CN107741556A - Electronic encapsulation shell dielectric withstanding voltage test fixture - Google Patents
Electronic encapsulation shell dielectric withstanding voltage test fixture Download PDFInfo
- Publication number
- CN107741556A CN107741556A CN201710981100.0A CN201710981100A CN107741556A CN 107741556 A CN107741556 A CN 107741556A CN 201710981100 A CN201710981100 A CN 201710981100A CN 107741556 A CN107741556 A CN 107741556A
- Authority
- CN
- China
- Prior art keywords
- locating piece
- lead
- withstanding voltage
- end surface
- dielectric withstanding
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
Abstract
The present invention relates to electronic component processing unit (plant), more particularly to electronic encapsulation shell dielectric withstanding voltage test fixture, including base, locating piece is installed with the upper side of base, opposite side is movably installed with pushing block, the described pushing block direction of motion is the operative end surface away from or close to locating piece, and pushing block acts against Chisel lead in the operative end surface of locating piece；Rotating shaft is also equipped with base, for shaft parallel in the operative end surface of locating piece, rotating shaft both ends connect spanner respectively, and pressing plate is installed between described spanner；Described pressing plate is located above the operative end surface of locating piece.Electronic encapsulation shell dielectric withstanding voltage test fixture provided by the invention, the dielectric withstanding voltage once tested between row's lead and housing is simple to operate, saves the time；And lead end face is in close contact with spring leaf when testing, and is not easy open circuit, lead layer gold is not easy to scratch.
Description
Technical field
The present invention relates to electronic component processing unit (plant), more particularly to electronic encapsulation shell dielectric withstanding voltage test fixture.
Background technology
There is fraction product in flat metal shell used for electronic packaging, need to be according to the particular/special requirement of user, specific
Ambient humidity and time under, to applying the AC or DC voltage specified between housing and lead, so as to test housing and lead
Between dielectric withstanding voltage whether meet to require.
A manually operated test pen contacts with housing, another test pen and wire contacts, and be powered conducting, certain
Medium can bear voltage without breakdown in time, the dielectric withstanding voltage that can only be tested between single wire and housing every time, and one
Product generally has more leads, and in summary phenomenon has following weak point：
1. can only once test a dielectric withstanding voltage between lead and housing, and there are more leads on a housing, the testing time
It is long, than relatively time-consuming.
2. because diameter wire is smaller, during test, test pen, with regard to small, easily slide and disconnected with wire contacts area；
3. test pen is improper with wire contacts, the scuffing of lead layer gold is easily caused.
The content of the invention
The present invention provides a kind of uniform force, the bending clamp of the high Chisel lead of qualification rate.
Specifically technical scheme is：
The bending clamp of Chisel lead, including base, base upper side are installed with locating piece, and opposite side is movably installed with
Pushing block, the described pushing block direction of motion are the operative end surface away from or close to locating piece, and it is fixed that pushing block acts against Chisel lead
In the operative end surface of position block；Rotating shaft is also equipped with base, shaft parallel connects respectively in the operative end surface of locating piece, rotating shaft both ends
Spanner is connect, pressing plate is installed between described spanner；Described pressing plate is located above the operative end surface of locating piece.
Be additionally provided with pin in the operative end surface of described locating piece, described pushing block towards locating piece operative end surface one
Side is provided with through hole, and the pin other end is inserted in through hole, pushing block is oriented to and spacing.
Electronic encapsulation shell dielectric withstanding voltage test fixture provided by the invention, there is following technology a little：
1. utilizing fixture, the dielectric withstanding voltage that can once test between row's lead and housing is time saving and energy saving；
2. housing is fixed on fixture, lead is set directly to be contacted with the spring leaf on test fixture, it is not easy to disconnect；
Electronic encapsulation shell dielectric withstanding voltage test fixture provided by the invention, only need to be row's lead elder generation of tested housing and spring
Piece contacts, and housing is fixed into locating piece, and a test pen contacts housing, and another test pen is placed directly in the guiding of fixture
By screw and wire contacts in hole, turn on the power switch, start to test；Jie that can once test between row's lead and housing
Matter is pressure-resistant, simple to operate, saves the time；And lead end face is in close contact with spring leaf when testing, and is not easy open circuit, lead layer gold is not
Easily scratch.
Brief description of the drawings
Fig. 1 is the cross-sectional view of the present invention；
Fig. 2 is the overlooking the structure diagram of the present invention；
Fig. 3 is the use state side structure schematic view of the present invention.
Embodiment
It is described in conjunction with the embodiments the embodiment of the present invention.
As depicted in figs. 1 and 2, electronic encapsulation shell dielectric withstanding voltage test fixture, including locating piece 1, described locating piece 1
Include the detent of upper surface setting, conducting strip 3 is installed in one side wall of detent, connected on described conducting strip 3
There are multiple spring leafs 5, spring leaf 5 is located at side wall towards on the side of detent, and the described position of spring leaf 5 and number are with treating
The lead 7 of the electronic encapsulation shell 6 of test corresponds；Be additionally provided with conducting bolt 2 in described side wall, conducting bolt 2 with
Conducting strip 3 connects；Top side wall is provided with pilot hole 4, and described conducting bolt 2 is located at the bottom of pilot hole 4.
Spring leaf 5 is mainly used to contact conducting with lead 7, while coordinates fixed product with locating piece 1.
As shown in figure 3, being tested using the fixture, electronic encapsulation shell 6 to be tested is placed in the locating slot of locating piece 1,
Spring leaf 5 contacts conducting with row's lead 7 respectively, i.e., by the way of in parallel, while Jie tested between row's lead 7 and housing
Matter is pressure-resistant, saves the time, greatly improves operating efficiency；Spring leaf 5 coordinates with locating piece 1 fixes the same of electronic encapsulation shell 6
When spring leaf 5 be close to the end face of lead 7, be not easy to disconnect and scratch lead coating.
Spring leaf spring leaf 5 is fixed with locating piece 1 with conducting bolt 2, and composition surveys dielectric withstanding voltage fixture.Outside Electronic Packaging
After shell 6 is fixed on fixture, a test pen 9 contacts the housing of electronic encapsulation shell 6, and another test pen 8 is placed directly in folder
Contacted, turned on the power switch with lead 7 by conducting bolt 2 in the pilot hole 4 of tool, start to test.
Claims (1)
1. electronic encapsulation shell dielectric withstanding voltage test fixture, it is characterised in that：Including locating piece（1）, described locating piece（1）Bag
The detent of upper surface setting is included, conducting strip is installed in one side wall of detent（3）, described conducting strip（3）Upper company
It is connected to multiple spring leafs（5）, spring leaf（5）Positioned at side wall towards on the side of detent, described spring leaf（5）Position and
Number and electronic encapsulation shell to be tested（6）Lead（7）Correspond；Conducting bolt is additionally provided with described side wall
（2）, conducting bolt（2）With conducting strip（3）Connection；Top side wall is provided with pilot hole（4）, described conducting bolt（2）Positioned at leading
Xiang Kong（4）Bottom.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710981100.0A CN107741556A (en) | 2017-10-20 | 2017-10-20 | Electronic encapsulation shell dielectric withstanding voltage test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710981100.0A CN107741556A (en) | 2017-10-20 | 2017-10-20 | Electronic encapsulation shell dielectric withstanding voltage test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107741556A true CN107741556A (en) | 2018-02-27 |
Family
ID=61237932
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710981100.0A Pending CN107741556A (en) | 2017-10-20 | 2017-10-20 | Electronic encapsulation shell dielectric withstanding voltage test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107741556A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113281627A (en) * | 2021-06-04 | 2021-08-20 | 广东电网有限责任公司 | Alternating current withstand voltage test auxiliary device |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201583561U (en) * | 2009-12-31 | 2010-09-15 | 郑晓明 | Measuring clamp of side surface pin LED |
| CN101971042A (en) * | 2008-02-19 | 2011-02-09 | 西门子工业公司 | Adjustable electrical probes for circuit breaker tester |
| CN102621470A (en) * | 2012-03-31 | 2012-08-01 | 中国电子科技集团公司第十三研究所 | Method for testing performance of semiconductor microwave power chip packaging shell |
| CN104714057A (en) * | 2013-12-13 | 2015-06-17 | 旺矽科技股份有限公司 | Test fixture |
| CN207752094U (en) * | 2017-10-20 | 2018-08-21 | 宜兴市吉泰电子有限公司 | Electronic encapsulation shell dielectric withstanding voltage test fixture |
-
2017
- 2017-10-20 CN CN201710981100.0A patent/CN107741556A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101971042A (en) * | 2008-02-19 | 2011-02-09 | 西门子工业公司 | Adjustable electrical probes for circuit breaker tester |
| CN201583561U (en) * | 2009-12-31 | 2010-09-15 | 郑晓明 | Measuring clamp of side surface pin LED |
| CN102621470A (en) * | 2012-03-31 | 2012-08-01 | 中国电子科技集团公司第十三研究所 | Method for testing performance of semiconductor microwave power chip packaging shell |
| CN104714057A (en) * | 2013-12-13 | 2015-06-17 | 旺矽科技股份有限公司 | Test fixture |
| CN207752094U (en) * | 2017-10-20 | 2018-08-21 | 宜兴市吉泰电子有限公司 | Electronic encapsulation shell dielectric withstanding voltage test fixture |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113281627A (en) * | 2021-06-04 | 2021-08-20 | 广东电网有限责任公司 | Alternating current withstand voltage test auxiliary device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN207133392U (en) | A kind of semiconductor laser ageing test device | |
| CN204028317U (en) | The test board of Minitype electrical leakage breaker checkout equipment | |
| CN111092311A (en) | Wiring device of switch socket | |
| CN107741556A (en) | Electronic encapsulation shell dielectric withstanding voltage test fixture | |
| CN207752094U (en) | Electronic encapsulation shell dielectric withstanding voltage test fixture | |
| US8339144B2 (en) | Test fixture for testing positioning of connector | |
| CN207992345U (en) | A kind of phone charger test equipment | |
| CN207992412U (en) | A kind of phone charger test system | |
| CN104319505B (en) | Flexible printed circuit board grafting tool | |
| CN203616347U (en) | Electronic component test fixture | |
| CN103675622A (en) | Device and method for testing partial discharge of IGBT module | |
| CN207992346U (en) | A kind of phone charger test device | |
| CN201859200U (en) | Plug and play relay test device | |
| CN2566491Y (en) | Locked power supply socket | |
| CN201392349Y (en) | Chip resistance aging test holding fixture | |
| CN211955758U (en) | Clamp for detecting voltage internal resistance of battery | |
| CN211698070U (en) | Circuit fault overhauling device for electronic major | |
| CN208443954U (en) | A kind of wire harness conducting test device | |
| CN107516776A (en) | Electric snap joint with measurement point | |
| CN203117349U (en) | Test fixture capable of automatically ejecting out test terminal | |
| CN205333684U (en) | Upset pressfitting detection device | |
| CN208543396U (en) | It is a kind of for testing the novel clamp of solar panel crack | |
| CN208297666U (en) | More proof voltage insulation resistance measuring devices in parallel | |
| CN218828266U (en) | Wire harness | |
| CN216351001U (en) | DIP element detection device upset subassembly |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WD01 | Invention patent application deemed withdrawn after publication | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20180227 |