CN210863889U

CN210863889U - Electronic product testing device

Info

Publication number: CN210863889U
Application number: CN201920891484.1U
Authority: CN
Inventors: 李强
Original assignee: Jiaxing Yongrui Electronic Technology Co Ltd
Current assignee: Jiaxing Yongrui Electronic Technology Co Ltd
Priority date: 2019-06-13
Filing date: 2019-06-13
Publication date: 2020-06-26
Anticipated expiration: 2029-06-13

Abstract

An electronic product testing device comprises a substrate, a clamping mechanism, a sensor assembly, a wireless sensing probe assembly, a biological characteristic simulator, a first moving assembly and a second moving assembly, wherein the clamping mechanism, the sensor assembly, the wireless sensing probe assembly, the biological characteristic simulator, the first moving assembly and the second moving assembly are arranged on the substrate; the substrate is provided with a through hole; the sensor assembly comprises a first supporting block, a first sliding rail and a sensor, wherein the first supporting block is arranged at the edge of the perforation and is positioned on one side opposite to the clamping mechanism, the first sliding rail is detachably connected with the first supporting block, and the sensor is arranged on the first sliding rail in a sliding mode and is positioned in the perforation; the wireless induction probe assembly comprises an induction probe which is positioned in the through hole and internally provided with a wireless induction chip, and the biological characteristic simulator is positioned in the through hole; the first moving assembly is arranged at the edge of the through hole and is positioned on the same side face of the substrate as the clamping mechanism, and comprises a first moving part and a plug connector arranged at one end of the first moving part; the second moving assembly is arranged on the edge of the through hole and is positioned on the same side face of the substrate with the clamping mechanism.

Description

Electronic product testing device

[ technical field ] A method for producing a semiconductor device

The utility model relates to an electronic product test equipment technical field especially relates to an electronic product testing arrangement.

[ background of the invention ]

After an electronic product (such as a mobile phone, a tablet computer, etc.) is manufactured, a plurality of performances (such as vibration, fingerprint identification, NFC, Near Field Communication, key-press, earphone playing, etc.) of the electronic product are usually required to be tested, and a test host needs to test the performance of the electronic product by means of a special test fixture. However, the existing test fixture can only meet the test requirement of the test host for a certain performance, and when different performances of the electronic product need to be tested, different test fixtures need to be replaced for many times to meet the test requirement. Such a test mode is complex to operate and low in efficiency.

In view of the above, it is desirable to provide a novel electronic product testing apparatus to overcome the above drawbacks.

[ Utility model ] content

The utility model aims at providing an electronic product testing arrangement can satisfy electronic product's multinomial capability test, and convenient to use.

In order to achieve the above object, the present invention provides an electronic product testing device, which comprises a substrate, a clamping mechanism, a sensor assembly, a wireless sensing probe assembly, a biological characteristic simulator, a first moving assembly and a second moving assembly, wherein the clamping mechanism, the sensor assembly, the wireless sensing probe assembly, the biological characteristic simulator, the first moving assembly and the second moving assembly are mounted on the substrate; the substrate is provided with a through hole; the sensor assembly comprises a first supporting block, a first sliding rail and a sensor, wherein the first supporting block is arranged at the edge of the perforation and is positioned on one side opposite to the clamping mechanism, the first sliding rail is detachably connected with the first supporting block, and the sensor is arranged on the first sliding rail in a sliding manner and is positioned in the perforation; the wireless induction probe assembly comprises an induction probe which is positioned in the through hole and internally provided with a wireless induction chip, and the biological characteristic simulator is positioned in the through hole; the first moving assembly is arranged at the edge of the through hole, is positioned on the same side of the substrate as the clamping mechanism, and comprises a first moving part and a plug connector arranged at one end of the first moving part; the second moving assembly is arranged on the edge of the through hole and is positioned on the same side face of the substrate with the clamping mechanism.

In a preferred embodiment, the clamping mechanism comprises a driving piece with a telescopic column, a mounting table for the telescopic column to pass through, and a claw arranged on the mounting table, wherein the claw is connected with one end of the telescopic column far away from the driving piece.

In a preferred embodiment, the mounting table comprises a pair of side plates, a limiting block and a mounting rod; the clamping jaw is installed on the limiting block, the limiting block is installed between the pair of side plates, the installation rod penetrates through the pair of side plates, the limiting block and the clamping jaw, and the telescopic column penetrates through the limiting block and is connected with one end of the clamping jaw.

In a preferred embodiment, the clamping mechanism further comprises a mounting plate fixed to the base plate at the edge of the through hole; the driving piece, the mounting table and the clamping jaws are arranged on one side, deviating from the substrate, of the mounting plate.

In a preferred embodiment, the end of the jaw remote from the telescopic column is provided with a cushion.

In a preferred embodiment, the wireless sensing probe assembly further includes a second supporting block mounted at an edge of the through hole and located on a side opposite to the clamping mechanism, and a second slide rail detachably connected to the second supporting block, the sensing probe is slidably connected to the second slide rail, and the biometric simulator is slidably connected to the second slide rail.

In a preferred embodiment, the second moving assembly includes a second moving member and a telescopic rod connected to one end of the second moving member, the telescopic rod is disposed toward a direction close to the through hole, and the plug is disposed toward a direction close to the through hole.

In a preferred embodiment, the second moving assembly further comprises an abutting head, and the abutting head is mounted at one end of the telescopic rod far away from the second moving member.

In a preferred embodiment, the second moving assembly further includes a fixing block, and the second moving member is connected to the base plate through the fixing block.

In a preferred embodiment, the electronic product testing device further includes a plug assembly, the plug assembly includes a third moving member and a plug mounted at one end of the third moving member, the plug is disposed in a direction close to the through hole, and the third moving member can drive the plug to move in a direction close to or away from the through hole.

Compared with the prior art, beneficial effect lies in: the utility model provides a pair of electronic product testing arrangement is provided with sensor module, wireless inductive probe subassembly, biological characteristic simulator, first motion subassembly and second motion subassembly and can satisfy multiple capability test such as vibrations, NFC, fingerprint identification, button and earphone broadcast of electronic product simultaneously, and no longer need change different testing arrangement and test convenient to use.

[ description of the drawings ]

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention, and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.

Fig. 1 is a perspective view of the electronic product testing device provided by the present invention.

Fig. 2 is an enlarged view of the region a shown in fig. 1.

Fig. 3 is a perspective view of the electronic product testing apparatus shown in fig. 1 from another perspective.

FIG. 4 is a schematic diagram of the electronic product testing apparatus shown in FIG. 1 for testing an electronic product.

[ detailed description ] embodiments

In order to make the objects, technical solutions and advantageous technical effects of the present invention more clearly understood, the present invention is further described in detail with reference to the accompanying drawings and the following detailed description. It should be understood that the detailed description and specific examples, while indicating the present invention, are given by way of illustration only and not by way of limitation.

It will be understood that the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", and the like, are used in the orientation or positional relationship indicated in the drawings for convenience in describing the present invention and simplicity in description, and do not indicate or imply that the device or element so referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the present invention.

Referring to fig. 1 to 4, the present invention provides an electronic product testing apparatus 100, which includes a substrate 10, a clamping mechanism 20 installed on the substrate 10 and used for clamping an electronic product 200, a sensor assembly 30 installed on the substrate 10, a wireless sensing probe assembly 40, a biological characteristic simulator 50, a first moving assembly 60 and a second moving assembly 70; a rectangular through hole 101 is formed in the middle of the substrate 10; the sensor assembly 30 comprises a first supporting block 31 which is arranged at the edge of the through hole 101 and is positioned at the side opposite to the clamping mechanism 20, a first sliding rail 32 which is detachably connected with the first supporting block 31, and a sensor 33 which is arranged on the first sliding rail 32 in a sliding manner and is positioned in the through hole 101; the wireless sensing probe assembly 40 comprises a sensing probe 401 which is positioned in the perforation 101 and is internally provided with a wireless sensing chip, and the biological characteristic simulator 50 is positioned in the perforation 101; the first moving assembly 60 is mounted at the edge of the through hole 101 and located on the same side of the substrate 10 as the clamping mechanism 20, the first moving assembly 60 includes a first moving member 61 and a plug 62 mounted at one end of the first moving member 61, the plug 62 is electrically connected to a testing host (not shown) and is disposed toward a direction close to the through hole 101; the second moving assemblies 70 are all installed at the edge of the through hole 101 and located on the same side of the substrate 10 as the clamping mechanism 20, and the second moving assemblies 70 are used for contacting with external keys (such as a volume adjustment key, an on/off key, etc.) of the electronic product 200 to detect whether the pressing performance of the external keys of the electronic product 200 is good or not.

The wireless induction chip is an NFC chip or an RF (radio frequency) chip. In the present embodiment, the sensor 33 is a vibration sensor for detecting whether the electronic product 200 placed on the substrate 10 has a vibration or shaking phenomenon; the electronic product 200 can be a mobile phone, a tablet computer and the like, and the electronic product 200 is provided with a corresponding NFC chip; the biometric simulator 50 is used for displaying a fingerprint of a person, and the electronic product 200 is provided with a corresponding biometric detector 50; the first moving member 61 is a single-acting cylinder, and the plug 62 of the first moving assembly 60 is used for plugging with a headphone jack of an electronic product.

Because the first slide rail 32 is detachably connected to the first support block 31, and the sensor 33 can move back and forth along the first slide rail 32, the distance between the first slide rail 32 and the substrate 10 and the sliding distance of the sensor 33 along the first slide rail 32 can be adjusted according to the actual test position, so as to meet the test requirements of different types of electronic products 200. In this embodiment, the number of the first supporting blocks 31 is two, and the interval is set up in the both sides of the perforation 101, and the first slide rail 32 can be dismantled and connected between two first supporting blocks 31, so can guarantee that the sensor 33 can move along the first slide rail 32 smoothly, reduce the possibility that the sensor 33 rocks when moving along the first slide rail 32.

The electronic product testing apparatus 100 is communicatively connected to a testing host (not shown), when the electronic product 200 is placed on the through hole 101 of the substrate 10 (at this time, the substrate 10 is in a static state), the clamping mechanism 20 clamps the electronic product 200 to prevent the electronic product 200 from moving, an operation program of an operation interface of the electronic product 200 is touched at this time, and the sensor 33 detects whether the electronic product 200 has a vibration or shaking phenomenon in the operation interface of the operation program; if the sensor 33 detects that the electronic product 200 on the substrate 10 has no vibration or shaking phenomenon, the test host determines that the vibration performance of the electronic product 200 does not meet the standard.

When the electronic product 200 approaches the wireless sensing chip, the wireless sensing chip wirelessly communicates with the NFC chip of the electronic product 200, and the test host acquires information of the electronic product 200 through the wireless sensing chip and determines the NFC performance of the electronic product 200; if the electronic product 200 is close to the wireless sensing chip, the wireless sensing chip and the NFC chip of the electronic product 200 cannot perform wireless communication, and the test host determines that the NFC performance of the electronic device 200 does not reach the standard.

The testing host generates biological characteristic information (such as fingerprint information) and transmits the biological characteristic information to the biological characteristic simulator 50 to enable the biological characteristic simulator 50 to display the biological characteristic information, when the biological characteristic simulator 50 of the electronic product testing device 100 is contacted with a biological characteristic detector of the electronic product 200, the biological characteristic simulator and the biological characteristic detector of the electronic product 200 perform induction detection, and the testing host judges the performance of the electronic product 200 by collecting the induction information of the biological characteristic simulator 50 and the biological characteristic detector of the electronic product 200; if the biometric simulator 50 is in contact with the biometric detector of the electronic product 200, the biometric simulator 50 cannot sense and detect the biometric detector of the electronic product 200 or the biometric detector cannot identify the biometric information displayed by the biometric simulator 50, the test host determines that the fingerprint identification function of the electronic product 200 does not meet the standard.

When the plug 62 of the first motion assembly 60 of the electronic product testing apparatus 100 is plugged into the earphone jack of the electronic product 200 to electrically connect the electronic product 200 with the testing host, the operation program touching the operation interface of the electronic product 200 turns on the voice playing function, and if the sound or the speaker of the testing host cannot make a sound, the testing host determines that the earphone playing function of the electronic product 200 has a fault or the earphone jack of the electronic product 200 has a fault.

In one embodiment, the clamping mechanism 20 includes a driver 21 having a telescopic post 211, a mounting block 22 for the telescopic post 211 to pass through, and a "Z" shaped pawl 23 mounted on the mounting block 22, the pawl 23 being connected to an end of the telescopic post 211 remote from the driver 21. When the telescopic column 211 of the driver 21 retracts towards the inside of the driver 21, one end of the claw 23 far away from the telescopic column 211 is driven to move towards the direction far away from the through hole 101; when the telescopic column 211 of the driver 21 is extended by the driver 21, the end of the telescopic column 211 away from the claw 23 is driven to move towards the direction close to the through hole 101.

In one embodiment, the mounting platform 22 includes a pair of side plates 221, a stop block 222, and a mounting rod 223; the locking jaw 23 is mounted on the limiting block 222, the limiting block 222 is mounted between the pair of side plates 221, the mounting rod 223 penetrates through the pair of side plates 221, the limiting block 222 and the locking jaw 23, the locking jaw 23 uses the mounting rod 223 as a rotating shaft, and the telescopic column 211 penetrates through the limiting block 222 and is connected with one end of the locking jaw 23.

In one embodiment, the end of the claw 23 away from the telescopic column 211 is provided with a buffer 231, and the buffer 231 is made of a silicon material, so as to prevent the electronic product 200 from being directly damaged or worn due to the excessive pushing force or the excessive retracting speed of the driver 21.

In one embodiment, the clamping mechanism 20 further comprises a mounting plate 24, the mounting plate 24 being fixed to the base plate 10 and located at the edge of the through hole 101; the driver 21, the mounting table 22 and the claws 23 are mounted on the side of the mounting plate 24 facing away from the substrate 10. In the present embodiment, the number of the clamping mechanisms 20 is four, and the clamping mechanisms 20 are provided in pairs on both sides of the through hole 101, and the claws 23 of the clamping mechanisms 20 on both sides of the through hole 101 are provided in directions to approach each other. When the claws 23 of the clamping mechanism 20 abut against the electronic product 200, the electronic product 200 can be well prevented from shaking in the direction away from the substrate 10 along the longitudinal axis.

In one embodiment, the wireless sensing probe assembly 40 further includes a second supporting block 41 mounted at an edge of the through hole 101 and located at a side opposite to the clamping mechanism 20, and a second sliding rail 42 detachably connected to the second supporting block 41, the second supporting block 41 and the first supporting block 31 are disposed at an interval, the sensing probe 401 is slidably connected to the second sliding rail 42, and the biometric simulator 50 is slidably connected to the second sliding rail 42. Because the second slide rail 42 is detachably connected to the second support block 41, and the sensing probe 401 and the biometric simulator 50 can both move back and forth along the second slide rail 42, the distance between the second slide rail 42 and the substrate 10 and the sliding distance between the sensing probe 401 and the biometric simulator 50 along the second slide rail 42 can be adjusted according to the actual test position, so as to meet the test requirements of different types of electronic products. In this embodiment, the number of the second supporting blocks 41 is two, and the second sliding rails 42 are detachably connected between the two second supporting blocks 41, so that the inductive probe 401 and the biometric simulator 50 can be ensured to stably move along the second sliding rails 42, and the possibility of shaking when the inductive probe 401 and the biometric simulator 50 move along the second sliding rails 42 is reduced.

Specifically, the shape of the second support block 41 is the same as that of the first support block 31, the cross sections of the first support block 31 and the second support block 41 are L-shaped, the first support block 31 and the second support block 41 both include a first section 311 and a second section 312 vertically connected to the first section 311, the first section 311 is provided with a first strip-shaped hole 3111, and the edge of the through hole 101 is provided with a plurality of mounting holes 1011 corresponding to the first strip-shaped hole 3111; the second section 312 defines a second strip 3121, and the first section 311 is connected to the edge of the through hole 101. The first supporting block 31 can adjust the mounting position of the first bar-shaped hole 3111 along the edge of the through hole 101 according to the actual testing position, that is, the sensor assembly 30 moves from one end of the substrate 10 to the direction close to the other end of the substrate 10 by fixing the first bar-shaped hole 3111 and the corresponding mounting hole 1011 through screws; the first slide rail 32 can be adjusted according to the actual test position, that is, two ends of the first slide rail 32 are respectively slidably received between the second elongated holes 3121 of the two first support blocks 31, and the first slide rail 32 slides in the second elongated hole 3121 of the first support block 31 to move the first slide rail 32 toward the direction close to or away from the substrate 10.

Similarly, the second supporting block 41 can also adjust the installation position of the first strip-shaped hole 3111 along the edge of the through hole 101 according to the actual test position, that is, the first strip-shaped hole 3111 and the corresponding installation hole 1011 are fixed by screws, so that the wireless inductive probe assembly 40 and the biometric simulator 50 move from one end of the substrate 10 to the direction close to the other end of the substrate 10; the second slide rail 42 may be installed along the second elongated hole 3121 of the second support block 41 by adjusting the installation position of the second slide rail 42 according to the actual test position, that is, two ends of the second slide rail 42 are respectively slidably received between the second elongated holes 3121 of the two second support blocks 42, and the second slide rail 42 is slid in the second elongated hole 3121 of the second support block 42 to move the second slide rail 42 toward or away from the substrate 10.

In one embodiment, the second moving assembly 70 includes a second moving member 71 and a telescopic rod 72 connected to one end of the second moving member 71, and the telescopic rod 72 is disposed toward a direction close to the through hole 101. In the present embodiment, the second moving member 71 is a single-acting cylinder, so that when the second moving member 71 drives the telescopic rod 72 to move toward the direction close to the through hole 101, the telescopic rod 72 can contact with an external key of the electronic product 200.

In one embodiment, the second moving element 70 further comprises an abutting head 73, and the abutting head 73 is mounted on an end of the telescopic rod 72 far away from the second moving element 71. In the present embodiment, the abutting head 73 is made of a silicone material, so that the electronic product 200 can be prevented from being directly damaged or abraded due to the excessive pushing force or the excessive pushing speed of the second moving member 71. In the present embodiment, the number of the second moving assemblies 71 is three, and the second moving assemblies 71 are adjacently disposed side by side, so that the second moving assemblies 71 can simultaneously contact with a plurality of external keys (such as a volume adjustment key, an on/off key, etc.) of the electronic product 200 to detect whether the pressing performance of the external keys of the electronic product 200 is good.

In one embodiment, the second moving component 70 further includes a fixing block 74, and the second moving component 70 is fixedly connected to the substrate 10 through the fixing block 74, so as to enhance the connection reliability of the second moving component 70 and the substrate 10.

In one embodiment, the electronic product testing apparatus 100 further includes a plug assembly 80, the plug assembly 80 includes a third moving element 81 and a plug 82 installed at one end of the third moving element 81, the plug 82 is disposed toward the through hole 101 and electrically connected to the testing host, and the third moving element 81 can drive the plug 82 to move toward the direction close to or away from the through hole 101 to plug with an interface (e.g., a charging port) of the electronic product 200. In this embodiment, the third moving element 81 is a single-acting cylinder, and in other embodiments, the interface may be a SIM card slot, an SD card slot, or other interfaces.

When the clamping mechanism 20 clamps the electronic product 200 in the through hole 101 and aligns with the plug 82, the third moving member 81 of the plugging assembly 80 drives the plug 82 to move towards the direction close to the through hole 101 so that the plug 82 is plugged with the interface of the electronic product 200, and at this time, the testing host tests the charging and discharging performance of the electronic product 200; after the electronic product 200 is tested, the plug assembly 80 drives the plug 82 to move in a direction away from the through hole 101, so that the plug 82 is pulled out of the interface of the electronic product 200. Therefore, when the electronic product 200 is tested, the plug 82 of the plug assembly 80 can be automatically aligned and plugged with the interface of the electronic product 200, and the plug does not need to be manually aligned and plugged with the interface of the electronic product 200, so that the testing efficiency is improved.

In one embodiment, the electronic product testing device 100 further comprises two third supporting blocks 90 and a third slide rail 91 detachably connected between the two third supporting blocks 90, wherein the third supporting blocks 90 and the third slide rail 91 are respectively identical to the first supporting blocks 31 and the first slide rail 91 in shape. In this embodiment, the third support block 90 and the third slide rail 91 are spare parts for mounting an inductive probe, a biometric simulator or other detection device.

In conclusion, the beneficial effects are that: has the advantages that: the utility model provides an electronic product testing arrangement is provided with sensor module, wireless inductive probe subassembly, biological characteristic simulator, first motion subassembly and second motion subassembly and can satisfy multiple capability test such as vibrations, fingerprint identification, NFC, button and earphone broadcast of electronic product simultaneously, and no longer need change different testing arrangement and test convenient to use. In addition, the plug-in assembly is arranged, so that the test host can test the charge and discharge performance of the electronic product through the plug-in assembly.

The invention is not limited solely to that described in the specification and the embodiments, and additional advantages and modifications will readily occur to those skilled in the art, and it is not intended to be limited to the specific details, representative apparatus, and illustrative examples shown and described herein, without departing from the spirit and scope of the general concept as defined by the appended claims and their equivalents.

Claims

1. An electronic product testing device is characterized by comprising a substrate, a clamping mechanism, a sensor assembly, a wireless sensing probe assembly, a biological characteristic simulator, a first moving assembly and a second moving assembly, wherein the clamping mechanism, the sensor assembly, the wireless sensing probe assembly, the biological characteristic simulator, the first moving assembly and the second moving assembly are arranged on the substrate; the substrate is provided with a through hole; the sensor assembly comprises a first supporting block, a first sliding rail and a sensor, wherein the first supporting block is arranged at the edge of the perforation and is positioned on one side opposite to the clamping mechanism, the first sliding rail is detachably connected with the first supporting block, and the sensor is arranged on the first sliding rail in a sliding manner and is positioned in the perforation; the wireless induction probe assembly comprises an induction probe which is positioned in the through hole and internally provided with a wireless induction chip, and the biological characteristic simulator is positioned in the through hole; the first moving assembly is arranged at the edge of the through hole, is positioned on the same side of the substrate as the clamping mechanism, and comprises a first moving part and a plug connector arranged at one end of the first moving part; the second moving assembly is arranged on the edge of the through hole and is positioned on the same side face of the substrate with the clamping mechanism.

2. The device for testing electronic products of claim 1, wherein the clamping mechanism comprises a driving member having a retractable post, a mounting platform for the retractable post to pass through, and a claw mounted on the mounting platform, the claw being connected to an end of the retractable post remote from the driving member.

3. The device for testing electronic products of claim 2, wherein the mounting platform comprises a pair of side plates, a limiting block and a mounting rod; the clamping jaw is installed on the limiting block, the limiting block is installed between the pair of side plates, the installation rod penetrates through the pair of side plates, the limiting block and the clamping jaw, and the telescopic column penetrates through the limiting block and is connected with one end of the clamping jaw.

4. The device for testing electronic products of claim 2, wherein said clamping mechanism further comprises a mounting plate secured to said substrate at an edge of said aperture; the driving piece, the mounting table and the clamping jaws are arranged on one side, deviating from the substrate, of the mounting plate.

5. An electronic product testing device according to claim 3, wherein the end of the jaw remote from the telescopic column is provided with a cushion pad.

6. The device for testing electronic products of claim 1, wherein the wireless inductive probe assembly further comprises a second support block mounted at an edge of the through hole and located on a side opposite to the clamping mechanism, and a second slide rail detachably connected to the second support block, the inductive probe is slidably connected to the second slide rail, and the biometric simulator is slidably connected to the second slide rail.

7. The device for testing electronic products of claim 1, wherein the second motion assembly comprises a second motion member and a retractable rod connected to an end of the second motion member, the retractable rod is disposed toward the through hole, and the plug is disposed toward the through hole.

8. The device for testing electronic products of claim 7, wherein the second motion assembly further comprises an abutting head, and the abutting head is mounted at one end of the telescopic rod away from the second motion member.

9. The electronic product testing device of claim 7, wherein the second motion assembly further comprises a fixed block, and the second motion member is connected to the substrate through the fixed block.

10. The device of claim 1, further comprising a plug assembly, wherein the plug assembly comprises a third moving member and a plug attached to one end of the third moving member, the plug is disposed in a direction close to the through hole, and the third moving member can drive the plug to move in a direction close to or away from the through hole.