CN210323264U - Photoelectronic device testing device - Google Patents
Photoelectronic device testing device Download PDFInfo
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- CN210323264U CN210323264U CN201920595764.8U CN201920595764U CN210323264U CN 210323264 U CN210323264 U CN 210323264U CN 201920595764 U CN201920595764 U CN 201920595764U CN 210323264 U CN210323264 U CN 210323264U
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- cabinet body
- motor
- cabinet
- rotating shaft
- optoelectronic device
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Abstract
The utility model discloses a photoelectronic device testing device, which comprises a cabinet body with a cavity structure inside and a cover which is arranged on the front side of the cabinet body and is used for covering the front side of the cabinet body, wherein one side of the cover is connected with one side of the cabinet body through a hinge, and the other side of the cover is locked with the other side of the cabinet body through a locking mechanism; the front of the cabinet body on be provided with and place the mouth, the lateral wall of placing the mouth on be provided with a mount pad, the mount pad on install the test probe, the cabinet body in be provided with photoelectronic device conveyer. When this photoelectronic device testing arrangement tests photoelectronic device, photoelectronic device is located the cabinet internally, avoids the dust to enter into the internal portion of cabinet, prevents that photoelectronic device from receiving the pollution.
Description
Technical Field
The utility model relates to a reach photoelectronic device test technical field, in particular to photoelectronic device testing arrangement.
Background
The photoelectronic device is various functional devices made by utilizing the electricity-photon conversion effect, the design principle of the photoelectronic device is based on the change of the external field to the propagation mode of guided wave light, and the photoelectronic device is also different from the early-stage photoelectric devices which are used by people.
In recent years, the optoelectronic device manufacturing industry has achieved rapid development. Under the stimulation of continuously expanding the requirements of the application fields such as optical communication, optical display and the like, the product has greater breakthrough. During production, because the integration of optoelectronic devices is high, the sockets are dense, the common online testing device cannot be accurately positioned, the conventional manual testing is mostly adopted, the workload is large, the efficiency is low, a large amount of manpower is wasted, and the automatic online testing cannot be realized.
The utility model discloses a grant utility model patent that bulletin number is CN 207866970U discloses a all sorts of 100G optoelectronic device testing arrangement, including conveyer belt and slide, the upper portion center fixedly connected with standing groove of conveyer belt, and the upper portion both sides fixedly connected with guide pillar of conveyer belt, the slide sets up the top at the conveyer belt, the lower surface slidable mounting of slide has the slider, the lower part fixed mounting of slider has the cylinder, the lower extreme fixedly connected with fixed plate of cylinder, the lower part fixedly connected with guide pin bushing and the fixed column of fixed plate, and the lower part center fixed mounting of fixed plate has the test probe, the spring has been cup jointed on the upper portion of fixed column, and the lower part of fixed column slides and has cup jointed the pressure. The guide pillars are arranged on the conveying belt, and the guide sleeves matched with the guide pillars are arranged on two sides of the fixing plate, so that the test probe pins are accurate; the placing groove is formed in the conveying belt, so that the photoelectronic device is accurately placed in the placing groove, and automatic online testing is convenient to realize. However, when testing the optoelectronic device, the optoelectronic device is exposed, and is easily polluted by dust, which easily causes damage to the optoelectronic device.
SUMMERY OF THE UTILITY MODEL
The present invention is directed to a testing device for optoelectronic devices to solve the above-mentioned problems of the prior art.
In order to achieve the above object, the present invention provides an optoelectronic device testing apparatus, including a cabinet body having a cavity structure inside and a cover disposed on the front side of the cabinet body for covering the front side of the cabinet body, wherein one side of the cover is connected to one side of the cabinet body through a hinge, and the other side of the cover is locked to the other side of the cabinet body through a locking mechanism;
the front of the cabinet body on be provided with and place the mouth, the lateral wall of placing the mouth on be provided with a mount pad, the mount pad on install the test probe, the cabinet body in be provided with photoelectronic device conveyer.
Preferably, the photoelectronic device conveying device comprises a motor, a rotating shaft and a belt, wherein the motor and the rotating shaft are respectively arranged on the inner surface of the back face of the cabinet body and are respectively fixedly connected with the inner surface of the back face of the cabinet body, a fixing plate is arranged between the motor and the rotating shaft, two ends of the fixing plate are respectively fixedly connected with the motor and the rotating shaft, and the belt is tightly connected to the rotating shaft and the rotating shaft of the motor.
Preferably, the motor is controlled by a PLC electronic system device, the motor is powered by mains supply, the PLC electronic system device is electrically connected with the motor, the PLC electronic system device is arranged in the cabinet body, a plurality of placing grooves are arranged on the outer surface of the belt in the vertical direction at intervals, and the placing grooves are fixedly connected with the belt.
Preferably, the number of the placing grooves is set to be 10-100.
Preferably, a spring door for covering the placing opening is arranged on the placing opening.
Preferably, a transparent window is further arranged on the front surface of the cabinet body.
Preferably, the locking structure is an electronic lock, a coded lock or a mechanical lock.
Preferably, the cabinet body and the cover are made of sheet metal materials.
The utility model has the advantages that: firstly, the placing groove is formed in the belt, so that the optoelectronic device is accurately placed in the placing groove, and automatic online testing is convenient to realize; when testing the photoelectronic device, the photoelectronic device is located in the cabinet body, and a spring door is arranged on the placing opening, so that dust is prevented from entering the cabinet body, and the photoelectronic device is prevented from being polluted.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.
Fig. 1 is a schematic external structural diagram of an optoelectronic device testing apparatus according to an embodiment of the present invention;
fig. 2 is a schematic view of an internal structure of an optoelectronic device testing apparatus according to an embodiment of the present invention.
The reference numbers illustrate:
reference numerals | Name (R) | Reference numerals | Name (R) |
1 | |
2 | Cover for portable |
3 | Hinge (C) | 4 | |
5 | |
6 | |
7 | |
8 | Optoelectronic |
81 | |
82 | |
83 | |
84 | |
9 | PLC |
10 | |
11 | |
12 | Fixing plate |
The objects, features and advantages of the present invention will be further described with reference to the accompanying drawings.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
It should be noted that all the directional indicators (such as upper, lower, left, right, front and rear … …) in the embodiment of the present invention are only used to explain the relative position relationship between the components, the motion situation, etc. in a specific posture (as shown in the drawings), and if the specific posture is changed, the directional indicator is changed accordingly.
In addition, the descriptions related to "first", "second", etc. in the present invention are for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicit ly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, the technical solutions in the embodiments may be combined with each other, but it must be based on the realization of those skilled in the art, and when the technical solutions are contradictory or cannot be realized, the combination of the technical solutions should not be considered to exist, and is not within the protection scope of the present invention.
In the embodiment of the present invention, referring to fig. 1 and fig. 2, the optoelectronic device testing apparatus includes a cabinet 1 having a cavity structure inside and a cover 2 disposed on the front side of the cabinet 1 and used for covering the front side of the cabinet 1, one side of the cover 2 is connected to one side of the cabinet 1 through a hinge 3, and the other side of the cover 2 is locked to the other side of the cabinet 1 through a locking mechanism 4; the locking structure 4 is an electronic lock, a coded lock or a mechanical lock.
Furthermore, a placing opening 5 is formed in the front face of the cabinet body 1, the optoelectronic device is placed and taken through the placing opening 5, and a spring door 10 used for covering the placing opening 5 is arranged on the placing opening 5. The side wall of the placing opening 5 is provided with a mounting seat 6, the mounting seat 6 is provided with a test probe 7, and the cabinet body 1 is internally provided with a photoelectronic device conveying device 8.
Optionally, referring to fig. 2, the optoelectronic device conveying apparatus 8 includes a motor 81, a rotating shaft 82 and a belt 83, the motor 81 and the rotating shaft 82 are respectively disposed on the inner surface of the back of the cabinet 1 and respectively fixedly connected to the inner surface of the back of the cabinet 1, a fixing plate 12 is disposed between the motor 81 and the rotating shaft 82, two ends of the fixing plate 12 are respectively fixedly connected to the motor 81 and the rotating shaft 82, so that the motor 81 and the rotating shaft 82 are more fixed, the balance is good, the rotating shaft 82 is not easily loosened, the rotating effect of the belt 83 is not affected, and the cabinet 1 is prevented from being deformed by force when the rotating shaft 82 rotates for a long time. The belt 83 is tightly connected to the rotating shaft and the rotating shaft of the motor 81; the motor 81 is controlled by a PLC electronic system device 9, the motor 81 is powered by commercial power, the PLC electronic system device 9 is electrically connected with the motor 81, the PLC electronic system device 9 is arranged in the cabinet body 1, a plurality of placing grooves 84 are arranged on the outer surface of the belt 83 at intervals in the vertical direction, the number of the placing grooves 84 is 10-100, and the placing grooves 84 are fixedly connected with the belt 83.
The working principle of this embodiment is as follows:
the PLC electronic system 9 used in this embodiment is an electronic system device operated by digital operation with a microprocessor as a core, and is designed for industrial field application, and it uses a programmable memory to store operation instructions for executing logic operation, sequence control, timing/counting, arithmetic operation, etc. in its internal, and controls various types of machinery or production processes through digital or analog input/output interfaces. The displacement of the corresponding placing groove 84 rotated to the test probe 7 is controlled by storing the position information in the PLC electronic system 9, memorizing the position information of the placing groove 84 and calculating the stroke of the rotation of the belt 83. When testing the optoelectronic device, the optoelectronic device is placed in the placing groove 84, the PLC electronic system device 9 rotates the placing groove 84 corresponding to the optoelectronic device to the test probe 7, and the test probe 7 tests the optoelectronic device; after all the photoelectronic devices are tested, the photoelectronic devices are taken away through the placing port 5.
In this embodiment, the front of the cabinet body is further provided with a transparent window 11, and the state of the mobile phone in the cabinet body can be clearly seen through the transparent window 11.
Further, the cabinet body 1 and the cover 2 are made of sheet metal materials, and safety is further improved.
The above only is the preferred embodiment of the present invention, not limiting the scope of the present invention, all the equivalent structure changes made by the contents of the specification and the drawings under the inventive concept of the present invention, or the direct/indirect application in other related technical fields are included in the patent protection scope of the present invention.
Claims (8)
1. A photoelectronic device testing device comprises a cabinet body with a cavity structure inside and a cover which is arranged on the front surface of the cabinet body and used for covering the front surface of the cabinet body, wherein one side of the cover is connected with one side of the cabinet body through a hinge, and the other side of the cover is locked with the other side of the cabinet body through a locking mechanism,
the front of the cabinet body on be provided with and place the mouth, the lateral wall of placing the mouth on be provided with a mount pad, the mount pad on install the test probe, the cabinet body in be provided with photoelectronic device conveyer.
2. The optoelectronic device testing apparatus of claim 1, wherein the optoelectronic device transferring apparatus comprises a motor, a rotating shaft and a belt, the motor and the rotating shaft are respectively disposed on and fixedly connected to the inner surface of the back of the cabinet, a fixing plate is disposed between the motor and the rotating shaft, two ends of the fixing plate are respectively fixedly connected to the motor and the rotating shaft, and the belt is tightly connected to the rotating shaft and the rotating shaft of the motor.
3. An optoelectronic device testing apparatus as claimed in claim 2, wherein the motor is controlled by a PLC electronic system device, the motor is powered by commercial power, the PLC electronic system device is electrically connected to the motor, the PLC electronic system device is disposed in the cabinet, a plurality of placement slots are disposed at intervals in a vertical direction on an outer surface of the belt, and the placement slots are fixedly connected to the belt.
4. An optoelectronic device testing apparatus as claimed in claim 3, wherein the number of said placement grooves is set to 10-100.
5. An optoelectronic device testing apparatus as claimed in claim 1, wherein the placement opening is provided with a spring door for covering the placement opening.
6. An optoelectronic device testing apparatus as claimed in claim 1, wherein a transparent window is further provided on the front surface of the cabinet.
7. An optoelectronic device testing apparatus as claimed in claim 1 wherein the locking mechanism is an electronic lock, a combination lock or a mechanical lock.
8. The optoelectronic device testing apparatus of claim 1, wherein the cabinet and the cover are made of sheet metal.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201920595764.8U CN210323264U (en) | 2019-04-25 | 2019-04-25 | Photoelectronic device testing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201920595764.8U CN210323264U (en) | 2019-04-25 | 2019-04-25 | Photoelectronic device testing device |
Publications (1)
Publication Number | Publication Date |
---|---|
CN210323264U true CN210323264U (en) | 2020-04-14 |
Family
ID=70137030
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201920595764.8U Active CN210323264U (en) | 2019-04-25 | 2019-04-25 | Photoelectronic device testing device |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN210323264U (en) |
-
2019
- 2019-04-25 CN CN201920595764.8U patent/CN210323264U/en active Active
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