CN210572418U

CN210572418U - PCB probe row for solar cell electrical property tester

Info

Publication number: CN210572418U
Application number: CN201921020538.3U
Authority: CN
Inventors: 池军
Original assignee: Funing Sumin Green Energy Technology Co ltd
Current assignee: Funing Sumin Green Energy Technology Co ltd
Priority date: 2019-07-03
Filing date: 2019-07-03
Publication date: 2020-05-19
Anticipated expiration: 2029-07-03

Abstract

The utility model discloses a PCB probe row for solar cell electrical property tester of solar cell test technical field aims at solving the probe row circuit internal resistance that disposes on the tester among the prior art big, stability is not good enough, the more loose technical problem of overall structure. The PCB probe row comprises a PCB board and a plurality of probes, two lines which are not crossed with each other are printed on the PCB board, a plurality of probe connection points are arranged on the lines, and the probes are connected with the PCB board through the probe connection points; one end of the wiring is provided with an outer lead connecting point, and the PCB probe row is connected with the solar cell electrical property tester through the outer lead connecting point.

Description

PCB probe row for solar cell electrical property tester

Technical Field

The utility model relates to a PCB probe row for solar cell electrical property tester belongs to solar cell test technical field.

Background

The probe row is used as a direct contact part of the solar cell electrical property tester, and the stability and the contact with the cell electrode are good or not, so that the stability and the accuracy of the production line cell test are directly determined. At present, the probe row configured on the tester fixes each probe by taking an acrylic material as a probe support, and the probes are connected by a lead, so that the following defects exist in the practical use: firstly, the probe bar circuit has large internal resistance, and the test precision is reduced; secondly, the connection lead is not fixed, so that the stability of the probe bar circuit is not good enough, and the fluctuation of electrical property data obtained by testing the battery piece is large; thirdly, the overall structure is relatively loose, which is not beneficial to daily maintenance.

SUMMERY OF THE UTILITY MODEL

The utility model aims to overcome the defects in the prior art and provide a PCB probe row for a solar cell electrical property tester, which comprises a PCB board and a plurality of probes, wherein two lines which are not crossed with each other are printed on the PCB board, a plurality of probe connection points are arranged on the lines, and the probes are connected with the PCB board through the probe connection points; one end of the wiring is provided with an outer lead connecting point, and the PCB probe row is connected with the solar cell electrical property tester through the outer lead connecting point.

Furthermore, the connection mode of the probes and the PCB or/and the connection mode of the PCB probe row and the solar cell electrical property tester comprise welding.

Further, the soldering comprises silver soldering.

Furthermore, the two wires are parallel to each other, the probe connection points are uniformly distributed on the wires at equal intervals, and the external lead connection point is arranged at one end of the two wires in the same direction.

Furthermore, the probes are parallel to each other, the two ends of each probe exceed the upper edge and the lower edge of the PCB, and the two ends of each probe are connected with the PCB.

Further, the PCB board is a single panel.

Compared with the prior art, the utility model discloses the beneficial effect who reaches: the Printed Circuit Board (PCB) is adopted to carry out circuit connection on each probe, so that the internal resistance of the probe connection circuit is reduced, and the improvement of the test precision of the electrical property of the solar cell and the reduction of the test fluctuation are facilitated; the PCB also has the function of fixing each probe, simplifies the integral structure of the probe row, is favorable for reducing the maintenance man-hour and prolonging the service life.

Drawings

Fig. 1 is a schematic diagram of the circuit connection of the present invention.

In the figure: 1. a PCB board; 11. wiring; 12. a probe attachment point; 13. an outer wire connection point; 2. and (3) a probe.

Detailed Description

The present invention will be further described with reference to the accompanying drawings. The following examples are only for illustrating the technical solutions of the present invention more clearly, and the protection scope of the present invention is not limited thereby.

It should be noted that, in the description of the present invention, the terms "front", "rear", "left", "right", "upper", "lower", "inner", "outer", etc. indicate the directions or positional relationships based on the directions or positional relationships shown in the drawings, and are only for convenience of description of the present invention but do not require the present invention to be constructed and operated in a specific direction, and thus, should not be construed as limiting the present invention. As used in the description of the present invention, the terms "front," "back," "left," "right," "up," "down" and "in" refer to directions in the drawings, and the terms "inner" and "outer" refer to directions toward and away from, respectively, the geometric center of a particular component.

As shown in fig. 1, the circuit connection diagram of the present invention is a PCB probe row for a solar cell electrical performance tester, which includes a PCB board 1 and a plurality of probes 2, two lines 11 that do not cross each other are printed on the PCB board 1, a plurality of probe connection points 12 are arranged on the lines 11, and the probes 2 are connected to the PCB board 1 through the probe connection points 12; an outer lead connecting point 13 is arranged at one end of the wiring 11, and the PCB probe row is connected with the solar cell electrical property tester through the outer lead connecting point 13. The PCB has the advantages of high reliability, designability and the like, so that the production and design cost of the probe card is reduced, and the product reliability is improved; the probes 2 are electrically connected by the wiring 11, so that the internal resistance of a probe row circuit is reduced, the test precision of the electrical performance of the solar cell is improved, and the test fluctuation is reduced; the PCB also has the function of fixing the probe 2, simplifies the whole structure, is beneficial to reducing the maintenance man-hour and prolonging the service life.

As the preferred scheme, the probes 2 and the PCB board 1, and the PCB probe row and the solar cell electrical property tester are connected in a welding mode to ensure the connection reliability.

Preferably, the welding mode is silver welding to replace tin welding commonly used at present, so that the internal resistance of the probe bar is further reduced, and the test stability is improved.

Preferably, the two wires 11 are parallel to each other, and the probe connection points 12 are uniformly distributed on the wires 11 at equal intervals so as to reduce the length of the required wires 11 and further reduce the internal resistance of the probe row; the outer lead connecting point 13 is arranged at one end of the two wires 11 in the same direction, so that the connecting structure between the probe row and the solar cell electrical property tester is simplified, and the reliability is enhanced.

As the preferred scheme, 2 parallel to each other of probe, 2 both ends of probe surpass outer fringe about PCB board 1, and the position is connected with PCB board 1 between 2 both ends of probe for both ends all can test solar cell about 2 of probe, have avoided leading to unable problem of using because of reverse installation.

Preferably, the PCB board 1 is a single panel, which is beneficial to further reducing the manufacturing cost.

The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, a plurality of modifications and variations can be made without departing from the technical principle of the present invention, and these modifications and variations should also be considered as the protection scope of the present invention.

Claims

1. A PCB probe row for a solar cell electrical property tester is characterized by comprising a PCB (1) and a plurality of probes (2), wherein two lines (11) which are not crossed with each other are printed on the PCB (1), a plurality of probe connection points (12) are arranged on the lines (11), and the probes (2) are connected with the PCB (1) through the probe connection points (12); an outer lead connecting point (13) is arranged at one end of the wiring (11), and the PCB probe row is connected with the solar cell electrical property tester through the outer lead connecting point (13).

2. The PCB probe bank for the solar cell electrical performance tester as claimed in claim 1, wherein the connection manner of the probe (2) and the PCB board (1) or/and the PCB probe bank and the solar cell electrical performance tester comprises soldering.

3. The PCB probe card for a solar cell electrical performance tester as recited in claim 2, wherein the solder comprises silver solder.

4. The PCB probe card for a solar cell electrical property tester as claimed in claim 1, wherein the two wires (11) are parallel to each other, the probe connection points (12) are equally spaced apart on the wires (11), and the external lead connection points (13) are provided at the same direction end of the two wires (11).

5. The PCB probe bank for the solar cell electrical property tester as claimed in claim 4, wherein the probes (2) are parallel to each other, both ends of the probes (2) exceed the upper and lower outer edges of the PCB (1), and the two ends of the probes (2) are connected with the PCB (1) at a position between the two ends.

6. The PCB probe card for solar cell electrical property tester of any of claims 1 to 5, wherein the PCB board (1) is a single panel.