CN210375073U

CN210375073U - Chip spraying film layer thickness detection device

Info

Publication number: CN210375073U
Application number: CN201921805508.3U
Authority: CN
Inventors: 林小康
Original assignee: Suzhou Taikenike Painting Co ltd
Current assignee: Suzhou Taikenike Painting Co ltd
Priority date: 2019-10-25
Filing date: 2019-10-25
Publication date: 2020-04-21
Anticipated expiration: 2029-10-25

Abstract

The utility model discloses a chip spraying coating thickness detection device, including detection box body and probe, detection box body bottom is equipped with the carriage, the both sides of carriage are connected with the montant perpendicularly, detection box body is equipped with the gliding chamber that holds the montant slides, be equipped with the spring in the gliding chamber, the one end of spring links to each other with the gliding chamber inner wall, and the other end links to each other with the montant, when the spring does not receive external force, the bottom surface of carriage is less than the bottom surface of probe; the detection box body is provided with a limiting mechanism, the vertical rod is provided with a lower limiting groove, and when the bottom surface of the supporting frame and the bottom surface of the probe are located on the same plane, the limiting mechanism is matched with the lower limiting groove. Adopt the utility model provides a detection device during the measurement, can rely on the carriage to stand, need not hand, and the carriage can guarantee that probe and chip surface remain perpendicular unchangeable, is favorable to the accurate measurement of rete thickness.

Description

Chip spraying film layer thickness detection device

Technical Field

The utility model belongs to the technical field of detection device, concretely relates to chip spraying film thickness detection device.

Background

The chip need spout the rete in process of production, in order to guarantee the production quality of chip, need adopt thickness detection device to detect rete thickness, if adopt the coating calibrator. The coating thickness gauge can nondestructively measure the thickness of the non-magnetic coating on the magnetic metal substrate and the thickness of the non-conductive coating on the non-magnetic metal substrate, has the characteristics of small measurement error, high reliability, good stability, simple and convenient operation and the like, and is widely applied to the detection fields of manufacturing industry, metal processing industry, chemical industry, commodity inspection and the like. However, the existing film layer thickness detection device needs to be held by hand in the measurement process, so that data recording is inconvenient; in addition, in the measuring process, the probe and the chip to be measured are difficult to keep a vertical state, so that measuring errors are generated, and the accuracy of the measuring result is influenced.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to overcome not enough among the prior art, provide a chip spraying coating thickness detection device, solve current device need hand in the measurement process, probe and chip are difficult to keep the vertically problem.

The utility model provides a following technical scheme:

a device for detecting the thickness of a chip spraying film layer comprises a detection box body and a probe, wherein a support frame is arranged at the bottom of the detection box body, vertical rods are vertically connected to two sides of the support frame, the detection box body is provided with a sliding cavity for accommodating the vertical rods to slide, a spring is arranged in the sliding cavity, one end of the spring is connected with the inner wall of the sliding cavity, the other end of the spring is connected with the vertical rods, and when the spring is not subjected to external force, the bottom surface of the support frame is lower than the bottom surface of the probe; the detection box body is provided with a limiting mechanism, the vertical rod is provided with a lower limiting groove, and when the bottom surface of the supporting frame and the bottom surface of the probe are located on the same plane, the limiting mechanism is matched with the lower limiting groove.

Preferably, stop gear includes side piece, gag lever post and stopper, the side piece inside be equipped with the side chamber that the sliding chamber is linked together, the stopper is located the side intracavity just can follow the side chamber slides, the one end of gag lever post with the stopper links to each other, and the other end stretches out the side piece is connected with the handle, the stopper can with lower spacing groove looks block.

Preferably, the limiting rod is sleeved with a side spring, one end of the side spring is connected with the limiting block, and the other end of the side spring is connected with the inner wall of the side cavity.

Preferably, the vertical rod is further provided with an upper limiting groove located above the lower limiting groove, and the limiting block is clamped with the upper limiting groove when the spring is not subjected to external force.

Preferably, the support frame is rectangular, and the vertical rod is connected to the center of the short side of the support frame.

Preferably, the bottom of the supporting frame is provided with a plurality of rubber material anti-slip pads.

Preferably, a plurality of grooves which are uniformly distributed are arranged on two side faces of the detection box body.

Compared with the prior art, the beneficial effects of the utility model are that:

the utility model comprises a supporting frame at the bottom of the detection box body, when not measuring, the spring is free from external force, and the bottom surface of the supporting frame is lower than the bottom surface of the probe, thus protecting the probe from being damaged; during measurement, the detection box body is pressed downwards, the supporting frame and the vertical rod move upwards, the spring is compressed, when the probe reaches the surface of the chip, the limiting mechanism is matched with the lower limiting groove in the vertical rod to fix the vertical rod and the supporting frame, the detection box body can stand on the supporting frame at the moment without being held by hands, the supporting frame can ensure that the probe and the surface of the chip are kept vertical and unchanged, and accurate measurement of the thickness of the film layer is facilitated.

Drawings

Fig. 1 is a schematic front view of the present invention;

FIG. 2 is a schematic cross-sectional view of the support frame of FIG. 1 taken along line A-A;

fig. 3 is a schematic side view of the present invention;

fig. 4 is a schematic diagram of a part of the internal structure of the present invention shown in fig. 1;

FIG. 5 is a schematic structural view of the limiting block of FIG. 4 being pulled outward;

FIG. 6 is a schematic diagram of a part of the internal structure of the present invention during probe testing;

labeled as: 1. detecting the box body; 2. a support frame; 3. a vertical rod; 31. a lower limiting groove; 32. an upper limiting groove; 4. a probe; 5. a non-slip mat; 6. a side block; 7. a handle; 8. a groove; 9. a limiting rod; 10. a side spring; 11. a lateral cavity; 12. a slide chamber; 13. a spring; 14. and a limiting block.

Detailed Description

The present invention will be further described with reference to the accompanying drawings. The following examples are only for illustrating the technical solutions of the present invention more clearly, and the protection scope of the present invention is not limited thereby.

It should be noted that, in the description of the present invention, the terms "upper", "lower", "inner", "outer", etc. indicate the directions or positional relationships based on the directions or positional relationships shown in the drawings, and are only for convenience of description of the present invention and do not require the present invention to be constructed and operated in a specific direction, and thus, should not be construed as limiting the present invention.

As shown in fig. 1 and 3, the device for detecting the thickness of the chip spraying film layer comprises a detection box body 1 and a probe 4, wherein a plurality of grooves 8 which are uniformly distributed are arranged on two side surfaces of the detection box body 1, so that the device is convenient to grasp. The bottom of the detection box body 1 is provided with a supporting frame 2, two sides of the supporting frame 2 are vertically connected with vertical rods 3, as shown in fig. 4, the detection box body 1 is provided with a sliding cavity 12 for accommodating the vertical rods 3 to slide, a spring 13 is arranged in the sliding cavity 12, one end of the spring 13 is connected with the inner wall of the sliding cavity 12, the other end of the spring 13 is connected with the vertical rods 3, and when the spring 13 is not subjected to external force, the bottom surface of the supporting frame 2 is lower than the bottom surface of the; the detection box body 1 is provided with a limiting mechanism, the vertical rod 3 is provided with a lower limiting groove 31, and as shown in fig. 6, when the bottom surface of the supporting frame 2 and the bottom surface of the probe 4 are positioned on the same plane, the limiting mechanism is matched with the lower limiting groove 31.

As shown in fig. 4, the limiting mechanism includes a side block 6, a limiting rod 9 and a limiting block 14, a side cavity 11 communicated with a sliding cavity 12 is arranged inside the side block 6, the limiting block 14 is located in the side cavity 11 and can slide along the side cavity 11, one end of the limiting rod 9 is connected with the limiting block 14, the other end of the limiting rod extends out of the side block 6 and is connected with a handle 7, and the limiting block 14 can be clamped with a lower limiting groove 31. The outside cover of gag lever post 9 has side spring 10, and the one end of side spring 10 links to each other with stopper 14, and the other end links to each other with the inner wall of side chamber 11.

As shown in fig. 4-6, the vertical rod 3 is further provided with an upper limiting groove 32 located above the lower limiting groove 31, when the spring 13 is not subjected to an external force, the limiting block 14 is engaged with the upper limiting groove 32, and when the spring is not subjected to a measurement, the supporting frame 2 is not subjected to a position change due to the external force, so that the probe 4 is protected from being damaged.

As shown in fig. 2, the support frame 2 is rectangular, and the vertical bar 3 is connected to the center of the short side of the support frame 2, so that the structural stability is high. As shown in fig. 1, the bottom of the supporting frame 2 is provided with a plurality of rubber skidproof pads 5, which is beneficial to the stable standing of the detection box body 1.

The utility model discloses a use-way does: as shown in fig. 4, when not measuring, the spring 13 is not affected by external force, and at this time, the limiting block 14 is clamped in the upper limiting groove 32 under the action of the side spring 10 to fix the positions of the vertical rod 3 and the supporting frame 2, so as to ensure that the bottom surface of the supporting frame 2 is lower than the bottom surface of the probe 4 and is not affected by external force, thereby protecting the probe 4; when the film thickness of the chip needs to be measured, as shown in fig. 5, the handle 7 is held by a hand to pull the limiting rod 9 outwards, the side spring 10 is compressed, the limiting block 14 is pulled out from the upper limiting groove 32, the detection box body 1 is pressed downwards at the moment, as shown in fig. 6, the spring 13 is compressed, the vertical rod 3 slides upwards along the sliding cavity 12 until the probe 4 reaches the surface of the chip, meanwhile, the limiting block 14 is clamped into the lower limiting groove 31 under the action of the side spring 10 to fix the vertical rod 3 and the support frame 2, at the moment, the detection box body 1 can stand on the support frame 2 without being held by hands, and the support frame 2 can ensure that the probe 4 is vertical to the surface of the chip, which is beneficial to accurate measurement of the.

The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, a plurality of modifications and variations can be made without departing from the technical principle of the present invention, and these modifications and variations should also be considered as the protection scope of the present invention.

Claims

1. The device for detecting the thickness of the sprayed film layer of the chip comprises a detection box body and a probe, and is characterized in that a supporting frame is arranged at the bottom of the detection box body, vertical rods are vertically connected to two sides of the supporting frame, the detection box body is provided with a sliding cavity for accommodating the vertical rods to slide, a spring is arranged in the sliding cavity, one end of the spring is connected with the inner wall of the sliding cavity, the other end of the spring is connected with the vertical rods, and when the spring is not subjected to external force, the bottom surface of the supporting frame is lower than the bottom surface of the probe; the detection box body is provided with a limiting mechanism, the vertical rod is provided with a lower limiting groove, and when the bottom surface of the supporting frame and the bottom surface of the probe are located on the same plane, the limiting mechanism is matched with the lower limiting groove.

2. The device for detecting the thickness of the sprayed film layer of the chip according to claim 1, wherein the limiting mechanism comprises a side block, a limiting rod and a limiting block, a side cavity communicated with the sliding cavity is formed in the side block, the limiting block is located in the side cavity and can slide along the side cavity, one end of the limiting rod is connected with the limiting block, the other end of the limiting rod extends out of the side block and is connected with a handle, and the limiting block can be clamped with the lower limiting groove.

3. The device for detecting the thickness of the sprayed film layer of the chip as claimed in claim 2, wherein a side spring is sleeved outside the limiting rod, one end of the side spring is connected with the limiting block, and the other end of the side spring is connected with the inner wall of the side cavity.

4. The device for detecting the thickness of the sprayed film layer of the chip as claimed in claim 2, wherein the vertical rod is further provided with an upper limiting groove located above the lower limiting groove, and the limiting block is engaged with the upper limiting groove when the spring is not subjected to an external force.

5. The device for detecting the thickness of the chip sprayed film layer according to claim 1, wherein the supporting frame is rectangular, and the vertical rod is connected to the center of the short side of the supporting frame.

6. The device for detecting the thickness of the sprayed film layer of the chip as claimed in claim 1, wherein the bottom of the supporting frame is provided with a plurality of rubber material anti-slip pads.

7. The device for detecting the thickness of the sprayed film layer of the chip as claimed in claim 1, wherein the two side surfaces of the detection box body are provided with a plurality of uniformly distributed grooves.