CN210378087U

CN210378087U - Atomic force microscopic teaching aid for science popularization

Info

Publication number: CN210378087U
Application number: CN201920802835.7U
Authority: CN
Inventors: 王艳艳; 边琰
Original assignee: Tianjin University of Technology and Education China Vocational Training Instructor Training Center
Current assignee: Tianjin University of Technology and Education China Vocational Training Instructor Training Center
Priority date: 2019-05-30
Filing date: 2019-05-30
Publication date: 2020-04-21
Anticipated expiration: 2029-05-30

Abstract

The utility model discloses an atomic force microscopic teaching aid for science popularization, which comprises a base supporting plate, an upper supporting plate assembled right above the base supporting plate through a damping piece, and an AFM probe fixed right above the upper supporting plate through an adjusting screw; a sample table is fixed on the upper surface of the upper supporting plate, the sample table is positioned right below a probe at the bottom of the AFM probe, a sleeve is detachably fixed at the bottom of the upper supporting plate, a piezoelectric ceramic scanning tube is positioned in the sleeve and right below the sample table, and the bottom surface of the sleeve is higher than the base supporting plate; the AFM probe and the piezoelectric ceramic scanning tube are in communication connection with a circuit module. The utility model discloses the dismouting of being convenient for, it is with low costs, the science popularization teaching of being convenient for is used.

Description

Atomic force microscopic teaching aid for science popularization

Technical Field

The utility model relates to an atomic force microscope technical field especially relates to a science is general uses micro-teaching aid of atomic force and working method thereof.

Background

Understanding and understanding nanotechnology requires advanced instrumentation, and in the early 20 th century, 80 s, the utility model of scanning probe microscopy enabled researchers to observe and manipulate the nanometer world. Since the instrument has resolution far exceeding that of an optical microscope, reaching the sub-nanometer level, the instrument becomes an eye and a hand for researchers to explore the nanometer world. As an important member in a scanning probe microscope family, an Atomic Force Microscope (AFM) can test the surface morphology of micro-nano structures such as insulators, conductors, semiconductors and the like, has high test resolution (the longitudinal direction can reach 0.01nm), does not damage a tested sample in the test process, and is widely applied. However, the traditional atomic force microscope has a very high cost (millions of yuan), and is complex to operate, so that non-professional researchers often cannot observe the magical and colorful nanometer world by using the instrument, and cannot know about nanotechnology.

At present, commercial AFMs in the market are mostly used for scientific research work, instruments are large in size and complex to operate, and cannot be effectively applied to popularization of science-popularization nanotechnology, and science-popularization teaching aids of nanotechnology are generally few. Therefore, the popular science type AFM teaching aid which is simple in structure and convenient to install and operate is necessary.

SUMMERY OF THE UTILITY MODEL

The utility model aims at that Atomic Force Microscope (AFM) cost to existence among the prior art is high, is not suitable for non-professional scientific research personnel's problem, and provides a atomic force is micro-teaching aid for science popularization, and this teaching aid simple structure, cost are low, do not have the requirement to operating personnel's professional degree, are applicable to the teaching of science popularization nature.

The utility model provides a further aspect provides the work method of the atomic force microscopic teaching aid for science and popularization, and the method is simple and easy to operate.

For realizing the utility model discloses a technical scheme that the purpose adopted is:

a atomic force microscopic teaching aid for science popularization is characterized by comprising a base supporting plate, an upper supporting plate and an AFM probe, wherein the upper supporting plate is assembled right above the base supporting plate through a damping piece, and the AFM probe is fixed right above the upper supporting plate through an adjusting screw;

a detachable sleeve is fixed at the bottom of the upper supporting plate, the bottom surface of the sleeve is higher than that of the base supporting plate, a piezoelectric ceramic scanning tube is fixed in the sleeve, a sample table is fixed at the top of the piezoelectric ceramic scanning tube and is positioned right below a probe at the bottom of the AFM probe, and the sample table is driven by the piezoelectric ceramic scanning tube to move in the direction X, Y, Z;

the AFM probe and the piezoelectric ceramic scanning tube are in communication connection with a circuit module.

In the above technical scheme, it is a ring plate to go up the backup pad, the sleeve pipe is fixed go up the intra-annular of backup pad, just sheathed tube top surface with the top surface of going up the backup pad flushes mutually, sheathed tube bottom seals the top and forms a confession the constant head tank of piezoceramics scanning tube embedding.

In the above technical solution, the model of the circuit module is KPAFMCC 01.

In the above technical solution, the AFM probe is a small AFM probe based on DVD optical pickup.

In the above technical solution, the piezoelectric ceramic scanning tube is a piezoelectric ceramic scanner with model number 2005, and the scanning range is 15 μm × 15 μm × 4.2 μm.

In the above technical solution, the lead on the piezoelectric ceramic scanning tube is led out through the lead hole on the side wall of the sleeve and then electrically connected to the circuit module. The lead wires are led out from the lead wire holes, so that the whole circuit is simpler.

In the technical scheme, the lead of the AFM probe is electrically connected with the circuit module, and the circuit module is connected to an upper computer through a USB interface. The USB connection mode is convenient for plug-in mounting.

In the above technical scheme, the sample stage is a magnet sample stage, and the sample stage is bonded and fixed on the piezoelectric ceramic scanning tube

In the above technical solution, the damping member is a plurality of damping springs symmetrically arranged, the top of each damping spring is fixed on the lower surface of the upper supporting plate, and the bottom of each damping spring is fixed on the upper surface of the base supporting plate.

In the above technical solution, the sleeve is fixed on the upper support plate by a screw.

In the technical scheme, the top of the upper supporting plate is provided with a connecting plate, the screw penetrates through the connecting plate and then fixes the sleeve on the upper supporting plate, and the bottom of the adjusting screw penetrates through the connecting plate and then fixes the sleeve on the top surface of the upper supporting plate.

The working method of the atomic force microscopic teaching aid for science popularization comprises the following steps:

step 1, rotating an adjusting screw to enable the probe to approach a sample on the sample table, and enabling the probe to be in contact with the sample;

step 2, the circuit module controls the piezoelectric ceramic scanning tube to stretch in the Z direction until a probe on the probe and a sample on the sample platform are just contacted, the probe and the sample platform are interacted after contacting the sample, so that the probe is bent, the circuit module collects the bending quantity, converts the bending quantity into height information of the surface of the sample and transmits the height information outwards (an upper computer receives and displays the height information), and meanwhile, the circuit module collects X, Y displacement values of the scanning platform at the moment and transmits the height information outwards, and X, Y, Z forms a pixel point;

and 3, continuously driving the scanning platform to move along the direction X, Y by the circuit module, continuously acquiring the bending amount of the point probe until all scanning is finished, and acquiring 256 × 256 pixel points in total to form an image.

Compared with the prior art, the beneficial effects of the utility model are that:

1. this device simple structure, AFM probe, shock mounting and sweep the face platform all detachable link together, so can realize equipment by oneself, convenient to detach, portable can be applied to the teaching of anytime and anywhere, does not have special requirement to the teaching environment.

2. The device has simple components, simple and convenient connection mode, low cost and convenient popularization to teaching on a large scale.

3. The device is simple to operate, the upper computer display interface comprises an image display part and a button control part, the button control part comprises a scanning button and a stopping button, people with certain physical knowledge or no operation experience can also complete experiment operation to obtain a nanoscale image, and the device is convenient to use in science popularization teaching.

Drawings

FIG. 1 is a diagram of an atomic force microscope for science popularization;

fig. 2 is a connection structure diagram of the atomic force microscopic teaching aid for science popularization and an upper computer.

Fig. 3 is a working principle diagram of an atomic force microscope teaching aid for science popularization.

In the figure: 1-AFM probe, 2-adjusting screw, 3-screw, 4-connecting plate, 5-upper supporting plate, 6-piezoelectric ceramic scanning tube, 7-sleeve, 8-shock absorbing piece, 9-base supporting plate, 10-probe, 11-sample stage, 12-lead hole, 13-circuit module and 14-upper computer.

Detailed Description

The present invention will be described in further detail with reference to the following drawings and specific embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

Example 1

A atomic force microscopic teaching aid for science popularization is characterized by comprising a base supporting plate 9, an upper supporting plate 5 and an AFM probe 1, wherein the upper supporting plate 5 is assembled above the base supporting plate 9 through a damping piece 8, and the AFM probe 1 is fixed above the upper supporting plate 5 through an adjusting screw 2;

a detachable sleeve 7 is fixed at the bottom of the upper support plate 5, the bottom surface of the sleeve 7 is higher than the base support plate 9, a piezoelectric ceramic scanning tube 6 is fixed in the sleeve 7 (the bottom of the piezoelectric ceramic scanning tube 6 is adhered in the sleeve 7 by liquid glue), a sample stage 11 is fixed at the top of the piezoelectric ceramic scanning tube 6, the sample stage 11 is positioned under the bottom probe 10 of the AFM probe, and the sample stage 11 is driven by the piezoelectric ceramic scanning tube 6 to move in the direction X, Y, Z;

the AFM probe 1 and the piezoelectric ceramic scanning tube 6 are in communication connection with a circuit module 13.

Go up backup pad 5 and be a annular plate, sleeve pipe 7 is fixed go up the intra-annular of backup pad 5, just sleeve pipe 7 the top surface with the top surface of going up backup pad 5 flushes mutually, sleeve pipe 7's bottom seals the top and forms a confession the constant head tank of piezoceramics scanning tube 6 embedding, piezoceramics scanning tube 6 drive sample platform 11 is in it removes to do X, Y, Z directions on the top surface of backup pad 5.

When the shockproof scanning platform is used, the upper supporting plate 5 is placed on a fixed surface, the upper supporting plate 5, the base supporting plate 9 and the shock absorption piece 8 form a shock absorption device, and the scanning platform formed by the piezoelectric ceramic scanning tube 6 and the sleeve 7 is placed in the shock absorption device, so that the scanning platform is not in contact with the ground, and the shockproof purpose is realized. The anti-vibration device plays a role in preventing the ground vibration from influencing the test result. The accuracy of the measurement can be improved.

Example 2

The model of the circuit module is KPAFMCC 01. And the signal acquired by the AFM probe 1 is sent to the circuit module, amplified, processed and sent to the upper computer 14.

The circuit module is in communication connection with an upper computer, the upper computer is used for sending instructions to the circuit module and receiving signals transmitted by the circuit module, and meanwhile a display interface of the upper computer displays test results. The upper computer display interface comprises an image display part and a button control part, the pixel size of the image display part is set to be 256 multiplied by 256, the button control part comprises a scanning button and a stopping button and is used for sending signals to the circuit module, the circuit module receives the signals and drives the piezoelectric ceramic driver to scan or stop scanning, and therefore a test image is obtained.

Preferably, the AFM probe 1 is a small AFM probe manufactured by an optical pickup unit based on DVD. See, for example, references Wang W M, Huang K Y, Huang H F, et al, Low-voltage and high-performance buczer-scanner based on a linear atomic force microprocessor system [ J ]. Nanotechnology,2013,24(45):455503.

Preferably, the piezoceramic scanning tube 6 is a Harbin core Mingtian piezoceramic scanner model 2005 with a scanning range of 15 μm × 15 μm × 4.2 μm.

The working method comprises the following steps: the operation of approaching the probe 10 to the sample on the sample table 11 can be realized by rotating the adjusting screw 2. Until the probe 10 contacts the sample. Clicking a 'scanning' button on a display interface of the upper computer, starting scanning by the piezoelectric ceramic scanning tube, judging whether the probe contacts a sample or not through longitudinal scanning, controlling the piezoelectric ceramic scanning tube 6 to stretch in the Z direction by the circuit module until the probe 10 on the probe and the sample on the sample table 11 just contact, and enabling the probe 10 to be mutually interacted after contacting the sample, so that the probe is bent, and acquiring the bending amount and converting the bending amount into height information of the surface of the sample by the circuit module. And the displacement value is sent to an upper computer, meanwhile, a circuit module collects X, Y displacement values of the scanning table at the moment and sends the displacement values to the upper computer, and X, Y, Z forms a pixel point. Then, the circuit module continues to drive the scanning platform to move along the direction X, Y, the bending amount of the point probe is continuously acquired until all scanning is finished, 256 × 256 pixel points are acquired in total, an image is formed, and the image is displayed on the display interface.

Preferably, the lead wire on the piezoceramic scanning tube 6 is led out through the lead wire hole 12 on the side wall of the sleeve 7 and then electrically connected with the circuit module. The lead wires are led out from the lead wire holes 12, so that the whole circuit is more concise.

Preferably, the lead of the AFM probe 1 is electrically connected with the circuit module, and the circuit module is connected to an upper computer through a USB interface. The USB connection mode is convenient for plug-in mounting.

Preferably, the sample stage 11 is a magnet type sample stage, and the sample stage 11 is fixed to the piezoelectric ceramic scanning tube 6 by bonding. When in use, a sample is stuck on the small iron sheet by using the double-sided adhesive tape, and the small iron sheet is directly placed on the magnetic sample table for fixing.

Example 3

Damping member 8 is the damping spring that a plurality of symmetries set up, each damping spring's top is fixed on the lower surface of last backup pad 5, damping spring's bottom is fixed on the upper surface of base backup pad 9.

Preferably, the two ends of the damping spring are hook-shaped and respectively hooked in the fixing rings of the upper support plate 5 and the base support plate 9.

As preferred mode, damping spring is cylindrical spring, and the upper and lower both ends of spring insert in the cylindrical slot and welded fastening on backup pad 5 and the base backup pad 9, perhaps the bottom of going up backup pad 5 is fixed with little cylinder, the top of base backup pad 9 is fixed with little cylinder, and two little cylinder covers are in the inside and welded fastening at cylindrical spring's upper and lower both ends.

Preferably, the sleeve 7 is fixed to the upper support plate 5 by means of screws 3.

Preferably, a connecting plate 4 is arranged at the top of the upper supporting plate 5, the screw 3 passes through the connecting plate 4 and then fixes the sleeve 7 on the upper supporting plate 5, and the bottom of the adjusting screw 2 passes through the connecting plate 4 and then fixes on the top surface of the upper supporting plate 5.

Spatially relative terms, such as "upper," "lower," "left," "right," and the like, may be used in the embodiments for ease of description to describe one element or feature's relationship to another element or feature as illustrated in the figures. It will be understood that the spatial terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, elements described as "below" other elements or features would then be oriented "above" the other elements or features. Thus, the exemplary term "lower" can encompass both an upper and a lower orientation. The device may be otherwise oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.

Moreover, relational terms such as "first" and "second," and the like, may be used solely to distinguish one element from another element having the same name, without necessarily requiring or implying any actual such relationship or order between such elements.

The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, a plurality of improvements and decorations can be made without departing from the principle of the present invention, and these improvements and decorations should also be regarded as the protection scope of the present invention.

Claims

1. A atomic force microscopic teaching aid for science popularization is characterized by comprising a base supporting plate, an upper supporting plate and an AFM probe, wherein the upper supporting plate is assembled right above the base supporting plate through a damping piece, and the AFM probe is fixed right above the upper supporting plate through an adjusting screw;

2. The atomic force microscope for science and popularization as set forth in claim 1, wherein the upper support plate is a ring-shaped plate, the sleeve is fixed in the ring of the upper support plate, the top surface of the sleeve is flush with the top surface of the upper support plate, and a positioning groove for embedding the piezoceramic scanning tube is formed at the top of the bottom seal of the sleeve.

3. The atomic force microscope teaching aid for science according to claim 1, wherein the model of the circuit module is KPAFMCC 01.

4. The atomic force microscopy teaching aid of claim 1, wherein the AFM probe is a small AFM probe based on DVD optical pickup.

5. A science atomic force microscopy teaching aid as claimed in claim 1 wherein the piezo ceramic scanning tube is a model 2005 piezo ceramic scanner.

6. The atomic force microscope teaching aid for science popularization according to claim 1, wherein the lead wires on the piezoelectric ceramic scanning tube are led out through the lead wire holes on the side wall of the sleeve and then electrically connected with the circuit module.

7. An atomic force microscope teaching aid for science according to claim 1, wherein the sample stage is a magnet type sample stage, and the sample stage is fixed on the piezoelectric ceramic scanning tube by bonding.

8. An atomic force microscope teaching aid for science according to claim 1, wherein the shock absorbing member is a plurality of shock absorbing springs symmetrically arranged, the top of each shock absorbing spring is fixed on the lower surface of the upper supporting plate, and the bottom of each shock absorbing spring is fixed on the upper surface of the base supporting plate.

9. A science atomic force microscope teaching aid according to claim 1 wherein the sleeve is secured to the upper support plate by screws.

10. An atomic force microscope teaching aid for science popularization according to claim 9, wherein a connecting plate is arranged at the top of the upper supporting plate, the screw penetrates through the connecting plate to fix the sleeve on the upper supporting plate, and the bottom of the adjusting screw penetrates through the connecting plate to be fixed on the top surface of the upper supporting plate.