to the clamping groove to clamp and fix the wire terminal, and the clamping state can be released through the lever.

Further setting: the pressing mechanism is a quick clamp.

By adopting the technical scheme, the quick clamp provides a downward power source to drive the wiring frame to move.

Further setting: the wiring frame sets up down including the casing that is the setting of tube-shape, the opening of casing, the casing is located opening one side and is equipped with the probe card, and on the probe card was fixed in the casing, the PCB circuit board was located in the casing through column mouting to the probe card on, conductive probe was located on the PCB circuit board and was worn to establish to the probe card on, and the afterbody that pushes down the mechanism and be used in the casing moves in the lump with linkage probe card, PCB circuit board and conductive probe.

By adopting the technical scheme, the wiring frame is detachable, the internal PCB can be independently replaced, and the circuit board is adaptive to various test types.

Further setting: the elastic mechanism comprises a guide post connected on the probe board in a sliding manner, a first slideway for the guide post to be connected in a sliding manner and an elastic piece arranged in the first slideway and used for driving the guide post to eject.

Through adopting above-mentioned technical scheme, the effort of pushing down the mechanism is relieved the back, and elastic mechanism provides the power that the connection frame replied for conductive probe breaks away from binding post.

Further setting: the probe board is provided with a sliding block, the sliding block is provided with a second slide way for installing a guide pillar and an elastic piece, one side of the guide pillar, back to the PCB, is provided with a bolt, one end of the elastic piece props against the bolt, and the other end of the elastic piece props against the bottom wall of the second slide way of the sliding block.

Through adopting above-mentioned technical scheme, the second slide on the slider provides the storage space after the elastic component is compressed, and the structure is more reasonable.

Further setting: the second slide is provided with a through hole for the guide pillar to penetrate through, and the guide pillar is abutted against the PCB.

Through adopting above-mentioned technical scheme, the through-hole on the second slide can supply the guide pillar to pass, provides bigger resilience length.

Drawings

FIG. 1 is a schematic structural diagram of a quick test tool for a wire divider;

FIG. 2 is a schematic diagram of the internal structure of the quick test fixture for the wire dividers;

FIG. 3 is a schematic view of the construction of the wire frame;

fig. 4 is a schematic structural view of the elastic mechanism.

In the figure, 1, a support frame; 2. a clamping groove; 3. a lever; 4. a hook portion; 5. a locking block; 6. a clamping mechanism; 7. a wiring terminal; 8. a wiring frame; 9. a pressing mechanism; 10. a PCB circuit board; 11. a conductive probe; 12. external connection; 13. a housing; 14. a probe card; 15. an elastic mechanism; 16. a guide post; 17. a first slideway; 18. an elastic member; 19. a slider; 20. a bolt; 21. and a through hole.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings.

First preferred embodiment:

a quick test tool for a wire divider is shown in figure 1 and comprises a supporting frame 1, wherein a clamping mechanism 6 for enabling a wire terminal 7 to be embedded into a clamping groove 2 and limiting the wire terminal 7 in the clamping groove 2 is arranged on the supporting frame 1.

The clamping mechanism 6 comprises a lever 3 pivoted to the supporting frame 1 at the middle section, a hook part 4 arranged at one end part of the lever 3 and a locking block 5 arranged at the other end part of the lever 3, wherein the locking block 5 is of a cam structure and is pivoted with the lever 3, the lever 3 enables the hook part 4 to rotate and extend into the clamping groove 2 according to the pivoting of the middle section, and the locking block 5 at one end of the lever 3 is rotationally abutted to the side edge of the supporting frame 1 to enable the hook part 4 at the other end to be abutted to the wiring terminal 7.

As shown in fig. 2 and 3, a wiring frame 8 is arranged inside the supporting frame 1, the wiring frame 8 includes a PCB circuit board 10, a conductive probe 11 electrically connected with the PCB circuit board 10, and an external wire 12, the external wire 12 is laterally connected, and the conductive probe 11 is slidably inserted into the bottom of the supporting frame 1 and extends into the clamping groove 2.

The wiring frame 8 is slidably sleeved inside the supporting frame 1, the supporting frame 1 is provided with a pressing mechanism 9 which drives the wiring frame 8 to slide and is linked with the conductive probe 11 to slide to the clamping groove 2 and abut against the wiring terminal 7, and the pressing mechanism 9 is a rapid clamp.

Specifically, as shown in fig. 3, the connection frame 8 includes a cylindrical housing 13, an opening of the housing 13 is disposed downward, the housing 13 is disposed on one side of the opening and provided with a probe card 14, the probe card 14 is fixed on the housing 13, the PCB circuit board 10 is disposed in the housing 13 and mounted on the probe card 14 through a stand column, the conductive probe 11 is disposed on the PCB circuit board 10 and penetrates through the probe card 14, and the pressing mechanism 9 acts on a tail portion of the housing 13 and moves together with the probe card 14, the PCB circuit board 10 and the conductive probe 11.

As shown in fig. 3 and 4, an elastic mechanism 15 that provides a restoring force of the wire frame 8 when the hold-down mechanism 9 contacts the hold-down state is further included. The elastic mechanism 15 includes a guide post 16 slidably connected to the probe card 14, a first slide 17 for slidably connecting the guide post 16, and an elastic member 18 disposed in the first slide 17 for driving the guide post 16 to eject. The probe card 14 is provided with a slider 19, the slider 19 is provided with a second slide way (the angle problem is not shown in the figure) for installing the guide post 16 and the elastic element 18, one side of the guide post 16, which faces away from the PCB 10, is provided with a bolt 20, one end of the elastic element 18 abuts against the bolt 20, and the other end abuts against the bottom wall of the second slide way of the slider 19. The second slideway is provided with a through hole 21 for the guide post 16 to penetrate through, and the guide post 16 is abutted against the PCB circuit board 10.

When the connection frame 8 is pressed down, the guide post 16 abuts onto the terminal 7, compressing the elastic element 18 into the remaining first and

second slide ways

17, 17 due to the presence of the bolt 20. When the wire frame 8 is released from the depressed state, the elastic member 18 provides a power to return to the rise.

The above-mentioned embodiments are merely illustrative of the present invention, and are not intended to limit the present invention, and those skilled in the art can make modifications of the present embodiments without inventive contribution as required after reading the present specification, but all the embodiments are protected by patent law within the scope of the present invention.

Claims

1. The utility model provides a quick test fixture of wire divider which characterized in that: the clamping device comprises a supporting frame (1), wherein a clamping mechanism (6) for embedding a wiring terminal (7) into a clamping groove (2) and limiting the wiring terminal (7) in the clamping groove (2) is arranged on the supporting frame (1);

a wiring frame (8) is arranged in the supporting frame (1), the wiring frame (8) comprises a PCB (printed circuit board) (10), a conductive probe (11) and an external wire (12), the conductive probe is electrically connected with the PCB (10), the external wire (12) is laterally connected out, and the conductive probe (11) penetrates through the bottom of the supporting frame (1) and slides to the clamping groove (2) and extends into the clamping groove;

the wiring frame (8) is slidably sleeved inside the supporting frame (1), a pressing mechanism (9) which drives the wiring frame (8) to slide and is linked with the conductive probe (11) to slide into the clamping groove (2) and abut against the wiring terminal (7) is arranged on the supporting frame (1), and an elastic mechanism (15) which provides restoring force of the wiring frame (8) is arranged when the pressing mechanism (9) is in a contact pressing state.

2. The quick test fixture for deconcentrators according to claim 1, characterized in that: fixture (6) including middle section pivot to lever (3) on supporting frame (1), locate hook portion (4) of one of them tip of lever (3) and locate latch segment (5) of another tip of lever (3), latch segment (5) are the cam structure and with lever (3) pin joint, lever (3) make hook portion (4) rotatory stretch into to centre gripping groove (2) according to the pivot in middle section, latch segment (5) of lever (3) one end are rotatory to be contradicted and are made hook portion (4) of the other end contradict to binding post (7) on supporting frame (1) side.

3. The quick test fixture for deconcentrators according to claim 1, characterized in that: the pressing mechanism (9) is a quick clamp.

4. The quick test fixture for deconcentrators according to claim 1, characterized in that: connection frame (8) are including casing (13) that are the setting of tube-shape, and the opening of casing (13) sets up down, casing (13) are located opening one side and are equipped with probe card (14), and on probe card (14) were fixed in casing (13), PCB circuit board (10) were located casing (13) and pass through column mouting to probe card (14) on, on conductive probe (11) were located PCB circuit board (10) and were worn to establish to probe card (14), push down mechanism (9) and be used in the afterbody of casing (13) and link probe card (14), PCB circuit board (10) and conductive probe (11) and remove in the lump.

5. The deconcentrator rapid test tool according to claim 4, wherein: the elastic mechanism (15) comprises a guide post (16) connected to the probe board (14) in a sliding manner, a first slide way (17) for the guide post (16) to be connected in a sliding manner, and an elastic piece (18) arranged in the first slide way (17) and used for driving the guide post (16) to eject.

6. The quick test fixture for deconcentrators according to claim 5, characterized in that: the probe card is characterized in that a sliding block (19) is arranged on the probe card (14), a second slide way for installing a guide pillar (16) and an elastic piece (18) is arranged on the sliding block (19), a bolt (20) is arranged on one side, back to the PCB (10), of the guide pillar (16), one end of the elastic piece (18) abuts against the bolt (20), and the other end of the elastic piece abuts against the bottom wall of the second slide way of the sliding block (19).

7. The quick test fixture for deconcentrators according to claim 6, characterized in that: the second slideway is provided with a through hole (21) for the guide post (16) to penetrate through, and the guide post (16) is abutted against the PCB (10).