CN210571299U - System for measuring optical parameters of small-field projection module - Google Patents
System for measuring optical parameters of small-field projection module Download PDFInfo
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- CN210571299U CN210571299U CN201921601136.2U CN201921601136U CN210571299U CN 210571299 U CN210571299 U CN 210571299U CN 201921601136 U CN201921601136 U CN 201921601136U CN 210571299 U CN210571299 U CN 210571299U
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Abstract
A system for measuring optical parameters of a small-field projection module belongs to the technical field of projection module detection. The system for measuring the optical parameters of the small-field projection module comprises: the large target surface camera, the measured projection module, the mounting table and the optical parameter analysis module; the measured projection module and the large target surface camera are fixed on the mounting table, the distance between the measured projection module and the large target surface camera can be adjusted, the light sensing plane of the large target surface camera is vertical to the optical axis of the measured projection module, and the optical center of the measured projection module is always aligned with the center of the large target surface camera; the large target surface camera is used for acquiring a standard picture projected by the measured projection module, and the large target surface camera is electrically connected with the optical parameter analysis module to output an image electric signal. The utility model discloses the projection that can acquire little field of vision projection module is used for the analysis of projection module optical property, easily operates.
Description
Technical Field
The utility model relates to a technique in the optical detection field specifically is a system for measuring small visual field projection module optical parameter.
Background
The traditional measuring method is to control a projection module to project a graph onto a curtain, and measure optical parameters reflecting the performance of the projection module, such as uniformity, contrast, distortion, imaging quality and the like on the curtain by means of manual identification, an optical measuring instrument and the like. However, the projected image of the small view field projection module is very small, and the measurement tool used in the conventional measurement method is too large in size and cannot be used for measuring the optical parameters of the small view field projection module.
In order to solve the above problems existing in the prior art, the utility model discloses come from this.
SUMMERY OF THE UTILITY MODEL
The utility model discloses the aforesaid to prior art exists is not enough, provides a system for measuring small visual field projection module optical parameter, can acquire the projection of small visual field projection module for projection module optical property's analysis is easily operated.
The utility model relates to a system for be used for measuring small-field projection module optical parameter, include: the device comprises a mounting table, a projection module to be measured, a large target surface camera and an optical parameter analysis module; the measured projection module and the large target surface camera are fixed on the mounting table, the distance between the measured projection module and the large target surface camera is adjustable, the light sensing plane of the large target surface camera is vertical to the optical axis of the measured projection module, and the optical center of the measured projection module is always aligned with the center of the large target surface camera; the large target surface camera is used for acquiring a standard picture projected by the projection module to be detected, and the large target surface camera is electrically connected with the optical parameter analysis module to output an image electric signal.
Preferably, the side length of the large target surface camera pixel is not more than 1/3 of the side length of the projection image pixel, and the larger the difference between the two is, the more accurate the obtained optical parameters of the projection module are; further preferably, the large target surface camera adopts a high-resolution large target surface camera with not less than 2000 ten thousand pixels, and the photosensitive width is not less than the projection width of the projection module to be measured.
Preferably, an attenuator is arranged between the projection module to be measured and the large target surface camera, and the attenuator is mounted on the mounting table through a slide rail and slide block structure; further preferably, the attenuator is one or a combination of a filter and a polarizer to reduce the brightness of the resulting test image.
Preferably, the large target surface camera is provided with a shading cylinder at a light incidence end, so that the interference of ambient light on the large target surface camera photosensitive film is avoided.
Preferably, at least one of the projection module to be measured and the large target surface camera is mounted on the mounting table through a slide rail and slide block structure.
Preferably, the optical parameter analysis module adopts an upper computer, and the measurement of the optical parameters of the projection module to be measured is realized through software.
Technical effects
Compared with the prior art, the utility model discloses following technological effect has:
1) the optical parameter measurement can be carried out on the small-field projection module with the projection width smaller than 30 mm;
2) the large target surface camera directly obtains a standard picture projected by the projection module to be tested through the camera photosensitive film without installing a lens, so that a test image is not interfered by the camera lens, and the test image truly reflects the imaging projection effect of the projection module;
3) the obtained test image is clear, the information of the single projection image pixel can be distinguished, and the measurement accuracy is improved;
4) the test image can be preserved by the host computer, makes things convenient for projection module optical parameter to measure, and traces back.
Drawings
FIG. 1 is a system diagram in example 1;
in the figure: the device comprises a mounting table 1, a projection module 2 to be measured, an attenuator 3, a shading cylinder 4, a large target surface camera 5 and an upper computer 6.
Detailed Description
The present invention will be described in detail with reference to the accompanying drawings and specific embodiments.
Example 1
As shown in fig. 1, the present embodiment relates to a system for measuring optical parameters of a small field projection module, comprising: the device comprises an installation table 1, a projection module 2 to be measured, a large target surface camera 5 and an upper computer 6; the measured projection module 2 and the large target surface camera 5 are movably arranged on the mounting table 1 through a slide rail and slide block structure, the distance between the two is adjustable, the light sensing plane of the large target surface camera is vertical to the optical axis of the measured projection module, and the optical center of the measured projection module is always aligned with the center of the large target surface camera; the large target surface camera 5 is electrically connected with the upper computer 6 to output image electric signals, and the upper computer 6 realizes the measurement of the optical parameters of the projection module to be measured through software.
An attenuator 3 is arranged between the measured projection module 2 and the large target surface camera 5 to prevent overexposure, and the large target surface camera 5 is provided with a shading cylinder 4 at the light incidence end to avoid ambient light interference.
Preferably, the large target surface camera adopts a high-resolution large target surface camera with 2400 ten thousand pixels, and the side length of the pixel is less than 1/3 of the side length of the pixel of the projection image.
The embodiment is used for measuring the optical parameters of the small-field projection module, and comprises the following steps:
s1, mounting the projection module to be measured and the large target surface camera on a mounting table, enabling the light sensing plane of the large target surface camera to be perpendicular to the optical axis of the projection module to be measured, and enabling the optical center of the projection module to be measured to be always aligned with the center of the large target surface camera;
s2, opening the projection module to be tested, projecting a standard picture, preferably a rectangular image, obtaining the projection standard picture of the projection module to be tested by the large target surface camera photosensitive film to obtain a test image, and starting the upper computer to receive the test image; adjusting the attenuator to prevent the test image received by the test computer from being over exposed;
s3, adjusting the position of the projection module to be tested to a working distance, and then adjusting a focusing device on the projection module to be tested to reach a proper focusing position to make the test image clear;
s4, carrying out image analysis on the adjusted clear test image through the upper computer; specifically, the coordinates and/or gray values of each pixel of the test image are obtained, and the optical parameters of the projection module to be tested are calculated accordingly.
In the embodiment, a rectangular standard picture is taken as an example, and the distortion, the inclination and the uniformity in the optical parameters of the projection module to be measured are evaluated; in practical application, a targeted evaluation system can be designed according to the application occasions such as metering, quality inspection and the like and the requirements of application objects.
A. Distortion: and obtaining a distance difference value such as delta X or delta Y between the distortion limit position and the corresponding vertex at the distortion limit position on the test image, and comparing the distance difference value with the corresponding side length X or Y to obtain a distortion value delta X/X or delta Y/Y.
B. Inclination: based on two end points on any straight line of the standard picture, coordinates (x) of any corresponding two points on the test image are obtained1，y1) And (x)2，y2) Calculating
And judging the inclination degree according to the size of theta.
C. Uniformity: dividing a test image into a symmetrical nine-grid structure (influences caused by distortion and inclination can be ignored) to obtain average gray scale of each grid, wherein different images can adopt different division calculation modes;
one way of calculation is uniformity
Another way to calculate is uniformity
It is to be emphasized that: the above embodiments are only preferred embodiments of the present invention, and are not intended to limit the present invention in any form, and any simple modifications, equivalent changes and modifications made by the technical spirit of the present invention to the above embodiments are all within the scope of the technical solution of the present invention.
Claims (6)
1. A system for measuring optical parameters of a small field projection module, comprising: the large target surface camera, the measured projection module, the mounting table and the optical parameter analysis module;
the measured projection module and the large target surface camera are fixed on the mounting table, the distance between the measured projection module and the large target surface camera is adjustable, the light sensing plane of the large target surface camera is vertical to the optical axis of the measured projection module, and the optical center of the measured projection module is always aligned with the center of the large target surface camera;
the large target surface camera is used for acquiring a standard picture projected by the projection module to be detected, and the large target surface camera is electrically connected with the optical parameter analysis module to output an image electric signal.
2. The system for measuring optical parameters of a small field of view projection module of claim 1, wherein the side length of the large target surface camera pixel is no more than 1/3 of the side length of the projected image pixel.
3. The system for measuring optical parameters of a small-field projection module as claimed in claim 2, wherein said large target surface camera is a high-resolution large target surface camera with a resolution of not less than 2000 ten thousand pixels, and the photosensitive width is not less than the projection width of the projection module to be measured.
4. The system for measuring optical parameters of a small-field projection module as claimed in claim 1, wherein an attenuator is disposed between the projection module to be measured and the large-target-surface camera, and the attenuator is one or a combination of a filter and a polarizer.
5. The system of claim 4, wherein the large target camera is provided with a light shielding tube at the light incident end.
6. The system for measuring optical parameters of a small-field projection module as claimed in claim 1, wherein at least one of the measured projection module and the large-target camera is mounted on the mounting table by a slide rail slider structure.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921601136.2U CN210571299U (en) | 2019-09-25 | 2019-09-25 | System for measuring optical parameters of small-field projection module |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921601136.2U CN210571299U (en) | 2019-09-25 | 2019-09-25 | System for measuring optical parameters of small-field projection module |
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| Publication Number | Publication Date |
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| CN210571299U true CN210571299U (en) | 2020-05-19 |
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| CN201921601136.2U Active CN210571299U (en) | 2019-09-25 | 2019-09-25 | System for measuring optical parameters of small-field projection module |
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- 2019-09-25 CN CN201921601136.2U patent/CN210571299U/en active Active
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