CN210375628U - Lens detecting system - Google Patents
Lens detecting system Download PDFInfo
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- CN210375628U CN210375628U CN201921262689.XU CN201921262689U CN210375628U CN 210375628 U CN210375628 U CN 210375628U CN 201921262689 U CN201921262689 U CN 201921262689U CN 210375628 U CN210375628 U CN 210375628U
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- inspection system
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Abstract
The application discloses a lens detection system, which comprises an objective table, a lens detection unit and a lens detection unit, wherein the objective table is used for bearing a lens; an annular light source located above the stage for generating light rays that impinge on the lens surface; the image acquisition equipment is positioned above the annular light source and used for acquiring an image of the surface of the lens irradiated by the light rays, wherein the image acquisition equipment comprises a microscope and an image acquisition device; and the computer is connected with the image acquisition equipment and is used for acquiring the image and judging whether the surface of the lens has the defects or not according to the image. It is thus clear that the light source to the surperficial emission light of lens is annular light source in this application, guarantees all to have the light to penetrate at the surperficial all directions of lens, to the mar flaw of arbitrary distribution on the lens surface, guarantees that there is light to be the vertically at the surperficial projection direction of lens and the angle of mar, makes the formation of image contrast ratio of mar the highest, and then when making the computer judge whether there is the flaw on the lens surface according to the surperficial image of the lens of gathering, improves the detection precision of flaw.
Description
Technical Field
The application relates to the technical field of lens detection, in particular to a lens detection system.
Background
The problem of defects, which are a critical factor in evaluating the quality of lenses, inevitably occurs during the production of the lenses. Flaw detection to the lens has been carried out the transition to machine vision detection by traditional artifical naked eye detection, and when gathering the image on lens surface, set up a some light source and shine the lens surface at one side of camera central line, for the camera light filling to improve the precision of gathering the image.
When the scratch defect of the lens is detected, the direction of the scratch is randomly distributed on the surface of the lens, so the projection direction of the light emitted by the single point light source on the surface of the lens and the angle of the scratch are also random, and the smaller the angle is, the weaker the imaging contrast of the scratch is, and the lower the detection precision of the scratch defect is caused.
Therefore, how to solve the above technical problems should be a great concern to those skilled in the art.
SUMMERY OF THE UTILITY MODEL
The application aims at providing a lens detecting system to improve the detection precision of lens mar flaw.
In order to solve the above technical problem, the present application provides a lens inspection system, including:
the objective table is used for bearing the lens;
an annular light source positioned above the stage for generating light rays that impinge on the lens surface;
the image acquisition equipment is positioned above the annular light source and used for acquiring the image of the surface of the lens irradiated by the light rays, wherein the image acquisition equipment comprises a microscope and an image acquisition device;
and the computer is connected with the image acquisition equipment and is used for acquiring the image and judging whether the surface of the lens has flaws according to the image.
Optionally, the annular light source is a light source composed of a plurality of independent light sources.
Optionally, the plurality of independent light sources are all kola illumination light sources.
Optionally, the method further includes:
and the angle adjusting bracket is connected with the Kolla lighting source and is used for adjusting the angle between the Kolla lighting source and the lens.
Optionally, the angle ranges from 35 ° to 55 °, inclusive.
Optionally, the method further includes:
the first mobile equipment is connected with the computer and is used for moving the position of the object stage, wherein the first mobile equipment comprises a transverse moving device and a longitudinal moving device;
and the second mobile equipment is connected with the computer and is used for moving the position of the image acquisition equipment.
Optionally, the method further includes:
the camera is positioned between the image acquisition equipment and the annular light source and is used for acquiring a table top image of the object stage and sending the table top image to the computer, so that the computer can control the first mobile equipment and the second mobile equipment according to the table top image.
Optionally, the image acquisition device is a CCD image acquisition device.
Optionally, a lens in the koala lighting source close to the LED lamp bead is a spherical lens.
Optionally, the first mobile device and the second mobile device are both connected to the computer through serial ports.
The lens detection system provided by the application comprises an objective table, a lens detection unit and a lens detection unit, wherein the objective table is used for bearing the lens; an annular light source positioned above the stage for generating light rays that impinge on the lens surface; the image acquisition equipment is positioned above the annular light source and used for acquiring the image of the surface of the lens irradiated by the light rays, wherein the image acquisition equipment comprises a microscope and an image acquisition device; and the computer is connected with the image acquisition equipment and is used for acquiring the image and judging whether the surface of the lens has flaws according to the image. It is thus clear that the light source to the surperficial emission light of lens is annular light source in this application, guarantees all to have the light to penetrate at the surperficial all directions of lens, to the mar flaw of arbitrary distribution on the lens surface, guarantees that there is light to be the vertically at the surperficial projection direction of lens and the angle of mar, makes the formation of image contrast ratio of mar highest, and then makes the computer judge according to the surperficial image of the lens of gathering whether the lens surface has the flaw, improves the detection precision of flaw.
Drawings
For a clearer explanation of the embodiments or technical solutions of the prior art of the present application, the drawings needed for the description of the embodiments or prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a lens inspection system according to an embodiment of the present disclosure;
FIG. 2 is a schematic view of the projection of light on the surface of a lens and scratches;
FIG. 3 is a schematic view of a ring light source;
FIG. 4 is a structural diagram of a defect of a light irradiation point;
FIG. 5 is a schematic diagram of a Korea illumination source;
fig. 6 is a schematic structural diagram of another lens inspection system according to an embodiment of the present disclosure.
Detailed Description
In order that those skilled in the art will better understand the disclosure, the following detailed description will be given with reference to the accompanying drawings. It is to be understood that the embodiments described are only a few embodiments of the present application and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention, but the present invention may be implemented in other ways different from the specific details set forth herein, and one skilled in the art may similarly generalize the present invention without departing from the spirit of the present invention, and therefore the present invention is not limited to the specific embodiments disclosed below.
Referring to fig. 1 and 2, fig. 1 is a schematic structural diagram of a lens inspection system according to an embodiment of the present disclosure, and fig. 2 is a schematic diagram of light projected and scratched on a lens surface, the lens inspection system including:
the objective table 1 is used for bearing the lens 5;
an annular light source 2 located above the stage 1 for generating light to be irradiated on the surface of the lens;
an image capturing device 3 located above the annular light source 2, for capturing an image of the lens surface illuminated by the light, wherein the image capturing device 3 comprises a microscope 31 and an image capturing device 32;
and the computer 4 is connected with the image acquisition equipment 3 and is used for acquiring the image and judging whether the surface of the lens has flaws according to the image.
It is noted that the surface of the stage 1 provides a dark background to the lens 5 in order to capture an image of the lens surface from dark field imaging.
The field range of the image acquisition device 3 needs to be satisfied about the diameter size of the lens 5, and if the field range is too small, the detection range of the lens 5 will be omitted, and if the field range is too large, an interference imaging area is easily introduced, and in order to ensure the image quality of the lens surface and meet the design requirements, the microscope 31 adopts an XZ-4 type zoom tool microscope 31, and the zoom ratio thereof is 1: 6.5 (magnification of 0.7x-4.5x), field of view range 25.7mm to 4.0mm, working distance 90 mm.
It should be noted that the light emitted from the ring light source 2 is focused on the same position on the lens surface, and the incident angles of the light from the ring light source 2 on the lens surface are the same. The structure of the ring-shaped light source 2 is not particularly limited in this embodiment, and may be set by itself. In one embodiment of the present application, the ring light source 2 may be a ring light source 2 having an integral structure; in other embodiments of the present application, the ring light source 2 is a light source composed of a plurality of independent light sources, please refer to fig. 3.
It should be noted that the inspection system of the lens 5 in this embodiment can not only inspect scratch defects but also inspect spot defects, incident light is obliquely incident on the lens surface at an incident angle α, when the light is incident on a smooth surface area without defects, the light is emitted from the other side at the same angle α according to the light reflection law, and when the light is incident on the surface of the defects, the incident light is scattered in a relatively wide angle range due to the special local microstructure of the defects, the defects can be regarded as a secondary light source for emitting light, the image capturing device 3 collects the scattered light in a certain aperture angle range, and the reflected light from the smooth surface is excluded from the aperture angle range, so as to obtain a bright image of the defects in a dark background, see fig. 4.
Specifically, the illumination aperture (diameter) of the light source in the annular light source 2 needs to be larger than 5mm, the brightness of the light beam is as uniform as possible, and meanwhile, in order to enable the microscope 31 to avoid the reflected light emitted by the annular light source 2 and reflected by the surface of the lens, the angle of view of the light beam emitted by the annular light source 2 is not too large, and the illumination aperture angle is relatively fixed.
It should be noted that, in the present embodiment, the method for determining whether there is a defect on the lens surface according to the image by the computer 4 is not particularly limited, and may be selected by itself. For example, a conventional image processing method is adopted, that is, an image is subjected to graying processing, contrast and brightness are adjusted, then marginalization detection is performed on the image, then the image is processed by using closed operation, and finally a minimum external matrix method is adopted to obtain whether a defect exists on the surface of the lens, or the image on the surface of the lens is processed by adopting a neural network algorithm based on deep learning, and the processing process is explained in detail below.
Specifically, (1) the data set is established, 1500 sample images (the quantity is more the better) that collect flawed, guarantee that every sample image all has the flaw, then carry out artifical mark, mark out the frame (external matrix) of flaw to every sample image, mark the type of frame simultaneously (some flaw and mar flaw), then 1000 as training sets, 500 as verification sets, because the image quantity is limited, need carry out corresponding image enhancement operation to increase the variety of training images, data enhancement can include: image random cutting, random rotation, random brightness change and the like to complete data set establishment; (2) training and testing of the network model, which needs to rely on the establishment of a data set, but basic parameter design can be initialized according to the original parameters of the network. Generally, when initializing the convolutional neural network model, it is initialized by using unbiased parameters, for example, the kernel parameter of Conv is initialized by using a distribution with bias of 0 and variance of 0.01. However, if the model is to deal with the case of extreme imbalance of categories, it is considered that such initialization without optional prior assumption on the training data distribution makes the parameters prefer to evolve in the case of having a larger number of negative samples in the training process; (3) and defect detection, namely firstly performing feature extraction through a feature extraction network ResNet, then enriching feature information through an FPN (pyramid network), and connecting a frame classification and regression network branch to the feature of each scale of the FPN to perform defect detection and classification.
Further, the computer 4 generates a sample inspection report after determining whether there is any defect on the lens surface, and records the qualification of the lens 5 and the type of the defect and the number of defects on the lens surface, so as to sort the lens 5.
The light source to the surperficial emission light of lens is annular light source 2 in this embodiment, guarantees all to have the light to penetrate at the surperficial all directions of lens, to the mar flaw of arbitrary distribution on the lens surface, guarantees to have light to be the vertically at the surperficial projection direction of lens and the angle of mar, makes the formation of image contrast ratio of mar highest, and then makes computer 4 judge according to the surperficial image of the lens of gathering whether there is the flaw on the lens surface, improves the detection precision of flaw.
On the basis of the above embodiment, when the annular light source 2 is a light source composed of a plurality of independent light sources, the plurality of independent light sources may be light sources composed of a plurality of LED lamp beads, or the plurality of independent light sources are all kola illumination light sources.
Specifically, the schematic structural diagram of the kola lighting source is shown in fig. 5, and the kola lighting source includes an LED lamp bead 6, a lens L1 close to the LED lamp bead, and a lens far from the LED lamp bead.
Further, the lens L1 near the LED lamp bead is composed of three sub-lenses, preferably, the lens L1 near the LED lamp bead in the kola lighting source is a spherical lens, so that the processing is convenient, the cost is low, and the parameters of the lens L1 near the LED lamp bead and the parameters of the lens L2 near the LED lamp bead are shown in table 1. The LED Lamp beads 6 can be small-power LEDs (smaller than 0.1 watt) packaged by Lamp, and the LED light source has the advantages of being small in size, short in response time, strong in stability and the like.
TABLE 1 parameter Table of lens near LED Lamp bead
Referring to fig. 6, fig. 6 is a schematic structural diagram of another lens inspection system according to an embodiment of the present disclosure.
On the basis of the above embodiment, the lens 5 detection system further includes:
the angle adjusting bracket 7 is connected with the Kolla lighting source and used for adjusting the angle between the Kolla lighting source and the lens 5, the angle is adjusted through the angle adjusting bracket 7, and the operation is convenient.
Optionally, in an embodiment of the present application, the angle ranges from 35 ° to 55 °, inclusive, to ensure that the light emitted from the ring-shaped light source 2 is focused on the same position on the lens surface. It will be appreciated that each Kolla illumination source is at the same angle as the lens 5.
Preferably, the lens 5 inspection system further comprises:
a first moving device 8 connected to the computer 4 for moving the position of the object stage 1, wherein the first moving device 8 comprises a lateral moving means 81 and a longitudinal moving means 82;
a second movement device 9 connected to the computer 4 for moving the position of the image acquisition device 3.
Specifically, the transverse moving device 81 makes the object stage 1 transversely move, the longitudinal moving device 82 makes the object stage 1 longitudinally move, when a plurality of lenses 5 are placed on the object stage 1, the position of the object stage 1 can be adjusted through the first moving device 8, so that each lens 5 is aligned with the image acquisition device 3, and the image acquisition device 3 can independently acquire a surface image of each lens 5; the second mobile device 9 adjusts the position of the image acquisition device 3, so that the image acquired by the image acquisition device 3 is clearer, and the defect detection precision is further improved. Wherein, the first mobile device 8 and the second mobile device 9 are driven by stepping motors, communicate with the computer 4 through an SC3 type stepping motor controller, and control the stepping motors to control the first mobile device 8 and the second mobile device 9.
Optionally, in an embodiment of the present application, both the first mobile device 8 and the second mobile device 9 are connected to the computer 4 through a serial port, but the present application is not particularly limited to this, and in other embodiments of the present application, the first mobile device 8 and the second mobile device 9 may also be connected to the computer 4 through Wi-Fi or bluetooth.
Preferably, the lens 5 inspection system further comprises:
the camera 10 is located between the image acquisition device 3 and the annular light source 2, and is configured to acquire a tabletop image of the object stage 1 and send the tabletop image to the computer 4, so that the computer 4 controls the first mobile device 8 and the second mobile device 9 according to the tabletop image.
Specifically, the camera 10 collects a table top image of the object stage 1 and sends the table top image to the computer 4, the computer 4 can determine the positions of the lenses 5 according to the table top image by using a Canny edge detection method and a hough circle detection method, then the lenses 5 are aligned with the image collection device 3 one by adjusting the first mobile device 8, and the distance between the image collection device 3 and the lenses 5 is adjusted by the second mobile device 9.
Optionally, in an embodiment of the present application, the image capturing device 32 is a CCD (Charge-coupled device) image capturing device 32, but the present application is not limited thereto specifically, and in other embodiments of the present application, the image capturing device 32 is a CMOS (Complementary Metal Oxide Semiconductor) image capturing device 32.
Specifically, the CCD image acquiring device 32 may be a WAT-902B type 1/2-inch black-and-white CCD, with an effective pixel of 752x582, a pixel size of 8.6umx8.3um, and a signal-to-noise ratio of 50 db.
The embodiments are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same or similar parts among the embodiments are referred to each other. The device disclosed by the embodiment corresponds to the method disclosed by the embodiment, so that the description is simple, and the relevant points can be referred to the method part for description.
The lens inspection system provided by the present application is described in detail above. The principles and embodiments of the present application are explained herein using specific examples, which are provided only to help understand the method and the core idea of the present application. It should be noted that, for those skilled in the art, it is possible to make several improvements and modifications to the present application without departing from the principle of the present application, and such improvements and modifications also fall within the scope of the claims of the present application.
Claims (10)
1. A lens inspection system, comprising:
the objective table is used for bearing the lens;
an annular light source positioned above the stage for generating light rays that impinge on the lens surface;
the image acquisition equipment is positioned above the annular light source and used for acquiring the image of the surface of the lens irradiated by the light rays, wherein the image acquisition equipment comprises a microscope and an image acquisition device;
and the computer is connected with the image acquisition equipment and is used for acquiring the image and judging whether the surface of the lens has flaws according to the image.
2. The lens inspection system of claim 1, wherein the annular light source is a light source comprised of a plurality of individual light sources.
3. The lens inspection system of claim 2, wherein the plurality of independent light sources are all kola illumination sources.
4. The lens inspection system of claim 3, further comprising:
and the angle adjusting bracket is connected with the Kolla lighting source and is used for adjusting the angle between the Kolla lighting source and the lens.
5. The lens inspection system of claim 4, wherein the angle ranges from 35 ° to 55 °, inclusive.
6. The lens inspection system of any one of claims 1 to 5, further comprising:
the first mobile equipment is connected with the computer and is used for moving the position of the object stage, wherein the first mobile equipment comprises a transverse moving device and a longitudinal moving device;
and the second mobile equipment is connected with the computer and is used for moving the position of the image acquisition equipment.
7. The lens inspection system of claim 6, further comprising:
the camera is positioned between the image acquisition equipment and the annular light source and is used for acquiring a table top image of the object stage and sending the table top image to the computer, so that the computer can control the first mobile equipment and the second mobile equipment according to the table top image.
8. The lens inspection system of claim 7, wherein the image capture device is a CCD image capture device.
9. The lens inspection system of claim 3, wherein the lens of the Korea illumination source proximate to the LED bead is a spherical lens.
10. The lens inspection system of claim 7, wherein the first mobile device and the second mobile device are each coupled to the computer via a serial port.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201921262689.XU CN210375628U (en) | 2019-08-06 | 2019-08-06 | Lens detecting system |
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| CN201921262689.XU CN210375628U (en) | 2019-08-06 | 2019-08-06 | Lens detecting system |
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| CN210375628U true CN210375628U (en) | 2020-04-21 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110346119A (en) * | 2019-08-06 | 2019-10-18 | 广东工业大学 | A kind of eyeglass detection system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110346119A (en) * | 2019-08-06 | 2019-10-18 | 广东工业大学 | A kind of eyeglass detection system |
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Granted publication date: 20200421 Termination date: 20210806 |