CN210109253U - Novel electric performance test device for packaged diode - Google Patents
Novel electric performance test device for packaged diode Download PDFInfo
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- CN210109253U CN210109253U CN201920845685.8U CN201920845685U CN210109253U CN 210109253 U CN210109253 U CN 210109253U CN 201920845685 U CN201920845685 U CN 201920845685U CN 210109253 U CN210109253 U CN 210109253U
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Abstract
The utility model discloses a novel electrical property test of encapsulation diode device, include: the two matched fixed blocks are connected through a screw; one end of each test probe is contacted with the pin of the packaged diode, and the other end of each test probe is communicated with the digital source meter; wherein, a plurality of mounting holes are uniformly distributed in the fixed block, and each test probe is respectively arranged in each mounting hole in a sliding manner. Adopt the utility model discloses a test device of encapsulation diode makes test probe carry out adaptability according to the size of actual encapsulation diode pin and adjusts the installation, enlarges application range, improves adaptability and utilization ratio.
Description
Technical Field
The utility model relates to a testing device. More specifically, the utility model relates to a novel electrical property test of encapsulation diode device.
Background
A diode is a very important electronic component, a device with two electronic components, which only allows current to flow in a single direction, but blocks current in the reverse direction, and the unidirectional conduction characteristic of a diode, which is used in almost all electronic circuits. Diodes are classified into electronic diodes and crystal diodes, and the crystal diodes have become the mainstream due to many defects of the electronic diodes. For the crystal diode, the packaging process is very important, and the using effect and the using time of the diode are directly determined by the packaging process.
The packaged diode is widely applied to bypass protection of the solar cell, and main test items are forward conduction voltage drop and reverse leakage current.
At present, a special four-wire testing device is adopted for a conventional testing device for packaged diodes, but the conventional testing device has a single function, one testing device can only measure the packaged diodes with the same size, and the adaptability adjustment cannot be carried out according to the pin width of the actual packaged diodes, so that the utilization rate of the testing device is low, and the application range is small.
SUMMERY OF THE UTILITY MODEL
An object of the present invention is to solve at least the above problems and/or disadvantages and to provide at least the advantages which will be described later.
To achieve these objects and other advantages in accordance with the purpose of the invention, a novel packaged diode electrical performance testing apparatus is provided, including:
the two fixed blocks are matched and connected through a screw;
one end of each test probe is contacted with a pin of the packaged diode, and the other end of each test probe is communicated with the digital source meter;
the fixed block is internally and uniformly provided with a plurality of mounting holes, and each test probe is detachably arranged in each mounting hole respectively.
Preferably, wherein the number of the test probes is 4.
Preferably, wherein each of the test probes comprises:
the first conductive column is arranged to be a hollow structure, and one end of the first conductive column is communicated with the digital source meter;
the second conductive column is matched with the first conductive column and is set to be a solid structure, one end of the second conductive column is connected and contacted with the pin, and the second conductive column can slide in the first conductive column;
the first conductive column is provided with a plurality of through holes which penetrate through the first conductive column at intervals and at preset distances, the first conductive column is connected with the second conductive column through an expansion spring, and the through holes are further provided with a limiting rod in a matching mode.
Preferably, one end of the second conductive column is provided with a thread, and a probe is detachably connected to the second conductive column.
Preferably, wherein the probe is one of a round head or a pointed head.
Preferably, the fixing block is made of an insulating material.
Preferably, the insulating material is ABS resin material.
Preferably, the mounting hole is formed by two semicircular inner grooves respectively formed in each fixing block.
The utility model discloses at least, include following beneficial effect: two fixed blocks through the screw rod connection can high efficiency realize the dismouting, thereby the efficient realization is fixed to test probe and is loosened, and then shorten test dismouting time, the equipartition is provided with a plurality of mounting holes in the fixed block simultaneously, its aim at makes test probe have a plurality of installation chucking positions in the fixed block, make test probe carry out adaptability according to the size of actual encapsulation diode pin and adjust the installation, thereby make testing arrangement can test to the encapsulation diode of different volume dimensions size, make test range increase, adaptability and utilization ratio are improved.
Additional advantages, objects, and features of the invention will be set forth in part in the description which follows and in part will become apparent to those having ordinary skill in the art upon examination of the following or may be learned from practice of the invention.
Drawings
Fig. 1 is a view showing an overall structure of a test apparatus for packaging a diode;
FIG. 2 shows an internal structural view of a test probe;
fig. 3 shows an external structural view of the test probe.
Detailed Description
The present invention is further described in detail below with reference to the drawings so that those skilled in the art can implement the invention with reference to the description.
It will be understood that terms such as "having," "including," and "comprising," as used herein, do not preclude the presence or addition of one or more other elements or groups thereof.
Fig. 1 shows an implementation form of an electrical performance testing device according to the present invention, which includes:
the device comprises two matched fixed blocks 1, wherein the fixed blocks are connected through a screw 2; the two fixing blocks connected through the screw rod can be quickly and efficiently disassembled and assembled.
One end of each test probe is contacted with a pin of the packaged diode, and the other end of each test probe is communicated with the digital source meter; the concrete connection mode is as follows: one end of the test probe at the two ends is connected with the input end of the digital source meter, and the required current or voltage is input; one end of the test probe positioned in the middle is connected with a test end of the digital source meter to measure the voltage or current value at two ends of the diode, meanwhile, two adjacent test probes form a group, and the other end of each test probe is respectively contacted with the anode and the cathode of the packaged diode;
when measuring the forward conduction voltage drop, the test probes at the two ends are connected with the input end of the digital source meter, the middle two test probes are connected with the output end of the digital source meter, the set current is input, and the forward voltage drop under the condition of the input current is measured.
When measuring the reverse leakage current, the test probes at the two ends are connected with the input end of the digital source meter, the two test probes in the middle are connected with the output end of the digital source meter, the set voltage is input, and the leakage current under the condition of the input voltage is measured.
A plurality of mounting holes 4 are uniformly distributed in the fixed block, and each test probe 3 is detachably arranged in each mounting hole respectively. Through setting up two fixed blocks 1 into 2 dismouting of screw rod, realize detachable installation and fixed to test probe 3, make things convenient for test probe 3 fixed and unclamp in fixed block 1, the equipartition is provided with a plurality of mounting holes 4 in fixed block 1, its aim at makes test probe 3 have a plurality of installation chucking positions in fixed block 1, make test probe 3 can carry out the adaptability according to the size of actual encapsulation diode pin and adjust, thereby make testing arrangement can test to the encapsulation diode of not unidimensional size, increase the test range, improve adaptability and utilization ratio.
In another example, the test probes are provided in 4 numbers. The number of the test probes is set to be 4, so that the test probes can be in adaptive contact with pins of the packaged diode, and the reverse leakage current and the forward conduction voltage drop of the packaged diode can be detected.
In another example, each of the test probes includes:
the first conductive column 5 is arranged in a hollow structure, and one end of the first conductive column 5 is communicated with the digital source meter;
the second conductive column 6 is matched with the first conductive column 5, the second conductive column 6 is a solid structure, one end of the second conductive column 6 is in contact with the pins, and the second conductive column 6 can slide in the first conductive column 5; the second conductive column can slide in the first conductive column and is also contacted with the first conductive column, so that the electrical communication is ensured.
Wherein, the interval is predetermine apart from the equipartition and is provided with a plurality of through-holes 7 that run through on the first conductive post 5, first conductive post 5 with it connects through an expanding spring 8 to set up between the second conductive post 6, still cooperate on the through-hole 7 and be provided with a spacing stick 9.
When the test probe is used for carrying out a detection experiment, after the first conductive column 5 at the upper end is communicated with the digital source meter, the first conductive column 5 at the upper end is fixed in the mounting hole through manual extrusion or mechanical pressing, and the position of the first conductive column is not changed, the second conductive column 6 at the lower end can slide up and down in the first conductive column 5, then the limit rod 9 arranged on the circumference of the first conductive column is used for changing the fixed mounting position of the second conductive column in different through holes 7 on the first conductive column 5, further penetrating the telescopic spring 8 arranged between the first conductive column 5 and the second conductive column 6, and changing the effective elastic force action circle number of the telescopic elasticity between the first conductive column 5 and the second conductive column 6 (after the telescopic spring is penetrated by the limit rod at a certain position, the elastic force cannot be applied to the second conductive column from the penetrating position to the section of the telescopic spring contacted with the second conductive column), the elastic pressure between the first conductive column 5 and the second conductive column 6 can be adjusted, so that the contact pressure between the second conductive column 6 and the pins can be adjusted, and data measurement under different contact pressures can be realized.
In another example, one end of the second conductive post is provided with a screw thread, and a probe 10 is detachably connected to the screw thread. One end that the second led electrical pillar sets up to the probe of spiro union, makes the more convenient high efficiency of probe change.
In another example, the probe is one of a round head or a pointed head. Set up the probe into button head or tip, area of contact when making the second lead electrical pillar and pin contact is adjustable, makes it can detect the experimental data under the different area of contact.
In another example, the fixing block is made of an insulating material. The fixing block is made of insulating materials, and the position of the fixing block is touched by hands when a test experiment is carried out, so that the danger of electric shock is avoided.
In another example, the insulating material is an ABS resin material. The ABS resin material is a thermoplastic high polymer material with high strength, good toughness and easy processing and molding, is used for preparing various parts such as instruments, electrics, electrical appliances, machinery and the like, and has the advantage of high insulativity.
In another example, the mounting hole is formed by two semicircular inner grooves 11 respectively formed on each fixing block. The mounting hole is formed by two semicircular inner grooves, so that the mounting hole is more convenient and efficient to clamp with the hollow column.
The number of apparatuses and the scale of the process described here are intended to simplify the description of the present invention. Applications, modifications and variations of the inventive electrical performance testing device for a novel packaged diode will be apparent to those skilled in the art.
While embodiments of the invention have been disclosed above, it is not intended to be limited to the applications listed in the specification and the examples. It can be applicable to various and be fit for the utility model discloses a field completely. Additional modifications will readily occur to those skilled in the art. The invention is therefore not to be limited to the specific details and illustrations shown and described herein, without departing from the general concept defined by the claims and their equivalents.
Claims (8)
1. An electrical performance testing device of a novel packaged diode, comprising:
the two fixed blocks are matched and connected through a screw;
one end of each test probe is contacted with a pin of the packaged diode, and the other end of each test probe is communicated with the digital source meter;
the fixed block is internally and uniformly provided with a plurality of mounting holes, and each test probe is detachably arranged in each mounting hole respectively.
2. The device for testing the electrical performance of the novel packaged diode as claimed in claim 1, wherein the number of the test probes is 4.
3. The device for testing the electrical performance of a novel packaged diode as claimed in claim 1, wherein each of said test probes comprises:
the first conductive column is arranged to be a hollow structure, and one end of the first conductive column is communicated with the digital source meter;
the second conductive column is matched with the first conductive column and is set to be a solid structure, one end of the second conductive column is connected and contacted with the pin, and the second conductive column can slide in the first conductive column;
the first conductive column is provided with a plurality of through holes which penetrate through the first conductive column at intervals and at preset distances, the first conductive column is connected with the second conductive column through an expansion spring, and the through holes are further provided with a limiting rod in a matching mode.
4. The electrical property testing device of the novel packaged diode as claimed in claim 3, wherein the second conductive pillar has a screw thread at one end, and a probe is detachably connected to the second conductive pillar.
5. The device for testing the electrical performance of a novel packaged diode as claimed in claim 4, wherein the probe is one of a round head or a pointed head.
6. The device for testing the electrical performance of the novel packaged diode as claimed in claim 1, wherein the material of the fixing block is an insulating material.
7. The device for testing the electrical performance of the novel packaged diode as claimed in claim 6, wherein the insulating material is ABS resin.
8. The device for testing the electrical performance of the novel packaged diode as claimed in claim 1, wherein the mounting hole is formed by two semicircular inner grooves respectively formed in each of the fixing blocks.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920845685.8U CN210109253U (en) | 2019-06-05 | 2019-06-05 | Novel electric performance test device for packaged diode |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201920845685.8U CN210109253U (en) | 2019-06-05 | 2019-06-05 | Novel electric performance test device for packaged diode |
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| CN210109253U true CN210109253U (en) | 2020-02-21 |
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| CN201920845685.8U Active CN210109253U (en) | 2019-06-05 | 2019-06-05 | Novel electric performance test device for packaged diode |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113889669A (en) * | 2021-09-15 | 2022-01-04 | 浙江南都电源动力股份有限公司 | Lithium battery formation partial volume probe and device |
| CN117008070A (en) * | 2023-10-07 | 2023-11-07 | 成都世源频控技术股份有限公司 | Radar simulator with electric leakage detection function |
-
2019
- 2019-06-05 CN CN201920845685.8U patent/CN210109253U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113889669A (en) * | 2021-09-15 | 2022-01-04 | 浙江南都电源动力股份有限公司 | Lithium battery formation partial volume probe and device |
| CN117008070A (en) * | 2023-10-07 | 2023-11-07 | 成都世源频控技术股份有限公司 | Radar simulator with electric leakage detection function |
| CN117008070B (en) * | 2023-10-07 | 2023-12-19 | 成都世源频控技术股份有限公司 | Radar simulator with electric leakage detection function |
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Address after: No. 8 Fenghuang Middle Road, Fucheng District, Mianyang City, Sichuan Province 621000 Patentee after: Mianyang Haohua Photoelectric Technology Co.,Ltd. Address before: No. 8 Fenghuang Middle Road, Fucheng District, Mianyang City, Sichuan Province 621000 Patentee before: Mianyang Jinneng Mobile Energy Co.,Ltd. |