CN210426376U - Assembly part aperture detection gauge - Google Patents

Assembly part aperture detection gauge Download PDF

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Publication number
CN210426376U
CN210426376U CN201921645012.4U CN201921645012U CN210426376U CN 210426376 U CN210426376 U CN 210426376U CN 201921645012 U CN201921645012 U CN 201921645012U CN 210426376 U CN210426376 U CN 210426376U
Authority
CN
China
Prior art keywords
detection
base
movable ruler
aperture
cone
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201921645012.4U
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Chinese (zh)
Inventor
王墩宏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzhou Boneed Photovoltaic Technology Co ltd
Original Assignee
Suzhou Chiteng Precision Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suzhou Chiteng Precision Technology Co Ltd filed Critical Suzhou Chiteng Precision Technology Co Ltd
Priority to CN201921645012.4U priority Critical patent/CN210426376U/en
Application granted granted Critical
Publication of CN210426376U publication Critical patent/CN210426376U/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Abstract

The utility model belongs to the technical field of utensil is examined to the frock, concretely relates to utensil is examined in assembly part aperture. The assembly part aperture detection gauge comprises a base, a movable ruler plate and a detection cone; the detection device is characterized in that detection cones are symmetrically arranged on the base, movable ruler plates are assembled on the base through the detection cones, the detection cones penetrate through the movable ruler plates, a pressure spring is sleeved on the detection cone between the base and the movable ruler plates, one end of the pressure spring is fixedly connected with the base, and the other end of the pressure spring is fixedly connected with the contact surface of the movable ruler plates. The beneficial effects are as follows: simple structure can support the circuit board through graticule mesh and length scale interval on the slip chi board and measure the detection, and hole on the circuit board, accessible detect the awl and detect, judge whether aperture satisfies the demands according to the aperture scale interval on the detection awl, and the pressure spring between base and the activity chi board is convenient for detect time measuring, resets after pushing down the activity chi board, is convenient for detect the awl and breaks away from the hole on the circuit board, easy operation, convenient to use.

Description

Assembly part aperture detection gauge
Technical Field
The utility model belongs to the technical field of utensil is examined to the frock, concretely relates to utensil is examined in assembly part aperture.
Background
The method for detecting the aperture of the part mainly comprises the steps of detecting through a go-no go gauge, has a great defect, only can detect whether the part is in a qualified range or not, cannot accurately detect the actual size of the aperture of the part, and sometimes can cause a large number of parts to be at zero boundary points of qualified products, so that the best use state of the part cannot be well guaranteed, and no proper detection tool is used for quickly detecting the aperture of the circuit board aiming at the aperture detection of the circuit board, so that inconvenience is brought to the aperture detection of the circuit board.
SUMMERY OF THE UTILITY MODEL
The utility model discloses a remedy prior art's defect provides an assembly part aperture detects and examines utensil.
The utility model discloses a realize through following technical scheme:
an assembly part aperture detection gauge comprises a base, a movable ruler plate and a detection cone; the detection device is characterized in that detection cones are symmetrically arranged on the base, movable ruler plates are assembled on the base through the detection cones, the detection cones penetrate through the movable ruler plates, a pressure spring is sleeved on the detection cone between the base and the movable ruler plates, one end of the pressure spring is fixedly connected with the base, and the other end of the pressure spring is fixedly connected with the contact surface of the movable ruler plates.
Furthermore, the outer contour of the bottom of the detection cone is a cylinder, the outer contour of the top of the detection cone is a cone, and an aperture scale value is engraved on the surface of one end of the cone.
Furthermore, the surface of the movable ruler plate is carved with graticule grids which are staggered in a horizontal and vertical equidistance mode, and the interpenetration positions of the graticule grids are all provided with length scale values.
Further, the length and width of the base and the movable ruler plate are consistent.
Furthermore, the base and the movable ruler plate are both plastic plates.
The utility model has the advantages that: simple structure can support the circuit board through graticule mesh and length scale interval on the slip chi board and measure the detection, and hole on the circuit board, accessible detect the awl and detect, judge whether aperture satisfies the demands according to the aperture scale interval on the detection awl, and the pressure spring between base and the activity chi board is convenient for detect time measuring, resets after pushing down the activity chi board, is convenient for detect the awl and breaks away from the hole on the circuit board, easy operation, convenient to use.
Drawings
The present invention will be further described with reference to the accompanying drawings.
Fig. 1 is a schematic structural diagram of the present invention.
In the figure, a base 1, a movable ruler plate 2, a detection cone 3, a pressure spring 4, an aperture scale value 5, a reticle grid 6 and a length scale value 7 are arranged.
Detailed Description
Fig. 1 shows an embodiment of the present invention. The utility model relates to an assembly part aperture detection gauge, which comprises a base 1, a movable ruler plate 2 and a detection cone 3; the symmetry is equipped with and detects awl 3 on the base 1, is equipped with movable chi board 2 through each detection awl 3 on the base 1, and each detection awl 3 runs through movable chi board 2, and the cover has pressure spring 4 on the detection awl 3 that is located between base 1 and the movable chi board 2, 4 one end of pressure spring and base 1 fixed connection, one end and the 2 contact surface fixed connection of movable chi board in addition.
Furthermore, the outer contour of the bottom of the detection cone 3 is a cylinder, the outer contour of the top of the detection cone 3 is a cone, and an aperture scale value 5 is engraved on the surface of one end of the cone.
Furthermore, reticle grids 6 which are staggered in a horizontal and vertical equidistant mode are engraved on the surface of the movable ruler plate 2, and length scale values 7 are arranged at the interpenetration positions of the reticle grids 6.
Further, the length and width of the base 1 are consistent with those of the movable ruler plate 2.
Further, the base 1 and the movable ruler plate 2 are both plastic plates.
The utility model relates to an utensil is examined in assembly part aperture detection places the circuit board on activity chi board 2 during the use to the hole that will detect corresponds with detection awl 3, pushes down activity chi board 2, utilizes detection awl 3 on the base 1 to run through activity chi board 2 and extend to in the hole, through detecting 3 detection aperture sizes of awl, after reading the aperture scale interval 5 on the detection awl 3, the activity chi board 2 that resets can, in the testing process, the circuit board descends and rises along with activity chi board 2 synchronization, avoids detecting 3 bad holes of awl.
The present invention is not limited to the above embodiments, and any person should learn to make under the teaching of the present invention and the present invention has the same or similar technical solution, and all fall into the protection scope of the present invention.
The technology, shape and construction parts which are not described in detail in the present invention are all known technology.

Claims (5)

1. An assembly part aperture detection gauge comprises a base, a movable ruler plate and a detection cone; the device is characterized in that the base is symmetrically provided with detection cones, the base is provided with movable ruler plates through the detection cones, the detection cones penetrate through the movable ruler plates, the detection cones located between the base and the movable ruler plates are sleeved with pressure springs, one end of each pressure spring is fixedly connected with the base, and the other end of each pressure spring is fixedly connected with a contact surface of the corresponding movable ruler plate.
2. The assembly aperture detection tool of claim 1, wherein: the external profile of the bottom of the detection cone is a cylinder, the external profile of the top of the detection cone is a cone, and an aperture scale value is engraved on the surface of one end of the cone.
3. The assembly aperture detection tool of claim 1, wherein: the surface of the movable ruler plate is carved with graticule grids which are staggered in a horizontal and vertical equidistance mode, and the interpenetration positions of the graticule grids are all provided with length scale values.
4. The assembly aperture detection tool of claim 1, wherein: the length and width of the base and the movable ruler plate are consistent.
5. The assembly aperture detection tool of claim 1, wherein: the base and the movable ruler plate are both plastic plates.
CN201921645012.4U 2019-09-29 2019-09-29 Assembly part aperture detection gauge Expired - Fee Related CN210426376U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201921645012.4U CN210426376U (en) 2019-09-29 2019-09-29 Assembly part aperture detection gauge

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201921645012.4U CN210426376U (en) 2019-09-29 2019-09-29 Assembly part aperture detection gauge

Publications (1)

Publication Number Publication Date
CN210426376U true CN210426376U (en) 2020-04-28

Family

ID=70368042

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201921645012.4U Expired - Fee Related CN210426376U (en) 2019-09-29 2019-09-29 Assembly part aperture detection gauge

Country Status (1)

Country Link
CN (1) CN210426376U (en)

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Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant
TR01 Transfer of patent right

Effective date of registration: 20211116

Address after: A5a03, No.8, exploratory Road, Huishan Economic Development Zone, Wuxi City, Jiangsu Province, 214000

Patentee after: Wuxi hongzhichuang Auto Parts Co.,Ltd.

Address before: 215000 No. 143-68, Changhong Road, Luzhi Town, Wuzhong District, Suzhou City, Jiangsu Province

Patentee before: Suzhou chiteng Precision Technology Co.,Ltd.

TR01 Transfer of patent right
TR01 Transfer of patent right

Effective date of registration: 20220126

Address after: 215000 west side of Wuyue Road, Qidu Town, Wujiang District, Suzhou City, Jiangsu Province

Patentee after: SUZHOU BONEED PHOTOVOLTAIC TECHNOLOGY Co.,Ltd.

Address before: A5a03, No.8, exploratory Road, Huishan Economic Development Zone, Wuxi City, Jiangsu Province, 214000

Patentee before: Wuxi hongzhichuang Auto Parts Co.,Ltd.

TR01 Transfer of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20200428

CF01 Termination of patent right due to non-payment of annual fee