CN210270115U - Power supply aging test system - Google Patents
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- CN210270115U CN210270115U CN201920976109.7U CN201920976109U CN210270115U CN 210270115 U CN210270115 U CN 210270115U CN 201920976109 U CN201920976109 U CN 201920976109U CN 210270115 U CN210270115 U CN 210270115U
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Abstract
The application discloses a power supply aging test system which comprises a test device, wherein a plurality of products to be tested are arranged on the test device, and each product to be tested comprises at least two paths of power supply outputs; the products to be tested are distributed according to rows and columns to form a matrix, one path of power output of the products to be tested in each row in the matrix is sequentially connected in series to form one path of series output loop, one path of power output of the products to be tested in each column in the matrix is sequentially connected in series to form one path of series output loop, and each path of series output loop is electrically connected with an aging test load respectively to form an aging test on the path of series output loop. Through the aging test system of the power supply, the test efficiency of the aging test of the power supply can be improved, and the cost is reduced.
Description
Technical Field
The utility model relates to a product aging testing field especially relates to an aging testing system of power.
Background
The aging test is a process of performing corresponding condition strengthening experiments on the condition that various factors related to the product age in actual use conditions, for example, a power supply is burned for a long time by simulating a test environment under high-temperature and high-severe conditions, so that the safety, stability and reliability of the product are improved.
When a product to be tested is subjected to a batch burn-in test through a burn-in test cabinet or a burn-in test room, a conventional burn-in test system is shown in a first graph and a second graph for power supplies with different numbers of outputs (more than or equal to two outputs). The aging test system shown in the figure adopts a parallel connection mode for the output of a plurality of power supplies, each output of the product is provided with a boosting module, each output is boosted to a specified voltage, and then the voltage is fed back to a power grid through an inverter. The aging test system shown in fig. two adopts a series connection mode for the output of a plurality of power supplies, and one output with higher power in the plurality of power supplies is connected in series, and because the negative pole of each output is different after the outputs are connected in series, the rest of the outputs can only adopt an isolated electronic load or a resistance load to carry out aging test.
However, each output in the aging test system shown in fig. one needs a boosting module, which is high in cost, low in efficiency of boosting to a specified voltage, and complex in wiring; in the aging test system shown in fig. two, only the main output can be connected in series, and the rest of the outputs can only adopt the isolated module for aging test, which also has the problem of low efficiency, and needs more isolated modules and has higher cost.
SUMMERY OF THE UTILITY MODEL
An embodiment of the utility model provides an aging testing system of power can promote the test efficiency of the aging testing of power to reduce cost.
The aging test system of the power supply comprises a test device, wherein a plurality of products to be tested are arranged on the test device, and each product to be tested comprises at least two paths of power supply outputs;
the products to be tested are distributed according to rows and columns to form a matrix, one path of power output of the products to be tested in each row in the matrix is sequentially connected in series to form one path of series output loop, one path of power output of the products to be tested in each column in the matrix is sequentially connected in series to form one path of series output loop, and each path of series output loop is electrically connected with an aging test load respectively to form an aging test on the path of series output loop.
Optionally, in one embodiment, at least one matrix is formed based on the number of power output circuits of the product to be tested, and each series output circuit formed in each matrix is electrically connected to one burn-in test load.
Optionally, in one embodiment, the product to be tested includes a first power output and a second power output, and an M × N matrix with M rows and N columns is formed based on the two power outputs of the product to be tested, where M, N is greater than or equal to 2;
the first power outputs of the products to be tested in each row of the M-by-N matrix are sequentially connected in series to form M series output loops; the second power outputs of the products to be tested in each column of the M-N matrix are sequentially connected in series to form N series output loops; and outputting two paths of power supplies based on the product to be detected to form an N + M path series output loop.
Optionally, in one embodiment, the product to be tested includes a first power output, a second power output, and a third power output, where the first power output and the second power output of the product to be tested form an M × N matrix with M rows and N columns, and the third power output of the product to be tested forms a p × q matrix with p rows and q columns with each row or each column in the M × N matrix; wherein M, N is more than or equal to 2, p and q are more than or equal to 2, and M/N is p q;
the power outputs of the products to be tested in each row of the p-x-q matrix are sequentially connected in series to form a p-path series output loop; the power outputs of the products to be tested in each column of the p-x-q matrix are sequentially connected in series to form a q-path series output loop; the power outputs of the products to be tested in each row of the M-by-N matrix are sequentially connected in series to form M series output loops; and forming an M + N (p + q) circuit series output loop based on the three power outputs of the product to be tested.
Optionally, in one embodiment, the product to be tested includes a first power output, a second power output, a third power output, and a fourth power output; the first power output and the second power output of the product to be tested form an M x N matrix with M rows and N columns, the third power output of the product to be tested and each row in the M x N matrix form an M x N matrix with M rows and N columns, and the fourth power output of the product to be tested and each row in the M x N matrix form a p x q matrix with p rows and q columns; wherein M, N is more than or equal to 2, N and M are more than or equal to 2, p and q are more than or equal to 2, N is M × N, and M is p × q;
the power outputs of each row in the M x n matrix are sequentially connected in series to form M series output loops, the power outputs of each column in the M x n matrix are sequentially connected in series to form n series output loops, and the M x n matrix has M layers in total; the power outputs of each row in the p-x-q matrix are sequentially connected in series to form a p-path series output loop, the power outputs of each column in the p-x-q matrix are sequentially connected in series to form a q-path series output loop, and the p-x-q matrix has N layers in total; and forming an M (M + N) + N (p + q) circuit series output loop based on the four power outputs of the product to be detected.
Optionally, in one embodiment, each of the one series output loops is electrically connected to a different burn-in test load.
Optionally, in one embodiment, different series output loops electrically connected to the same burn-in test load are electrically isolated from each other.
Implement the embodiment of the utility model provides a, will have following beneficial effect:
according to the aging test system of the power supply, a plurality of products to be tested are distributed according to rows and columns to form a matrix, one path of power supply output of the products to be tested in each row in the matrix is sequentially connected in series to form one path of serial output loop, and each path of serial output loop is electrically connected with an aging test load respectively to form an aging test of the one path of serial output loop. Through the aging test system of the power supply, the power supply output of a plurality of products to be tested is subjected to aging test in a series connection mode, the loop quantity of aging test loads is reduced, the hardware cost of the boosting module and the isolation module is reduced, the problem of short circuit of the product output caused by series connection is effectively avoided, and the test efficiency of the aging test of the power supply is improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Wherein:
FIG. 1 is a schematic diagram of a parallel connection scheme employed in a conventional burn-in test system;
FIG. 2 is a schematic diagram of a series connection scheme employed in a conventional burn-in test system;
FIG. 3 is a diagram illustrating the connection of a product under test in the burn-in test system of the power supply in one embodiment;
FIG. 4 is a schematic diagram illustrating the connection of a product under test with two outputs according to one embodiment;
FIG. 5 is a schematic diagram illustrating the connection of a first matrix formed by products under test in one embodiment;
FIG. 6 is a schematic diagram illustrating the connection of a product under test with three outputs in one embodiment;
FIG. 7 is a diagram illustrating the connection of a product under test with four outputs according to one embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. It will be understood that, as used herein, the terms "first," "second," and the like may be used herein to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish one element from another. For example, a first element could be termed a second element, and, similarly, a second element could be termed a first element, without departing from the scope of the present application. The first element and the second element are both components, but they are not the same component.
The system comprises a testing device which can be an aging testing cabinet or an aging testing room, wherein a plurality of products to be tested are arranged on the testing device, and each product to be tested comprises at least two paths of power supply outputs.
Fig. 3 is a schematic diagram illustrating connection of a product to be tested in the burn-in test system of the power supply according to an embodiment. A plurality of products to be tested in the aging test system of the power supply form a matrix according to row and column distribution, one path of power supply output of the products to be tested in each row of the matrix is sequentially connected in series to form one path of series output loop, one path of power supply output of the products to be tested in each column of the matrix is sequentially connected in series to form one path of series output loop, and each path of series output loop is respectively and electrically connected with an aging test load to form an aging test on the path of series output loop.
Specifically, the burn-in test cabinet or the burn-in test room may be equally divided into several layers, and a plurality of products to be tested are placed on each layer to form a matrix distribution of several rows and several columns. As shown in fig. 3, one power output of the first row of 4 products to be tested is connected in series to obtain one series output loop, and then the other power output of the first row of the first product to be tested is connected in series with the other power output of the first column of other products to be tested to obtain one series output loop, 4 series output loops are provided in the 4 rows of products to be tested, 4 series output loops are provided in the 4 columns of products to be tested, and 8 series output loops are provided in total. That is, in the aging test system of the power supply in this embodiment, 16 products to be tested having two power supply outputs need only to electrically connect 8 series output loops with the aging test load, respectively, so as to form an aging test on all the products to be tested.
Through the aging test system of the power that this embodiment provided, the power output to a plurality of products that await measuring has adopted the mode of establishing ties to carry out aging test, has reduced the return circuit quantity of aging test load, has reduced the hardware cost who adopts step-up module and isolation module to effectively avoid because the product output short circuit problem that the establishing ties leads to, promoted the aging test's of power efficiency.
In one embodiment, at least one matrix is formed based on the number of power output circuits of the product to be tested, and each series output circuit formed in each matrix is electrically connected with one aging test load. Specifically, a first matrix can be formed by distributing products to be tested, which need to be subjected to aging testing, in rows and columns, and then the first matrix is decomposed according to the number of power output paths of the products to be tested to form a plurality of matrices, so that each path of power output of the products to be tested can form series connection. Each series output loop formed in each matrix is electrically connected with a burn-in test load respectively so as to form a burn-in test for each series output loop.
For example, when the product to be tested has three paths of power outputs, the rows or columns of the first matrix may be decomposed into m × n (m, n ≧ 2) small rows of matrices; when the product to be tested has four paths of power supply outputs, the rows and the columns of the first matrix are simultaneously decomposed, the rows of the first matrix are decomposed into m × n (m and n are more than or equal to 2) row small matrixes, and the columns of the first matrix are decomposed into p × q (p and q are more than or equal to 2) column small matrixes.
Fig. 4 is a schematic connection diagram of a product to be tested having two outputs in an embodiment, where the product to be tested includes a first power output and a second power output, and the two power outputs based on the product to be tested form an M × N matrix with M rows and N columns, where M, N is greater than or equal to 2. The first power outputs of the products to be tested in each row of the M-by-N matrix are sequentially connected in series to form M series output loops; and the second power outputs of the products to be tested in each column of the M-N matrix are sequentially connected in series to form N series output loops. And outputting two paths of power supplies based on the product to be detected to form an N + M path series output loop.
Specifically, as shown in fig. 4, taking 16 products to be measured with two outputs as an example, 16 products are grouped into a 4 × 4 matrix according to 4 rows and 4 columns. The first output of the products to be tested in the same row is connected in series to obtain a series output loop, so that 4 rows have 4 rows of series output loops; the second outputs of the same row of products are connected in series to obtain a series output loop, so that 4 rows of the products to be tested have 4 series output loops, and 16 products to be tested have 8 series voltages, so that the number of the output loops is reduced, the test cost is reduced, and the short circuit problem of the products to be tested in a series connection mode is effectively avoided.
In one embodiment, the product under test includes a first power output, a second power output, and a third power output, i.e., the product under test has three power outputs. Then, in the aging test system, for the aging test of the product to be tested, an M × N matrix with M rows and N columns can be formed according to the first power output and the second power output of the product to be tested, and a p × q matrix with p rows and q columns can be formed according to the third power output of the product to be tested and each row or each column in the M × N matrix; wherein M, N is more than or equal to 2, p and q are more than or equal to 2, and M/N is p.
The power outputs of the products to be tested in each row of the p-x-q matrix are sequentially connected in series to form a p-path series output loop; the power outputs of the products to be tested in each column of the p-q matrix are sequentially connected in series to form a q-path series output loop; the power outputs of the products to be tested in each row of the M-N matrix are sequentially connected in series to form M series output loops; and forming an M + N (p + q) circuit series output loop based on the three power outputs of the product to be tested.
Specifically, taking 64 products to be tested with three outputs as an example, as shown in fig. 5, the products to be tested in the burn-in test cabinet are grouped into a first matrix of 4 × 16 by rows and columns. According to the principle of a product to be tested with two power outputs, the power outputs of the product to be tested in the same column are directly connected in series to obtain a series output loop, and therefore 16 columns in the first matrix have 16 series output loops.
Further, as shown in fig. 6, 16 products to be measured in each row are further decomposed into 4 × 4 small matrices, and the voltage outputs of the products to be measured in the same row in the 4 × 4 small matrices are connected in series to obtain a series output loop, so that 4 rows have 4 series output loops; the voltage outputs of the products in the same column in the 4 x 4 small matrix are connected in series to obtain a series output loop, so that 4 columns have 4 series output loops; therefore, a total of 8 serial output loops are obtained for 4 × 4 small matrices in each row of the first matrix, a total of 4 × 4 small matrices is obtained for 4 × 8 — 32 serial output loops, and 16 serial output loops of 16 columns are added, so that 48 serial output loops are obtained. The 64 products to be tested with three outputs have 192 outputs in total, and only 48 outputs are output after the serial connection mode in the aging test system provided by the embodiment, so that the loop quantity of the aging test load is greatly reduced, the test cost is reduced, the problem of short circuit of the output of the products caused by serial connection is effectively avoided, and the test efficiency of the aging test of the power supply is improved.
In one embodiment, the product to be tested includes a first power output, a second power output, a third power output, and a fourth power output, that is, the product to be tested has four power outputs. Then, in the aging test system, for the aging test of the product to be tested, an M × N matrix with M rows and N columns is formed according to the first power output and the second power output of the product to be tested, an M × N matrix with M rows and N columns is formed according to the third power output of the product to be tested and each row in the M × N matrix, and a p × q matrix with p rows and q columns is formed according to the fourth power output of the product to be tested and each column in the M × N matrix; wherein M, N is more than or equal to 2, N and M are more than or equal to 2, p and q are more than or equal to 2, N is M and N, and M is p and q.
The power outputs of each row in the M x n matrix are sequentially connected in series to form M series output loops, the power outputs of each column in the M x n matrix are sequentially connected in series to form n series output loops, and the M x n matrix has M layers in total. And the power outputs of each row in the p-x-q matrix are sequentially connected in series to form a p-path series output loop, the power outputs of each column in the p-x-q matrix are sequentially connected in series to form a q-path series output loop, and the p-x-q matrix has N layers in total. And forming an M (M + N) + N (p + q) circuit series output loop based on the four power outputs of the product to be detected.
Specifically, similar to the principle of the product to be tested having three-way power output, taking 64 products to be tested having four-way output as an example, the products to be tested in the burn-in test cabinet are grouped into a first matrix of 4 × 16 by rows and columns, as shown in fig. 5. Then, 16 products in each row are further decomposed into 4 × 4 small matrixes, as shown in fig. 6, 4 rows are provided, so that 4 × 4 small matrixes in the row are provided, and 4 × 8-32 serial output loops are obtained. Each column is further decomposed into 2 × 2 small matrices, as shown in fig. 7, 16 columns, so that 16 small matrices of 2 × 2 columns result in 16 × 4 — 64 serial output loops, and thus 96 serial output loops are provided. And the total 256 outputs of 64 products to be tested with four outputs are provided, and only 96 outputs are provided after the serial connection mode in the aging test system provided by the embodiment, so that the loop quantity of the aging test load is greatly reduced, the test cost is reduced, the problem of short circuit of the product output caused by serial connection is effectively avoided, and the test efficiency of the aging test of the power supply is improved.
It can be understood that, by analogy, in other embodiments, the product to be tested may further have more power outputs, for example, five power outputs, six power outputs, and the like, which is similar to the connection principle of the product to be tested having multiple power outputs in the above embodiments, and the aging test system of the power supply provided by the application may perform the aging test by using a serial connection manner for the power outputs of the multiple products to be tested, thereby reducing the test cost and improving the test efficiency.
In one embodiment, each of the one-way series output loops is electrically connected with different aging test loads respectively.
In one embodiment, different series output loops electrically connected to the same burn-in test load are electrically isolated from each other.
The utility model provides an aging testing system of power, through to a plurality of products that await measuring according to row, row distribution constitution matrix, form series output circuit all the way after establishing ties in proper order with every row's the product that awaits measuring power output all the way in the matrix, every series output circuit all the way is connected with an aging testing load electricity respectively, and is right with the formation the aging testing of series output circuit all the way. Through the aging test system of the power supply, the power supply output of a plurality of products to be tested is subjected to aging test in a series connection mode, the loop quantity of aging test loads is reduced, the hardware cost of the boosting module and the isolation module is reduced, the problem of short circuit of the product output caused by series connection is effectively avoided, and the test efficiency of the aging test of the power supply is improved.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present application. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (7)
1. The aging test system of the power supply is characterized by comprising a test device, wherein the test device is provided with a plurality of products to be tested, and each product to be tested comprises at least two paths of power supply outputs;
the products to be tested are distributed according to rows and columns to form a matrix, one path of power output of the products to be tested in each row in the matrix is sequentially connected in series to form one path of series output loop, one path of power output of the products to be tested in each column in the matrix is sequentially connected in series to form one path of series output loop, and each path of series output loop is electrically connected with an aging test load respectively to form an aging test on the path of series output loop.
2. The system of claim 1, wherein at least one matrix is formed based on the number of power output circuits of the product to be tested, and each series output circuit formed in each matrix is electrically connected to a burn-in test load.
3. The system of claim 2, wherein the product under test comprises a first power output and a second power output, and the two power outputs based on the product under test form an M x N matrix with M rows and N columns, wherein M, N is greater than or equal to 2;
the first power outputs of the products to be tested in each row of the M-by-N matrix are sequentially connected in series to form M series output loops; the second power outputs of the products to be tested in each column of the M-N matrix are sequentially connected in series to form N series output loops; and outputting two paths of power supplies based on the product to be detected to form an N + M path series output loop.
4. The system of claim 2, wherein the product under test comprises a first power output, a second power output, and a third power output, the first power output and the second power output of the product under test form an M x N matrix with M rows and N columns, and the third power output of the product under test forms a p x q matrix with p rows and q columns with each row or each column in the M x N matrix, wherein M, N is greater than or equal to 2, p, q is greater than or equal to 2, and M/N is greater than or equal to p;
the power outputs of the products to be tested in each row of the p-x-q matrix are sequentially connected in series to form a p-path series output loop; the power outputs of the products to be tested in each column of the p-x-q matrix are sequentially connected in series to form a q-path series output loop; the power outputs of the products to be tested in each row of the M-by-N matrix are sequentially connected in series to form M series output loops; and forming an M + N (p + q) circuit series output loop based on the three power outputs of the product to be tested.
5. The system of claim 2, wherein the product under test includes a first power output, a second power output, a third power output, and a fourth power output; the first power output and the second power output of the product to be tested form an M x N matrix with M rows and N columns, the third power output of the product to be tested and each row in the M x N matrix form an M x N matrix with M rows and N columns, and the fourth power output of the product to be tested and each row in the M x N matrix form a p x q matrix with p rows and q columns;
the power outputs of each row in the M x n matrix are sequentially connected in series to form M series output loops, the power outputs of each column in the M x n matrix are sequentially connected in series to form n series output loops, and the M x n matrix has M layers in total; the power outputs of each row in the p-x-q matrix are sequentially connected in series to form a p-path series output loop, the power outputs of each column in the p-x-q matrix are sequentially connected in series to form a q-path series output loop, and the p-x-q matrix has N layers in total; and forming an M (M + N) + N (p + q) circuit series output loop based on the four power outputs of the product to be detected.
6. The system according to any one of claims 1-5, wherein each of said one series output loops is electrically connected to a different burn-in test load.
7. The system of any of claims 1-5, wherein different series output loops electrically connected to the same burn-in test load are electrically isolated from each other.
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