CN210834765U - Multifunctional portable magnetic powder flaw detector - Google Patents

Abstract

The utility model discloses a multi-functional portable magnetic particle flaw detector, including host computer and probe, the host computer includes the shell, supply circuit and host computer panel, supply circuit includes first transformer, the second transformer, third transformer and power, the probe includes the skeleton, a handle, the magnetization switch, magnetization supply socket, the iron core, magnetizing coil and magnetic head, magnetization supply socket is connected with supply circuit, the skeleton is iron core of perpendicular downward swing joint of every free end of I-shaped skeleton, the iron core is equipped with magnetizing coil outward, the free end swing joint magnetic head of iron core, magnetizing coil begins clockwise to arrange along the lower left free end of skeleton, first magnetizing coil and third magnetizing coil concatenate and are supplied power by first transformer, second magnetizing coil and fourth magnetizing coil concatenate and are supplied power by the second transformer. Framework and iron core and magnetic head between all adopt to dismantle articulated, the position of iron core and magnetic head is adjustable, can dismantle, the probe of different forms all can be used, has improved the commonality.

Description

Multifunctional portable magnetic powder flaw detector

Technical Field

The utility model relates to a detect a flaw and detect technical field, in particular to multi-functional portable magnetic particle flaw detector.

Background

The magnetic powder flaw detector utilizes the interaction between the leakage magnetic field at the defect position of a workpiece and magnetic powder, utilizes the difference between the magnetic conductivity of the surface and near-surface defects (such as cracks, slag inclusion, hairlines and the like) of a steel product and the magnetic conductivity of steel, after magnetization, the magnetic field at the discontinuous position of the materials generates a Kazaki change to form a leakage magnetic field on the surface of the workpiece at the part of the leakage magnetic flux leakage position, thereby attracting the magnetic powder to form the magnetic powder accumulation at the defect position, showing the defect position and shape under the proper illumination condition, and observing and explaining the accumulation of the magnetic powder, thereby realizing the magnetic powder flaw detection. Magnetic powder inspection is one of five conventional methods for nondestructive testing, and is also a common means for testing defects on the surface or near surface of a ferromagnetic material. The method has high detection sensitivity and simple and reliable process, so the method is widely adopted.

When the magnetic particle flaw detector works, different types of probes such as a rotating magnetic field probe, an angle welding seam probe, a magnetic yoke type probe, an angle welding seam rotating magnetic field probe, an annular probe and the like need to be selected according to the shape and the detection requirement of a detected workpiece, and the angle and the mutual position of magnetic heads in the probes need to be adjusted according to the surface shape of the workpiece, so that a good flaw detection effect is achieved. It is therefore desirable to provide a magnetic particle flaw detector that can adjust the angle and mutual position of the heads in the probe and that can be used with different types of probes.

SUMMERY OF THE UTILITY MODEL

The to-be-solved technical problem of the utility model is to provide a multi-functional portable magnetic particle flaw detector, a probe can regard as multiple form to use and change different grade type probe according to different demands, has reduced the cost of the appearance of detecting a flaw, has improved the commonality of the appearance of detecting a flaw.

In order to solve the technical problem, the utility model discloses a technical scheme does:

a multifunctional portable magnetic particle flaw detector comprises a flaw detector host and a probe, wherein the flaw detector host comprises a shell, a power supply circuit and a host panel in the shell, the power supply circuit comprises a first transformer, a second transformer, a third transformer and a power supply, the probe comprises a framework, a handle, a magnetization switch, a magnetization power socket, an iron core, a magnetization coil and a magnetic head, the magnetization power socket is connected with the power supply circuit, the framework is I-shaped, each free end of the framework is vertically and downwards movably connected with one iron core, the outside of each iron core is provided with the magnetization coil, the free end of each iron core is movably connected with one magnetic head, the magnetization coil is arranged clockwise along the left lower free end of the framework and sequentially comprises a first magnetization coil, a second magnetization coil, a third magnetization coil and a fourth magnetization coil, wherein the first magnetization coil and the third magnetization coil are powered by the first transformer, the second magnetizing coil and the fourth magnetizing coil are connected in series and are powered by a second transformer.

Preferably, the iron core is detachably hinged to the framework, and the magnetic head is detachably hinged to the iron core.

Preferably, the framework is made of silicon steel sheets.

Preferably, the probe is further provided with an illumination power supply seat, the multifunctional portable magnetic particle flaw detector is further provided with an illumination circuit, and the illumination circuit is electrically connected with the illumination power supply seat.

Preferably, the power supply circuit outputs a direct current power supply to the lighting circuit sequentially through the third transformer, the rectifying circuit and the filter circuit.

Preferably, the lighting circuit adopts an LED lighting circuit based on LM 3402.

The utility model discloses a multi-functional portable magnetic particle flaw detector, including flaw detector host computer and probe, the flaw detector host computer includes shell, power supply circuit and host computer panel in the shell, power supply circuit includes first transformer, second transformer, third transformer and power, the probe includes skeleton, handle, magnetization switch, magnetization supply socket, iron core, magnetizing coil and magnetic head, magnetization supply socket with power supply circuit connects, the skeleton is the I-shaped, an iron core is connected to every free end perpendicular downward swing joint of skeleton, be equipped with magnetizing coil outside every iron core, a magnetic head of the free end swing joint of every iron core, magnetizing coil begins clockwise along the lower left free end of skeleton and arranges, is first magnetizing coil, second magnetizing coil, third magnetizing coil and fourth magnetizing coil in proper order, the first magnetizing coil and the third magnetizing coil are connected in series and powered by a first transformer, and the second magnetizing coil and the fourth magnetizing coil are connected in series and powered by a second transformer. All adopt detachable articulated between skeleton and the iron core and between iron core and the magnetic head, the position of iron core and magnetic head is all adjustable, also can dismantle, and the probe of different forms all can be used, has improved magnetic particle flaw detector's commonality.

Drawings

FIG. 1 is a block diagram of the working principle of the multifunctional portable magnetic particle flaw detector of the present invention;

FIG. 2 is a schematic structural view of a probe in the multifunctional portable magnetic particle flaw detector of the present invention;

FIG. 3 is a power supply circuit diagram of a magnetizing coil in the multifunctional portable magnetic particle flaw detector of the present invention;

FIG. 4 is a circuit diagram of the lighting circuit of the multifunctional portable magnetic particle flaw detector of the present invention;

in the figure, 1-power supply circuit, 2-probe, 21-framework, 22-handle, 23-magnetization switch, 24-magnetization power socket, 25-iron core, 26-magnetization coil, 261-first magnetization coil, 262-second magnetization coil, 263-third magnetization coil, 264-fourth magnetization coil, 27-magnetic head, 3-lighting power socket and 4-lighting circuit.

Detailed Description

The following describes the present invention with reference to the accompanying drawings. It should be noted that the description of the embodiments is provided to help understanding of the present invention, but the present invention is not limited thereto. In addition, the technical features related to the embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.

As shown in fig. 1, 2 and 3, a multifunctional portable magnetic particle flaw detector comprises a flaw detector main unit (not shown) and a probe 2, wherein the flaw detector main unit comprises a shell (not shown), a power supply circuit 1 and a main unit panel (not shown) which are arranged in the shell, the power supply circuit 1 comprises a first transformer T1, a second transformer T2, a third transformer T3 and a power supply, the probe 2 comprises a framework 21, a handle 22, a magnetization switch 23, a magnetization power socket 24, iron cores 25, magnetization coils 26 and magnetic heads 27, the magnetization power socket 24 is connected with the power supply circuit 1, the framework 21 is in an i shape, each free end of the framework 21 is vertically and downwards movably connected with one iron core 25, each iron core 25 is externally provided with a magnetization coil 26, the free end of each iron core 25 is movably connected with one magnetic head 27, the magnetization coils 26 are arranged along the clockwise direction from the left lower free end of the framework 21, the first magnetizing coil 261, the second magnetizing coil 262, the third magnetizing coil 263 and the fourth magnetizing coil 264 are sequentially arranged, wherein the first magnetizing coil 261 and the third magnetizing coil 263 are connected in series and powered by a first transformer T1, and the second magnetizing coil 262 and the fourth magnetizing coil 264 are connected in series and powered by a second transformer T2.

The iron core 25 is detachably hinged on the framework 21, and the magnetic head 27 is detachably hinged on the iron core 25. The iron core 25 is detachably hinged on the framework 21, and the magnetic head 27 is detachably hinged on the iron core 25. The framework 21 and the iron core 25 as well as the iron core 25 and the magnetic head 27 are detachably hinged, the positions of the iron core 25 and the magnetic head 27 are adjustable and can be detached, the probes 2 in different forms can be used, and the universality of the magnetic powder flaw detector is improved. The angle and mutual position of each magnetic head 27 can be adjusted to suit the flaw detection requirements of workpieces with different shapes, such as planes, circular arcs and saddle shapes.

The framework 21 is made of silicon steel sheets. High strength and satisfactory rigidity.

As shown in FIG. 3, the switch S1 and the switch S2 are arranged on the host panel, when the probe is used as a rotating magnetic field probe or a fillet weld rotating magnetic field probe, the switch S2 on the host panel is opened, the relay J2 does not work, the normally open contacts J2-1 and J2-2 are opened, and the normally closed contact J2-3 is closed. When the magnetization switch 23 on the probe 2 is pressed, the P3 is conducted with the P5, the relay J1 is attracted, the normally open contact J1-1 is closed, the first transformer T1 and the second transformer T2 are electrified, and the secondary outputs of the first transformer T1 and the second transformer T2 respectively supply power to the second magnetization coil 262 and the fourth magnetization coil 264, and the first magnetization coil 261 and the third magnetization coil 263. The primary of the second transformer T2 is connected in parallel with a phase-shifting capacitor C1, the exciting current output by the secondary is in a certain phase difference with the secondary output of the first transformer T1, and the two sets of magnetizing coils of the probe 2 can generate an alternating magnetic field with a certain phase difference. When the probe is used as a fillet weld probe or a yoke type probe, or the hinge bolt is loosened, the set of iron core 25, magnetizing coil 26 and magnetic head 27 are removed, and only the other set corresponding to the magnetizing coil and the magnetizing coil is retained. The second magnetizing coil 262 and the fourth magnetizing coil 264 are supplied with power only by the first transformer T1 while being magnetized. If the field current needs to be increased, switch S2 on the host panel may be closed. During magnetization, the relay J1 and the relay J2 work, the normally closed contact J2-3 of the relay J2 is opened, the normally open contacts J2-1 and J2-2 are closed, and the same-name ends of primary and secondary outputs of the first transformer T1 and the second transformer T2 are connected in parallel, so that large exciting currents can be provided for the second magnetizing coil 262 and the fourth magnetizing coil 264 under the condition that exciting voltages are not changed.

The multifunctional portable magnetic particle flaw detector is characterized in that an illumination power supply seat 3 is further arranged on the probe 2, an illumination circuit 4 is further arranged on the multifunctional portable magnetic particle flaw detector, and the illumination circuit 4 is electrically connected with the illumination power supply seat 3. The power supply in the power supply circuit 1 outputs direct current power supply to the lighting circuit 4 through the third transformer T3, the rectifying circuit and the filter circuit in sequence. The lighting circuit 4 facilitates illumination and observation of magnetic marks in dark environments.

As shown in fig. 4, the lighting circuit adopts an LM 3402-based LED lighting circuit. LM3402 is a step-down voltage stabilizer derived from a controllable current source, and can drive a high-power and high-brightness LED lamp connected in series, and the input voltage range is 6V-42V. R3 is a resistor for adjusting the LED current, and the calculation is more complicated, and the average current can be estimated according to 0.2/R3. In order to prolong the service life of the LED lamp, the load of the third transformer T3 is reduced, where R3 is 1 Ω, and the average current is about 200 mA. The value of R1 is related to the quantity of LED lamp, and R1 takes 300K omega when 5 LED lamps. The 3 pins of the LM3402 are input ends of pulse width modulation signals, the brightness of the LED lamp can be adjusted, and when the pins are open-circuited, the dimming is not performed. The brightness is not needed during normal flaw detection, and the 3 pins of the LM3402 can be suspended without connection.

The utility model discloses a multi-functional portable magnetic particle flaw detector, including flaw detector host computer and probe 2, the flaw detector host computer includes shell (not shown in the figure), supply circuit 1 and the host computer panel in the shell, supply circuit 1 includes first transformer T1, second transformer T2, third transformer T3 and power, probe 2 includes skeleton 21, handle 22, magnetization switch 23, magnetization supply socket 24, iron core 25, magnetizing coil 26 and magnetic head 27, magnetization supply socket 24 with supply circuit 1 is connected, skeleton 21 is the I-shaped, perpendicular downward swing joint iron core 25 of every free end of skeleton 21, every iron core 25 is equipped with magnetizing coil 26 outward, a magnetic head 27 of the free end swing joint of every iron core 25, magnetizing coil 26 along the lower left free end of skeleton 21 begins clockwise direction and arranges, the first magnetizing coil 261, the second magnetizing coil 262, the third magnetizing coil 263 and the fourth magnetizing coil 264 are sequentially arranged, wherein the first magnetizing coil 261 and the third magnetizing coil 263 are connected in series and powered by a first transformer T1, and the second magnetizing coil 262 and the fourth magnetizing coil 264 are connected in series and powered by a second transformer T2. All adopt the detachable articulated between skeleton 21 and iron core 25 and the magnetic head 27, the position of iron core 25 and magnetic head 27 is all adjustable, also can dismantle, and different forms's probe 2 all can be used, has reduced the cost of flaw detector, has improved magnetic particle flaw detector's commonality.

The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the described embodiments. It will be apparent to those skilled in the art that various changes, modifications, substitutions and alterations can be made in the embodiments without departing from the principles and spirit of the invention, and the scope of the invention is to be accorded the full scope of the claims.

Claims (6)

1. The utility model provides a multi-functional portable magnetic particle flaw detector, includes flaw detector host computer and probe, its characterized in that: the flaw detector host comprises a shell, a power supply circuit and a host panel, wherein the power supply circuit comprises a first transformer, a second transformer, a third transformer and a power supply, a probe comprises a framework, a handle, a magnetization switch, a magnetization power socket, an iron core, a magnetization coil and a magnetic head, the magnetization power socket is connected with the power supply circuit, the framework is in an I shape, each free end of the framework is vertically and downwards movably connected with the iron core, the magnetization coil is arranged outside each iron core, the free end of each iron core is movably connected with the magnetic head, the magnetization coil is arranged along the lower left free end of the framework in the clockwise direction and sequentially comprises a first magnetization coil, a second magnetization coil, a third magnetization coil and a fourth magnetization coil, and the first magnetization coil and the third magnetization coil are connected in series and supplied with power by the first transformer, the second magnetizing coil and the fourth magnetizing coil are connected in series and are powered by a second transformer.

2. The multi-functional portable magnetic particle inspection instrument of claim 1, characterized in that: the iron core is detachably hinged to the framework, and the magnetic head is detachably hinged to the iron core.

3. The multi-functional portable magnetic particle inspection instrument of claim 1, characterized in that: the framework is made of silicon steel sheets.

4. The multi-functional portable magnetic particle inspection instrument of claim 1, characterized in that: the multifunctional portable magnetic particle flaw detector is characterized in that an illumination power supply seat is further arranged on the probe, and an illumination circuit is further arranged on the multifunctional portable magnetic particle flaw detector and is electrically connected with the illumination power supply seat.

5. The multi-functional portable magnetic particle inspection instrument of claim 4, characterized in that: and the power supply circuit outputs direct current power to the lighting circuit sequentially through the third transformer, the rectifying circuit and the filter circuit.

6. The multi-functional portable magnetic particle inspection instrument of claim 4, characterized in that: the lighting circuit adopts an LED lighting circuit based on LM 3402.

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